JP2006100729A - ワイヤボンディングにおけるボールの検査方法 - Google Patents
ワイヤボンディングにおけるボールの検査方法 Download PDFInfo
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Abstract
【解決手段】 半導体チップ1のパッド3と外部電極との間をボールボンディングによって配線するワイヤボンディングにおけるボールの接合状態の検査方法であって、パッド3とボール5の部分を撮像手段12で撮像し、該撮像手段で撮像した平面画像から画像処理によってボール5の接合状態を検出するようにしたワイヤボンディングにおけるボールの検査方法において、パッド3とボール5の部分を照らす照明光として撮像手段12のレンズ13の光軸と平行な同軸光を用い、該同軸光の色を検査内容に応じて切り替えるようにした。
【選択図】 図1
Description
図1は、本発明方法を適用して構成したワイヤボンディング検査装置の一実施の形態を示すブロック図である。
まず最初に、パッド3の合焦点高さ、すなわちパッド3の表面のZ軸(上下)方向の位置検出について、図4の撮影画像を参照して説明する。
いま、4行×8列(計32画素)からなる輝度検出窓W1の各画素の輝度値が図4中の右側最上段の表中に示すような値だったとすると、まず最初に、エッジ3aと平行な方向に各列の輝度値を加算した後、各列毎にその平均値を求める。
この図5は、基準面を中心として上下方向±30μmの高さ範囲をピッチ1μm間隔で順次撮影した61枚の撮影画像についてのパッド3の輝度レベルデータをプロットしたものである。
次に、ボール圧着面9の合焦点高さ、すなわちボール圧着面9の表面のZ軸(上下)方向の高さ位置を求める処理について、図6の撮影画像を参照して説明する。
いま、図中の右水平位置における輝度検出窓Wの各画素の輝度値が図7中の右側最上段の表に示すような値だったとすると、ボール5の半径方向(行方向)に沿って隣り合う画素同士の差分演算を行ない、その差分輝度値(絶対値)を求める。
上記のようにしてパッド3の合焦点高さとボール圧着面9の合焦点高さが得られたら、得られたパッド3の合焦点高さとボール圧着面9の合焦点高さとの差分演算(引き算)を行なう。このようにして得られた差分値がボール5の圧着厚t(図2参照)となる。以上のようにして、ボール5の圧着厚tを画像処理によって自動的に測定することができる。
次に、ボール外径Dの検出処理について、図7の撮影画像を参照して説明する。
次に、ボール5の圧着点O、すなわちボール5の中心位置の検出処理について、図8の撮影画像を参照して説明する。
2 半導体チップ
3 パッド
3a パッドのエッジ
4 ボンディングワイヤ
5 ボール
5a ボールの外径線(エッジ)
6 キャピラリ
7 インサイドチャンファ部
8 コーン部
8a コーン部の外径線
9 ボール圧着面
11 X−Yテーブル
12 カメラ(撮像手段)
13 レンズ
14 XYZ軸駆動機構
15 XYZ位置制御部
16 画像処理部
17 モニタ
18 制御回路
19 同軸照明用RGB光源
20 同軸照明手段
21 リング照明用RGB光源
22 リング照明手段
23,24 光ファイバー
W、W1〜W8 輝度検出窓
t ボールの圧着厚
D ボール外径
O ボール圧着点(ボールの中心位置)
Claims (7)
- 半導体チップのパッドと外部電極との間をボールボンディングによって配線するワイヤボンディングにおけるボールの接合状態の検査方法であって、パッドとボール部分を撮像手段で撮影し、該撮像手段で撮影した平面画像から画像処理によってボールの接合状態を検出するようにしたワイヤボンディングにおけるボールの検査方法において、
前記パッドとボール部分を照らす照明光として撮像手段のレンズ光軸と平行な同軸光を用い、該同軸光の色を検査内容に応じて切り替えるようにしたことを特徴とするワイヤボンディングにおけるボールの検査方法。 - 前記接合状態の検査内容が、少なくとも、パッドの合焦点高さ、ボール圧着面の合焦点高さ、ボールの外径寸法、ボールの圧着点の検出であり、前記パッドの合焦点高さの検出処理に際しては前記同軸照明光の色を青色とし、前記ボール圧着面の合焦点高さの検出処理に際しては前記同軸照明光の色を黄色または赤色とし、前記ボールの外径寸法の検出処理に際しては前記同軸照明光の色を青色とし、前記ボールの圧着点の検出処理に際しては前記同軸照明光の色を赤色または黄色とすることを特徴とする請求項1記載のワイヤボールボンディングにおけるボールの検査方法。
- 前記パッドの合焦点高さの検出処理に際して、撮像手段を所定のステップ間隔で上下方向に移動しながら、各ステップ位置において前記青色の同軸照明光で照らされるパッドとボールの接合部分の平面画像を撮影し、各撮像画像におけるパッドのエッジ部分の輝度変化を求め、該輝度変化が最大となる撮影画像の撮像高さ位置を当該パッドの合焦点高さとすることを特徴とする請求項2記載のワイヤボールボンディングにおけるボールの検査方法。
- 前記ボール圧着面の合焦点高さの検出処理に際して、所定のステップ間隔で撮像手段を上下方向に移動しながら、各ステップ位置において前記黄色または赤色の同軸照明光で照らされるパッドとボールの接合部分の平面画像を撮影し、各撮影画像におけるボール圧着面の輝度変化を求め、該輝度変化が最大となる撮影画像の撮像高さ位置を当該ボール圧着面の合焦点高さとすることを特徴とする請求項2記載のワイヤボンディングにおけるボールの検査方法。
- 前記ボールの外径寸法の検出処理に際して、撮像手段によって前記青色の同軸照明光で照らされるパッドとボールの接合部分の平面画像を撮影し、該撮影画像におけるボール外周のエッジ部分の輝度変化を求め、該輝度変化が最大となる左右の画素位置間の距離を当該ボールの外径寸法とすることを特徴とする請求項2記載のワイヤボンディングにおけるボールの検査方法。
- 前記ボールの圧着点の検出処理に際して、撮像手段によって前記赤色または黄色の同軸照明光で照らされるパッドとボールの接合部分の平面画像を撮影し、該撮影画像におけるインサイドファンチャ部外周のエッジ部分の輝度変化を求め、該輝度変化が最大となる左右の画素位置間の中間点を当該ボールの圧着点とすることを特徴とする請求項2記載のワイヤボンディングにおけるボールの検査方法。
- 前記同軸照明光に加え、補助光としてリング照明光を用いることを特徴とする請求項1〜6のいずれかに記載のワイヤボンディングにおけるボールの検査方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004287697A JP4234661B2 (ja) | 2004-09-30 | 2004-09-30 | ワイヤボンディングにおけるボールの検査方法 |
