JP2006516031A5 - - Google Patents

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Publication number
JP2006516031A5
JP2006516031A5 JP2006500776A JP2006500776A JP2006516031A5 JP 2006516031 A5 JP2006516031 A5 JP 2006516031A5 JP 2006500776 A JP2006500776 A JP 2006500776A JP 2006500776 A JP2006500776 A JP 2006500776A JP 2006516031 A5 JP2006516031 A5 JP 2006516031A5
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JP
Japan
Prior art keywords
alkyl
independently
tantalum
trimethylsilyl
compound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006500776A
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English (en)
Japanese (ja)
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JP2006516031A (ja
Filing date
Publication date
Priority claimed from US10/345,616 external-priority patent/US6989457B2/en
Application filed filed Critical
Publication of JP2006516031A publication Critical patent/JP2006516031A/ja
Publication of JP2006516031A5 publication Critical patent/JP2006516031A5/ja
Pending legal-status Critical Current

Links

JP2006500776A 2003-01-16 2004-01-06 タンタル系材料の蒸着のための化学蒸着前駆体 Pending JP2006516031A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/345,616 US6989457B2 (en) 2003-01-16 2003-01-16 Chemical vapor deposition precursors for deposition of tantalum-based materials
PCT/US2004/000060 WO2004065650A2 (en) 2003-01-16 2004-01-06 Chemical vapor deposition precursors for deposition of tantalum-based materials

Publications (2)

Publication Number Publication Date
JP2006516031A JP2006516031A (ja) 2006-06-15
JP2006516031A5 true JP2006516031A5 (enExample) 2007-03-01

Family

ID=32711960

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006500776A Pending JP2006516031A (ja) 2003-01-16 2004-01-06 タンタル系材料の蒸着のための化学蒸着前駆体

Country Status (6)

Country Link
US (2) US6989457B2 (enExample)
EP (1) EP1599488A4 (enExample)
JP (1) JP2006516031A (enExample)
KR (1) KR101062591B1 (enExample)
CN (1) CN1738826A (enExample)
WO (1) WO2004065650A2 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7012292B1 (en) * 1998-11-25 2006-03-14 Advanced Technology Materials, Inc Oxidative top electrode deposition process, and microelectronic device structure
US6989457B2 (en) * 2003-01-16 2006-01-24 Advanced Technology Materials, Inc. Chemical vapor deposition precursors for deposition of tantalum-based materials
US6960675B2 (en) * 2003-10-14 2005-11-01 Advanced Technology Materials, Inc. Tantalum amide complexes for depositing tantalum-containing films, and method of making same
US7166732B2 (en) * 2004-06-16 2007-01-23 Advanced Technology Materials, Inc. Copper (I) compounds useful as deposition precursors of copper thin films
JP5053543B2 (ja) * 2005-02-02 2012-10-17 東ソー株式会社 タンタル化合物、その製造方法、タンタル含有薄膜、及びその形成方法
US9312557B2 (en) * 2005-05-11 2016-04-12 Schlumberger Technology Corporation Fuel cell apparatus and method for downhole power systems
DE102005033102A1 (de) * 2005-07-15 2007-01-25 H.C. Starck Gmbh Tantal- und Niob-Verbindungen und ihre Verwendung für die Chemical Vapour Deposition (CVD)
US7521356B2 (en) * 2005-09-01 2009-04-21 Micron Technology, Inc. Atomic layer deposition systems and methods including silicon-containing tantalum precursor compounds
US7713876B2 (en) * 2005-09-28 2010-05-11 Tokyo Electron Limited Method for integrating a ruthenium layer with bulk copper in copper metallization
JP5096016B2 (ja) * 2006-02-14 2012-12-12 東ソー株式会社 タンタル化合物とその製造方法、及びそれを原料とするタンタル含有薄膜とその形成方法
KR20140139636A (ko) 2006-03-10 2014-12-05 어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 티타네이트, 란타네이트 및 탄탈레이트 유전막의 원자층 증착 및 화학 증기 증착용 전구체 조성물
US7959985B2 (en) * 2006-03-20 2011-06-14 Tokyo Electron Limited Method of integrating PEALD Ta-containing films into Cu metallization
US7959986B2 (en) * 2006-08-09 2011-06-14 Praxair Technology, Inc. Organometallic compounds, processes for the preparation thereof and methods of use thereof
DE102006037955A1 (de) * 2006-08-12 2008-02-14 H.C. Starck Gmbh Tantal- und Niob-Verbindungen und ihre Verwendung für die Chemical Vapour Deposition (CVD)
US8513789B2 (en) * 2006-10-10 2013-08-20 Tessera, Inc. Edge connect wafer level stacking with leads extending along edges
US7750173B2 (en) 2007-01-18 2010-07-06 Advanced Technology Materials, Inc. Tantalum amido-complexes with chelate ligands useful for CVD and ALD of TaN and Ta205 thin films
KR20090115197A (ko) * 2007-03-12 2009-11-04 쇼와 덴코 가부시키가이샤 코발트 함유막 형성 재료, 및 상기 재료를 이용한 코발트 실리사이드막의 제조 방법
KR20100016477A (ko) * 2007-04-12 2010-02-12 어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 Ald/cvd용의 지르코늄, 하프늄, 티타늄 및 규소 전구체
WO2009012341A2 (en) * 2007-07-16 2009-01-22 Advancaed Technology Materials, Inc. Group iv complexes as cvd and ald precursors for forming metal-containing thin films
US8455049B2 (en) * 2007-08-08 2013-06-04 Advanced Technology Materials, Inc. Strontium precursor for use in chemical vapor deposition, atomic layer deposition and rapid vapor deposition
DE102007049015A1 (de) 2007-10-11 2009-04-16 H.C. Starck Gmbh Neue Tantal- und Niob-Verbindungen
US20090275164A1 (en) * 2008-05-02 2009-11-05 Advanced Technology Materials, Inc. Bicyclic guanidinates and bridging diamides as cvd/ald precursors
WO2012005957A2 (en) 2010-07-07 2012-01-12 Advanced Technology Materials, Inc. Doping of zro2 for dram applications
US9443736B2 (en) 2012-05-25 2016-09-13 Entegris, Inc. Silylene compositions and methods of use thereof
WO2014124056A1 (en) 2013-02-08 2014-08-14 Advanced Technology Materials, Inc. Ald processes for low leakage current and low equivalent oxide thickness bitao films

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130172A (en) * 1988-10-21 1992-07-14 The Regents Of The University Of California Low temperature organometallic deposition of metals
GB9714181D0 (en) 1997-07-05 1997-09-10 Bp Chem Int Ltd Polymerisation catalyst
US6015917A (en) * 1998-01-23 2000-01-18 Advanced Technology Materials, Inc. Tantalum amide precursors for deposition of tantalum nitride on a substrate
US7081271B2 (en) * 2001-12-07 2006-07-25 Applied Materials, Inc. Cyclical deposition of refractory metal silicon nitride
US6989457B2 (en) * 2003-01-16 2006-01-24 Advanced Technology Materials, Inc. Chemical vapor deposition precursors for deposition of tantalum-based materials

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