JP2006518112A - 電子部品及びその製造方法 - Google Patents
電子部品及びその製造方法 Download PDFInfo
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- JP2006518112A JP2006518112A JP2006503298A JP2006503298A JP2006518112A JP 2006518112 A JP2006518112 A JP 2006518112A JP 2006503298 A JP2006503298 A JP 2006503298A JP 2006503298 A JP2006503298 A JP 2006503298A JP 2006518112 A JP2006518112 A JP 2006518112A
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- 238000004519 manufacturing process Methods 0.000 title claims description 5
- 230000005855 radiation Effects 0.000 claims abstract description 36
- 239000000463 material Substances 0.000 claims description 27
- 150000001875 compounds Chemical class 0.000 claims description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 230000005294 ferromagnetic effect Effects 0.000 claims 2
- 239000010410 layer Substances 0.000 description 28
- 238000000034 method Methods 0.000 description 17
- 230000000694 effects Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- UGKDIUIOSMUOAW-UHFFFAOYSA-N iron nickel Chemical compound [Fe].[Ni] UGKDIUIOSMUOAW-UHFFFAOYSA-N 0.000 description 4
- 239000007769 metal material Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000005291 magnetic effect Effects 0.000 description 3
- 230000015654 memory Effects 0.000 description 3
- KGWWEXORQXHJJQ-UHFFFAOYSA-N [Fe].[Co].[Ni] Chemical compound [Fe].[Co].[Ni] KGWWEXORQXHJJQ-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- WABPQHHGFIMREM-AKLPVKDBSA-N lead-210 Chemical compound [210Pb] WABPQHHGFIMREM-AKLPVKDBSA-N 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- QVYYOKWPCQYKEY-UHFFFAOYSA-N [Fe].[Co] Chemical compound [Fe].[Co] QVYYOKWPCQYKEY-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/60—Protection against electrostatic charges or discharges, e.g. Faraday shields
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- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
- H01L23/49506—Lead-frames or other flat leads characterised by the die pad an insulative substrate being used as a diepad, e.g. ceramic, plastic
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- H01L23/00—Details of semiconductor or other solid state devices
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
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- H01L2224/05554—Shape in top view being square
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
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- H01L2224/05599—Material
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
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- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
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- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
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- H01L2924/3025—Electromagnetic shielding
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- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
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- Ceramic Engineering (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
説明を簡単に、かつ明瞭にするために、描写図は構成の概要を示しており、そして公知の特徴及び技術についての記述及び詳細は本発明を不必要に不明瞭にしないために省略する。また、描写図に示される構成要素は必ずしも寸法通りになっていない。例えば、図に示される構成要素の幾つかの寸法は他の構成要素に対して誇張して描いて本発明の実施形態を理解し易くなるようにしている。異なる図における同じ参照番号は同じ構成要素を指す。
Claims (3)
- 電子チップと、
側壁及び底部を有するチップキャリア部とを備え、
電子チップはチップキャリア部の底部の上に搭載され、
チップキャリア部は電子チップを電子部品の外部の放射線から遮蔽する、電子部品。 - 電子チップと、
電子チップ上に位置する強磁性放射線遮蔽層と、
底部及び側壁を有するチップキャリア部を含むリードフレームとを備え、
前記側壁及び底部は単一構造体を形成し、
前記側壁及び底部は、各々、
銅からなる第1層と、
強磁性放射線遮蔽層により構成される第2層とを備え、
電子チップはチップキャリア部の上に搭載される、電子部品。 - 電子部品を製造する方法であって、
側壁及び放射線遮蔽材を有するチップキャリア部を設ける工程と、
電子チップの上面に隣接した放射線遮蔽層を有する電子チップを設ける工程と、
電子チップをチップキャリア部の上に、電子チップの上面がチップキャリア部から離反して向くように搭載する工程と、
モールドコンパウンドを電子チップ及びチップキャリア部の周囲に形成する工程とを備える方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/367,344 US6967390B2 (en) | 2003-02-13 | 2003-02-13 | Electronic component and method of manufacturing same |
PCT/US2004/003100 WO2004075254A2 (en) | 2003-02-13 | 2004-02-04 | Electronic component and method of manufacturing same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006518112A true JP2006518112A (ja) | 2006-08-03 |
JP2006518112A5 JP2006518112A5 (ja) | 2007-03-22 |
JP4620656B2 JP4620656B2 (ja) | 2011-01-26 |
Family
ID=32849965
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006503298A Expired - Lifetime JP4620656B2 (ja) | 2003-02-13 | 2004-02-04 | 電子部品及びその製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6967390B2 (ja) |
JP (1) | JP4620656B2 (ja) |
KR (1) | KR101064531B1 (ja) |
