JP2006501659A5 - - Google Patents
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- Publication number
- JP2006501659A5 JP2006501659A5 JP2004540528A JP2004540528A JP2006501659A5 JP 2006501659 A5 JP2006501659 A5 JP 2006501659A5 JP 2004540528 A JP2004540528 A JP 2004540528A JP 2004540528 A JP2004540528 A JP 2004540528A JP 2006501659 A5 JP2006501659 A5 JP 2006501659A5
- Authority
- JP
- Japan
- Prior art keywords
- film
- layer
- layers
- transfer
- transferred
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010408 film Substances 0.000 claims 48
- 239000010410 layer Substances 0.000 claims 42
- 239000002346 layers by function Substances 0.000 claims 13
- 238000000034 method Methods 0.000 claims 13
- 239000004065 semiconductor Substances 0.000 claims 12
- 239000000463 material Substances 0.000 claims 8
- 238000005516 engineering process Methods 0.000 claims 6
- 230000003287 optical effect Effects 0.000 claims 6
- 239000004020 conductor Substances 0.000 claims 5
- 239000012777 electrically insulating material Substances 0.000 claims 3
- 239000012811 non-conductive material Substances 0.000 claims 2
- 239000012790 adhesive layer Substances 0.000 claims 1
- 230000003796 beauty Effects 0.000 claims 1
- 238000011038 discontinuous diafiltration by volume reduction Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 229920001002 functional polymer Polymers 0.000 claims 1
- 239000011810 insulating material Substances 0.000 claims 1
- 239000004922 lacquer Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10246241 | 2002-10-02 | ||
| DE10246241.0 | 2002-10-02 | ||
| PCT/DE2003/003258 WO2004032257A2 (de) | 2002-10-02 | 2003-09-30 | Folie mit organischen halbleitern |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006501659A JP2006501659A (ja) | 2006-01-12 |
| JP2006501659A5 true JP2006501659A5 (enExample) | 2006-11-24 |
| JP4841841B2 JP4841841B2 (ja) | 2011-12-21 |
Family
ID=32049195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004540528A Expired - Fee Related JP4841841B2 (ja) | 2002-10-02 | 2003-09-30 | 有機半導体付フィルム |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US7655498B2 (enExample) |
| EP (2) | EP1559147B1 (enExample) |
| JP (1) | JP4841841B2 (enExample) |
| KR (1) | KR101196591B1 (enExample) |
| CN (1) | CN100454602C (enExample) |
| AU (1) | AU2003281923A1 (enExample) |
| DE (1) | DE10393887D2 (enExample) |
| ES (1) | ES2439446T3 (enExample) |
| PL (1) | PL213928B1 (enExample) |
| RU (1) | RU2317613C2 (enExample) |
| WO (1) | WO2004032257A2 (enExample) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10061299A1 (de) | 2000-12-08 | 2002-06-27 | Siemens Ag | Vorrichtung zur Feststellung und/oder Weiterleitung zumindest eines Umwelteinflusses, Herstellungsverfahren und Verwendung dazu |
| DE10061297C2 (de) | 2000-12-08 | 2003-05-28 | Siemens Ag | Verfahren zur Sturkturierung eines OFETs |
| DE10105914C1 (de) | 2001-02-09 | 2002-10-10 | Siemens Ag | Organischer Feldeffekt-Transistor mit fotostrukturiertem Gate-Dielektrikum und ein Verfahren zu dessen Erzeugung |
| DE10151036A1 (de) | 2001-10-16 | 2003-05-08 | Siemens Ag | Isolator für ein organisches Elektronikbauteil |
| DE10151440C1 (de) | 2001-10-18 | 2003-02-06 | Siemens Ag | Organisches Elektronikbauteil, Verfahren zu seiner Herstellung und seine Verwendung |
| DE10160732A1 (de) | 2001-12-11 | 2003-06-26 | Siemens Ag | Organischer Feld-Effekt-Transistor mit verschobener Schwellwertspannung und Verwendung dazu |
| DE10212640B4 (de) | 2002-03-21 | 2004-02-05 | Siemens Ag | Logische Bauteile aus organischen Feldeffekttransistoren |
| DE10253154A1 (de) | 2002-11-14 | 2004-05-27 | Siemens Ag | Messgerät zur Bestimmung eines Analyten in einer Flüssigkeitsprobe |
