JP2006332599A - Electronic device - Google Patents

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JP2006332599A
JP2006332599A JP2006082226A JP2006082226A JP2006332599A JP 2006332599 A JP2006332599 A JP 2006332599A JP 2006082226 A JP2006082226 A JP 2006082226A JP 2006082226 A JP2006082226 A JP 2006082226A JP 2006332599 A JP2006332599 A JP 2006332599A
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Prior art keywords
lid
electronic device
metal frame
joint
bent portion
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Inventor
Yuji Tamura
裕司 田村
Shinichiro Sawa
晋一郎 澤
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Kyocera Corp
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Kyocera Corp
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Priority to JP2006082226A priority Critical patent/JP2006332599A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

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  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic device exhibiting high reliability in hermetic sealing in which an insulating substrate is not cracked even after the lid is welded to the insulating substrate by resistance welding and then cooled. <P>SOLUTION: The electronic device comprises an insulating substrate 1 having a recess 4 for containing an electronic component 5 in the upper surface, a metal frame 2 fixed to the upper surface of the insulating substrate 1, and a lid 3 for closing the recess 4 by bonding the outer circumferential portion of the lower surface to the upper surface of the metal frame 2 wherein the lid 3 has a bend 3b along a joint 3a to the metal frame 2 on the inside of the joint 3a. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、電子部品が収容された絶縁基体の凹部が蓋体で塞がれ、電子部品が気密封止されてなる電子装置に関するものである。   The present invention relates to an electronic device in which a concave portion of an insulating base in which an electronic component is accommodated is closed with a lid, and the electronic component is hermetically sealed.

従来、圧電振動子や半導体素子等の電子部品は、これらの電子部品を気密に収容するための絶縁基体内に気密封止されて電子装置となり、携帯電話やコンピュータ等の各種電子機器の部品として使用される。   Conventionally, electronic parts such as piezoelectric vibrators and semiconductor elements are hermetically sealed in an insulating base for accommodating these electronic parts in an airtight manner to form an electronic device, which is used as a part of various electronic devices such as mobile phones and computers. used.

このような電子部品を気密に収容する絶縁基体において、最も信頼性の高いとされるものは、酸化アルミニウム質焼結体等のセラミックスから成り、上面の中央部に電子部品を収容するための凹部を有する絶縁基体と、絶縁基体の凹部の内側から、上面の外周部や側面、下面等の外表面にかけて導出された配線導体と、絶縁基体の凹部を取り囲む枠部上面に形成された枠状のメタライズ層と、メタライズ層にロウ付けされた鉄−ニッケル−コバルト合金や鉄−ニッケル合金等の金属製の金属枠体とを具備する構成のものである。そして、金属枠体の上面に抵抗溶接により鉄−ニッケル合金や鉄−ニッケル−コバルト合金から成る平板状の蓋体を接合することにより、凹部が塞がれて電子部品が気密封止される。   Among the insulating bases for accommodating such electronic components in an airtight manner, the most reliable one is made of ceramics such as an aluminum oxide sintered body, and a recess for accommodating the electronic components in the central portion of the upper surface. An insulating base having a wiring shape that extends from the inside of the concave portion of the insulating base to the outer surface of the upper surface, such as the outer peripheral portion, the side surface, and the lower surface; The metallized layer and a metal frame made of a metal such as an iron-nickel-cobalt alloy or iron-nickel alloy brazed to the metallized layer are provided. Then, by joining a flat lid made of iron-nickel alloy or iron-nickel-cobalt alloy to the upper surface of the metal frame by resistance welding, the recess is closed and the electronic component is hermetically sealed.

この構成の絶縁基体の場合、絶縁基体の凹部に電子部品を収容するとともに電子部品の電極と配線導体とを電気的に接続した後、金属枠体上面に平板状の蓋体を載置し、この蓋体の外周部に抵抗溶接機の一対のローラー電極を接触させながら転動させるとともに、この一対のローラー電極間に溶接のための大電流を流し金属枠体と蓋体とを直接的に抵抗溶接することによって、内部に電子部品が気密に収納された製品としての電子装置となる。この電子装置は、配線導体のうち絶縁基体の外表面に導出された部位を外部電気回路に接続することにより外部電気回路基板に実装されて使用される。
特開2000−151332号公報 特開2000−134055号公報
In the case of the insulating base of this configuration, after storing the electronic component in the recess of the insulating base and electrically connecting the electrode of the electronic component and the wiring conductor, a flat lid is placed on the upper surface of the metal frame, The pair of roller electrodes of the resistance welding machine are rolled while contacting the outer periphery of the lid, and a large current for welding is passed between the pair of roller electrodes to directly connect the metal frame and the lid. By resistance welding, an electronic device as a product in which electronic components are hermetically housed is obtained. This electronic device is used by being mounted on an external electric circuit board by connecting a portion of the wiring conductor led to the outer surface of the insulating base to an external electric circuit.
JP 2000-151332 A JP 2000-134055 A

しかしながら、上記従来の絶縁基体および電子装置においては、
抵抗溶接時に1000℃程度の高い温度に熱せられるため、平板状の蓋体および絶縁基体の両方とも膨張して封止され、その後冷却に伴い鉄−ニッケル合金や鉄−ニッケル−コバルト合金から成る蓋体とセラミックスからなる絶縁基体との熱膨張係数(線膨張係数)の違いから生じる強い引っ張り応力(熱応力)が、金属枠体を介して絶縁基体に作用し、金属枠体が取着されている絶縁基体の側面にクラックが発生する問題があった。絶縁基体にクラックが生じると、電子部品の気密封止の信頼性が劣化してしまう。
However, in the above conventional insulating base and electronic device,
Because it is heated to a high temperature of about 1000 ° C. during resistance welding, both the flat lid and the insulating base are expanded and sealed, and then a lid made of iron-nickel alloy or iron-nickel-cobalt alloy with cooling. Strong tensile stress (thermal stress) resulting from the difference in thermal expansion coefficient (linear expansion coefficient) between the body and the insulating base made of ceramics acts on the insulating base via the metal frame, and the metal frame is attached There was a problem that cracks occurred on the side surfaces of the insulating substrate. If a crack occurs in the insulating substrate, the reliability of the hermetic sealing of the electronic component deteriorates.

特に、近年、電子装置の小型化にともない、絶縁基体の凹部を取り囲む枠部の厚さが薄くなり、機械的な強度が低くなる傾向にあることから、上記のような絶縁基体のクラックといった問題が発生しやすくなってきている。   In particular, with the recent downsizing of electronic devices, the thickness of the frame surrounding the concave portion of the insulating base tends to be thin and the mechanical strength tends to be low. Is becoming more likely to occur.

本発明は、上記従来の問題点に鑑みて完成されたものであり、その目的は、熱膨張係数が異なる蓋体と絶縁基体とが溶接等の手段で接合され、絶縁基体の凹部内に電子部品が気密封止されてなる電子装置において、絶縁基体にクラックの発生することのない気密封止の信頼性に優れた電子装置を提供することにある。   The present invention has been completed in view of the above-described conventional problems. The object of the present invention is to join a lid body having a different thermal expansion coefficient and an insulating base by means such as welding, and to form an electron in the recess of the insulating base. In an electronic device in which components are hermetically sealed, an object of the present invention is to provide an electronic device excellent in the reliability of hermetic sealing without causing cracks in an insulating substrate.

本発明の電子装置は、上面に電子部品が収容される凹部を有する絶縁基体と、該絶縁基体の上面に取着される金属枠体と、下面の外周部が前記金属枠体の上面に接合されて前記凹部を塞ぐ蓋体とを具備した電子装置であって、
前記蓋体は、前記金属枠体との接合部よりも内側に、該接合部に沿った屈曲部を有していることを特徴とするものである。
An electronic device according to the present invention includes an insulating base having a recess for accommodating an electronic component on the upper surface, a metal frame attached to the upper surface of the insulating base, and an outer peripheral portion of the lower surface joined to the upper surface of the metal frame. And an electronic device comprising a lid that closes the recess,
The lid has a bent portion along the joint inside the joint with the metal frame.

また、本発明の電子装置は好ましくは、前記屈曲部が、前記蓋体を平面視して、環状に設けられていることを特徴とするものである。   The electronic device of the present invention is preferably characterized in that the bent portion is provided in an annular shape when the lid is viewed in plan.

