JP2008263025A5 - - Google Patents
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- JP2008263025A5 JP2008263025A5 JP2007104039A JP2007104039A JP2008263025A5 JP 2008263025 A5 JP2008263025 A5 JP 2008263025A5 JP 2007104039 A JP2007104039 A JP 2007104039A JP 2007104039 A JP2007104039 A JP 2007104039A JP 2008263025 A5 JP2008263025 A5 JP 2008263025A5
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- Prior art keywords
- single crystal
- semiconductor single
- semiconductor
- manufacturing
- temperature
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007104039A JP5168990B2 (ja) | 2007-04-11 | 2007-04-11 | 半導体基板の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007104039A JP5168990B2 (ja) | 2007-04-11 | 2007-04-11 | 半導体基板の製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008263025A JP2008263025A (ja) | 2008-10-30 |
JP2008263025A5 true JP2008263025A5 (de) | 2010-02-04 |
JP5168990B2 JP5168990B2 (ja) | 2013-03-27 |
Family
ID=39985291
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007104039A Active JP5168990B2 (ja) | 2007-04-11 | 2007-04-11 | 半導体基板の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5168990B2 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5205840B2 (ja) * | 2007-07-06 | 2013-06-05 | 信越半導体株式会社 | 半導体基板の製造方法 |
TW202134488A (zh) | 2019-10-24 | 2021-09-16 | 日商信越半導體股份有限公司 | 半導體基板的製造方法及半導體基板 |
JP7247902B2 (ja) | 2020-01-10 | 2023-03-29 | 信越半導体株式会社 | エピタキシャルウェーハの製造方法 |
CN116685723A (zh) | 2021-01-25 | 2023-09-01 | 信越半导体株式会社 | 外延晶圆的制造方法 |
CN114005753B (zh) * | 2021-10-29 | 2023-07-11 | 西安微电子技术研究所 | 一种igbt产品的氧化工艺方法及氧化后igbt产品 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04311029A (ja) * | 1991-04-09 | 1992-11-02 | Seiko Epson Corp | 半導体薄膜の製造方法 |
JPH09162088A (ja) * | 1995-12-13 | 1997-06-20 | Asahi Chem Ind Co Ltd | 半導体基板とその製造方法 |
JP2003303971A (ja) * | 2002-04-09 | 2003-10-24 | Matsushita Electric Ind Co Ltd | 半導体基板及び半導体装置 |
JP3604018B2 (ja) * | 2002-05-24 | 2004-12-22 | 独立行政法人科学技術振興機構 | シリコン基材表面の二酸化シリコン膜形成方法、半導体基材表面の酸化膜形成方法、及び半導体装置の製造方法 |
US7045432B2 (en) * | 2004-02-04 | 2006-05-16 | Freescale Semiconductor, Inc. | Method for forming a semiconductor device with local semiconductor-on-insulator (SOI) |
JP4095615B2 (ja) * | 2004-02-16 | 2008-06-04 | 光 小林 | 酸化膜の形成方法、半導体装置、半導体装置の製造方法 |
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2007
- 2007-04-11 JP JP2007104039A patent/JP5168990B2/ja active Active
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