JP2006513573A5 - - Google Patents

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Publication number
JP2006513573A5
JP2006513573A5 JP2004566602A JP2004566602A JP2006513573A5 JP 2006513573 A5 JP2006513573 A5 JP 2006513573A5 JP 2004566602 A JP2004566602 A JP 2004566602A JP 2004566602 A JP2004566602 A JP 2004566602A JP 2006513573 A5 JP2006513573 A5 JP 2006513573A5
Authority
JP
Japan
Prior art keywords
subpad
fixed abrasive
shore
astm
hardness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004566602A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006513573A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2003/041364 external-priority patent/WO2004062849A1/en
Publication of JP2006513573A publication Critical patent/JP2006513573A/ja
Publication of JP2006513573A5 publication Critical patent/JP2006513573A5/ja
Pending legal-status Critical Current

Links

JP2004566602A 2003-01-10 2003-12-23 化学的機械的平坦化用途向けのパッド構成体 Pending JP2006513573A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US43931403P 2003-01-10 2003-01-10
PCT/US2003/041364 WO2004062849A1 (en) 2003-01-10 2003-12-23 Pad constructions for chemical mechanical planarization applications

Publications (2)

Publication Number Publication Date
JP2006513573A JP2006513573A (ja) 2006-04-20
JP2006513573A5 true JP2006513573A5 (enExample) 2006-12-28

Family

ID=32713463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004566602A Pending JP2006513573A (ja) 2003-01-10 2003-12-23 化学的機械的平坦化用途向けのパッド構成体

Country Status (9)

Country Link
US (1) US7163444B2 (enExample)
EP (1) EP1590127A1 (enExample)
JP (1) JP2006513573A (enExample)
KR (1) KR101018942B1 (enExample)
CN (1) CN100551623C (enExample)
AU (1) AU2003297539A1 (enExample)
MY (1) MY136868A (enExample)
TW (1) TWI312305B (enExample)
WO (1) WO2004062849A1 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7887711B2 (en) * 2002-06-13 2011-02-15 International Business Machines Corporation Method for etching chemically inert metal oxides
US6737365B1 (en) * 2003-03-24 2004-05-18 Intel Corporation Forming a porous dielectric layer
US7179159B2 (en) * 2005-05-02 2007-02-20 Applied Materials, Inc. Materials for chemical mechanical polishing
JP2007149949A (ja) * 2005-11-28 2007-06-14 Roki Techno Co Ltd デバイスウエハ用の研磨パッド
US20070128991A1 (en) * 2005-12-07 2007-06-07 Yoon Il-Young Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same
US20080233845A1 (en) * 2007-03-21 2008-09-25 3M Innovative Properties Company Abrasive articles, rotationally reciprocating tools, and methods
US8087975B2 (en) 2007-04-30 2012-01-03 San Fang Chemical Industry Co., Ltd. Composite sheet for mounting a workpiece and the method for making the same