また、本発明の電子装置は好ましくは、前記屈曲部の平面視形状は、角部が丸みを帯びた矩形状であることを特徴とするものである。   In the electronic device of the present invention, it is preferable that the shape of the bent portion in plan view is a rectangular shape with rounded corners.

また、本発明の電子装置は好ましくは、前記蓋体の上面及び下面が、前記屈曲部の外側部位に比し内側部位で上方に配されていることを特徴とする。   In the electronic device according to the present invention, it is preferable that the upper surface and the lower surface of the lid body are arranged upward at the inner portion as compared with the outer portion of the bent portion.

また、本発明の電子装置は好ましくは、前記蓋体が、抵抗溶接にて前記金属枠体に接合されていることを特徴とするものである。   The electronic device of the present invention is preferably characterized in that the lid is joined to the metal frame by resistance welding.

また、本発明の電子装置は好ましくは、前記蓋体は、前記屈曲部の内側部位と外側部位との間に設けられる段差の大きさが、前記接合部上に位置する前記蓋体の厚みよりも大であることを特徴とするものである。   In the electronic device according to the present invention, preferably, the lid has a level difference between the inner portion and the outer portion of the bent portion, which is larger than the thickness of the lid member located on the joint portion. Is also large.

また、本発明の電子装置は好ましくは、前記蓋体の厚みが、前記金属枠体との接合部に比し前記屈曲部で薄いことを特徴とするものである。   The electronic device of the present invention is preferably characterized in that the lid body is thinner at the bent portion than at the joint portion with the metal frame.

また、本発明の電子装置は好ましくは、前記屈曲部は、前記蓋体が下側に突出して湾曲した形状であることを特徴とするものである。   In the electronic device of the present invention, it is preferable that the bent portion has a curved shape with the lid projecting downward.

また、本発明の電子装置は好ましくは、前記屈曲部は、電子部品を搭載した際、縦断面視にて、前記蓋体の前記金属枠体との接合部から電子部品の端部の延長線上と交差する部位の間に配置されることを特徴とするものである。   In the electronic device of the present invention, it is preferable that the bent portion is on an extension line of the end portion of the electronic component from the joint portion of the lid body with the metal frame body when the electronic component is mounted. It is arrange | positioned between the site | parts which cross | intersect.

また、本発明の電子装置は好ましくは、前記蓋体の前記金属枠体との接合面に、ニッケルめっき層が被着されていることを特徴とするものである。   Also, the electronic device of the present invention is preferably characterized in that a nickel plating layer is deposited on the joint surface of the lid with the metal frame.

また、本発明の電子装置は好ましくは、前記蓋体の下面にニッケルめっき層が被着されており、前記接合部に被着されるニッケルめっき層が、他の部分に被着されるニッケルめっき層よりも融点が低いことを特徴とするものである。   In the electronic device of the present invention, preferably, a nickel plating layer is deposited on the lower surface of the lid, and the nickel plating layer deposited on the joint is deposited on another portion. The melting point is lower than that of the layer.

本発明の電子装置によれば、上面に電子部品が収容される凹部を有する絶縁基体と、絶縁基体の上面に取着される金属枠体と、下面の外周部が金属枠体の上面に接合されて前記凹部を塞ぐ蓋体とを具備した電子装置であって、
蓋体は、前記金属枠体との接合部よりも内側に、接合部に沿った屈曲部を有していることから、蓋体と絶縁基体との熱膨張係数の違いから生じる、引っ張り応力は、屈曲部がたわむことにより効果的に吸収される。そのため、金属枠体および絶縁基体に大きな引っ張り応力が作用することを防ぐことができ、絶縁基体にクラックが発生する問題は、効果的に防ぐことができる。
According to the electronic device of the present invention, the insulating base having a recess for accommodating electronic components on the upper surface, the metal frame attached to the upper surface of the insulating base, and the outer peripheral portion of the lower surface are joined to the upper surface of the metal frame. And an electronic device comprising a lid that closes the recess,
Since the lid has a bent portion along the joint inside the joint with the metal frame, the tensile stress caused by the difference in thermal expansion coefficient between the lid and the insulating base is The bent portion is effectively absorbed by the bending. Therefore, it is possible to prevent a large tensile stress from acting on the metal frame and the insulating base, and it is possible to effectively prevent a problem that a crack occurs in the insulating base.

また、本発明の電子装置によれば、屈曲部が、蓋体を平面視して、環状に設けられていることにより、蓋体の接合時に、蓋体と絶縁基体の熱膨張差に起因する引っ張り応力が平面視で蓋体の全周にわたって、つまり、その蓋体が上面に接合される絶縁基体全面に分散され、絶縁基体のクラックはさらに効果的に防止されて、より信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the bent portion is provided in an annular shape in plan view of the lid body, which is caused by a difference in thermal expansion between the lid body and the insulating base when the lid body is joined. Tensile stress is distributed over the entire circumference of the lid in plan view, that is, the entire surface of the insulating substrate bonded to the upper surface, and cracks of the insulating substrate are further effectively prevented, resulting in more reliable electrons. Equipment can be provided.

また、本発明の電子装置によれば、屈曲部の平面視形状は、角部が丸みを帯びた矩形状であることにより、蓋体の接合時に、蓋体と絶縁基体の熱膨張差に起因する引っ張り応力が特に大きく作用しやすい蓋体の角部およびその周辺において、丸みの外縁に沿って応力が分散されるため、引っ張り応力が一点(角部)に集中することは効果的に防止され、より信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the planar view shape of the bent portion is due to the difference in thermal expansion between the lid body and the insulating base when the lid body is joined because the corner portion is a rounded rectangular shape. The stress is distributed along the outer edge of the rounded corner at and around the corner of the lid where the tensile stress is particularly likely to act. This effectively prevents the tensile stress from concentrating on one point (corner). A more reliable electronic device can be provided.

また、本発明の電子装置によれば、蓋体の上面及び下面が、屈曲部の外側部位に比し内側部位で上方に配されていることにより、蓋体の接合時に熱せられた凹部内のガスの温度が常温まで降下してきて収縮し、蓋体が外の大気圧に押されて凹部側に多少凹むように変形したとしても、蓋体の下面が、凹部に収容された電子部品や、例えば、電子部品を絶縁基体に形成された配線導体に接続する金属細線等の導電部に触れ、蓋体を介してこれらの導電部同士が電気的短絡を生じる、というような不具合を誘発することは効果的に防止され、より一層信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the upper surface and the lower surface of the lid body are arranged upward at the inner portion as compared with the outer portion of the bent portion, so that the inside of the concave portion heated at the time of joining the lid body. Even if the temperature of the gas drops to room temperature and contracts, and the lid body is pushed by the outside atmospheric pressure and deformed so as to be slightly recessed toward the recessed portion, the lower surface of the lid body is an electronic component housed in the recessed portion, For example, touching a conductive part such as a thin metal wire connecting an electronic component to a wiring conductor formed on an insulating base, and inducing a problem such that these conductive parts cause an electrical short circuit through the lid. Can be effectively prevented and a more reliable electronic device can be provided.

また、本発明の電子装置によれば、蓋体が、抵抗溶接にて金属枠体に接合されていることにより、気密封止の信頼性に優れた電子装置をより確実に提供できる。   Moreover, according to the electronic device of the present invention, the lid body is joined to the metal frame body by resistance welding, so that an electronic device excellent in the reliability of hermetic sealing can be provided more reliably.

また、本発明の電子装置によれば、蓋体は、屈曲部の内側部位と外側部位との間に設けられる段差の大きさが、接合部上に位置する蓋体の厚みよりも大であることにより、蓋体の接合時に熱せられた凹部内のガスの温度が常温まで降下してきて収縮し、蓋体が外の大気圧に押されて凹部側に多少凹むように変形したとしても、蓋体の下面が、凹部に収容された電子部品や、例えば、電子部品を絶縁基体に形成された配線導体に接続する金属細線等の導電部に触れ、蓋体を介してこれらの導電部同士が電気的短絡を生じる、というような不具合を誘発することは効果的に防止され、より一層信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the size of the step provided between the inner portion and the outer portion of the bent portion of the lid is larger than the thickness of the lid located on the joint portion. As a result, even if the temperature of the gas in the recesses heated at the time of joining of the lid body drops to normal temperature and contracts, and the lid body is pushed by the external atmospheric pressure and deformed to be slightly recessed toward the recess side, The lower surface of the body touches a conductive portion such as an electronic component housed in the recess, or a thin metal wire that connects the electronic component to a wiring conductor formed on the insulating base, and the conductive portions are connected to each other via the lid. Inducing a malfunction such as an electrical short circuit is effectively prevented, and an electronic device with higher reliability can be provided.

