JP2006517293A - イメージングシステム - Google Patents

イメージングシステム Download PDF

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Publication number
JP2006517293A
JP2006517293A JP2006502200A JP2006502200A JP2006517293A JP 2006517293 A JP2006517293 A JP 2006517293A JP 2006502200 A JP2006502200 A JP 2006502200A JP 2006502200 A JP2006502200 A JP 2006502200A JP 2006517293 A JP2006517293 A JP 2006517293A
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JP
Japan
Prior art keywords
focusing
optical
beam splitter
common
path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006502200A
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English (en)
Japanese (ja)
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JP2006517293A5 (enExample
Inventor
アンドリュー マックスウェル スコット
アンドリュー チャールズ リューイン
サイモン クリストファー ウッズ
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Qinetiq Ltd
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Qinetiq Ltd
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Filing date
Publication date
Application filed by Qinetiq Ltd filed Critical Qinetiq Ltd
Publication of JP2006517293A publication Critical patent/JP2006517293A/ja
Publication of JP2006517293A5 publication Critical patent/JP2006517293A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J2009/002—Wavefront phase distribution

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Focusing (AREA)
JP2006502200A 2003-01-28 2004-01-27 イメージングシステム Pending JP2006517293A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0301923.9A GB0301923D0 (en) 2003-01-28 2003-01-28 Imaging system
PCT/GB2004/000317 WO2004068090A1 (en) 2003-01-28 2004-01-27 Imaging system

Publications (2)

Publication Number Publication Date
JP2006517293A true JP2006517293A (ja) 2006-07-20
JP2006517293A5 JP2006517293A5 (enExample) 2007-03-01

Family

ID=9951945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006502200A Pending JP2006517293A (ja) 2003-01-28 2004-01-27 イメージングシステム

Country Status (5)

Country Link
US (1) US7808712B2 (enExample)
EP (1) EP1588134A1 (enExample)
JP (1) JP2006517293A (enExample)
GB (1) GB0301923D0 (enExample)
WO (1) WO2004068090A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015510150A (ja) * 2012-02-29 2015-04-02 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． ソフトウェア定義式顕微鏡

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0402941D0 (en) 2004-02-11 2004-03-17 Qinetiq Ltd Surface shape measurement
US20080158512A1 (en) * 2005-02-25 2008-07-03 Tetsuro Mizushima Two-Dimensional Image Formation Device
US7573579B2 (en) * 2006-10-12 2009-08-11 Duke University Coded aperture imaging photopolarimetry
WO2011014207A1 (en) 2009-07-31 2011-02-03 University Of Utah Research Foundation Beam splitter module
US9377758B1 (en) 2012-04-27 2016-06-28 University Of South Florida Incoherent digital holographic adaptive optics
JP5965726B2 (ja) * 2012-05-24 2016-08-10 オリンパス株式会社 立体視内視鏡装置
WO2014034339A1 (ja) * 2012-08-30 2014-03-06 オリンパスメディカルシステムズ株式会社 内視鏡
CN105278093B (zh) * 2015-09-30 2017-07-28 中国人民解放军国防科学技术大学 一种用于天文目标成像的系统
CN106667418B (zh) * 2016-11-22 2019-03-22 珠海维尔康生物科技有限公司 内窥镜
US10606062B2 (en) * 2018-06-20 2020-03-31 Karl Storz Imaging, Inc. Medical imaging device with split image on common image sensor
CN111220546B (zh) * 2020-03-30 2024-07-23 中北大学 一种数字剪切散斑的同轴笼式结构无损检测系统

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61202102A (ja) * 1985-03-06 1986-09-06 Hitachi Ltd 光波干渉顕微鏡
JPH0493912A (ja) * 1990-08-06 1992-03-26 Olympus Optical Co Ltd 手術用顕微鏡
JPH04267203A (ja) * 1991-02-22 1992-09-22 Seiko Epson Corp 偏光変換素子
JPH10122833A (ja) * 1996-10-15 1998-05-15 Asahi Optical Co Ltd 表面測定装置
JP2000155015A (ja) * 1998-11-20 2000-06-06 Hitachi Ltd 薄膜磁気ヘッド寸法・配列測定方法および薄膜磁気ヘッド寸法・配列測定装置
US6081327A (en) * 1995-02-08 2000-06-27 Leica Geosystems Ag Leveling instrument
WO2001013159A1 (en) * 1999-08-18 2001-02-22 Qinetiq Limited Three dimensional imaging system

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Publication number Priority date Publication date Assignee Title
US4005285A (en) * 1975-10-30 1977-01-25 Xerox Corporation Optical system for extending photosensor array resolution
US4487490A (en) * 1982-08-16 1984-12-11 Mckee William J Instantaneous three-dimensional camera
US5135183A (en) * 1991-09-23 1992-08-04 Hughes Aircraft Company Dual-image optoelectronic imaging apparatus including birefringent prism arrangement
US5384455A (en) * 1993-04-12 1995-01-24 Environmental Research Institute Of Michigan Measurement-diverse speckle imaging
WO1996029821A2 (en) * 1995-03-21 1996-09-26 Philips Electronics N.V. Image pick-up apparatus
US6115121A (en) * 1997-10-31 2000-09-05 The Regents Of The University Of California Single and double superimposing interferometer systems
JP4344090B2 (ja) 1998-03-10 2009-10-14 イギリス国 ３次元像形成システム
CA2267558C (en) * 1998-04-10 2005-09-13 Her Majesty The Queen, In Right Of Canada, As Represented By The Ministe R Of National Defence Fourier-transform spectrometer configuration optimized for self emission suppression and simplified radiometric calibration
US6107617A (en) * 1998-06-05 2000-08-22 The United States Of America As Represented By The Secretary Of The Air Force Liquid crystal active optics correction for large space based optical systems
CA2243382A1 (en) 1998-07-16 2000-01-16 Universite De Montreal Method and electrode structure for reducing the influence of electrode motion artifacts
US6219146B1 (en) * 1999-07-09 2001-04-17 Etec Systems, Inc. Laser reflector alignment
US6598974B2 (en) * 2001-05-08 2003-07-29 Johnson & Johnson Vision Care, Inc. Method and apparatus for measuring wavefront aberrations

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61202102A (ja) * 1985-03-06 1986-09-06 Hitachi Ltd 光波干渉顕微鏡
JPH0493912A (ja) * 1990-08-06 1992-03-26 Olympus Optical Co Ltd 手術用顕微鏡
JPH04267203A (ja) * 1991-02-22 1992-09-22 Seiko Epson Corp 偏光変換素子
US6081327A (en) * 1995-02-08 2000-06-27 Leica Geosystems Ag Leveling instrument
JPH10122833A (ja) * 1996-10-15 1998-05-15 Asahi Optical Co Ltd 表面測定装置
JP2000155015A (ja) * 1998-11-20 2000-06-06 Hitachi Ltd 薄膜磁気ヘッド寸法・配列測定方法および薄膜磁気ヘッド寸法・配列測定装置
WO2001013159A1 (en) * 1999-08-18 2001-02-22 Qinetiq Limited Three dimensional imaging system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015510150A (ja) * 2012-02-29 2015-04-02 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． ソフトウェア定義式顕微鏡

Also Published As

Publication number Publication date
EP1588134A1 (en) 2005-10-26
US20060171021A1 (en) 2006-08-03
US7808712B2 (en) 2010-10-05
WO2004068090A1 (en) 2004-08-12
GB0301923D0 (en) 2003-02-26

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