JP2006520022A5 - - Google Patents

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Publication number
JP2006520022A5
JP2006520022A5 JP2006509233A JP2006509233A JP2006520022A5 JP 2006520022 A5 JP2006520022 A5 JP 2006520022A5 JP 2006509233 A JP2006509233 A JP 2006509233A JP 2006509233 A JP2006509233 A JP 2006509233A JP 2006520022 A5 JP2006520022 A5 JP 2006520022A5
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JP
Japan
Prior art keywords
sample region
probe
view
specimen
image data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006509233A
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English (en)
Japanese (ja)
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JP2006520022A (ja
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Publication date
Priority claimed from US10/795,205 external-priority patent/US7009172B2/en
Application filed filed Critical
Publication of JP2006520022A publication Critical patent/JP2006520022A/ja
Publication of JP2006520022A5 publication Critical patent/JP2006520022A5/ja
Pending legal-status Critical Current

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JP2006509233A 2003-03-06 2004-03-05 連続的な非ラスタパターンを使用して撮像する方法および装置 Pending JP2006520022A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US45269403P 2003-03-06 2003-03-06
US10/795,205 US7009172B2 (en) 2003-03-06 2004-03-04 Method and apparatus for imaging using continuous non-raster patterns
PCT/US2004/006973 WO2004079405A2 (en) 2003-03-06 2004-03-05 Method and apparatus for imaging using contunuous non-raster patterns

Publications (2)

Publication Number Publication Date
JP2006520022A JP2006520022A (ja) 2006-08-31
JP2006520022A5 true JP2006520022A5 (enExample) 2007-04-12

Family

ID=33313322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006509233A Pending JP2006520022A (ja) 2003-03-06 2004-03-05 連続的な非ラスタパターンを使用して撮像する方法および装置

Country Status (4)

Country Link
US (1) US7009172B2 (enExample)
EP (1) EP1604190A4 (enExample)
JP (1) JP2006520022A (enExample)
WO (1) WO2004079405A2 (enExample)

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US8031926B2 (en) * 2004-05-20 2011-10-04 Board Of Regents Of The Nevada System Of Higher Education, On Behalf Of The University Of Nevada, Reno Discrete event distribution sampling apparatus and methods
US7960702B2 (en) * 2004-05-20 2011-06-14 Board of Regents of the Nevada System fo Higher Education, on behalf of the University of Nevada, Reno Photon event distribution sampling apparatus and method
JP4765667B2 (ja) * 2006-02-27 2011-09-07 ブラザー工業株式会社 画像処理プログラムおよび画像処理装置
US7406860B2 (en) 2006-04-28 2008-08-05 Seagate Technology Llc Atomic force microscopy scanning and image processing
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US20100195868A1 (en) * 2007-05-31 2010-08-05 Lu Peter J Target-locking acquisition with real-time confocal (tarc) microscopy
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US9075225B2 (en) 2009-10-28 2015-07-07 Alentic Microscience Inc. Microscopy imaging
US20140152801A1 (en) 2009-10-28 2014-06-05 Alentic Microscience Inc. Detecting and Using Light Representative of a Sample
WO2011053631A1 (en) 2009-10-28 2011-05-05 Alentic Microscience Inc. Microscopy imaging
JP5737704B2 (ja) * 2010-09-27 2015-06-17 株式会社ライフテック 蛍光一粒子検出方法および検出システム
ES2778753T3 (es) 2010-10-13 2020-08-11 Mbda Uk Ltd Método y aparato de colocación de pieza de trabajo
US9586817B2 (en) 2011-07-28 2017-03-07 Seagate Technology Llc Semi-auto scanning probe microscopy scanning
US20130081159A1 (en) * 2011-07-29 2013-03-28 Seagate Technology Llc Advanced atomic force microscopy scanning for obtaining a true shape
JP2013058956A (ja) * 2011-09-09 2013-03-28 Sony Corp 情報処理装置、情報処理方法、プログラム及び情報処理システム
JP6422864B2 (ja) * 2012-07-18 2018-11-14 ザ、トラスティーズ オブ プリンストン ユニバーシティ マルチスケールスペクトルナノスコピー
US9518920B2 (en) 2013-06-26 2016-12-13 Alentic Microscience Inc. Sample processing improvements for microscopy
US10502666B2 (en) 2013-02-06 2019-12-10 Alentic Microscience Inc. Sample processing improvements for quantitative microscopy
US9784960B2 (en) * 2014-06-10 2017-10-10 Purdue Research Foundation High frame-rate multichannel beam-scanning microscopy
US10437038B2 (en) 2015-02-20 2019-10-08 Max-Planck-Geselleschaft Zur Foerderung Der Wissenschaften E.V. Device and method for creating an optical tomogram of a microscopic sample
US10564180B2 (en) * 2015-04-14 2020-02-18 Shimadzu Corporation Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample
EP3125272A1 (en) * 2015-07-29 2017-02-01 FEI Company Scan pattern in a charged particle microscope comprising nested orbital windings
DE102016211126A1 (de) * 2016-06-22 2017-12-28 Osram Opto Semiconductors Gmbh Messeinrichtung für flächige Proben und Verfahren zum Messen
JP6423841B2 (ja) * 2016-10-11 2018-11-14 浜松ホトニクス株式会社 試料観察装置及び試料観察方法
US11189027B2 (en) * 2017-05-15 2021-11-30 Sigtuple Technologies Private Limited Method and system for determining area to be scanned in peripheral blood smear for analysis
US10979681B2 (en) * 2018-09-13 2021-04-13 Varjo Technologies Oy Display apparatus and method of displaying using light source and beam scanning arrangement
DE102018216038A1 (de) * 2018-09-20 2020-03-26 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Erfassung eines Bildes eines Objekts mit einem Scanmikroskop
CN110275294A (zh) * 2019-06-27 2019-09-24 长春理工大学 阿基米德双螺线型排列方式的龙虾眼透镜
CN115335747A (zh) 2020-02-12 2022-11-11 萨曼萃医疗公司 用于以减少的样本运动伪影对样本进行成像的系统和方法
GB2598780B (en) * 2020-09-14 2022-10-12 Thermo Fisher Scient Ecublens Sarl Systems and methods for performing laser-induced breakdown spectroscopy
GB2598779B (en) * 2020-09-14 2023-05-24 Thermo Fisher Scient Ecublens Sarl Kinematics path method for laser-induced breakdown spectroscopy
EP4435490A1 (de) * 2023-03-22 2024-09-25 Abberior Instruments GmbH Verfahren, minflux-mikroskop und computerprogramm für die lokalisierung oder für das verfolgen von emittern
DE102023115483A1 (de) 2023-06-14 2024-12-19 Abberior Instruments Gmbh Verfahren, lichtmikroskop und computerprogramm zur lokalisierung oder zum verfolgen eines emitters

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US5865978A (en) * 1997-05-09 1999-02-02 Cohen; Adam E. Near-field photolithographic masks and photolithography; nanoscale patterning techniques; apparatus and method therefor
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