また、本発明の電子装置によれば、蓋体の厚みが、金属枠体との接合部に比し屈曲部で薄いことにより、金属枠体との接合の機械的な強度が必要な部位では蓋体を十分に厚くして接合の強度を確実に確保することができるとともに、比較的薄くたわみ易い屈曲部ではより一層効果的に引っ張り応力を吸収することができる。そのため、金属枠体が取着されている絶縁基体にクラックが発生する問題は、より効果的に防ぐことができる。   Further, according to the electronic device of the present invention, the thickness of the lid is thinner at the bent portion than at the joint with the metal frame, so that the mechanical strength of the joint with the metal frame is required. The lid can be made sufficiently thick to ensure the bonding strength, and the bending stress that is relatively thin and easily bent can absorb the tensile stress more effectively. Therefore, the problem that cracks are generated in the insulating substrate to which the metal frame is attached can be prevented more effectively.

また、本発明の電子装置によれば、屈曲部3bは、蓋体3が下側にU字状に湾曲して形成されていることにより、抵抗溶接にともない、蓋体や金属枠体の金属成分が溶融して飛散しても、その飛散物は、U字状の屈曲部の枠体側の側面に付着するので、凹部内に入り込むことが抑制される。そのため、飛散物が電子部品に付着して動作不良や電気的な短絡等の不具合を誘発することが効果的に防止される、より信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the bent portion 3b is formed by bending the lid 3 in a U-shape on the lower side, so that the metal of the lid or the metal frame is accompanied by resistance welding. Even if the component melts and scatters, the scattered matter adheres to the side surface of the U-shaped bent portion on the frame body side, so that entry into the recess is suppressed. Therefore, it is possible to provide a more reliable electronic device that effectively prevents the scattered matter from adhering to the electronic component and inducing malfunctions such as malfunctions and electrical shorts.

屈曲部は、蓋体が下側に突出して湾曲した形状である場合でも、蓋体と絶縁基体との熱膨張係数の違いから生じる、引っ張り応力は、屈曲部がたわむことにより効果的に吸収することができ、絶縁基体にクラックが発生する問題は効果的に防止される。   Even when the bent portion has a curved shape with the lid projecting downward, the tensile stress resulting from the difference in thermal expansion coefficient between the lid and the insulating base is effectively absorbed by the bending portion being bent. The problem of cracking in the insulating substrate can be effectively prevented.

また、本発明の電子装置によれば、屈曲部は、電子部品を搭載した際、縦断面視(絶縁基体1と直交する縦断面、以下同意)にて、蓋体の金属枠体との接合部から電子部品の端部の延長線上と交差する部位の間に配置されていることから、接合部と電子部品との間に屈曲部が位置し、溶融した飛散物が電子部品に飛散することはよりいっそう効果的に防ぐことができ、更により信頼性の高い電子装置を提供できる。   According to the electronic device of the present invention, when the electronic part is mounted, the bent portion is joined to the metal frame of the lid body in a longitudinal sectional view (a longitudinal section orthogonal to the insulating base body 1, hereinafter agreed). Between the joint and the part that intersects the extension line of the end of the electronic component, the bent portion is located between the joint and the electronic component, and the molten scattered matter scatters to the electronic component. Can be prevented more effectively, and a more reliable electronic device can be provided.

また、本発明の電子装置によれば、蓋体の金属枠体との接合面に、ニッケルめっき層が被着されていることから、蓋体と金属枠体を接合する溶接抵抗時に、ニッケルめっき層が溶融し、接合を容易に行うことができる。ニッケルめっき層は、鉄−ニッケル合金や鉄−ニッケル−コバルト合金(融点、1449℃)に比べて、融点が約800〜1000℃程度と低いので低い温度で溶接できる。そのため、抵抗溶接時の熱により絶縁基体と金属枠体との間に熱応力が生じて金属枠体が剥がれる絶縁基体に機械的な破壊が生じる等の不具合は抑制され、より信頼性の高い電子装置を提供できる。   In addition, according to the electronic device of the present invention, since the nickel plating layer is deposited on the joint surface of the lid with the metal frame, the nickel plating is applied at the time of welding resistance for joining the lid and the metal frame. The layers melt and can be joined easily. Since the nickel plating layer has a melting point as low as about 800 to 1000 ° C. as compared with an iron-nickel alloy or iron-nickel-cobalt alloy (melting point, 1449 ° C.), it can be welded at a low temperature. For this reason, defects such as mechanical damage to the insulating substrate where the thermal stress is generated between the insulating substrate and the metal frame due to heat during resistance welding and the metal frame is peeled off are suppressed, and more reliable electrons Equipment can be provided.

また、本発明の電子装置によれば、蓋体の下面にニッケルめっき層が被着されており、接合部に被着されるニッケルめっき層が、他の部分に被着されるニッケルめっき層よりも融点が低いことから、蓋体と金属枠体を接合する溶接抵抗時に、蓋体の接合部のニッケルめっきだけが溶融し、他の部分のニッケルめっきは溶融しないようにする溶接抵抗が可能となり、他の部分のニッケルめっきが溶融し、電子部品に飛散することのない、より信頼性の高い電子装置を提供できる。   Further, according to the electronic device of the present invention, the nickel plating layer is deposited on the lower surface of the lid, and the nickel plating layer deposited on the joint is more than the nickel plating layer deposited on the other portion. However, since the melting point is low, it is possible to weld resistance so that only the nickel plating of the joint of the lid melts and the nickel plating of other parts does not melt when welding resistance to join the lid to the metal frame. It is possible to provide a more reliable electronic device in which the nickel plating of other portions is not melted and scattered in the electronic component.

また、蓋体の下面にニッケルめっき層が被着されているため、蓋体の下面側の電気抵抗が下がって電流が流れ易くなり、抵抗溶接がより容易、かつ確実に行なえる。   In addition, since the nickel plating layer is deposited on the lower surface of the lid, the electric resistance on the lower surface side of the lid is lowered, current flows easily, and resistance welding can be performed more easily and reliably.

また、絶縁基体と直交する縦断面視にて、蓋体と枠体の接合部より下側に位置する屈曲部の側面、特には枠体側の側面は、ニッケルめっき層が被着されるため、飛散物(主に、接合部に被着される融点の低いニッケル)がより容易かつ強固に付着する。そのため、電子装置の信頼性が向上する。   In addition, in a longitudinal cross-sectional view orthogonal to the insulating base, the side surface of the bent portion located below the joint portion of the lid body and the frame body, in particular, the side surface on the frame body side is coated with the nickel plating layer, Scattered matter (mainly nickel having a low melting point deposited on the joint) adheres more easily and firmly. Therefore, the reliability of the electronic device is improved.

本発明の電子装置を添付の図面を基に説明する。図1は本発明の電子装置9の実施の形態の一例を示す断面図である。   The electronic device of the present invention will be described with reference to the accompanying drawings. FIG. 1 is a sectional view showing an example of an embodiment of an electronic device 9 of the present invention.

図1において、1は絶縁基体、2は金属枠体、3は蓋体である。   In FIG. 1, 1 is an insulating substrate, 2 is a metal frame, and 3 is a lid.

