JP2006054441A5 - - Google Patents
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- JP2006054441A5 JP2006054441A5 JP2005203715A JP2005203715A JP2006054441A5 JP 2006054441 A5 JP2006054441 A5 JP 2006054441A5 JP 2005203715 A JP2005203715 A JP 2005203715A JP 2005203715 A JP2005203715 A JP 2005203715A JP 2006054441 A5 JP2006054441 A5 JP 2006054441A5
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- moving
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Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US58757004P | 2004-07-12 | 2004-07-12 | |
| US58721604P | 2004-07-12 | 2004-07-12 | |
| US58730204P | 2004-07-12 | 2004-07-12 | |
| US60/587,570 | 2004-07-12 | ||
| US60/587,302 | 2004-07-12 | ||
| US60/587,216 | 2004-07-12 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006054441A JP2006054441A (ja) | 2006-02-23 |
| JP2006054441A5 true JP2006054441A5 (enExample) | 2008-08-21 |
| JP4981272B2 JP4981272B2 (ja) | 2012-07-18 |
Family
ID=36031676
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005203715A Expired - Lifetime JP4981272B2 (ja) | 2004-07-12 | 2005-07-12 | 動的な焦点合わせ方法および装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4981272B2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6598737B2 (ja) * | 2016-06-21 | 2019-10-30 | 三菱電機株式会社 | ウエハ検査装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0587544A (ja) * | 1991-09-27 | 1993-04-06 | Toshiba Corp | 欠陥検査装置 |
| JPH0675164A (ja) * | 1992-05-01 | 1994-03-18 | Copal Co Ltd | 撮像装置 |
| JPH07140083A (ja) * | 1993-11-16 | 1995-06-02 | Hitachi Electron Eng Co Ltd | 異物検出光学系のフォーカス制御方法 |
| JPH10325705A (ja) * | 1997-05-26 | 1998-12-08 | Dainippon Screen Mfg Co Ltd | 測長方法及びこれを用いたテーブル型測長装置 |
| JP4255997B2 (ja) * | 1998-06-27 | 2009-04-22 | 株式会社安川電機 | 半導体ウエハの外観検査装置 |
| US6581202B1 (en) * | 2000-11-10 | 2003-06-17 | Viasystems Group, Inc. | System and method for monitoring and improving dimensional stability and registration accuracy of multi-layer PCB manufacture |
| JP2003075115A (ja) * | 2001-09-03 | 2003-03-12 | Shibaura Mechatronics Corp | 基板検査装置および基板検査方法 |
| JP2004165250A (ja) * | 2002-11-11 | 2004-06-10 | Nikon Corp | マスク検査方法、マスク検査装置、露光方法、及び露光装置 |
-
2005
- 2005-07-12 JP JP2005203715A patent/JP4981272B2/ja not_active Expired - Lifetime
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