CN (1) | CN1781189B (ja) |
TW (1) | TWI351081B (ja) |
WO (1) | WO2004075254A2 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006202791A (ja) * | 2005-01-18 | 2006-08-03 | Hitachi Medical Corp | Icパッケージ及びそれを用いたx線ct装置 |
JP2013141047A (ja) * | 2013-04-24 | 2013-07-18 | Dainippon Printing Co Ltd | 半導体装置、半導体装置の製造方法、およびシールド板 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7353460B2 (en) * | 2002-08-06 | 2008-04-01 | Robert Tu Consulting Inc. | Web site navigation under a hierarchical menu structure |
US7329620B1 (en) * | 2004-10-08 | 2008-02-12 | National Semiconductor Corporation | System and method for providing an integrated circuit having increased radiation hardness and reliability |
TWI339432B (en) * | 2007-08-13 | 2011-03-21 | Ind Tech Res Inst | Magnetic shielding package structure of a magnetic memory device |
DE102010039063B4 (de) | 2010-08-09 | 2024-01-18 | Robert Bosch Gmbh | Sensormodul mit einem elektromagnetisch abgeschirmten elektrischen Bauteil und Verfahren zur Herstellung eines solchen Sensormoduls |
TWM409527U (en) * | 2011-02-23 | 2011-08-11 | Azurewave Technologies Inc | Forming integrated circuit module |
US20150001696A1 (en) * | 2013-06-28 | 2015-01-01 | Infineon Technologies Ag | Semiconductor die carrier structure and method of manufacturing the same |
KR102354370B1 (ko) | 2015-04-29 | 2022-01-21 | 삼성전자주식회사 | 쉴딩 구조물을 포함하는 자기 저항 칩 패키지 |
JP2018056356A (ja) | 2016-09-29 | 2018-04-05 | 株式会社東芝 | 半導体装置 |
US20220230901A1 (en) * | 2021-01-21 | 2022-07-21 | Micron Technology, Inc. | Containers for protecting semiconductor devices and related methods |
Citations (3)
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JPH0661408A (ja) * | 1992-08-10 | 1994-03-04 | Rohm Co Ltd | 表面実装型半導体装置 |
JPH0714944A (ja) * | 1993-04-16 | 1995-01-17 | Northern Telecom Ltd | 集積回路パッケージおよびその組立構造 |
JPH11284117A (ja) * | 1998-03-27 | 1999-10-15 | Enomoto Co Ltd | 半導体装置の製造方法及び半導体リードフレーム |
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JPS5588356A (en) * | 1978-12-27 | 1980-07-04 | Hitachi Ltd | Semiconductor device |
US4888449A (en) * | 1988-01-04 | 1989-12-19 | Olin Corporation | Semiconductor package |
CA2080177C (en) * | 1992-01-02 | 1997-02-25 | Edward Allan Highum | Electro-magnetic shield and method for making the same |
US5844168A (en) * | 1995-08-01 | 1998-12-01 | Minnesota Mining And Manufacturing Company | Multi-layer interconnect sutructure for ball grid arrays |
US6008996A (en) * | 1997-04-07 | 1999-12-28 | Micron Technology, Inc. | Interdigitated leads-over-chip lead frame, device, and method for supporting an integrated circuit die |
JP3370636B2 (ja) * | 2000-03-03 | 2003-01-27 | 三井金属鉱業株式会社 | キャリア箔付金属箔及びその製造方法 |
JP4398056B2 (ja) * | 2000-04-04 | 2010-01-13 | Necトーキン株式会社 | 樹脂モールド体 |
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US6689661B2 (en) * | 2001-04-10 | 2004-02-10 | Micron Technology, Inc. | Method for forming minimally spaced MRAM structures |
-
2003
- 2003-02-13 US US10/367,344 patent/US6967390B2/en not_active Expired - Lifetime
-
2004
- 2004-02-04 WO PCT/US2004/003100 patent/WO2004075254A2/en active Application Filing
- 2004-02-04 CN CN2004800068102A patent/CN1781189B/zh not_active Expired - Lifetime
- 2004-02-04 JP JP2006503298A patent/JP4620656B2/ja not_active Expired - Lifetime
- 2004-02-04 KR KR1020057014938A patent/KR101064531B1/ko active IP Right Grant
- 2004-02-11 TW TW093103188A patent/TWI351081B/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0661408A (ja) * | 1992-08-10 | 1994-03-04 | Rohm Co Ltd | 表面実装型半導体装置 |
JPH0714944A (ja) * | 1993-04-16 | 1995-01-17 | Northern Telecom Ltd | 集積回路パッケージおよびその組立構造 |
JPH11284117A (ja) * | 1998-03-27 | 1999-10-15 | Enomoto Co Ltd | 半導体装置の製造方法及び半導体リードフレーム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006202791A (ja) * | 2005-01-18 | 2006-08-03 | Hitachi Medical Corp | Icパッケージ及びそれを用いたx線ct装置 |
JP4509806B2 (ja) * | 2005-01-18 | 2010-07-21 | 株式会社日立メディコ | Icパッケージ及びそれを用いたx線ct装置 |
JP2013141047A (ja) * | 2013-04-24 | 2013-07-18 | Dainippon Printing Co Ltd | 半導体装置、半導体装置の製造方法、およびシールド板 |
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US20040159916A1 (en) | 2004-08-19 |
CN1781189A (zh) | 2006-05-31 |
KR20050100684A (ko) | 2005-10-19 |
CN1781189B (zh) | 2010-04-28 |
WO2004075254A3 (en) | 2005-12-01 |
TWI351081B (en) | 2011-10-21 |
JP4620656B2 (ja) | 2011-01-26 |
TW200416973A (en) | 2004-09-01 |
US6967390B2 (en) | 2005-11-22 |
WO2004075254A2 (en) | 2004-09-02 |
KR101064531B1 (ko) | 2011-09-14 |
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