絶縁基体1の上面の凹部4に電子部品5を収容するとともに、金属枠体2の上面に蓋体3を接合して電子部品5を気密封止することにより電子装置9が基本的に構成される。   The electronic device 5 is basically configured by housing the electronic component 5 in the concave portion 4 on the upper surface of the insulating base 1 and joining the lid 3 to the upper surface of the metal frame 2 to hermetically seal the electronic component 5. The

絶縁基体1は、例えば直方体状で、上面に電子部品5を搭載する凹部4が形成されており、酸化アルミニウム質焼結体やガラスセラミックス、窒化アルミニウム質焼結体、ムライト質焼結体等の絶縁材料により形成される。絶縁基体1は、例えば酸化アルミニウム質焼結体から成る場合、酸化アルミニウム,酸化珪素,酸化マグネシウム,酸化カルシウム等の原料粉末に適当な有機バインダー,溶剤を添加混合して泥漿状となし、これを従来周知のドクターブレード法によりシート状とすることによって絶縁基体1用のセラミックグリーンシートを複数枚作製し、しかる後、このセラミックグリーンシートの一部に適当な打ち抜き加工を施して枠状とするとともに、枠状のセラミックグリーンシートが上層に位置するようにして上下に積層し、1600℃程度の高温で焼成することによって製作される。   The insulating substrate 1 has, for example, a rectangular parallelepiped shape and is provided with a concave portion 4 on which an electronic component 5 is mounted on the upper surface, such as an aluminum oxide sintered body, a glass ceramic, an aluminum nitride sintered body, and a mullite sintered body. It is formed of an insulating material. When the insulating substrate 1 is made of, for example, an aluminum oxide sintered body, an appropriate organic binder and solvent are added to and mixed with raw material powders such as aluminum oxide, silicon oxide, magnesium oxide, and calcium oxide to form a slurry. A plurality of ceramic green sheets for the insulating substrate 1 are produced by forming into a sheet shape by a conventionally known doctor blade method, and then a suitable punching process is performed on a part of the ceramic green sheet to form a frame shape. The frame-shaped ceramic green sheets are stacked one above the other so that they are positioned in the upper layer, and are fired at a high temperature of about 1600 ° C.

凹部4に搭載される電子部品5は、IC,LSI等の半導体集積回路素子、LD(半導体レーザ)、LED(発光ダイオード)、PD(フォトダイオード)、CCD、ラインセンサ、イメージセンサ等の光半導体素子、圧電振動子、水晶振動子等の振動子、その他の種々の電子部品である。   The electronic component 5 mounted in the recess 4 is an optical semiconductor such as a semiconductor integrated circuit element such as an IC or LSI, an LD (semiconductor laser), an LED (light emitting diode), a PD (photodiode), a CCD, a line sensor, or an image sensor. These are elements, piezoelectric vibrators, vibrators such as crystal vibrators, and other various electronic components.

絶縁基体1は、凹部4の内側から外面(上面の外周部や側面、下面等)にかけて配線導体6が導出されている。   In the insulating base 1, the wiring conductor 6 is led out from the inner side of the recess 4 to the outer surface (the outer peripheral portion of the upper surface, the side surface, the lower surface, etc.).

配線導体6は、凹部4に収容される電子部品5を絶縁基体の外面に導出する導電路として機能する。凹部4内に収容された電子部品5の電極(図示せず)を配線導体6のうち凹部4に露出した部位にボンディングワイヤ(金属細線)8や半田(図示せず)等を介して電気的に接続することにより、配線導体6を介して電子部品5の電極が絶縁基体1の外面に導出される。   The wiring conductor 6 functions as a conductive path that leads the electronic component 5 accommodated in the recess 4 to the outer surface of the insulating base. An electrode (not shown) of the electronic component 5 accommodated in the recess 4 is electrically connected to a portion of the wiring conductor 6 exposed to the recess 4 via a bonding wire (metal thin wire) 8 or solder (not shown). By connecting to, the electrode of the electronic component 5 is led out to the outer surface of the insulating substrate 1 through the wiring conductor 6.

配線導体6は、タングステン、モリブデン、マンガン、銅、銀、金等の金属材料からなり、例えばタングステンから成る場合、タングステン粉末に適当な有機バインダー、溶剤を添加混合して得たタングステンペーストを、絶縁基体1となるセラミックグリーンシートに従来周知のスクリーン印刷法により所定パターンに印刷塗布し、これを絶縁基体1となるセラミックグリーンシートとともに焼成することによって、所定のパターンに被着形成される。   The wiring conductor 6 is made of a metal material such as tungsten, molybdenum, manganese, copper, silver, or gold. For example, when it is made of tungsten, the tungsten paste obtained by adding and mixing an appropriate organic binder and solvent to tungsten powder is insulated. The ceramic green sheet to be the base 1 is printed and applied in a predetermined pattern by a well-known screen printing method, and is fired together with the ceramic green sheet to be the insulating base 1 to form a predetermined pattern.

なお、電子部品5の電極を凹部の外側(絶縁基体1の外面)に導出する手段は、配線導体6に限らず、金属製の端子やビア導体等の手段でもよく、また、これらの手段を併用してもよい。   The means for leading the electrode of the electronic component 5 to the outside of the recess (the outer surface of the insulating base 1) is not limited to the wiring conductor 6, and may be a means such as a metal terminal or a via conductor. You may use together.

また、絶縁基体1は、上面に凹部4を取り囲むようにして枠状のメタライズ層7が形成されている。このメタライズ層7に鉄−ニッケル−コバルト合金等の金属材料から成る金属枠体2が、銀ロウ等のロウ材(図示せず)を介してロウ付けされ接合されている。   The insulating base 1 has a frame-like metallized layer 7 formed on the upper surface so as to surround the recess 4. A metal frame 2 made of a metal material such as iron-nickel-cobalt alloy is brazed and joined to the metallized layer 7 via a brazing material (not shown) such as silver brazing.

また、金属枠体2に、鉄−ニッケル合金や鉄−ニッケル−コバルト合金等の金属材料から成る蓋体3を抵抗溶接や電子ビーム溶接、ロウ付け等の接合手段で接合することにより、凹部4が蓋体3で塞がれ、絶縁基体1と金属枠体2と蓋体3とから成る容器の内部に電子部品5が気密封止される。   Also, the lid 4 made of a metal material such as iron-nickel alloy or iron-nickel-cobalt alloy is joined to the metal frame 2 by joining means such as resistance welding, electron beam welding, brazing, etc. Is closed with the lid 3, and the electronic component 5 is hermetically sealed inside the container formed of the insulating base 1, the metal frame 2, and the lid 3.

なお、メタライズ層7は金属枠体2をロウ付けするための下地金属層として機能し、配線導体6と同様の金属材料により形成することができる。メタライズ層7は、例えばタングステンから成る場合、タングステン粉末に適当な有機バインダー,溶剤を添加混合して得たタングステンペーストを、絶縁基体1となるセラミックグリーンシートの凹部4を取り囲む部位、つまり最上層となる枠状のセラミックグリーンシートの上面にスクリーン印刷法により枠状のパターンに印刷塗布しておくことによって形成される。   The metallized layer 7 functions as a base metal layer for brazing the metal frame 2 and can be formed of the same metal material as the wiring conductor 6. When the metallized layer 7 is made of tungsten, for example, a tungsten paste obtained by adding and mixing an appropriate organic binder and solvent to the tungsten powder is used to surround a portion surrounding the concave portion 4 of the ceramic green sheet serving as the insulating base 1, that is, the uppermost layer. It is formed by printing and applying a frame-shaped pattern on the upper surface of the frame-shaped ceramic green sheet.

また、金属枠体2は、例えば鉄−ニッケル−コバルト合金からなる場合、鉄−ニッケル−コバルト合金の板材に適当な圧延加工や打抜き加工、エッチング加工等の加工を施すことにより形成される。   Further, when the metal frame 2 is made of, for example, an iron-nickel-cobalt alloy, the metal frame 2 is formed by subjecting a plate material of the iron-nickel-cobalt alloy to suitable rolling, punching, etching, or the like.

金属枠体2の形状は例えば、内周が矩形状の四角枠状である。これにより、半導体集積回路素子や圧電振動子等の一般に直方体状である電子部品7を無駄なスペースを取ることなく効率よく取り囲むものとなる。この場合、金属枠体2は、各角部が円弧状に面取りされて角部で欠け等が生じることを防止することが好ましい。   The shape of the metal frame 2 is, for example, a rectangular frame shape with a rectangular inner periphery. As a result, the electronic component 7 that is generally a rectangular parallelepiped, such as a semiconductor integrated circuit element or a piezoelectric vibrator, can be efficiently surrounded without taking a useless space. In this case, it is preferable that the metal frame 2 prevent each corner from being chamfered in an arc shape to cause chipping or the like at the corner.

また、金属枠体4のメタライズ層7に対するロウ付けは、メタライズ層7と金属枠体4の下面との間に銀ロウ等のロウ材(ロウ材のプレフォーム等)を介在させておき、ロウ材を加熱溶融させて接合することにより行なわれる。   Also, the brazing of the metal frame 4 to the metallized layer 7 is performed by interposing a brazing material such as silver brazing (preform of brazing material) between the metallized layer 7 and the lower surface of the metal frame 4. It is carried out by melting and joining the materials.