US11/237,032 US7899239B2 (en) | 2004-09-30 | 2005-09-28 | Inspection method of bonded status of ball in wire bonding |
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JP2004287697A JP4234661B2 (ja) | 2004-09-30 | 2004-09-30 | ワイヤボンディングにおけるボールの検査方法 |
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JP2006100729A true JP2006100729A (ja) | 2006-04-13 |
JP4234661B2 JP4234661B2 (ja) | 2009-03-04 |
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JP2004287697A Expired - Lifetime JP4234661B2 (ja) | 2004-09-30 | 2004-09-30 | ワイヤボンディングにおけるボールの検査方法 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008153268A1 (en) * | 2007-06-14 | 2008-12-18 | Hits Co., Ltd. | Semiconductor package inspection system and inspection method using semiconductor package inspection system |
WO2012165030A1 (ja) * | 2011-05-31 | 2012-12-06 | 株式会社村田製作所 | バンプ位置の導出方法およびバンプ形成位置の補正方法、バンプボンダー並びにバンプの外観検査装置 |
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JP2981941B2 (ja) * | 1991-12-02 | 1999-11-22 | 株式会社新川 | ボンデイングワイヤ検査装置 |
JP3259398B2 (ja) | 1993-01-22 | 2002-02-25 | ソニー株式会社 | ワイヤボンディングの検査装置 |
JP2720759B2 (ja) | 1993-07-21 | 1998-03-04 | 日本電気株式会社 | ボンディングワイヤー外観自動検査装置 |
JP2962581B2 (ja) * | 1995-06-30 | 1999-10-12 | シーメンス アクチエンゲゼルシヤフト | 光距離センサ |
JPH09196856A (ja) * | 1996-01-23 | 1997-07-31 | Tsubakimoto Chain Co | 表面検査方法、表面検査装置及びプリズム |
JP3370547B2 (ja) * | 1997-03-17 | 2003-01-27 | 株式会社新川 | ボンディングワイヤ高さ検査装置 |
JPH10311713A (ja) | 1997-05-13 | 1998-11-24 | Canon Inc | ボンディングワイヤ検査方法および装置 |
JP2001343336A (ja) * | 2000-05-31 | 2001-12-14 | Nidek Co Ltd | 欠陥検査方法及び欠陥検査装置 |
JP4048096B2 (ja) * | 2002-10-10 | 2008-02-13 | 立命館大学総合理工学研究機構 | 被検出物の高さ計測方法 |
DE10330003B4 (de) * | 2003-07-03 | 2007-03-08 | Leica Microsystems Semiconductor Gmbh | Vorrichtung, Verfahren und Computerprogramm zur Wafer-Inspektion |
JP2005158780A (ja) * | 2003-11-20 | 2005-06-16 | Hitachi Ltd | パターン欠陥検査方法及びその装置 |
JP4365292B2 (ja) * | 2004-09-02 | 2009-11-18 | 株式会社カイジョー | ワイヤボンディングにおけるボール圧着厚の測定方法 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2008153268A1 (en) * | 2007-06-14 | 2008-12-18 | Hits Co., Ltd. | Semiconductor package inspection system and inspection method using semiconductor package inspection system |
KR100884582B1 (ko) * | 2007-06-14 | 2009-02-19 | (주)에이치아이티에스 | 반도체패키지 검사시스템 및 반도체패키지 검사시스템에의한 검사방법 |
KR101236795B1 (ko) | 2010-03-29 | 2013-02-25 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 제조용 와이어 본더의 바값 측정 시스템 |
WO2012165030A1 (ja) * | 2011-05-31 | 2012-12-06 | 株式会社村田製作所 | バンプ位置の導出方法およびバンプ形成位置の補正方法、バンプボンダー並びにバンプの外観検査装置 |
JPWO2012165030A1 (ja) * | 2011-05-31 | 2015-02-23 | 株式会社村田製作所 | バンプ位置の導出方法およびバンプ形成位置の補正方法、バンプボンダー並びにバンプの外観検査装置 |
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US20060079008A1 (en) | 2006-04-13 |
JP4234661B2 (ja) | 2009-03-04 |
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