| DE50306538D1 (de) | 2002-11-19 | 2007-03-29 | Polyic Gmbh & Co Kg | Organische elektronische schaltung mit stukturierter halbleitender funktionsschicht und herstellungsverfahren dazu |
| DE10302149A1 (de) | 2003-01-21 | 2005-08-25 | Siemens Ag | Verwendung leitfähiger Carbon-black/Graphit-Mischungen für die Herstellung von low-cost Elektronik |
| DE10330062A1 (de) * | 2003-07-03 | 2005-01-27 | Siemens Ag | Verfahren und Vorrichtung zur Strukturierung von organischen Schichten |
| DE10339036A1 (de) | 2003-08-25 | 2005-03-31 | Siemens Ag | Organisches elektronisches Bauteil mit hochaufgelöster Strukturierung und Herstellungsverfahren dazu |
| DE10340644B4 (de) | 2003-09-03 | 2010-10-07 | Polyic Gmbh & Co. Kg | Mechanische Steuerelemente für organische Polymerelektronik |
| JP4549751B2 (ja) * | 2004-06-17 | 2010-09-22 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR100659061B1 (ko) * | 2004-09-20 | 2006-12-19 | 삼성에스디아이 주식회사 | 유기 박막 트랜지스터 및 이를 구비한 평판표시장치 |
| DE102005009820A1 (de) | 2005-03-01 | 2006-09-07 | Polyic Gmbh & Co. Kg | Elektronikbaugruppe mit organischen Logik-Schaltelementen |
| US8089062B2 (en) * | 2005-03-23 | 2012-01-03 | Xerox Corporation | Wax encapsulated electronic devices |
| US9024298B2 (en) * | 2005-07-26 | 2015-05-05 | Xerox Corporation | Encapsulation layer for electronic devices |
| GB0523163D0 (en) * | 2005-11-14 | 2005-12-21 | Suisse Electronique Microtech | Patterning of conductive layers with underlying compressible spacer layer or spacer layer stack |
| US8174262B2 (en) | 2006-07-21 | 2012-05-08 | Halliburton Energy Services, Inc. | Fluid saturation estimation |
| DE102006047388A1 (de) * | 2006-10-06 | 2008-04-17 | Polyic Gmbh & Co. Kg | Feldeffekttransistor sowie elektrische Schaltung |
| US8542442B2 (en) * | 2007-05-07 | 2013-09-24 | Centre Suisse d'Electronique et de Microtechnique SA—Recherche et Developpement | Isotropic zero-order diffractive filter |
| DE102007061587A1 (de) * | 2007-12-18 | 2009-06-25 | Abb Ag | Isolationsmaterial mit Lack und Materialzusatz sowie Isolationsband |
| GB2467316B (en) * | 2009-01-28 | 2014-04-09 | Pragmatic Printing Ltd | Electronic devices, circuits and their manufacture |
| JP5676985B2 (ja) * | 2010-09-09 | 2015-02-25 | キヤノン株式会社 | ホログラム形成装置及びホログラム形成方法 |
| DE102011084437A1 (de) * | 2011-10-13 | 2013-04-18 | Osram Opto Semiconductors Gmbh | Lichtemittierendes Bauelement und Verfahren zum Herstellen eines lichtemittierenden Bauelements |
| ES2657018T3 (es) | 2012-01-13 | 2018-03-01 | Arjo Wiggins Fine Papers Limited | Procedimiento de fabricación de una lámina |
| US9846874B2 (en) * | 2012-04-25 | 2017-12-19 | Hewlett-Packard Development Company, L.P. | Performing a user related operation |
| FR2996338B1 (fr) | 2012-09-28 | 2020-10-16 | Hologram Ind | Composant optique de securite a effet reflectif, fabrication d'un tel composant et document securise equipe d'un tel composant |
| CN103594624B (zh) * | 2013-11-07 | 2015-12-09 | 电子科技大学 | 一种有机场效应晶体管及其制备方法 |
| RU2573903C1 (ru) * | 2014-09-02 | 2016-01-27 | Федеральное государственное бюджетное учреждение науки Институт синтетических полимерных материалов им. Н.С. Ениколопова Российской академии наук (ИСПМ РАН) | Способ получения гибкой электропроводящей полимерной пленки |
| CN104459833A (zh) * | 2014-12-13 | 2015-03-25 | 中国科学技术大学先进技术研究院 | 一种新型光学聚合物复合薄膜及其制作方法和应用 |
| CN108811400B (zh) * | 2018-07-24 | 2020-09-25 | Oppo广东移动通信有限公司 | 电子设备外壳及其制备方法以及电子设备 |
