JP2008226881A5 - - Google Patents
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- Publication number
- JP2008226881A5 JP2008226881A5 JP2007058427A JP2007058427A JP2008226881A5 JP 2008226881 A5 JP2008226881 A5 JP 2008226881A5 JP 2007058427 A JP2007058427 A JP 2007058427A JP 2007058427 A JP2007058427 A JP 2007058427A JP 2008226881 A5 JP2008226881 A5 JP 2008226881A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- printed circuit
- inspection jig
- board inspection
- wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims 20
- 238000007689 inspection Methods 0.000 claims 18
- 230000037431 insertion Effects 0.000 claims 6
- 238000003780 insertion Methods 0.000 claims 6
- 238000009429 electrical wiring Methods 0.000 claims 2
- 239000004020 conductor Substances 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007058427A JP4861860B2 (ja) | 2007-03-08 | 2007-03-08 | プリント基板検査用治具及びプリント基板検査装置 |
| US12/044,593 US20080218188A1 (en) | 2007-03-08 | 2008-03-07 | Jig for printed substrate inspection and printed substrate inspection apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007058427A JP4861860B2 (ja) | 2007-03-08 | 2007-03-08 | プリント基板検査用治具及びプリント基板検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008226881A JP2008226881A (ja) | 2008-09-25 |
| JP2008226881A5 true JP2008226881A5 (enExample) | 2010-02-12 |
| JP4861860B2 JP4861860B2 (ja) | 2012-01-25 |
Family
ID=39741003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007058427A Expired - Fee Related JP4861860B2 (ja) | 2007-03-08 | 2007-03-08 | プリント基板検査用治具及びプリント基板検査装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20080218188A1 (enExample) |
| JP (1) | JP4861860B2 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8760186B2 (en) * | 2010-02-19 | 2014-06-24 | International Business Machines Corporation | Probe apparatus assembly and method |
| JP2011247838A (ja) | 2010-05-31 | 2011-12-08 | Ricoh Co Ltd | スイッチプローブ、基板検査装置及び基板検査システム |
| JP6016292B2 (ja) * | 2011-10-13 | 2016-10-26 | デクセリアルズ株式会社 | 太陽電池用測定治具及び太陽電池セルの出力測定方法 |
| JP6407128B2 (ja) * | 2015-11-18 | 2018-10-17 | 三菱電機株式会社 | 半導体装置の評価装置および半導体装置の評価方法 |
| CN106443299B (zh) * | 2016-09-27 | 2019-01-04 | 惠州市金百泽电路科技有限公司 | 一种侦断印制电路板台阶孔开短路功能性缺陷的检测方法 |
| JP2020188046A (ja) * | 2019-05-10 | 2020-11-19 | 信越半導体株式会社 | プローブカード |
| IT202300008097A1 (it) * | 2023-04-26 | 2024-10-26 | Technoprobe Spa | Testa di misura con sonde di contatto aventi proprietà di deformazione migliorate |
| IT202300008094A1 (it) * | 2023-04-26 | 2024-10-26 | Technoprobe Spa | Testa di misura con sonde di contatto aventi mezzi di arresto e una configurazione perfezionata |
| TW202509486A (zh) * | 2023-04-26 | 2025-03-01 | 義大利商探針科技公司 | 具有改善組態之接觸探針之探針頭 |
| IT202300008088A1 (it) * | 2023-04-26 | 2024-10-26 | Technoprobe Spa | Testa di misura con sonde di contatto perfezionate |
| IT202300008100A1 (it) * | 2023-04-26 | 2024-10-26 | Technoprobe Spa | Testa di misura con sonde di contatto aventi una configurazione perfezionata |
| CN118566590A (zh) * | 2024-05-22 | 2024-08-30 | 国网山西省电力公司电力科学研究院 | 一种电缆缓冲层体积电阻率测试电极、装置及方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4496903A (en) * | 1981-05-11 | 1985-01-29 | Burroughs Corporation | Circuit board test fixture |
| US4870354A (en) * | 1988-08-11 | 1989-09-26 | Zehntel, Inc. | Apparatus for contacting a printed circuit board with an array of test probes |
| US4977370A (en) * | 1988-12-06 | 1990-12-11 | Genrad, Inc. | Apparatus and method for circuit board testing |
| JPH0385456A (ja) * | 1989-08-30 | 1991-04-10 | Hitachi Electron Eng Co Ltd | プローバ |
| US5574382A (en) * | 1991-09-17 | 1996-11-12 | Japan Synthetic Rubber Co., Ltd. | Inspection electrode unit for printed wiring board |
| JP3821171B2 (ja) * | 1995-11-10 | 2006-09-13 | オー・エイチ・ティー株式会社 | 検査装置及び検査方法 |
| US5898314A (en) * | 1996-02-26 | 1999-04-27 | Delaware Capital Formation, Inc. | Translator fixture with force applying blind pins |
| US6661245B1 (en) * | 1996-10-31 | 2003-12-09 | International Business Machines Corporation | Method to eliminate wiring of electrical fixtures using spring probes |
| US6229322B1 (en) * | 1998-08-21 | 2001-05-08 | Micron Technology, Inc. | Electronic device workpiece processing apparatus and method of communicating signals within an electronic device workpiece processing apparatus |
| JP2005077262A (ja) * | 2003-09-01 | 2005-03-24 | Matsushita Electric Ind Co Ltd | プリント配線板の検査用基板 |
| CN100549708C (zh) * | 2004-07-15 | 2009-10-14 | Jsr株式会社 | 电路基板的检查装置以及电路基板的检查方法 |
-
2007
- 2007-03-08 JP JP2007058427A patent/JP4861860B2/ja not_active Expired - Fee Related
-
2008
- 2008-03-07 US US12/044,593 patent/US20080218188A1/en not_active Abandoned