そして、絶縁基体1の凹部4に電子部品5を搭載するとともにその電極を配線導体6に電気的に接続し、その後、金属枠体2の上面に蓋体3を抵抗溶接や電子ビーム溶接、ロウ付け等の接合手段により接合して電子部品5を気密封止することにより、電子装置9が構成される。   Then, the electronic component 5 is mounted in the concave portion 4 of the insulating base 1 and the electrode is electrically connected to the wiring conductor 6. Thereafter, the lid 3 is attached to the upper surface of the metal frame 2 by resistance welding, electron beam welding, brazing, or the like. The electronic device 9 is configured by hermetically sealing the electronic component 5 by joining with a joining means such as attaching.

蓋体3は、上述のような接合手段で金属枠体2と接合されるため、鉄−ニッケル−コバルト合金や鉄−ニッケル合金等の金属材料により形成される。   Since the lid 3 is joined to the metal frame 2 by the joining means as described above, the lid 3 is formed of a metal material such as an iron-nickel-cobalt alloy or an iron-nickel alloy.

蓋体3は、凹部4を塞ぐのに適した平面視形状で形成される。例えば、凹部4が、直方体状の電子部品の収容に適した矩形状に形成される場合、蓋体3は、平面視で矩形状に形成される。   The lid 3 is formed in a plan view shape suitable for closing the recess 4. For example, when the recessed part 4 is formed in the rectangular shape suitable for accommodation of a rectangular parallelepiped electronic component, the cover body 3 is formed in a rectangular shape in plan view.

また、蓋体3は、その外周縁が金属枠体2の外周縁よりも内側に位置するようにして形成されることが好ましい。この場合、金属枠体2と蓋体2との接合部の外側に、溶接金属やロウ材のフィレットが形成され、接合をより強固なものとすることができる。   Moreover, it is preferable that the cover body 3 is formed so that the outer peripheral edge is located inside the outer peripheral edge of the metal frame 2. In this case, a weld metal or braze fillet is formed on the outer side of the joint between the metal frame 2 and the lid 2 so that the joint can be made stronger.

本発明の電子装置9において、図1に示すように、蓋体3は、金属枠体2との接合部3aよりも内側に、接合部3aに沿った屈曲部3bを有している。   In the electronic device 9 of the present invention, as shown in FIG. 1, the lid 3 has a bent portion 3 b along the joint portion 3 a on the inner side of the joint portion 3 a with the metal frame 2.

本構成により、金属枠体2の上面に蓋体3を、例えば抵抗溶接により接合して電子部品5を気密封止する工程において、抵抗溶接時に1000℃程度の高い温度に熱せられ、その後冷却に伴い蓋体3と絶縁基体1との熱膨張係数の違いから生じる引っ張り応力は、屈曲部3bがたわむことにより効果的に吸収される。そのため、金属枠体2および絶縁基体に大きな引っ張り応力が作用することを防ぐことができ、絶縁基体1にクラックが発生する問題は、効果的に防ぐことができる。   With this configuration, the lid 3 is joined to the upper surface of the metal frame 2 by, for example, resistance welding, and the electronic component 5 is hermetically sealed, and is heated to a high temperature of about 1000 ° C. during resistance welding, and then cooled. Along with this, the tensile stress resulting from the difference in thermal expansion coefficient between the lid 3 and the insulating base 1 is effectively absorbed by the bending portion 3b being bent. Therefore, it is possible to prevent a large tensile stress from acting on the metal frame 2 and the insulating base, and it is possible to effectively prevent the problem that the insulating base 1 is cracked.

屈曲部3bを有する蓋体3は、例えば鉄−ニッケル−コバルト合金の板材に、打抜き加工等の切断加工を施して所定の寸法に形成するとともに、プレス加工方式で一部を屈曲させて屈曲部を形成することにより製作することができる。   The lid 3 having the bent portion 3b is formed into a predetermined size by subjecting a plate material of, for example, an iron-nickel-cobalt alloy to a cutting process such as punching, and a bent portion by bending a part thereof by a press working method. Can be manufactured.

屈曲部3bは、蓋体3と絶縁基体1との間に生じる引っ張り応力を効果的に吸収するために、応力の起点となる部位である、蓋体3と金属枠体2との接合部の内側に、接合部に沿わせて形成する必要がある。   In order to effectively absorb the tensile stress generated between the lid 3 and the insulating base 1, the bent portion 3b is a portion of the joint between the lid 3 and the metal frame 2 that is a starting point of stress. It is necessary to form inside along the joint.

なお、屈曲部3bは、電子部品5の電極や金属細線8と接触して隣接する電極間を電気的に短絡させるような不具合を防止するために、凹部4と反対側(上側)に向かって屈曲した形状とする。   The bent portion 3b is directed toward the side opposite to the concave portion 4 (upper side) in order to prevent a problem in which the electrodes adjacent to the electronic component 5 and the fine metal wires 8 are brought into electrical short circuit. A bent shape.

また、屈曲の形態は、図示したような一段のみに限らず、複数段に屈曲しているものでもよい。また、屈曲部3bの表面が曲面状でもよい。   Further, the form of bending is not limited to one stage as shown in the figure, and may be bent in a plurality of stages. Further, the surface of the bent portion 3b may be curved.

また、屈曲部3bは、引っ張り応力を吸収する上では、蓋体3と金属枠体2との接合部に近い部位に位置することが好ましい。ただし、屈曲部3bを接合部に近づけ過ぎると、蓋体3の接合時に屈曲部3bが接合部に重ならないように位置合わせすることが難しくなり、電子装置としての生産性が低下したり、気密封止の信頼性がかえって低下したりするおそれがある。従って、屈曲部3bは、平面視で、その内側部位が電子部品5の外周部に接する程度の位置であることが好ましい。   Moreover, it is preferable that the bending part 3b is located in the site | part close | similar to the junction part of the cover body 3 and the metal frame 2, when absorbing tensile stress. However, if the bent portion 3b is too close to the joint portion, it is difficult to align the bent portion 3b so that it does not overlap the joint portion when the lid body 3 is joined. The reliability of hermetic sealing may be lowered. Therefore, the bent portion 3 b is preferably at a position where the inner portion thereof is in contact with the outer peripheral portion of the electronic component 5 in plan view.

また、図2に示すように、本発明の電子装置9において、屈曲部3bが、蓋体3を平面視して、環状に設けられていることが好ましい。この場合、蓋体3と絶縁基体1の熱膨張差に起因する引っ張り応力が平面視で蓋体3の全周にわたって、つまりその蓋体3が上面に接合される絶縁基体1全面に分散され、絶縁基体1のクラックはさらに効果的に防止されて、より信頼性の高い電子装置9を提供できる。なお、図2は、図1に示す電子装置の上面図である。図2において図1と同じ部位には同じ符号を付している。   As shown in FIG. 2, in the electronic device 9 of the present invention, the bent portion 3 b is preferably provided in an annular shape when the lid 3 is viewed in plan. In this case, the tensile stress due to the thermal expansion difference between the lid 3 and the insulating base 1 is dispersed over the entire circumference of the lid 3 in plan view, that is, over the entire insulating base 1 where the lid 3 is joined to the upper surface, Cracks in the insulating substrate 1 are further effectively prevented, and a more reliable electronic device 9 can be provided. 2 is a top view of the electronic device shown in FIG. In FIG. 2, the same parts as those in FIG.

また、本発明の電子装置9において、屈曲部3bの平面視形状は、角部が丸みを帯びた矩形状であることが好ましい。この場合、蓋体3の接合時に、蓋体3と絶縁基体1の熱膨張差に起因する引っ張り応力が特に大きく作用しやすい蓋体3の角部およびその周辺において、丸みの外縁に沿って応力が分散されるため、引っ張り応力が一点(角部)に集中することは効果的に防止され、より信頼性の高い電子装置9を提供できる。   Moreover, in the electronic device 9 of the present invention, the planar view shape of the bent portion 3b is preferably a rectangular shape with rounded corners. In this case, when the lid 3 is joined, the stress along the outer edge of the round is formed at and around the corner of the lid 3 where the tensile stress caused by the difference in thermal expansion between the lid 3 and the insulating base 1 is particularly large. Therefore, it is possible to effectively prevent the tensile stress from concentrating on one point (corner) and to provide the electronic device 9 with higher reliability.

