JPS5540966A - Multiplex temperature measuring method and its unit - Google Patents

Multiplex temperature measuring method and its unit

Info

Publication number
JPS5540966A
JPS5540966A JP11432878A JP11432878A JPS5540966A JP S5540966 A JPS5540966 A JP S5540966A JP 11432878 A JP11432878 A JP 11432878A JP 11432878 A JP11432878 A JP 11432878A JP S5540966 A JPS5540966 A JP S5540966A
Authority
JP
Japan
Prior art keywords
temperature
unit
maximum
measurement
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11432878A
Other languages
Japanese (ja)
Inventor
Katsuyoshi Fukuda
Toshi Asano
Hitoshi Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP11432878A priority Critical patent/JPS5540966A/en
Publication of JPS5540966A publication Critical patent/JPS5540966A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To establish the multiplex temperature measuring method and its unit which can make measurement of temperature easily and effectively with comparatively simple constitution, by connecting a plurality of piezoelectric oscillators different in resonant frequency to each part of measured object and to common lines.
CONSTITUTION: The piezoelectric oscillators 11a, 11b... are connected in parallel with the line 12 and they are separately located to the measuring parts of the temperature measured body. CPU 16 drives the function generator 19 and sequentially sweeps the oscillation frequency of the oscillator 15 from about 5MHz. Further, the output of the detector 15 is discriminated whether it is maximum or not, and if maximum point is present, the frequency is read in and temperature conversion is made from the value of the resonant frequency temperature coefficient stored in the memory unit 17 and the measured part is judged. It is recorded or displayed for the temperature measuring part with the recording or display unit 20. Further, the oscillation frequency is changed by about 200kHz and the resonant frequency in which the output of the detector 15 is maximum is read in to operate the temperature. Thus, at the 50th measurement, it returns to the initial point to repeat the measurement of the resonance point.
COPYRIGHT: (C)1980,JPO&Japio
JP11432878A 1978-09-18 1978-09-18 Multiplex temperature measuring method and its unit Pending JPS5540966A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11432878A JPS5540966A (en) 1978-09-18 1978-09-18 Multiplex temperature measuring method and its unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11432878A JPS5540966A (en) 1978-09-18 1978-09-18 Multiplex temperature measuring method and its unit

Publications (1)

Publication Number Publication Date
JPS5540966A true JPS5540966A (en) 1980-03-22

Family

ID=14635064

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11432878A Pending JPS5540966A (en) 1978-09-18 1978-09-18 Multiplex temperature measuring method and its unit

Country Status (1)

Country Link
JP (1) JPS5540966A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6461625A (en) * 1987-09-01 1989-03-08 Anritsu Corp Temperature measuring instrument
JP2008256519A (en) * 2007-04-04 2008-10-23 Tokyo Denpa Co Ltd Multipoint crystal temperature measurement apparatus
WO2023157366A1 (en) * 2022-02-16 2023-08-24 株式会社村田製作所 Vibration device and vibration method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6461625A (en) * 1987-09-01 1989-03-08 Anritsu Corp Temperature measuring instrument
JP2008256519A (en) * 2007-04-04 2008-10-23 Tokyo Denpa Co Ltd Multipoint crystal temperature measurement apparatus
WO2023157366A1 (en) * 2022-02-16 2023-08-24 株式会社村田製作所 Vibration device and vibration method

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