JP2007507836A5 - - Google Patents

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Publication number
JP2007507836A5
JP2007507836A5 JP2006529510A JP2006529510A JP2007507836A5 JP 2007507836 A5 JP2007507836 A5 JP 2007507836A5 JP 2006529510 A JP2006529510 A JP 2006529510A JP 2006529510 A JP2006529510 A JP 2006529510A JP 2007507836 A5 JP2007507836 A5 JP 2007507836A5
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JP
Japan
Prior art keywords
electrode
substrate
subset
extension
connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006529510A
Other languages
English (en)
Japanese (ja)
Other versions
JP4943152B2 (ja
JP2007507836A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/CA2004/001716 external-priority patent/WO2005034584A1/en
Publication of JP2007507836A publication Critical patent/JP2007507836A/ja
Publication of JP2007507836A5 publication Critical patent/JP2007507836A5/ja
Application granted granted Critical
Publication of JP4943152B2 publication Critical patent/JP4943152B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2006529510A 2003-10-03 2004-09-21 エレクトロルミネセント・ディスプレイをテストする装置 Expired - Fee Related JP4943152B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US50860203P 2003-10-03 2003-10-03
US60/508,602 2003-10-03
PCT/CA2004/001716 WO2005034584A1 (en) 2003-10-03 2004-09-21 Electrode arrangement for testing electroluminescent display

Publications (3)

Publication Number Publication Date
JP2007507836A JP2007507836A (ja) 2007-03-29
JP2007507836A5 true JP2007507836A5 (https=) 2007-11-08
JP4943152B2 JP4943152B2 (ja) 2012-05-30

Family

ID=34421763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006529510A Expired - Fee Related JP4943152B2 (ja) 2003-10-03 2004-09-21 エレクトロルミネセント・ディスプレイをテストする装置

Country Status (7)

Country Link
US (1) US7497755B2 (https=)
JP (1) JP4943152B2 (https=)
KR (1) KR20070015110A (https=)
CN (1) CN1891015A (https=)
CA (1) CA2539589A1 (https=)
TW (1) TW200518622A (https=)
WO (1) WO2005034584A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541349A (ja) * 2005-05-04 2008-11-20 オーテーベー、グループ、ベスローテン、フェンノートシャップ Ｏｌｅｄを製造するための方法、ｏｌｅｄを製造するための中間生成物、およびｏｌｅｄ
EP2578733A4 (en) 2010-06-04 2014-05-14 Showa Glove Co KNITTED NAIL GUIDING ELEMENT, KNITTED NEEDLE, KNITTING METHOD, KNITTED SWEATER AND GLOVES
WO2014162454A1 (ja) * 2013-04-01 2014-10-09 パイオニア株式会社 接合構造および発光装置
CN105355633B (zh) * 2015-10-26 2018-08-03 京东方科技集团股份有限公司 制作阵列基板的方法和阵列基板
WO2020039554A1 (ja) * 2018-08-23 2020-02-27 シャープ株式会社 アクティブマトリクス基板、表示装置及び母基板
CN208805652U (zh) * 2018-10-30 2019-04-30 惠科股份有限公司 一种引脚组件及显示面板
JP7801972B2 (ja) * 2022-08-31 2026-01-19 株式会社ジャパンディスプレイ Ｌｅｄ実装基板及びその製造方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3028442A (en) * 1959-10-01 1962-04-03 Owens Corning Fiberglass Corp Method and apparatus for melting and feeding heat-softenable materials
JPH0685341B2 (ja) * 1991-09-27 1994-10-26 帝国通信工業株式会社 フレキシブル基板の端子構造
US5432015A (en) * 1992-05-08 1995-07-11 Westaim Technologies, Inc. Electroluminescent laminate with thick film dielectric
JP3213472B2 (ja) * 1994-04-26 2001-10-02 シャープ株式会社 アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置
JP3031527B2 (ja) * 1995-06-19 2000-04-10 カシオ計算機株式会社 液晶表示装置
KR0182184B1 (en) 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
US6111424A (en) * 1997-09-04 2000-08-29 Lucent Technologies Inc. Testing method and apparatus for flat panel displays using infrared imaging
US6407502B2 (en) * 1997-09-16 2002-06-18 Lite Array, Inc. EL display with electrodes normal to the surface
JP4128677B2 (ja) * 1998-11-24 2008-07-30 東芝松下ディスプレイテクノロジー株式会社 液晶表示装置の検査方法
JP2000200053A (ja) * 1999-01-07 2000-07-18 Futaba Corp 表示素子用基板の製造方法及び表示素子用基板
US6771019B1 (en) 1999-05-14 2004-08-03 Ifire Technology, Inc. Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties
TW589455B (en) * 2000-11-24 2004-06-01 Hannstar Display Corp Testing method for LCD panel
KR100353955B1 (ko) * 2000-12-20 2002-09-28 엘지.필립스 엘시디 주식회사 신호라인 검사를 위한 액정표시장치
KR100800330B1 (ko) * 2001-12-20 2008-02-01 엘지.필립스 엘시디 주식회사 라인 온 글래스형 신호라인 검사를 위한 액정표시패널
EP1459601B1 (en) 2001-12-21 2009-04-08 iFire IP Corporation Low firing temperature thick film dielectric layer for electroluminescent display
WO2003055636A1 (en) 2001-12-21 2003-07-10 Ifire Technology Inc. Method of laser ablation for patterning thin film layers for electroluminescent displays
JP2006505764A (ja) * 2002-01-23 2006-02-16 マレナ システムズ コーポレーション 欠陥検出及び解析用赤外線サーモグラフィ
KR100777724B1 (ko) * 2002-02-07 2007-11-19 삼성에스디아이 주식회사 유기전자 발광소자와, 이의 기판 및 그 절단방법
EP1554756B1 (en) * 2002-09-20 2016-07-20 Koninklijke Philips N.V. A method for manufacturing an electrical device

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