US20080287047A1 (en) * 2007-05-18 2008-11-20 Sang Fang Chemical Industry Co., Ltd. Polishing pad, use thereof and method for making the same
US7815491B2 (en) 2007-05-29 2010-10-19 San Feng Chemical Industry Co., Ltd. Polishing pad, the use thereof and the method for manufacturing the same
KR20100093537A (ko) * 2007-10-31 2010-08-25 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웨이퍼를 폴리싱하기 위한 조성물, 방법 및 공정
US7645186B1 (en) * 2008-07-18 2010-01-12 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad manufacturing assembly
KR20110033277A (ko) * 2008-07-18 2011-03-30 쓰리엠 이노베이티브 프로퍼티즈 캄파니 플로팅 요소를 구비한 연마 패드 및 이 연마 패드의 제작 방법과 이용 방법
US8771042B2 (en) 2009-02-02 2014-07-08 3M Innovative Properties Company Optical fiber polishing apparatus
TWI510328B (zh) * 2010-05-03 2015-12-01 Iv Technologies Co Ltd 基底層、包括此基底層的研磨墊及研磨方法
US8360823B2 (en) * 2010-06-15 2013-01-29 3M Innovative Properties Company Splicing technique for fixed abrasives used in chemical mechanical planarization
CN102601747B (zh) * 2011-01-20 2015-12-09 中芯国际集成电路制造(上海)有限公司 一种研磨垫及其制备方法、使用方法
JP5789634B2 (ja) * 2012-05-14 2015-10-07 株式会社荏原製作所 ワークピースを研磨するための研磨パッド並びに化学機械研磨装置、および該化学機械研磨装置を用いてワークピースを研磨する方法
CA2874456C (en) 2012-05-22 2018-07-03 Wynright Corporation System, method, and apparatus for picking-and-putting product
CN102862128B (zh) 2012-09-20 2015-10-21 北京国瑞升科技股份有限公司 一种凹凸结构磨料制品及其制备方法
US20150038066A1 (en) * 2013-07-31 2015-02-05 Nexplanar Corporation Low density polishing pad
WO2015048011A1 (en) * 2013-09-25 2015-04-02 3M Innovative Properties Company Multi-layered polishing pads
EP2859997B1 (en) * 2013-10-08 2015-09-30 Valentini, Guido Method for manufacturing a polishing pad and polishing pad
USD785339S1 (en) * 2014-10-23 2017-05-02 Griot's Garage, Inc. Hand applicator buffing pad
JP6604472B2 (ja) * 2015-09-29 2019-11-13 富士紡ホールディングス株式会社 研磨パッド
WO2018005767A1 (en) * 2016-06-29 2018-01-04 Saint-Gobain Abrasives, Inc. Abrasive tools and methods for forming same
KR101916119B1 (ko) * 2017-02-06 2019-01-30 주식회사 리온에스엠아이 화학적 기계 연마용 연마패드
USD832898S1 (en) * 2017-02-09 2018-11-06 Global Polishing Systems LLC Material removal/polishing tool
CN107081688A (zh) * 2017-05-27 2017-08-22 江苏省江南新型复合研磨材料及制品工程技术研究中心有限公司 一种高强度高性能的复合研磨片及其制造方法
US11331767B2 (en) 2019-02-01 2022-05-17 Micron Technology, Inc. Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods
DE112020000934T5 (de) 2019-02-26 2021-11-04 Denka Company Limited Klebefolie zum Rückseitenschleifen und Herstellungsverfahren für Halbleiterwafer
JP7156341B2 (ja) * 2020-07-13 2022-10-19 信越半導体株式会社 片面研磨装置及び片面研磨方法、並びに研磨パッド
KR102594068B1 (ko) * 2021-10-12 2023-10-24 에스케이엔펄스 주식회사 연마패드 및 이를 이용한 반도체 소자의 제조방법
CN114227530B (zh) * 2021-12-10 2022-05-10 湖北鼎汇微电子材料有限公司 一种抛光垫及半导体器件的制造方法