上記丸みは、例えば、蓋体3が平面視で矩形状の場合に屈曲部3bの外縁を接線とする円弧状等である。   The roundness is, for example, an arc shape having the outer edge of the bent portion 3b as a tangent when the lid 3 is rectangular in plan view.

さらにまた、本発明の電子装置9において、蓋体3の上面及び下面が、屈曲部3bの外側部位に比し内側部位で上方に配されていることが好ましい。この構成により、蓋体の接合時に熱せられた凹部4内のガスの温度が常温まで降下してきて収縮し、蓋体3が外の大気圧に押されて凹部側に多少凹むように変形したとしても、蓋体の下面が、凹部4に収容された電子部品5や、例えば、電子部品を絶縁基体1に形成された配線導体6に接続する金属細線8等の導電部に触れ、蓋体を介してこれらの導電部同士が電気的短絡を生じる、というような不具合を誘発することは効果的に防止され、より一層信頼性の高い電子装置9を提供できる。   Furthermore, in the electronic device 9 of the present invention, it is preferable that the upper surface and the lower surface of the lid body 3 are arranged upward at the inner portion as compared with the outer portion of the bent portion 3b. With this configuration, it is assumed that the temperature of the gas in the recess 4 heated when the lid is joined is lowered to normal temperature and contracts, and the lid 3 is pushed by the outside atmospheric pressure and deformed so as to be slightly recessed toward the recess. In addition, the lower surface of the lid touches the conductive part such as the electronic component 5 housed in the recess 4 or the fine metal wire 8 that connects the electronic component to the wiring conductor 6 formed on the insulating base 1, for example. Thus, it is possible to effectively prevent an inconvenience such that an electrical short circuit occurs between these conductive parts, and the electronic device 9 having higher reliability can be provided.

さらにまた、本発明の電子装置9において、蓋体3が、抵抗溶接にて金属枠体2に接合されていることが好ましい。この構成により、気密封止の信頼性に優れた電子装置9をより確実に提供できる。   Furthermore, in the electronic device 9 of the present invention, the lid 3 is preferably joined to the metal frame 2 by resistance welding. With this configuration, it is possible to more reliably provide the electronic device 9 having excellent hermetic sealing reliability.

蓋体3を金属枠体2に抵抗溶接で接合する場合、蓋体の表面のうち、少なくとも金属枠体2に接合される部位に、ニッケル等の蓋体よりも融点の低い金属層をめっき法等の手段で被着させて、抵抗溶接をより容易に行なえるようにしてもよい。   When the lid 3 is joined to the metal frame 2 by resistance welding, a metal layer having a melting point lower than that of the lid, such as nickel, is plated on at least a portion of the surface of the lid that is joined to the metal frame 2 For example, the resistance welding may be performed more easily.

さらにまた、本発明の電子装置9において、蓋体3は、屈曲部3bの内側部位と外側部位との間に設けられる段差の大きさが、接合部3a上に位置する蓋体3の厚みよりも大であることが好ましい。この構成により、蓋体3の接合時に熱せられた凹部4内のガスの温度が常温まで降下してきて収縮し、蓋体3が外の大気圧に押されて凹部側に多少凹むように変形したとしても、蓋体3の下面が、凹部4に収容された電子部品5や、例えば、電子部品5を絶縁基体1に形成された配線導体6に接続する金属細線8等の導電部に触れ、蓋体を介してこれらの導電部同士が電気的短絡を生じる、というような不具合を誘発することは効果的に防止され、より一層信頼性の高い電子装置9を提供できる。   Furthermore, in the electronic device 9 according to the present invention, the lid 3 has a level difference between the inner portion and the outer portion of the bent portion 3b that is larger than the thickness of the lid 3 located on the joint portion 3a. Is also preferably large. With this configuration, the temperature of the gas in the recess 4 heated during the bonding of the lid body 3 drops to normal temperature and contracts, and the lid body 3 is pushed by the outside atmospheric pressure and deformed to be slightly recessed toward the recess side. Even so, the lower surface of the lid 3 touches the conductive part such as the electronic component 5 housed in the recess 4 or, for example, the metal thin wire 8 that connects the electronic component 5 to the wiring conductor 6 formed on the insulating base 1, It is possible to effectively prevent such a problem that the conductive parts cause an electrical short circuit through the lid, and the electronic device 9 with higher reliability can be provided.

つまり、蓋体3の厚みは、例えば抵抗溶接による接合強度の確保を考慮すれば0.1mm程度が好ましく、この場合、段差の大きさは、0.15mm〜0.4mm程度が好ましい。   That is, the thickness of the lid 3 is preferably about 0.1 mm in consideration of securing the bonding strength by resistance welding, for example, and in this case, the size of the step is preferably about 0.15 mm to 0.4 mm.

さらにまた、本発明の電子装置9において、蓋体3の厚みが、金属枠体2との接合部2aに比し屈曲部2bで薄いことが好ましい。この構成により、金属枠体2との接合の機械的な強度が必要な部位では蓋体3を十分に厚くして接合の強度を確実に確保することができるとともに、比較的薄くたわみ易い屈曲部3bではより一層効果的に引っ張り応力を吸収することができる。そのため、金属枠体2が取着されている絶縁基体1にクラックが発生する問題は、より効果的に防ぐことができる。   Furthermore, in the electronic device 9 of the present invention, it is preferable that the thickness of the lid 3 is thinner at the bent portion 2b than the joint 2a with the metal frame 2. With this configuration, the lid 3 can be made sufficiently thick at portions where mechanical strength for joining with the metal frame 2 is required to ensure the joining strength, and the bending portion is relatively thin and easily bent. In 3b, the tensile stress can be absorbed more effectively. Therefore, the problem that cracks occur in the insulating substrate 1 to which the metal frame 2 is attached can be more effectively prevented.

つまり、蓋体3の厚みが0.1mmの場合、屈曲部2bの厚みは0.08mm程度が好ましい。これは、蓋体3を加工するプレス金型の屈曲部2bに接する部分の隙間を他の部位の隙間より、狭くしておく方法により得られる。   That is, when the thickness of the lid 3 is 0.1 mm, the thickness of the bent portion 2b is preferably about 0.08 mm. This can be obtained by a method in which the gap in the portion in contact with the bent portion 2b of the press mold for processing the lid 3 is made narrower than the gap in other portions.

本発明の電子装置について、別の実施形態の一例を図3に示す。   An example of another embodiment of the electronic device of the present invention is shown in FIG.

図3は、本発明の電子装置9の他の実施形態を示す断面図であり、図1および図2と同じ部位には同じ符号を付している。   FIG. 3 is a cross-sectional view showing another embodiment of the electronic device 9 of the present invention, and the same parts as those in FIGS. 1 and 2 are denoted by the same reference numerals.

この電子装置9において、屈曲部3bは、蓋体3が下側に突出して湾曲した形状である。他の部位については、図1および図2を基に説明した実施形態と同様である。   In the electronic device 9, the bent portion 3b has a shape in which the lid body 3 protrudes downward and is curved. Other parts are the same as those described with reference to FIGS. 1 and 2.

蓋体3が下側に突出して湾曲した形状である屈曲部3bが形成されていることにより、抵抗溶接にともない、蓋体3や金属枠体2の金属成分が溶融して飛散しても、その飛散物は、屈曲部3bの枠体側の側面に付着するので、凹部4内に入り込むことが抑制される。そのため、飛散物(飛散する金属等)が電子部品5に付着して動作不良や電気的な短絡等の不具合を誘発することが効果的に防止される、より信頼性の高い電子装置9を提供できる。   By forming the bent portion 3b having a curved shape with the lid 3 protruding downward, even if resistance welding, the metal components of the lid 3 and the metal frame 2 are melted and scattered, Since the scattered matter adheres to the side surface of the bent portion 3b on the frame body side, entry into the concave portion 4 is suppressed. Therefore, it is possible to provide a highly reliable electronic device 9 that effectively prevents scattered objects (such as scattered metal) from adhering to the electronic component 5 to induce malfunctions such as malfunctions and electrical shorts. it can.

なお、屈曲部3bは、蓋体3が下側に突出して湾曲した形状である場合でも、蓋体3と絶縁基体1との熱膨張係数の違いから生じる、引っ張り応力は、屈曲部3bがたわむことにより効果的に吸収することができ、絶縁基体1にクラックが発生する問題は効果的に防止される。   Even when the bent portion 3b has a curved shape in which the lid 3 protrudes downward, the bent portion 3b bends due to the tensile stress caused by the difference in thermal expansion coefficient between the lid 3 and the insulating base 1. Therefore, the problem of cracks occurring in the insulating substrate 1 can be effectively prevented.

