JP2008226881A5 - - Google Patents

Download PDF

Info

Publication number
JP2008226881A5
JP2008226881A5 JP2007058427A JP2007058427A JP2008226881A5 JP 2008226881 A5 JP2008226881 A5 JP 2008226881A5 JP 2007058427 A JP2007058427 A JP 2007058427A JP 2007058427 A JP2007058427 A JP 2007058427A JP 2008226881 A5 JP2008226881 A5 JP 2008226881A5
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
inspection jig
board inspection
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007058427A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008226881A (ja
JP4861860B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2007058427A priority Critical patent/JP4861860B2/ja
Priority claimed from JP2007058427A external-priority patent/JP4861860B2/ja
Priority to US12/044,593 priority patent/US20080218188A1/en
Publication of JP2008226881A publication Critical patent/JP2008226881A/ja
Publication of JP2008226881A5 publication Critical patent/JP2008226881A5/ja
Application granted granted Critical
Publication of JP4861860B2 publication Critical patent/JP4861860B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2007058427A 2007-03-08 2007-03-08 プリント基板検査用治具及びプリント基板検査装置 Expired - Fee Related JP4861860B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007058427A JP4861860B2 (ja) 2007-03-08 2007-03-08 プリント基板検査用治具及びプリント基板検査装置
US12/044,593 US20080218188A1 (en) 2007-03-08 2008-03-07 Jig for printed substrate inspection and printed substrate inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007058427A JP4861860B2 (ja) 2007-03-08 2007-03-08 プリント基板検査用治具及びプリント基板検査装置

Publications (3)

Publication Number Publication Date
JP2008226881A JP2008226881A (ja) 2008-09-25
JP2008226881A5 true JP2008226881A5 (enExample) 2010-02-12
JP4861860B2 JP4861860B2 (ja) 2012-01-25

Family

ID=39741003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007058427A Expired - Fee Related JP4861860B2 (ja) 2007-03-08 2007-03-08 プリント基板検査用治具及びプリント基板検査装置

Country Status (2)

Country Link
US (1) US20080218188A1 (enExample)
JP (1) JP4861860B2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8760186B2 (en) * 2010-02-19 2014-06-24 International Business Machines Corporation Probe apparatus assembly and method
JP2011247838A (ja) 2010-05-31 2011-12-08 Ricoh Co Ltd スイッチプローブ、基板検査装置及び基板検査システム
JP6016292B2 (ja) * 2011-10-13 2016-10-26 デクセリアルズ株式会社 太陽電池用測定治具及び太陽電池セルの出力測定方法
JP6407128B2 (ja) * 2015-11-18 2018-10-17 三菱電機株式会社 半導体装置の評価装置および半導体装置の評価方法
CN106443299B (zh) * 2016-09-27 2019-01-04 惠州市金百泽电路科技有限公司 一种侦断印制电路板台阶孔开短路功能性缺陷的检测方法
JP2020188046A (ja) * 2019-05-10 2020-11-19 信越半導体株式会社 プローブカード
IT202300008097A1 (it) * 2023-04-26 2024-10-26 Technoprobe Spa Testa di misura con sonde di contatto aventi proprietà di deformazione migliorate
TW202509486A (zh) * 2023-04-26 2025-03-01 義大利商探針科技公司 具有改善組態之接觸探針之探針頭
IT202300008094A1 (it) * 2023-04-26 2024-10-26 Technoprobe Spa Testa di misura con sonde di contatto aventi mezzi di arresto e una configurazione perfezionata
IT202300008100A1 (it) * 2023-04-26 2024-10-26 Technoprobe Spa Testa di misura con sonde di contatto aventi una configurazione perfezionata
IT202300008088A1 (it) * 2023-04-26 2024-10-26 Technoprobe Spa Testa di misura con sonde di contatto perfezionate
CN118566590A (zh) * 2024-05-22 2024-08-30 国网山西省电力公司电力科学研究院 一种电缆缓冲层体积电阻率测试电极、装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4496903A (en) * 1981-05-11 1985-01-29 Burroughs Corporation Circuit board test fixture
US4870354A (en) * 1988-08-11 1989-09-26 Zehntel, Inc. Apparatus for contacting a printed circuit board with an array of test probes
US4977370A (en) * 1988-12-06 1990-12-11 Genrad, Inc. Apparatus and method for circuit board testing
JPH0385456A (ja) * 1989-08-30 1991-04-10 Hitachi Electron Eng Co Ltd プローバ
KR100288344B1 (ko) * 1991-09-17 2001-11-30 마쯔모또 에이찌 프린트배선판용검사전극유니트와그것을포함하는검사장치및프린트배선판용의검사방법
JP3821171B2 (ja) * 1995-11-10 2006-09-13 オー・エイチ・ティー株式会社 検査装置及び検査方法
US5898314A (en) * 1996-02-26 1999-04-27 Delaware Capital Formation, Inc. Translator fixture with force applying blind pins
US6661245B1 (en) * 1996-10-31 2003-12-09 International Business Machines Corporation Method to eliminate wiring of electrical fixtures using spring probes
US6229322B1 (en) * 1998-08-21 2001-05-08 Micron Technology, Inc. Electronic device workpiece processing apparatus and method of communicating signals within an electronic device workpiece processing apparatus
JP2005077262A (ja) * 2003-09-01 2005-03-24 Matsushita Electric Ind Co Ltd プリント配線板の検査用基板
TWI409461B (zh) * 2004-07-15 2013-09-21 Jsr Corp Circuit board inspection device and circuit board inspection method

Similar Documents

Publication Publication Date Title
JP2008226881A5 (enExample)
JP2012159422A5 (enExample)
JP4861860B2 (ja) プリント基板検査用治具及びプリント基板検査装置
JP2012164469A5 (enExample)
JP2018050076A5 (enExample)
CN102445141B (zh) 一种多层电路板层检测方法和装置
JP2005108861A5 (enExample)
CN202018494U (zh) 四线式pcb测试治具
JP2011075313A5 (enExample)
CN201234406Y (zh) 一种软性印刷线路板
US7525329B2 (en) Electrical connecting apparatus
CA2592901A1 (en) Semi-generic in-circuit test fixture
TWM469489U (zh) 測試組件及其電性檢測裝置
JP2011096912A (ja) プリント回路板及びプリント回路板を備えた電子機器
JP2010164490A5 (enExample)
JP2012159425A5 (enExample)
CN102445648A (zh) 电路板文字漏印的检测方法
CN101173973B (zh) 柔性电路板的线路通断检测方法
CN103513141B (zh) 便于检查v-cut品质的电路板及其电路板测试方法
TW200739095A (en) Method for fabricating connecting jig, and connecting jig
Teng et al. Via-in-pad plated over (VIPPO) design considerations for the mitigation of a unique solder separation failure mode
CN102548220A (zh) 电路板的制作方法
CN201051111Y (zh) 刺穿式探针
JP2008026319A (ja) 非接触シングルサイドプローブ構造
JP2006332612A5 (enExample)