JP2006517293A5 - - Google Patents

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Publication number
JP2006517293A5
JP2006517293A5 JP2006502200A JP2006502200A JP2006517293A5 JP 2006517293 A5 JP2006517293 A5 JP 2006517293A5 JP 2006502200 A JP2006502200 A JP 2006502200A JP 2006502200 A JP2006502200 A JP 2006502200A JP 2006517293 A5 JP2006517293 A5 JP 2006517293A5
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JP
Japan
Prior art keywords
common
beam splitter
optical
path
focusing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006502200A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006517293A (ja
Filing date
Publication date
Priority claimed from GBGB0301923.9A external-priority patent/GB0301923D0/en
Application filed filed Critical
Publication of JP2006517293A publication Critical patent/JP2006517293A/ja
Publication of JP2006517293A5 publication Critical patent/JP2006517293A5/ja
Pending legal-status Critical Current

Links

JP2006502200A 2003-01-28 2004-01-27 イメージングシステム Pending JP2006517293A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0301923.9A GB0301923D0 (en) 2003-01-28 2003-01-28 Imaging system
PCT/GB2004/000317 WO2004068090A1 (en) 2003-01-28 2004-01-27 Imaging system

Publications (2)

Publication Number Publication Date
JP2006517293A JP2006517293A (ja) 2006-07-20
JP2006517293A5 true JP2006517293A5 (enExample) 2007-03-01

Family

ID=9951945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006502200A Pending JP2006517293A (ja) 2003-01-28 2004-01-27 イメージングシステム

Country Status (5)

Country Link
US (1) US7808712B2 (enExample)
EP (1) EP1588134A1 (enExample)
JP (1) JP2006517293A (enExample)
GB (1) GB0301923D0 (enExample)
WO (1) WO2004068090A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0402941D0 (en) 2004-02-11 2004-03-17 Qinetiq Ltd Surface shape measurement
US20080158512A1 (en) * 2005-02-25 2008-07-03 Tetsuro Mizushima Two-Dimensional Image Formation Device
US7573579B2 (en) * 2006-10-12 2009-08-11 Duke University Coded aperture imaging photopolarimetry
WO2011014207A1 (en) 2009-07-31 2011-02-03 University Of Utah Research Foundation Beam splitter module
DE112012005960T5 (de) * 2012-02-29 2014-11-06 Agilent Technologies, Inc. Softwaredefiniertes Mikroskop
US9377758B1 (en) 2012-04-27 2016-06-28 University Of South Florida Incoherent digital holographic adaptive optics
JP5965726B2 (ja) * 2012-05-24 2016-08-10 オリンパス株式会社 立体視内視鏡装置
WO2014034339A1 (ja) * 2012-08-30 2014-03-06 オリンパスメディカルシステムズ株式会社 内視鏡
CN105278093B (zh) * 2015-09-30 2017-07-28 中国人民解放军国防科学技术大学 一种用于天文目标成像的系统
CN106667418B (zh) * 2016-11-22 2019-03-22 珠海维尔康生物科技有限公司 内窥镜
US10606062B2 (en) * 2018-06-20 2020-03-31 Karl Storz Imaging, Inc. Medical imaging device with split image on common image sensor
CN111220546B (zh) * 2020-03-30 2024-07-23 中北大学 一种数字剪切散斑的同轴笼式结构无损检测系统

Family Cites Families (19)

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US4005285A (en) * 1975-10-30 1977-01-25 Xerox Corporation Optical system for extending photosensor array resolution
US4487490A (en) * 1982-08-16 1984-12-11 Mckee William J Instantaneous three-dimensional camera
JPS61202102A (ja) * 1985-03-06 1986-09-06 Hitachi Ltd 光波干渉顕微鏡
JP2938940B2 (ja) 1990-08-06 1999-08-25 オリンパス光学工業株式会社 手術用顕微鏡
JPH04267203A (ja) * 1991-02-22 1992-09-22 Seiko Epson Corp 偏光変換素子
US5135183A (en) * 1991-09-23 1992-08-04 Hughes Aircraft Company Dual-image optoelectronic imaging apparatus including birefringent prism arrangement
US5384455A (en) * 1993-04-12 1995-01-24 Environmental Research Institute Of Michigan Measurement-diverse speckle imaging
DE19504039C1 (de) * 1995-02-08 1996-04-04 Leica Ag Vorrichtung für Nivellierzwecke
WO1996029821A2 (en) * 1995-03-21 1996-09-26 Philips Electronics N.V. Image pick-up apparatus
JP3637165B2 (ja) * 1996-10-15 2005-04-13 ペンタックス株式会社 表面測定装置
US6115121A (en) * 1997-10-31 2000-09-05 The Regents Of The University Of California Single and double superimposing interferometer systems
JP4344090B2 (ja) 1998-03-10 2009-10-14 イギリス国 ３次元像形成システム
CA2267558C (en) * 1998-04-10 2005-09-13 Her Majesty The Queen, In Right Of Canada, As Represented By The Ministe R Of National Defence Fourier-transform spectrometer configuration optimized for self emission suppression and simplified radiometric calibration
US6107617A (en) * 1998-06-05 2000-08-22 The United States Of America As Represented By The Secretary Of The Air Force Liquid crystal active optics correction for large space based optical systems
CA2243382A1 (en) 1998-07-16 2000-01-16 Universite De Montreal Method and electrode structure for reducing the influence of electrode motion artifacts
JP4646342B2 (ja) * 1998-11-20 2011-03-09 株式会社日立グローバルストレージテクノロジーズ 薄膜磁気ヘッド寸法・配列測定方法および薄膜磁気ヘッド寸法・配列測定装置
US6219146B1 (en) * 1999-07-09 2001-04-17 Etec Systems, Inc. Laser reflector alignment
GB2353392A (en) * 1999-08-18 2001-02-21 Secr Defence Imaging system suitable for use in multi-layer optical data storage applications
US6598974B2 (en) * 2001-05-08 2003-07-29 Johnson & Johnson Vision Care, Inc. Method and apparatus for measuring wavefront aberrations

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