JP2008172997A5 - - Google Patents

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Publication number
JP2008172997A5
JP2008172997A5 JP2007313290A JP2007313290A JP2008172997A5 JP 2008172997 A5 JP2008172997 A5 JP 2008172997A5 JP 2007313290 A JP2007313290 A JP 2007313290A JP 2007313290 A JP2007313290 A JP 2007313290A JP 2008172997 A5 JP2008172997 A5 JP 2008172997A5
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JP
Japan
Prior art keywords
circuit
electrically connected
secondary battery
potential
control circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007313290A
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English (en)
Japanese (ja)
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JP5361176B2 (ja
JP2008172997A (ja
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Priority to JP2007313290A priority Critical patent/JP5361176B2/ja
Priority claimed from JP2007313290A external-priority patent/JP5361176B2/ja
Publication of JP2008172997A publication Critical patent/JP2008172997A/ja
Publication of JP2008172997A5 publication Critical patent/JP2008172997A5/ja
Application granted granted Critical
Publication of JP5361176B2 publication Critical patent/JP5361176B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007313290A 2006-12-13 2007-12-04 半導体装置 Expired - Fee Related JP5361176B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007313290A JP5361176B2 (ja) 2006-12-13 2007-12-04 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006335643 2006-12-13
JP2006335643 2006-12-13
JP2007313290A JP5361176B2 (ja) 2006-12-13 2007-12-04 半導体装置

Publications (3)

Publication Number Publication Date
JP2008172997A JP2008172997A (ja) 2008-07-24
JP2008172997A5 true JP2008172997A5 (enExample) 2011-01-13
JP5361176B2 JP5361176B2 (ja) 2013-12-04

Family

ID=39526403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007313290A Expired - Fee Related JP5361176B2 (ja) 2006-12-13 2007-12-04 半導体装置

Country Status (2)

Country Link
US (2) US7974111B2 (enExample)
JP (1) JP5361176B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010267368A (ja) * 2009-04-17 2010-11-25 Semiconductor Energy Lab Co Ltd 半導体記憶装置
CN105765840B (zh) * 2013-11-26 2018-06-15 三菱电机株式会社 直流电源装置和具有该直流电源装置的制冷循环应用设备

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06334119A (ja) 1993-02-17 1994-12-02 Seiko Instr Inc 昇圧用半導体集積回路及びその半導体集積回路を用いた電子機器
JP2708374B2 (ja) * 1994-07-26 1998-02-04 インターナショナル・ビジネス・マシーンズ・コーポレイション コンピュータ用バッテリ接続装置及びバッテリの切換方法
JPH09219932A (ja) * 1996-02-13 1997-08-19 Alps Electric Co Ltd ワイヤレス機器の充電装置
JP3394133B2 (ja) * 1996-06-12 2003-04-07 沖電気工業株式会社 昇圧回路
JP3109595B2 (ja) * 1998-08-28 2000-11-20 日本電気株式会社 受信ダイバーシティ制御方法およびダイバーシティ受信機
JP3614747B2 (ja) * 2000-03-07 2005-01-26 Necエレクトロニクス株式会社 昇圧回路、それを搭載したicカード及びそれを搭載した電子機器
JP3830414B2 (ja) 2002-04-02 2006-10-04 ローム株式会社 昇圧回路を備えた半導体装置
US6888399B2 (en) * 2002-02-08 2005-05-03 Rohm Co., Ltd. Semiconductor device equipped with a voltage step-up circuit
US7494066B2 (en) * 2003-12-19 2009-02-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
SG143030A1 (en) * 2004-01-30 2008-06-27 Agency Science Tech & Res Radio frequency identification and communication device
US7256642B2 (en) * 2004-03-19 2007-08-14 Semiconductor Energy Laboratory Co., Ltd. Booster circuit, semiconductor device, and electronic apparatus
JP3972916B2 (ja) * 2004-04-08 2007-09-05 セイコーエプソン株式会社 昇圧回路及び半導体集積回路
JP4519713B2 (ja) 2004-06-17 2010-08-04 株式会社東芝 整流回路とこれを用いた無線通信装置
JP2006049341A (ja) * 2004-07-30 2006-02-16 Renesas Technology Corp 半導体装置およびその製造方法
US7804203B2 (en) * 2004-09-09 2010-09-28 Semiconductor Energy Laboratory Co., Ltd. Wireless chip
JP2006109429A (ja) * 2004-09-09 2006-04-20 Semiconductor Energy Lab Co Ltd 無線チップ
JP4942998B2 (ja) * 2004-12-24 2012-05-30 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
CN101088158B (zh) 2004-12-24 2010-06-23 株式会社半导体能源研究所 半导体装置
JP4873868B2 (ja) * 2005-02-09 2012-02-08 ルネサスエレクトロニクス株式会社 パッシブ型rfid用の半導体装置、icタグ、icタグの制御方法及び通信方法
US20060267769A1 (en) * 2005-05-30 2006-11-30 Semiconductor Energy Laboratory Co., Ltd. Terminal device and communication system
CN101385039B (zh) * 2006-03-15 2012-03-21 株式会社半导体能源研究所 半导体器件
EP1895450B1 (en) 2006-08-31 2014-03-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and power receiving device
JP5179849B2 (ja) * 2006-12-28 2013-04-10 株式会社半導体エネルギー研究所 半導体装置

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