JP2006332479A - 電力半導体装置 - Google Patents
電力半導体装置 Download PDFInfo
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- JP2006332479A JP2006332479A JP2005156543A JP2005156543A JP2006332479A JP 2006332479 A JP2006332479 A JP 2006332479A JP 2005156543 A JP2005156543 A JP 2005156543A JP 2005156543 A JP2005156543 A JP 2005156543A JP 2006332479 A JP2006332479 A JP 2006332479A
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- semiconductor device
- power semiconductor
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- external cooling
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
半導体装置の支持基板と外部冷却フィン間のオイルコンパウンドが支持基板外への流出を防ぎ、支持基板と外部冷却フィン間の接触熱抵抗の増大を防ぐ。
【解決手段】
本発明の半導体装置は、底面部に金属基板、側面及び上面を有機樹脂で覆い、内部に複数個の電力半導体素子を搭載し、前記底面の金属基板上とモジュール内部に搭載する半導体素子との間に複数枚の絶縁基板を配置した内部絶縁型のパワー半導体装置であって、前記底面の金属基板の放熱面側に樹脂リングを有し、半導体素子の稼動、非稼動時の温度変化による、支持基板に反りの変化に起因するオイルコンパウンドの流出をなくす。
【選択図】図1
Description
Claims (5)
- 底面が金属基板、側面及び上面が有機樹脂で構成され、内部に複数個の電力半導体素子を搭載し、前記底面の金属基板上とモジュール内部に搭載する半導体素子との間に複数枚の絶縁基板を配置した内部絶縁型の電力半導体装置において、
前記底面の金属基板の放熱面側に環状の樹脂部材を有することを特徴とする電力半導体装置。 - 請求項1に記載の電力半導体装置において、前記金属基板の放熱面側に配置した環状の樹脂部材が、前記金属基板の外縁周に配置したゴム弾性部材であることを特徴とする電力半導体装置。
- 請求項1に記載の電力半導体装置において、前記内部に搭載した複数個の電力半導体素子が複数個のIGBT素子を含むことを特徴とする電力半導体装置。
- 請求項1に記載の電力半導体装置において、前記内部に搭載した複数個の電力半導体素子が複数個のIGBT素子とダイオード素子とを含むことを特徴とする電力半導体装置。
- 請求項1に記載の電力半導体装置において、前記金属基板の放熱面側に凹部を備え、該凹部に前記環状の樹脂部材を嵌合したことを特徴とする電力半導体装置。
Priority Applications (1)
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JP2005156543A JP4367376B2 (ja) | 2005-05-30 | 2005-05-30 | 電力半導体装置 |
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JP2005156543A JP4367376B2 (ja) | 2005-05-30 | 2005-05-30 | 電力半導体装置 |
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JP2006332479A true JP2006332479A (ja) | 2006-12-07 |
JP4367376B2 JP4367376B2 (ja) | 2009-11-18 |
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010062725A (ja) * | 2008-09-02 | 2010-03-18 | Nec Access Technica Ltd | 無線通信システム、端末装置、省電力方法、プログラム |
KR100972447B1 (ko) * | 2009-10-01 | 2010-07-26 | 김지희 | 무접점 릴레이 |
CN103515338A (zh) * | 2012-06-25 | 2014-01-15 | 三菱电机株式会社 | 半导体模块 |
KR200472484Y1 (ko) | 2012-06-14 | 2014-05-02 | 엘에스산전 주식회사 | 전력용 반도체 고정기구 |
JP2018139278A (ja) * | 2017-02-24 | 2018-09-06 | 三菱電機株式会社 | 半導体装置、半導体装置の製造方法 |
JP2018174228A (ja) * | 2017-03-31 | 2018-11-08 | 富士電機株式会社 | 半導体装置および半導体装置の製造方法 |
WO2023233869A1 (ja) * | 2022-05-30 | 2023-12-07 | 富士電機株式会社 | 半導体装置及び電力変換装置 |
-
2005
- 2005-05-30 JP JP2005156543A patent/JP4367376B2/ja not_active Expired - Fee Related
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010062725A (ja) * | 2008-09-02 | 2010-03-18 | Nec Access Technica Ltd | 無線通信システム、端末装置、省電力方法、プログラム |
JP4693071B2 (ja) * | 2008-09-02 | 2011-06-01 | Necアクセステクニカ株式会社 | 無線通信システム、端末装置、省電力方法、プログラム |
KR100972447B1 (ko) * | 2009-10-01 | 2010-07-26 | 김지희 | 무접점 릴레이 |
KR200472484Y1 (ko) | 2012-06-14 | 2014-05-02 | 엘에스산전 주식회사 | 전력용 반도체 고정기구 |
CN103515338A (zh) * | 2012-06-25 | 2014-01-15 | 三菱电机株式会社 | 半导体模块 |
US9357678B2 (en) | 2012-06-25 | 2016-05-31 | Mitsubishi Electric Corporation | Semiconductor module |
DE102013207552B4 (de) | 2012-06-25 | 2019-06-06 | Mitsubishi Electric Corp. | Halbleitermodul |
JP2018139278A (ja) * | 2017-02-24 | 2018-09-06 | 三菱電機株式会社 | 半導体装置、半導体装置の製造方法 |
CN108511408A (zh) * | 2017-02-24 | 2018-09-07 | 三菱电机株式会社 | 半导体装置、半导体装置的制造方法 |
CN108511408B (zh) * | 2017-02-24 | 2021-10-15 | 三菱电机株式会社 | 半导体装置、半导体装置的制造方法 |
JP2018174228A (ja) * | 2017-03-31 | 2018-11-08 | 富士電機株式会社 | 半導体装置および半導体装置の製造方法 |
WO2023233869A1 (ja) * | 2022-05-30 | 2023-12-07 | 富士電機株式会社 | 半導体装置及び電力変換装置 |
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JP4367376B2 (ja) | 2009-11-18 |
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