JP2008170941A - 基板検査装置及び方法 - Google Patents
基板検査装置及び方法 Download PDFInfo
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- JP2008170941A JP2008170941A JP2007238310A JP2007238310A JP2008170941A JP 2008170941 A JP2008170941 A JP 2008170941A JP 2007238310 A JP2007238310 A JP 2007238310A JP 2007238310 A JP2007238310 A JP 2007238310A JP 2008170941 A JP2008170941 A JP 2008170941A
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Abstract
【解決手段】このために本発明は、電源電圧線を通じて供給される電源電圧と電源電圧感知線を通じて感知される降下電源電圧とを比べて、その差分値を出力する比較器、及びデータ電圧を比較器から出力される差分値だけ補償して有機電界発光表示パネルに供給するレベルシフター回路を含む基板検査装置及び方法を開示する。
【選択図】図6
Description
1)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
2)アノード/正孔バッファ層/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
3)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/電子バッファ層/カソード
4)アノード/正孔バッファ層/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/電子バッファ層/カソード
5)アノード/正孔注入層/正孔バッファ層/正孔輸送層/発光層/電子輸送層/電子注入層/カソード
6)アノード/正孔注入層/正孔輸送層/発光層/電子輸送層/電子バッファ層/電子注入層/カソード
1)アノード/正孔注入輸送層/発光層/電子輸送層/電子注入層/カソード
2)アノード/正孔バッファ層/正孔注入輸送層/発光層/電子輸送層/電子注入層/カソード
3)アノード/正孔注入層/正孔輸送層/発光層/電子注入輸送層/電子バッファ層/カソード
4)アノード/正孔バッファ層/正孔輸送層/発光層/電子注入輸送層/電子バッファ層/カソード
5)アノード/正孔注入輸送層/正孔バッファ層/発光層/電子輸送層/電子注入層/カソード
6)アノード/正孔注入層/正孔輸送層/発光層/電子バッファ層/電子注入輸送層/カソード
1)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
2)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/正孔バッファ層/アノード
3)カソード/電子バッファ層/電子注入層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
4)カソード/電子バッファ層/電子注入層/電子輸送層/発光層/正孔輸送層/正孔バッファ層/アノード
5)カソード/電子注入層/電子輸送層/発光層/正孔輸送層/正孔バッファ層/正孔注入層/アノード
6)カソード/電子注入層/電子バッファ層/電子輸送層/発光層/正孔輸送層/正孔注入層/アノード
1)カソード/電子注入層/電子輸送層/発光層/正孔注入輸送層/アノード
2)カソード/電子注入層/電子輸送層/発光層/正孔注入輸送層/正孔バッファ層/アノード
3)カソード/電子バッファ層/電子注入輸送層/発光層/正孔輸送層/正孔注入層/アノード
4)カソード/電子バッファ層/電子注入輸送層/発光層/正孔輸送層/正孔バッファ層/アノード
5)カソード/電子注入層/電子輸送層/発光層/正孔バッファ層/正孔注入輸送層/アノード
6)カソード/電子注入輸送層/電子バッファ層/発光層/正孔輸送層/正孔注入層/アノード
440 有機電界発光表示パネル
500 感知補償部
510 比較器
520 レベルシフター
530 初期化レベルシフター
600 基板検査装置
710 電源電圧補償段階
720 降下電源電圧補償段階
730 電源電圧と降下電圧との比較出力段階
740 電圧補償段階
750 補償された電源電圧をパネルに印加する段階
Claims (24)
- 電源電圧線を通じて供給される電源電圧と電源電圧感知線を通じて感知される降下電源電圧とを比べて、その差分値を出力する比較器、及び
