JPS5540966A - Multiplex temperature measuring method and its unit - Google Patents
Multiplex temperature measuring method and its unitInfo
- Publication number
- JPS5540966A JPS5540966A JP11432878A JP11432878A JPS5540966A JP S5540966 A JPS5540966 A JP S5540966A JP 11432878 A JP11432878 A JP 11432878A JP 11432878 A JP11432878 A JP 11432878A JP S5540966 A JPS5540966 A JP S5540966A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- unit
- maximum
- measurement
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
PURPOSE: To establish the multiplex temperature measuring method and its unit which can make measurement of temperature easily and effectively with comparatively simple constitution, by connecting a plurality of piezoelectric oscillators different in resonant frequency to each part of measured object and to common lines.
CONSTITUTION: The piezoelectric oscillators 11a, 11b... are connected in parallel with the line 12 and they are separately located to the measuring parts of the temperature measured body. CPU 16 drives the function generator 19 and sequentially sweeps the oscillation frequency of the oscillator 15 from about 5MHz. Further, the output of the detector 15 is discriminated whether it is maximum or not, and if maximum point is present, the frequency is read in and temperature conversion is made from the value of the resonant frequency temperature coefficient stored in the memory unit 17 and the measured part is judged. It is recorded or displayed for the temperature measuring part with the recording or display unit 20. Further, the oscillation frequency is changed by about 200kHz and the resonant frequency in which the output of the detector 15 is maximum is read in to operate the temperature. Thus, at the 50th measurement, it returns to the initial point to repeat the measurement of the resonance point.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11432878A JPS5540966A (en) | 1978-09-18 | 1978-09-18 | Multiplex temperature measuring method and its unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11432878A JPS5540966A (en) | 1978-09-18 | 1978-09-18 | Multiplex temperature measuring method and its unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5540966A true JPS5540966A (en) | 1980-03-22 |
Family
ID=14635064
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11432878A Pending JPS5540966A (en) | 1978-09-18 | 1978-09-18 | Multiplex temperature measuring method and its unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5540966A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6461625A (en) * | 1987-09-01 | 1989-03-08 | Anritsu Corp | Temperature measuring instrument |
JP2008256519A (en) * | 2007-04-04 | 2008-10-23 | Tokyo Denpa Co Ltd | Multipoint crystal temperature measurement apparatus |
WO2023157366A1 (en) * | 2022-02-16 | 2023-08-24 | 株式会社村田製作所 | Vibration device and vibration method |
-
1978
- 1978-09-18 JP JP11432878A patent/JPS5540966A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6461625A (en) * | 1987-09-01 | 1989-03-08 | Anritsu Corp | Temperature measuring instrument |
JP2008256519A (en) * | 2007-04-04 | 2008-10-23 | Tokyo Denpa Co Ltd | Multipoint crystal temperature measurement apparatus |
WO2023157366A1 (en) * | 2022-02-16 | 2023-08-24 | 株式会社村田製作所 | Vibration device and vibration method |
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