このように、蓋体3を下側に突出して湾曲した形状である屈曲部3bを作製するには、機械的な曲げ加工やプレス加工等の加工を施して、蓋体3を部分的に曲げること等の方法を用いることができる。   Thus, in order to produce the bent portion 3b having a curved shape by protruding the lid 3 downward, the lid 3 is partially bent by performing a mechanical bending process or a pressing process. Such a method can be used.

なお、屈曲部3bは、平面視にて、電子部品5を取り囲む枠状や環状に配置されることにより、飛散物の電子部品5への付着の防止をより確実に防止することができる。   In addition, the bending part 3b can prevent more reliably prevention of the adhering to the electronic component 5 of a scattered matter by arrange | positioning in the frame shape and cyclic | annular form which surround the electronic component 5 by planar view.

また、この屈曲部3bは、縦断面視にて、U字型、V字型等の、突出して湾曲した形状であればよく、加工に用いる装置の形状や精度等に応じて、本発明の効果を損なわない範囲で、側面が傾斜したり湾曲したりしているものでもよい。また、先端を挟む両側面の形状が異なっているようなものでもよい。   In addition, the bent portion 3b may be a protruding and curved shape such as a U-shape or a V-shape in a longitudinal sectional view, and according to the shape and accuracy of the apparatus used for processing, As long as the effect is not impaired, the side surface may be inclined or curved. Further, the shape of both side surfaces sandwiching the tip may be different.

また、本発明の電子装置9において、屈曲部3bは、電子部品5を搭載した際、縦断面視にて、蓋体3の金属枠体2との接合部から電子部品5の端部の延長線上と交差する部位の間に配置されていることから、接合部と電子部品5との間に屈曲部3bが位置し、溶融しためっきが電子部品5に飛散することはよりいっそう効果的に防ぐことができ、更により信頼性の高い電子装置9を提供できる。   Further, in the electronic device 9 of the present invention, when the electronic component 5 is mounted, the bent portion 3b is an extension of the end of the electronic component 5 from the joint portion of the lid 3 with the metal frame 2 in a longitudinal sectional view. Since it is arrange | positioned between the site | parts which cross | intersect on a line | wire, the bending part 3b is located between a junction part and the electronic component 5, and it prevents the molten metal plating to the electronic component 5 more effectively. In addition, the electronic device 9 with higher reliability can be provided.

また、本発明の電子装置9において、蓋体3の金属枠体2との接合面(符号なし)に、ニッケルめっき層(図示せず)が被着されていることから、蓋体3と金属枠体2を接合する溶接抵抗時に、ニッケルめっきが溶融し、接合を容易に行うことができる。ニッケルめっき層は、鉄−ニッケル合金や鉄−ニッケル−コバルト合金(融点、1449℃)に比べて、融点が約800〜1000℃程度と低いので低い温度で溶接できる。そのため、抵抗溶接時の熱により絶縁基体1と金属枠体2との間に熱応力が生じて、金属枠体2が剥がれる、絶縁基体1に機械的な破壊が生じる等の不具合は抑制され、より信頼性の高い電子装置9を提供できる。   Further, in the electronic device 9 of the present invention, since the nickel plating layer (not shown) is attached to the joint surface (not indicated) of the lid 3 with the metal frame 2, the lid 3 and the metal At the time of welding resistance for joining the frame body 2, the nickel plating is melted and joining can be performed easily. Since the nickel plating layer has a melting point as low as about 800 to 1000 ° C. as compared with an iron-nickel alloy or iron-nickel-cobalt alloy (melting point, 1449 ° C.), it can be welded at a low temperature. Therefore, a heat stress is generated between the insulating base 1 and the metal frame 2 due to heat at the time of resistance welding, and problems such as peeling of the metal frame 2 and mechanical breakdown of the insulating base 1 are suppressed. The electronic device 9 with higher reliability can be provided.

ニッケルめっき層は、無電解めっき法や電解めっき法等のめっき法により、蓋体3の金属枠体2との接合面に被着させることができる。   The nickel plating layer can be applied to the joint surface of the lid 3 with the metal frame 2 by a plating method such as an electroless plating method or an electrolytic plating method.

例えば、無電解めっき法の場合であれば、硫酸ニッケル等のニッケル源と、次亜リン酸等のリン系の還元剤とを主成分として含有する無電解ニッケルめっき液に蓋体3(ロウ付けする前)を浸漬することにより被着させることができる。この場合、ニッケルめっき層は、還元剤の成分が共析するためリンを3〜10質量%程度含有するので、共析成分の作用により融点が約800℃程度に低くなる。   For example, in the case of the electroless plating method, the lid 3 (brazing) is applied to an electroless nickel plating solution containing a nickel source such as nickel sulfate and a phosphorus-based reducing agent such as hypophosphorous acid as main components. Can be deposited by dipping. In this case, since the nickel plating layer contains about 3 to 10% by mass of phosphorus because the components of the reducing agent are eutectoid, the melting point is lowered to about 800 ° C. by the action of the eutectoid components.

また、本発明の電子装置9おいて、蓋体3の下面にニッケルめっき層が被着されており、接合部に被着されるニッケルめっき層が、他の部分に被着されるニッケルめっき層よりも融点が低いことから、蓋体3と金属枠体2を接合する溶接抵抗時に、蓋体3の接合部のニッケルめっきだけが溶融し、他の部分のニッケルめっきは溶融しないようにする溶接抵抗が可能となり、他の部分のニッケルめっきが溶融し、電子部品5に飛散するようなことのない、より信頼性の高い電子装置9を提供できる。   Moreover, in the electronic device 9 of the present invention, the nickel plating layer is applied to the lower surface of the lid 3, and the nickel plating layer applied to the joint portion is applied to the other portion. Since the melting point is lower than the above, at the time of welding resistance for joining the lid 3 and the metal frame 2, only the nickel plating at the joining portion of the lid 3 is melted and the nickel plating at other portions is not melted. It is possible to provide a highly reliable electronic device 9 that can be resisted and that the nickel plating of other portions is not melted and scattered in the electronic component 5.

また、蓋体3の下面にニッケルめっき層が被着されているので、下面側の電気抵抗が下がって電流が流れ易くなり、抵抗溶接がより容易、かつ確実に行なえる。   In addition, since the nickel plating layer is deposited on the lower surface of the lid 3, the electric resistance on the lower surface side is lowered, current flows easily, and resistance welding can be performed more easily and reliably.

また、絶縁基体と直交する縦断面視にて、蓋体と枠体の接合部より下側に位置する屈曲部3bの側面、特には枠体側の側面は、ニッケルめっき層が被着されるので、飛散物(主に、接合部に被着される融点の低いニッケル)がより容易かつ強固に付着する。そのため、電子装置9の信頼性が向上する。   In addition, a nickel plating layer is applied to the side surface of the bent portion 3b, particularly the side surface on the frame body side, located below the joint between the lid body and the frame body in a longitudinal sectional view orthogonal to the insulating substrate. The scattered matter (mainly nickel having a low melting point deposited on the joint) adheres more easily and firmly. Therefore, the reliability of the electronic device 9 is improved.

蓋体3の下面にニッケルめっき層を、接合部に被着されるニッケルめっき層が、他の部分に被着されるニッケルめっき層よりも融点が低くなるように被着させるには、例えば、以下のような方法を用いる。   In order to deposit the nickel plating layer on the lower surface of the lid 3 so that the nickel plating layer deposited on the joining portion has a lower melting point than the nickel plating layer deposited on other portions, for example, The following method is used.

