TW200518622A - Apparatus for testing electroluminescent display - Google Patents

Apparatus for testing electroluminescent display

Info

Publication number
TW200518622A
TW200518622A TW093129845A TW93129845A TW200518622A TW 200518622 A TW200518622 A TW 200518622A TW 093129845 A TW093129845 A TW 093129845A TW 93129845 A TW93129845 A TW 93129845A TW 200518622 A TW200518622 A TW 200518622A
Authority
TW
Taiwan
Prior art keywords
subset
electrode extensions
electrode
connector
extensions
Prior art date
Application number
TW093129845A
Other languages
English (en)
Chinese (zh)
Inventor
Hisashi Abe
Derek Luke
Original Assignee
Ifire Technology Corp
Sanyo Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ifire Technology Corp, Sanyo Electric Co filed Critical Ifire Technology Corp
Publication of TW200518622A publication Critical patent/TW200518622A/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/179—Interconnections, e.g. wiring lines or terminals
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW093129845A 2003-10-03 2004-10-01 Apparatus for testing electroluminescent display TW200518622A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US50860203P 2003-10-03 2003-10-03

Publications (1)

Publication Number Publication Date
TW200518622A true TW200518622A (en) 2005-06-01

Family

ID=34421763

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093129845A TW200518622A (en) 2003-10-03 2004-10-01 Apparatus for testing electroluminescent display

Country Status (7)

Country Link
US (1) US7497755B2 (https=)
JP (1) JP4943152B2 (https=)
KR (1) KR20070015110A (https=)
CN (1) CN1891015A (https=)
CA (1) CA2539589A1 (https=)
TW (1) TW200518622A (https=)
WO (1) WO2005034584A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541349A (ja) * 2005-05-04 2008-11-20 オーテーベー、グループ、ベスローテン、フェンノートシャップ Ｏｌｅｄを製造するための方法、ｏｌｅｄを製造するための中間生成物、およびｏｌｅｄ
EP2578733A4 (en) 2010-06-04 2014-05-14 Showa Glove Co KNITTED NAIL GUIDING ELEMENT, KNITTED NEEDLE, KNITTING METHOD, KNITTED SWEATER AND GLOVES
WO2014162454A1 (ja) * 2013-04-01 2014-10-09 パイオニア株式会社 接合構造および発光装置
CN105355633B (zh) * 2015-10-26 2018-08-03 京东方科技集团股份有限公司 制作阵列基板的方法和阵列基板
WO2020039554A1 (ja) * 2018-08-23 2020-02-27 シャープ株式会社 アクティブマトリクス基板、表示装置及び母基板
CN208805652U (zh) * 2018-10-30 2019-04-30 惠科股份有限公司 一种引脚组件及显示面板
JP7801972B2 (ja) * 2022-08-31 2026-01-19 株式会社ジャパンディスプレイ Ｌｅｄ実装基板及びその製造方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3028442A (en) * 1959-10-01 1962-04-03 Owens Corning Fiberglass Corp Method and apparatus for melting and feeding heat-softenable materials
JPH0685341B2 (ja) * 1991-09-27 1994-10-26 帝国通信工業株式会社 フレキシブル基板の端子構造
US5432015A (en) * 1992-05-08 1995-07-11 Westaim Technologies, Inc. Electroluminescent laminate with thick film dielectric
JP3213472B2 (ja) * 1994-04-26 2001-10-02 シャープ株式会社 アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置
JP3031527B2 (ja) * 1995-06-19 2000-04-10 カシオ計算機株式会社 液晶表示装置
KR0182184B1 (en) 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
US6111424A (en) * 1997-09-04 2000-08-29 Lucent Technologies Inc. Testing method and apparatus for flat panel displays using infrared imaging
US6407502B2 (en) * 1997-09-16 2002-06-18 Lite Array, Inc. EL display with electrodes normal to the surface
JP4128677B2 (ja) * 1998-11-24 2008-07-30 東芝松下ディスプレイテクノロジー株式会社 液晶表示装置の検査方法
JP2000200053A (ja) * 1999-01-07 2000-07-18 Futaba Corp 表示素子用基板の製造方法及び表示素子用基板
US6771019B1 (en) 1999-05-14 2004-08-03 Ifire Technology, Inc. Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties
TW589455B (en) * 2000-11-24 2004-06-01 Hannstar Display Corp Testing method for LCD panel
KR100353955B1 (ko) * 2000-12-20 2002-09-28 엘지.필립스 엘시디 주식회사 신호라인 검사를 위한 액정표시장치
KR100800330B1 (ko) * 2001-12-20 2008-02-01 엘지.필립스 엘시디 주식회사 라인 온 글래스형 신호라인 검사를 위한 액정표시패널
EP1459601B1 (en) 2001-12-21 2009-04-08 iFire IP Corporation Low firing temperature thick film dielectric layer for electroluminescent display
WO2003055636A1 (en) 2001-12-21 2003-07-10 Ifire Technology Inc. Method of laser ablation for patterning thin film layers for electroluminescent displays
JP2006505764A (ja) * 2002-01-23 2006-02-16 マレナ システムズ コーポレーション 欠陥検出及び解析用赤外線サーモグラフィ
KR100777724B1 (ko) * 2002-02-07 2007-11-19 삼성에스디아이 주식회사 유기전자 발광소자와, 이의 기판 및 그 절단방법
EP1554756B1 (en) * 2002-09-20 2016-07-20 Koninklijke Philips N.V. A method for manufacturing an electrical device

Also Published As

Publication number Publication date
WO2005034584B1 (en) 2005-06-02
CA2539589A1 (en) 2005-04-14
WO2005034584A1 (en) 2005-04-14
CN1891015A (zh) 2007-01-03
JP4943152B2 (ja) 2012-05-30
WO2005034584A9 (en) 2005-10-27
US7497755B2 (en) 2009-03-03
JP2007507836A (ja) 2007-03-29
US20050073250A1 (en) 2005-04-07
KR20070015110A (ko) 2007-02-01

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