JP2008058281A5 - - Google Patents

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Publication number
JP2008058281A5
JP2008058281A5 JP2006239070A JP2006239070A JP2008058281A5 JP 2008058281 A5 JP2008058281 A5 JP 2008058281A5 JP 2006239070 A JP2006239070 A JP 2006239070A JP 2006239070 A JP2006239070 A JP 2006239070A JP 2008058281 A5 JP2008058281 A5 JP 2008058281A5
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JP
Japan
Prior art keywords
ion
ion trap
ions
mass spectrometry
spectrometry method
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JP2006239070A
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English (en)
Japanese (ja)
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JP4369454B2 (ja
JP2008058281A (ja
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Priority to JP2006239070A priority Critical patent/JP4369454B2/ja
Priority claimed from JP2006239070A external-priority patent/JP4369454B2/ja
Priority to US11/889,232 priority patent/US7989764B2/en
Publication of JP2008058281A publication Critical patent/JP2008058281A/ja
Publication of JP2008058281A5 publication Critical patent/JP2008058281A5/ja
Application granted granted Critical
Publication of JP4369454B2 publication Critical patent/JP4369454B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2006239070A 2006-09-04 2006-09-04 イオントラップ質量分析方法 Expired - Fee Related JP4369454B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006239070A JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法
US11/889,232 US7989764B2 (en) 2006-09-04 2007-08-10 Ion trap mass spectrometry method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006239070A JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009175006A Division JP5107977B2 (ja) 2009-07-28 2009-07-28 イオントラップ質量分析装置

Publications (3)

Publication Number Publication Date
JP2008058281A JP2008058281A (ja) 2008-03-13
JP2008058281A5 true JP2008058281A5 (cg-RX-API-DMAC10.html) 2008-07-17
JP4369454B2 JP4369454B2 (ja) 2009-11-18

Family

ID=39150189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006239070A Expired - Fee Related JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法

Country Status (2)

Country Link
US (1) US7989764B2 (cg-RX-API-DMAC10.html)
JP (1) JP4369454B2 (cg-RX-API-DMAC10.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
JP5405668B2 (ja) * 2010-07-27 2014-02-05 株式会社日立ハイテクノロジーズ イオントラップ質量分析装置および質量分析方法
JP5812881B2 (ja) * 2012-01-23 2015-11-17 株式会社日立ハイテクノロジーズ タンデム型質量分析装置及びその質量分析方法
US9218948B2 (en) * 2012-03-22 2015-12-22 Shimadzu Corporation Mass spectrometer
US8669520B2 (en) * 2012-07-26 2014-03-11 Hamilton Sundstrand Corporation Waveform generation for ion trap
WO2017126006A1 (ja) * 2016-01-18 2017-07-27 株式会社島津製作所 イオントラップ質量分析装置及び該装置を用いた質量分析方法
RU2650497C2 (ru) * 2016-08-15 2018-04-16 Федеральное государственное бюджетное образовательное учреждение высшего образования "Рязанский государственный радиотехнический университет" Способ масс-спектрометрического анализа ионов в трехмерной ионной ловушке и устройство для его осуществления
WO2020075068A1 (en) * 2018-10-09 2020-04-16 Dh Technologies Development Pte. Ltd. Electron beam throttling for electron capture dissociation

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0409362B1 (en) * 1985-05-24 1995-04-19 Finnigan Corporation Method of operating an ion trap
US5436445A (en) * 1991-02-28 1995-07-25 Teledyne Electronic Technologies Mass spectrometry method with two applied trapping fields having same spatial form
US5381007A (en) 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5479012A (en) 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
US5572022A (en) 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
JPH095298A (ja) 1995-06-06 1997-01-10 Varian Assoc Inc 四重極イオントラップ内の選択イオン種を検出する方法
JP3413079B2 (ja) * 1997-10-09 2003-06-03 株式会社日立製作所 イオントラップ型質量分析装置
JP2001160373A (ja) * 1999-12-02 2001-06-12 Hitachi Ltd イオントラップ質量分析方法並びにイオントラップ質量分析計
JP3756365B2 (ja) 1999-12-02 2006-03-15 株式会社日立製作所 イオントラップ質量分析方法
JP2002313276A (ja) * 2001-04-17 2002-10-25 Hitachi Ltd イオントラップ型質量分析装置及び方法
US6608303B2 (en) * 2001-06-06 2003-08-19 Thermo Finnigan Llc Quadrupole ion trap with electronic shims
WO2003019614A2 (en) 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer
EP1463090B1 (en) * 2001-11-07 2012-02-15 Hitachi High-Technologies Corporation Mass spectrometry and ion trap mass spectrometer
AU2002350343A1 (en) * 2001-12-21 2003-07-15 Mds Inc., Doing Business As Mds Sciex Use of notched broadband waveforms in a linear ion trap
US6710336B2 (en) * 2002-01-30 2004-03-23 Varian, Inc. Ion trap mass spectrometer using pre-calculated waveforms for ion isolation and collision induced dissociation
JP3653504B2 (ja) * 2002-02-12 2005-05-25 株式会社日立ハイテクノロジーズ イオントラップ型質量分析装置
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置
US7019289B2 (en) * 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
JP4332482B2 (ja) 2004-09-21 2009-09-16 株式会社日立ハイテクノロジーズ イオントラップ質量分析方法および装置
DE102005061425B4 (de) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern
US7378653B2 (en) * 2006-01-10 2008-05-27 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
US7351965B2 (en) * 2006-01-30 2008-04-01 Varian, Inc. Rotating excitation field in linear ion processing apparatus

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