まず、蓋体3(ロウ付けする前)の全面に、硫酸ニッケル等のニッケル源と、ジメチルアミンボラン等のホウ素系の還元剤とを主成分とする無電解ニッケルめっき液を用いてニッケルめっき層を被着させる。次に、接合面(接合面となる部位)を除く蓋体3の露出面(特に下面)に樹脂材料等のマスク材を被着させてマスクし、これを、上記のようなリン系の還元剤を含有する無電解ニッケルめっき液に浸漬し、接合面に、リンを含有するニッケルめっき層を被着させる。ホウ素系の還元剤を含有する無電解ニッケルめっき液により被着されたニッケルめっき層は、リン成分が多く共析するようなことがないので、融点が約1000℃程度と高い。以上の工程により、接合部に被着されるものの融点が、他の部分に被着されるものの融点よりも低いニッケルめっき層が被着、形成される。   First, a nickel plating layer is formed on the entire surface of the lid 3 (before brazing) using an electroless nickel plating solution mainly composed of a nickel source such as nickel sulfate and a boron-based reducing agent such as dimethylamine borane. Adhere. Next, a mask material such as a resin material is applied to the exposed surface (particularly the lower surface) of the lid 3 excluding the joint surface (part to be the joint surface) for masking. It is immersed in an electroless nickel plating solution containing an agent, and a nickel plating layer containing phosphorus is deposited on the joint surface. Since the nickel plating layer deposited by the electroless nickel plating solution containing a boron-based reducing agent does not co-deposit with much phosphorus component, the melting point is as high as about 1000 ° C. Through the above-described steps, a nickel plating layer having a melting point lower than that of the portion to be deposited on the joining portion is deposited and formed.

なお、本発明は上述の実施の形態に限定されるものではなく、本発明の要旨を逸脱しない範囲内であれば種々の変更が可能である。例えば、絶縁基体1は、平板状のものでも構わず、平板状の上面に金属枠体2が接合され、電子部品収納用の凹部4を有するものであってもよい。   Note that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the scope of the present invention. For example, the insulating substrate 1 may have a flat plate shape, or may have a metal frame 2 joined to a flat upper surface and a concave portion 4 for storing an electronic component.

また、配線導体6や金属枠体2や蓋体3の露出表面をニッケル、金等のめっき層で被覆して、酸化腐食を防止するとともに、金属細線8の接合性をより確実強固なものとしてもよい。   Further, the exposed surfaces of the wiring conductor 6, the metal frame 2 and the lid 3 are covered with a plating layer of nickel, gold or the like to prevent oxidative corrosion and to make the bonding of the fine metal wires 8 more reliable and strong. Also good.

本発明の電子装置の実施の形態の一例を示す断面図である。It is sectional drawing which shows an example of embodiment of the electronic device of this invention. 図1に示す電子装置の上面図である。It is a top view of the electronic device shown in FIG. 本発明の電子装置の、他の実施の形態を示す断面図である。It is sectional drawing which shows other embodiment of the electronic device of this invention.

符号の説明Explanation of symbols

1・・・絶縁基体
2・・・金属枠体
3・・・蓋体
3a・・接続部
3b・・屈曲部
4・・・凹部
5・・・電子部品
6・・・配線導体
7・・・メタライズ層
8・・・金属細線
9・・・電子装置
DESCRIPTION OF SYMBOLS 1 ... Insulation base | substrate 2 ... Metal frame 3 ... Lid 3a ... Connection part 3b ... Bending part 4 ... Concave part 5 ... Electronic component 6 ... Wiring conductor 7 ... Metallized layer 8 ... Metal wire 9 ... Electronic device

Claims (11)

上面に電子部品が収容される凹部を有する絶縁基体と、該絶縁基体の上面に取着される金属枠体と、下面の外周部が前記金属枠体の上面に接合されて前記凹部を塞ぐ蓋体とを具備した電子装置であって、前記蓋体は、前記金属枠体との接合部よりも内側に、該接合部に沿った屈曲部を有していることを特徴とする電子装置。 An insulating base having a recess for receiving an electronic component on the upper surface, a metal frame attached to the upper surface of the insulating base, and a lid for closing the recess by joining the outer peripheral portion of the lower surface to the upper surface of the metal frame An electronic device comprising: a body, wherein the lid body has a bent portion along the joint inside the joint with the metal frame. 前記屈曲部が、前記蓋体を平面視して、環状に設けられていることを特徴とする請求項1に記載の電子装置。 The electronic device according to claim 1, wherein the bent portion is provided in an annular shape when the lid is viewed in plan. 前記屈曲部の平面視形状は、角部が丸みを帯びた矩形状であることを特徴とする請求項2に記載の電子装置。 The electronic device according to claim 2, wherein a shape of the bent portion in plan view is a rectangular shape with rounded corners. 前記蓋体の上面及び下面が、前記屈曲部の外側部位に比し内側部位で上方に配されていることを特徴とする請求項1乃至請求項3のいずれかに記載の電子装置。 4. The electronic device according to claim 1, wherein an upper surface and a lower surface of the lid body are disposed upward at an inner portion as compared with an outer portion of the bent portion. 5. 前記蓋体が、抵抗溶接にて前記金属枠体に接合されていることを特徴とする請求項1乃至請求項4のいずれかに記載の電子装置。 The electronic device according to claim 1, wherein the lid is joined to the metal frame by resistance welding. 前記蓋体は、前記屈曲部の内側部位と外側部位との間に設けられる段差の大きさが、前記接合部上に位置する前記蓋体の厚みよりも大であることを特徴とする請求項1乃至請求項5のいずれかに記載の電子装置。 2. The lid according to claim 1, wherein a size of a step provided between an inner part and an outer part of the bent part is larger than a thickness of the lid located on the joint part. The electronic device according to claim 1. 前記蓋体の厚みが、前記金属枠体との接合部に比し前記屈曲部で薄いことを特徴とする請求項1乃至請求項6のいずれかに記載の電子装置。 7. The electronic device according to claim 1, wherein a thickness of the lid body is thinner at the bent portion than a joint portion with the metal frame. 前記屈曲部は、前記蓋体が下側に突出して湾曲した形状であることを特徴とする請求項1乃至請求項3のいずれかに記載の電子装置。 The electronic device according to claim 1, wherein the bent portion has a curved shape with the lid projecting downward. 前記屈曲部は、電子部品を搭載した際、縦断面視にて、前記蓋体の前記金属枠体との接合部から電子部品の端部の延長線上と交差する部位の間に配置されることを特徴とする請求項8に記載の電子装置。 When the electronic component is mounted, the bent portion is arranged between a portion of the lid body that intersects the extended line of the end portion of the electronic component from a joint portion of the lid body with the metal frame body in a longitudinal sectional view. The electronic device according to claim 8. 前記蓋体の前記金属枠体との接合面に、ニッケルめっき層が被着されていることを特徴とする請求項8または請求項9に記載の電子装置。 10. The electronic device according to claim 8, wherein a nickel plating layer is attached to a joint surface between the lid and the metal frame. 前記蓋体の下面にニッケルめっき層が被着されており、前記接合部に被着されるニッケルめっき層が、他の部分に被着されるニッケルめっき層よりも融点が低いことを特徴とする請求項10に記載の電子装置。 A nickel plating layer is applied to the lower surface of the lid, and the nickel plating layer applied to the joint has a melting point lower than that of the nickel plating layer applied to other portions. The electronic device according to claim 10.
JP2006082226A 2005-04-27 2006-03-24 Electronic device Pending JP2006332599A (en)

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Cited By (4)

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US7719006B2 (en) 2007-03-12 2010-05-18 Denso Corporation Physical quantity sensor and semiconductor device having package and cover
JP2010186691A (en) * 2009-02-13 2010-08-26 Seiko Instruments Inc Electrochemical cell
JP5995212B1 (en) * 2016-01-13 2016-09-21 パナソニックIpマネジメント株式会社 Physical quantity sensor
JP2017120865A (en) * 2015-12-29 2017-07-06 日立金属株式会社 Hermetic sealing cap

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7719006B2 (en) 2007-03-12 2010-05-18 Denso Corporation Physical quantity sensor and semiconductor device having package and cover
JP2010186691A (en) * 2009-02-13 2010-08-26 Seiko Instruments Inc Electrochemical cell
JP2017120865A (en) * 2015-12-29 2017-07-06 日立金属株式会社 Hermetic sealing cap
JP5995212B1 (en) * 2016-01-13 2016-09-21 パナソニックIpマネジメント株式会社 Physical quantity sensor
WO2017122755A1 (en) 2016-01-13 2017-07-20 Panasonic Intellectual Property Management Co., Ltd. Physical quantity sensor
US9960091B2 (en) 2016-01-13 2018-05-01 Panasonic Intellectual Property Management Co., Ltd. Package
CN108885103A (en) * 2016-01-13 2018-11-23 松下知识产权经营株式会社 Physical quantity transducer

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