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4055897A (en) * 1976-03-11 1977-11-01 Minnesota Mining And Manufacturing Company Dental abrading device and method
US4927432A (en) 1986-03-25 1990-05-22 Rodel, Inc. Pad material for grinding, lapping and polishing
US5152917B1 (en) 1991-02-06 1998-01-13 Minnesota Mining & Mfg Structured abrasive article
US5110843A (en) 1991-05-01 1992-05-05 Minnesota Mining And Manufacturing Company Absorbent, non-skinned foam and the method of preparation
US5514245A (en) 1992-01-27 1996-05-07 Micron Technology, Inc. Method for chemical planarization (CMP) of a semiconductor wafer to provide a planar surface free of microscratches
DE69419764T2 (de) * 1993-09-13 1999-12-23 Minnesota Mining And Mfg. Co., St. Paul Schleifartikel, verfahren zur herstellung desselben, verfahren zur verwendung desselben zum endbearbeiten, und herstellungswerkzeug
CA2134156A1 (en) 1993-11-22 1995-05-23 Thomas P. Klun Coatable compositions, abrasive articles made therefrom, and methods of making and using same
JPH0955362A (ja) 1995-08-09 1997-02-25 Cypress Semiconductor Corp スクラッチを減少する集積回路の製造方法
CN1197542A (zh) 1995-09-13 1998-10-28 株式会社日立制作所 抛光方法和设备
US5958794A (en) 1995-09-22 1999-09-28 Minnesota Mining And Manufacturing Company Method of modifying an exposed surface of a semiconductor wafer
US5692950A (en) 1996-08-08 1997-12-02 Minnesota Mining And Manufacturing Company Abrasive construction for semiconductor wafer modification
CN1085575C (zh) * 1996-09-11 2002-05-29 美国3M公司 磨料制品及其制造方法
US6231629B1 (en) 1997-03-07 2001-05-15 3M Innovative Properties Company Abrasive article for providing a clear surface finish on glass
US6194317B1 (en) 1998-04-30 2001-02-27 3M Innovative Properties Company Method of planarizing the upper surface of a semiconductor wafer
TW479285B (en) * 1997-04-30 2002-03-11 Minnesota Mining & Mfg Method of modifying a wafer suited for semiconductor fabrication
JPH10315119A (ja) * 1997-05-19 1998-12-02 Toshiba Mach Co Ltd 研磨布
US6736714B2 (en) * 1997-07-30 2004-05-18 Praxair S.T. Technology, Inc. Polishing silicon wafers
US5919082A (en) * 1997-08-22 1999-07-06 Micron Technology, Inc. Fixed abrasive polishing pad
US5897426A (en) 1998-04-24 1999-04-27 Applied Materials, Inc. Chemical mechanical polishing with multiple polishing pads
JP2000156360A (ja) * 1998-06-30 2000-06-06 Fujitsu Ltd 半導体装置の製造方法
CN1076253C (zh) * 1998-10-23 2001-12-19 联华电子股份有限公司 化学机械研磨垫
US6461226B1 (en) * 1998-11-25 2002-10-08 Promos Technologies, Inc. Chemical mechanical polishing of a metal layer using a composite polishing pad
EP1068928A3 (en) * 1999-02-11 2003-08-13 Applied Materials, Inc. Chemical mechanical polishing processes and components
JP2000301450A (ja) * 1999-04-19 2000-10-31 Rohm Co Ltd Cmp研磨パッドおよびそれを用いたcmp処理装置
TW474852B (en) 1999-04-29 2002-02-01 Ebara Corp Method and apparatus for polishing workpieces
US6234875B1 (en) * 1999-06-09 2001-05-22 3M Innovative Properties Company Method of modifying a surface
EP1077108B1 (en) 1999-08-18 2006-12-20 Ebara Corporation Polishing method and polishing apparatus
JP2001077060A (ja) * 1999-09-08 2001-03-23 Toshiba Corp 半導体装置の製造方法
US6620725B1 (en) * 1999-09-13 2003-09-16 Taiwan Semiconductor Manufacturing Company Reduction of Cu line damage by two-step CMP
JP2001121405A (ja) * 1999-10-25 2001-05-08 Matsushita Electric Ind Co Ltd 研磨パッド
US6498101B1 (en) * 2000-02-28 2002-12-24 Micron Technology, Inc. Planarizing pads, planarizing machines and methods for making and using planarizing pads in mechanical and chemical-mechanical planarization of microelectronic device substrate assemblies
IL151862A0 (en) * 2000-04-07 2003-04-10 Cabot Microelectronics Corp Integrated chemical-mechanical polishing
JP2001334458A (ja) * 2000-05-26 2001-12-04 Ebara Corp ポリッシング方法
JP2001345297A (ja) * 2000-05-30 2001-12-14 Hitachi Ltd 半導体集積回路装置の製造方法及び研磨装置
KR100373846B1 (ko) * 2000-06-12 2003-02-26 지앤피테크놀로지 주식회사 반도체 및 광학부품용 연마패드 및 그 제조방법
US6383066B1 (en) * 2000-06-23 2002-05-07 International Business Machines Corporation Multilayered polishing pad, method for fabricating, and use thereof
JP3797861B2 (ja) * 2000-09-27 2006-07-19 株式会社荏原製作所 ポリッシング装置
US6645624B2 (en) * 2000-11-10 2003-11-11 3M Innovative Properties Company Composite abrasive particles and method of manufacture
US6612916B2 (en) * 2001-01-08 2003-09-02 3M Innovative Properties Company Article suitable for chemical mechanical planarization processes
US6612917B2 (en) 2001-02-07 2003-09-02 3M Innovative Properties Company Abrasive article suitable for modifying a semiconductor wafer
US6632129B2 (en) 2001-02-15 2003-10-14 3M Innovative Properties Company Fixed abrasive article for use in modifying a semiconductor wafer
US6817923B2 (en) * 2001-05-24 2004-11-16 Applied Materials, Inc. Chemical mechanical processing system with mobile load cup
JP4693024B2 (ja) * 2002-04-26 2011-06-01 東洋ゴム工業株式会社 研磨材

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