| DE102019132140A1 (de) * | 2019-11-27 | 2021-05-27 | Bayerische Motoren Werke Aktiengesellschaft | Verfahren und Vorrichtung zur Herstellung einer funktionalen Dekorschicht |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3527412A1 (de) * | 1985-07-31 | 1987-02-12 | Kurz Leonhard Fa | Mehrlagige folie, insbesondere heisspraegefolie und verfahren zu deren herstellung |
| FI91573C (sv) * | 1990-01-04 | 1994-07-11 | Neste Oy | Sätt att framställa elektroniska och elektro-optiska komponenter och kretsar |
| JPH1096808A (ja) * | 1996-09-24 | 1998-04-14 | Nippon Telegr & Teleph Corp <Ntt> | 微細パタン形成法 |
| RU2183882C2 (ru) | 1998-01-28 | 2002-06-20 | Тин Филм Электроникс Аса | Способ формирования электропроводящих или полупроводниковых трехмерных структур и способы уничтожения этих структур |
| US6114088A (en) * | 1999-01-15 | 2000-09-05 | 3M Innovative Properties Company | Thermal transfer element for forming multilayer devices |
| EP1198851B1 (en) * | 1999-07-21 | 2012-03-14 | E Ink Corporation | Reactive formation of dielectric layers and protection of organic layers in organic semiconductor device |
| EP1186042A1 (en) * | 2000-03-28 | 2002-03-13 | Koninklijke Philips Electronics N.V. | Integrated circuit with programmable memory element |
| JP4815659B2 (ja) * | 2000-06-09 | 2011-11-16 | ソニー株式会社 | 液晶表示装置 |
| DE10033112C2 (de) | 2000-07-07 | 2002-11-14 | Siemens Ag | Verfahren zur Herstellung und Strukturierung organischer Feldeffekt-Transistoren (OFET), hiernach gefertigter OFET und seine Verwendung |
| US6586791B1 (en) * | 2000-07-19 | 2003-07-01 | 3M Innovative Properties Company | Transistor insulator layer incorporating superfine ceramic particles |
| WO2002025750A1 (de) | 2000-09-22 | 2002-03-28 | Siemens Aktiengesellschaft | Elektrode und/oder leiterbahn für organische bauelemente und herstellungsverfahren dazu |
| US6814898B1 (en) * | 2000-10-17 | 2004-11-09 | Seagate Technology Llc | Imprint lithography utilizing room temperature embossing |
| DE10061297C2 (de) | 2000-12-08 | 2003-05-28 | Siemens Ag | Verfahren zur Sturkturierung eines OFETs |
| US6620657B2 (en) | 2002-01-15 | 2003-09-16 | International Business Machines Corporation | Method of forming a planar polymer transistor using substrate bonding techniques |
| US6653030B2 (en) * | 2002-01-23 | 2003-11-25 | Hewlett-Packard Development Company, L.P. | Optical-mechanical feature fabrication during manufacture of semiconductors and other micro-devices and nano-devices that include micron and sub-micron features |
| DE10219905B4 (de) | 2002-05-03 | 2011-06-22 | OSRAM Opto Semiconductors GmbH, 93055 | Optoelektronisches Bauelement mit organischen funktionellen Schichten und zwei Trägern sowie Verfahren zur Herstellung eines solchen optoelektronischen Bauelements |
-
2003
- 2003-09-30 WO PCT/DE2003/003258 patent/WO2004032257A2/de not_active Ceased
- 2003-09-30 CN CNB038244705A patent/CN100454602C/zh not_active Expired - Fee Related
- 2003-09-30 EP EP03773464.7A patent/EP1559147B1/de not_active Expired - Lifetime
- 2003-09-30 AU AU2003281923A patent/AU2003281923A1/en not_active Abandoned
- 2003-09-30 RU RU2005113274/28A patent/RU2317613C2/ru not_active IP Right Cessation
- 2003-09-30 JP JP2004540528A patent/JP4841841B2/ja not_active Expired - Fee Related
- 2003-09-30 KR KR1020057005785A patent/KR101196591B1/ko not_active Expired - Fee Related
- 2003-09-30 DE DE10393887T patent/DE10393887D2/de not_active Expired - Fee Related
- 2003-09-30 PL PL374836A patent/PL213928B1/pl not_active IP Right Cessation
- 2003-09-30 US US10/529,458 patent/US7655498B2/en not_active Expired - Fee Related
- 2003-09-30 ES ES10010395.1T patent/ES2439446T3/es not_active Expired - Lifetime
- 2003-09-30 EP EP10010395.1A patent/EP2261979B1/de not_active Expired - Lifetime
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