JP2006277557A5 - - Google Patents

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Publication number
JP2006277557A5
JP2006277557A5 JP2005098512A JP2005098512A JP2006277557A5 JP 2006277557 A5 JP2006277557 A5 JP 2006277557A5 JP 2005098512 A JP2005098512 A JP 2005098512A JP 2005098512 A JP2005098512 A JP 2005098512A JP 2006277557 A5 JP2006277557 A5 JP 2006277557A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2005098512A
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Japanese (ja)
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JP4528659B2 (ja
JP2006277557A (ja
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Priority to JP2005098512A priority Critical patent/JP4528659B2/ja
Priority claimed from JP2005098512A external-priority patent/JP4528659B2/ja
Priority to US11/392,538 priority patent/US7295938B2/en
Publication of JP2006277557A publication Critical patent/JP2006277557A/ja
Publication of JP2006277557A5 publication Critical patent/JP2006277557A5/ja
Application granted granted Critical
Publication of JP4528659B2 publication Critical patent/JP4528659B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005098512A 2005-03-30 2005-03-30 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム Expired - Fee Related JP4528659B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005098512A JP4528659B2 (ja) 2005-03-30 2005-03-30 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム
US11/392,538 US7295938B2 (en) 2005-03-30 2006-03-30 Clock jitter calculation device, clock jitter calculation method, and clock jitter calculation program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005098512A JP4528659B2 (ja) 2005-03-30 2005-03-30 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム

Publications (3)

Publication Number Publication Date
JP2006277557A JP2006277557A (ja) 2006-10-12
JP2006277557A5 true JP2006277557A5 (enExample) 2007-08-23
JP4528659B2 JP4528659B2 (ja) 2010-08-18

Family

ID=37069659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005098512A Expired - Fee Related JP4528659B2 (ja) 2005-03-30 2005-03-30 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム

Country Status (2)

Country Link
US (1) US7295938B2 (enExample)
JP (1) JP4528659B2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4769687B2 (ja) * 2006-10-30 2011-09-07 富士通セミコンダクター株式会社 タイミング検証方法、タイミング検証装置及びタイミング検証プログラム
US8134384B2 (en) * 2006-11-08 2012-03-13 Freescale Semiconductor, Inc. Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilities
JP2008287666A (ja) * 2007-05-21 2008-11-27 Sharp Corp 回路動作検証装置、半導体集積回路の製造方法、回路動作検証方法、制御プログラムおよび可読記録媒体
US8739099B1 (en) * 2007-07-20 2014-05-27 Altera Corporation Method and apparatus for determining clock uncertainties
JP2009187325A (ja) * 2008-02-06 2009-08-20 Nec Electronics Corp 半導体集積回路の設計方法および設計支援装置
US9565036B2 (en) 2009-06-30 2017-02-07 Rambus Inc. Techniques for adjusting clock signals to compensate for noise
JP2011034480A (ja) 2009-08-05 2011-02-17 Renesas Electronics Corp ジッタ算出装置、ジッタ算出方法、及びジッタ算出プログラム
JP5640259B2 (ja) 2010-06-09 2014-12-17 ルネサスエレクトロニクス株式会社 回路シミュレーション方法および回路シミュレーション装置
US8832616B2 (en) * 2011-03-18 2014-09-09 Sage Software, Inc. Voltage drop effect on static timing analysis for multi-phase sequential circuit
JP6089728B2 (ja) * 2013-01-30 2017-03-08 株式会社ソシオネクスト 半導体装置の設計方法、プログラム及び設計装置
JP2015230543A (ja) 2014-06-04 2015-12-21 株式会社ソシオネクスト 設計装置、設計方法及び設計プログラム
KR102327339B1 (ko) 2015-05-06 2021-11-16 삼성전자주식회사 집적 회로와 이를 포함하는 컴퓨팅 장치

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004077079A1 (ja) * 1993-08-25 2004-09-10 Hitoshi Ujiie ジッタ解析装置
JPH10321725A (ja) 1997-05-14 1998-12-04 Toshiba Corp 半導体集積回路の設計方法及び装置
TW559668B (en) * 1999-02-08 2003-11-01 Advantest Corp Apparatus for and method of measuring a jitter
JP2001084763A (ja) * 1999-09-08 2001-03-30 Mitsubishi Electric Corp クロック発生回路およびそれを具備した半導体記憶装置
CA2307911A1 (en) * 1999-11-18 2001-05-18 Loran Network Management Ltd. Method for determining the delay and jitter in communication between objects in a connected network
US6460001B1 (en) * 2000-03-29 2002-10-01 Advantest Corporation Apparatus for and method of measuring a peak jitter
WO2003007578A1 (en) * 2001-07-13 2003-01-23 Anritsu Corporation Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation
US6651016B1 (en) * 2001-12-21 2003-11-18 Credence Systems Corporation Jitter-corrected spectrum analyzer
JP2004093345A (ja) * 2002-08-30 2004-03-25 Renesas Technology Corp ジッタ測定回路
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method
US6701269B1 (en) * 2003-01-28 2004-03-02 Agilent Technologies, Inc. Jitter measurement extrapolation and calibration for bit error ratio detection
JP2004310567A (ja) * 2003-04-09 2004-11-04 Matsushita Electric Ind Co Ltd クロックばらつきタイミング解析方法
JP2005004268A (ja) * 2003-06-09 2005-01-06 Matsushita Electric Ind Co Ltd 半導体集積回路装置の動作解析方法、これに用いられる解析装置およびこれを用いた最適化設計方法
US7158899B2 (en) * 2003-09-25 2007-01-02 Logicvision, Inc. Circuit and method for measuring jitter of high speed signals
JP2005122298A (ja) * 2003-10-14 2005-05-12 Fujitsu Ltd タイミング解析装置、タイミング解析方法及びプログラム
US7002358B2 (en) * 2003-12-10 2006-02-21 Hewlett-Packard Development Company, L.P. Method and apparatus for measuring jitter
WO2005060655A2 (en) * 2003-12-16 2005-07-07 California Institute Of Technology Deterministic jitter equalizer
US7236555B2 (en) * 2004-01-23 2007-06-26 Sunrise Telecom Incorporated Method and apparatus for measuring jitter
US7203610B2 (en) * 2004-08-31 2007-04-10 Guide Technology, Inc. System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal data
JP2006214987A (ja) * 2005-02-07 2006-08-17 Nec Electronics Corp ノイズ測定システムおよび方法ならびに半導体装置

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