JP2008256519A - 多点水晶温度測定装置 - Google Patents
多点水晶温度測定装置 Download PDFInfo
- Publication number
- JP2008256519A JP2008256519A JP2007098707A JP2007098707A JP2008256519A JP 2008256519 A JP2008256519 A JP 2008256519A JP 2007098707 A JP2007098707 A JP 2007098707A JP 2007098707 A JP2007098707 A JP 2007098707A JP 2008256519 A JP2008256519 A JP 2008256519A
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- JP
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- Prior art keywords
- crystal
- temperature
- frequency
- measuring device
- temperature measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 239000013078 crystal Substances 0.000 title claims abstract description 91
- 238000009529 body temperature measurement Methods 0.000 title abstract description 23
- 239000000758 substrate Substances 0.000 claims description 29
- 239000004065 semiconductor Substances 0.000 claims description 25
- 239000000523 sample Substances 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 6
- 239000000853 adhesive Substances 0.000 abstract description 4
- 230000001070 adhesive effect Effects 0.000 abstract description 4
- 239000004973 liquid crystal related substance Substances 0.000 abstract 5
- 239000010453 quartz Substances 0.000 description 18
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 18
- 238000010438 heat treatment Methods 0.000 description 12
- 238000005259 measurement Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 5
- 239000004020 conductor Substances 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Images
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- Oscillators With Electromechanical Resonators (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007098707A JP2008256519A (ja) | 2007-04-04 | 2007-04-04 | 多点水晶温度測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007098707A JP2008256519A (ja) | 2007-04-04 | 2007-04-04 | 多点水晶温度測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008256519A true JP2008256519A (ja) | 2008-10-23 |
| JP2008256519A5 JP2008256519A5 (https=) | 2010-05-06 |
Family
ID=39980227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007098707A Pending JP2008256519A (ja) | 2007-04-04 | 2007-04-04 | 多点水晶温度測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2008256519A (https=) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011137738A (ja) * | 2009-12-28 | 2011-07-14 | Fukuda Crystal Laboratory | 多点温度測定装置 |
| JP2012032194A (ja) * | 2010-07-29 | 2012-02-16 | Masato Tanabe | 水晶温度計測用プローブおよび水晶温度計測装置 |
| JP2012189336A (ja) * | 2011-03-08 | 2012-10-04 | Furuya Kinzoku:Kk | 温度測定装置 |
| CN114910714A (zh) * | 2022-05-12 | 2022-08-16 | 东南大学 | 一种基于奇异点的高灵敏度电荷传感器及其使用方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5540966A (en) * | 1978-09-18 | 1980-03-22 | Toshiba Corp | Multiplex temperature measuring method and its unit |
| JPS6098323A (ja) * | 1983-11-02 | 1985-06-01 | Toyo Commun Equip Co Ltd | 生体内温度測定用プロ−ブ |
| JP2004140167A (ja) * | 2002-10-17 | 2004-05-13 | Dainippon Screen Mfg Co Ltd | 基板の温度測定方法、基板熱処理装置における設定温度の補正方法および基板熱処理装置 |
-
2007
- 2007-04-04 JP JP2007098707A patent/JP2008256519A/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5540966A (en) * | 1978-09-18 | 1980-03-22 | Toshiba Corp | Multiplex temperature measuring method and its unit |
| JPS6098323A (ja) * | 1983-11-02 | 1985-06-01 | Toyo Commun Equip Co Ltd | 生体内温度測定用プロ−ブ |
| JP2004140167A (ja) * | 2002-10-17 | 2004-05-13 | Dainippon Screen Mfg Co Ltd | 基板の温度測定方法、基板熱処理装置における設定温度の補正方法および基板熱処理装置 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011137738A (ja) * | 2009-12-28 | 2011-07-14 | Fukuda Crystal Laboratory | 多点温度測定装置 |
| JP2012032194A (ja) * | 2010-07-29 | 2012-02-16 | Masato Tanabe | 水晶温度計測用プローブおよび水晶温度計測装置 |
| JP2012189336A (ja) * | 2011-03-08 | 2012-10-04 | Furuya Kinzoku:Kk | 温度測定装置 |
| CN114910714A (zh) * | 2022-05-12 | 2022-08-16 | 东南大学 | 一种基于奇异点的高灵敏度电荷传感器及其使用方法 |
| CN114910714B (zh) * | 2022-05-12 | 2024-02-02 | 东南大学 | 一种基于奇异点的高灵敏度电荷传感器及其使用方法 |
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