データ電圧を前記比較器から出力される差分値だけ補償して有機電界発光表示パネルに供給するレベルシフター回路を含めてなることを特徴とする基板検査装置。 - 初期化電圧を前記比較器から出力される差分値だけ補償して有機電界発光表示パネルに供給する初期化レベルシフター回路を含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記初期化電圧は、有機電界発光表示パネルの画素回路に伝達される初期化電圧であることを特徴とする請求項2に記載の基板検査装置。
- 前記データ電圧は、有機電界発光表示パネルの画素回路に伝達されるデータ電圧であることを特徴とする請求項1に記載の基板検査装置。
- 前記有機電界発光表示パネルは、電源電圧、初期化電圧及びデータ電圧に電気的に繋がれることを特徴とする請求項2に記載の基板検査装置。
- 前記有機電界発光表示パネルの電源電圧線に電源電圧感知線が電気的に繋がれることを特徴とする請求項5に記載の基板検査装置。
- 前記有機電界発光表示パネルは、基板にマトリクス状に形成されることを特徴とする請求項1に記載の基板検査装置。
- 前記比較器、レベルシフター及び初期化レベルシフター回路は、前記基板に集積されて形成されることを特徴とする請求項7に記載の基板検査装置。
- 前記データ電圧は、赤色データ電圧、緑色データ電圧及び青色データ電圧であることを特徴とする請求項4に記載の基板検査装置。
- 前記比較器をスイッチングする比較器スイッチを含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記レベルシフター回路をスイッチングする電圧スイッチを含めてなることを特徴とする請求項1に記載の基板検査装置。
- 前記初期化レベルシフター回路をスイッチングする初期化スイッチを含めてなることを特徴とする請求項2に記載の基板検査装置。
- 前記比較器から出力される電圧値を固定する電圧差固定器を含めてなることを特徴とする請求項1に記載の基板検査装置。
- 電源電圧線を通じて供給される基板の電源電圧を感知する段階と、
電源電圧感知線を通じて感知される基板の降下電源電圧を感知する段階と、
前記電源電圧と前記降下電源電圧とを比べて出力する段階と、
前記出力された電圧だけデータ電圧を補償する段階と、を含めてなることを特徴とする基板検査方法。 - 前記電源電圧と前記降下電源電圧とを比べて出力する段階は、前記電源電圧と前記降下電源電圧とを比べてその電圧差を出力する段階であることを特徴とする請求項14に記載の基板検査方法。
- 前記電源電圧と前記降下電源電圧とを比べて出力する段階以後に、前記出力された電圧だけ初期化電圧を補償する段階を含めてなることを特徴とする請求項14に記載の基板検査方法。
- 前記データ電圧を補償する段階は、赤色データ電圧、緑色データ電圧及び青色データ電圧をすべて補償する段階であることを特徴とする請求項14に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階は、レベルシフターにおいて前記電源電圧と前記降下電源電圧との差分値をダウンシフトさせた補償データ電圧を出力する段階であることを特徴とする請求項14に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階以後に、前記比較器をスイッチングする段階を含めてなることを特徴とする請求項14に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階以後に、前記レベルシフター回路をスイッチングする段階を含めてなることを特徴とする請求項14に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階以後に、前記初期化レベルシフターをスイッチングする段階を含めてなることを特徴とする請求項16に記載の基板検査方法。
- 前記出力された電圧だけ初期化電圧を補償する段階は、初期化レベルシフターにおいて前記電源電圧と前記降下電源電圧との差分値をダウンシフトさせた補償初期化電圧を出力する段階であることを特徴とする請求項16に記載の基板検査方法。
- 前記出力された電圧だけデータ電圧を補償する段階以後に、前記電源電圧と前記降下電源電圧とを比べてその差分値を固定して一定電圧を出力する段階を含めてなることを特徴とする請求項14に記載の基板検査方法。
- 出力された電圧だけデータ電圧を補償する段階以後に、前記補償データ電圧をパネルに供給する段階を含めてなることを特徴とする請求項14に記載の基板検査方法。
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CN101226712A (zh) | 2008-07-23 |
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