JP2006040632A - 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置 - Google Patents

異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置 Download PDF

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Publication number
JP2006040632A
JP2006040632A JP2004216041A JP2004216041A JP2006040632A JP 2006040632 A JP2006040632 A JP 2006040632A JP 2004216041 A JP2004216041 A JP 2004216041A JP 2004216041 A JP2004216041 A JP 2004216041A JP 2006040632 A JP2006040632 A JP 2006040632A
Authority
JP
Japan
Prior art keywords
conductive
anisotropic conductive
path forming
conductive path
adapter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004216041A
Other languages
English (en)
Japanese (ja)
Inventor
Kiyoshi Kimura
潔 木村
Fujio Hara
富士雄 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JSR Corp
Original Assignee
JSR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JSR Corp filed Critical JSR Corp
Priority to JP2004216041A priority Critical patent/JP2006040632A/ja
Priority to PCT/JP2005/013252 priority patent/WO2006009144A1/ja
Priority to KR1020067027074A priority patent/KR20070029205A/ko
Priority to CNA2005800242334A priority patent/CN1989664A/zh
Priority to TW094124757A priority patent/TW200618424A/zh
Publication of JP2006040632A publication Critical patent/JP2006040632A/ja
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/1517—Multilayer substrate
    • H01L2924/15172—Fan-out arrangement of the internal vias
    • H01L2924/15174—Fan-out arrangement of the internal vias in different layers of the multilayer substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Measuring Leads Or Probes (AREA)
  • Non-Insulated Conductors (AREA)
JP2004216041A 2004-07-23 2004-07-23 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置 Pending JP2006040632A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2004216041A JP2006040632A (ja) 2004-07-23 2004-07-23 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置
PCT/JP2005/013252 WO2006009144A1 (ja) 2004-07-23 2005-07-19 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置
KR1020067027074A KR20070029205A (ko) 2004-07-23 2005-07-19 이방 도전성 커넥터 및 그의 제조 방법, 어댑터 장치 및회로 장치의 전기적 검사 장치
CNA2005800242334A CN1989664A (zh) 2004-07-23 2005-07-19 各向异性导电性连接器以及其制造方法、适配器装置和电路装置的电检查装置
TW094124757A TW200618424A (en) 2004-07-23 2005-07-21 Anisotropic conductive connector, its manufacturing method, adapter device and electrical inspection device of circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004216041A JP2006040632A (ja) 2004-07-23 2004-07-23 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置

Publications (1)

Publication Number Publication Date
JP2006040632A true JP2006040632A (ja) 2006-02-09

Family

ID=35785252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004216041A Pending JP2006040632A (ja) 2004-07-23 2004-07-23 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置

Country Status (5)

Country Link
JP (1) JP2006040632A (ko)
KR (1) KR20070029205A (ko)
CN (1) CN1989664A (ko)
TW (1) TW200618424A (ko)
WO (1) WO2006009144A1 (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009245745A (ja) * 2008-03-31 2009-10-22 Jsr Corp 異方導電性シート
KR100988304B1 (ko) * 2008-07-23 2010-10-18 주식회사 아이에스시테크놀러지 탄성 도전시트 및 그 탄성도전시트의 제조방법
WO2024048439A1 (ja) * 2022-08-31 2024-03-07 三井化学株式会社 フレーム付き異方導電性シート、フレーム付き異方導電性シートの製造方法及び電気検査装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107267076B (zh) * 2012-08-24 2021-06-29 迪睿合电子材料有限公司 各向异性导电膜的制造方法和各向异性导电膜
KR101506131B1 (ko) * 2014-04-11 2015-03-26 주식회사 아이에스시 검사용 시트의 제조방법 및 검사용 시트
US20170271299A1 (en) * 2015-10-29 2017-09-21 Boe Technology Group Co., Ltd Anisotropic conductive film (acf), bonding structure, and display panel, and their fabrication methods
KR102282081B1 (ko) * 2016-11-30 2021-07-27 데쿠세리아루즈 가부시키가이샤 도전 입자 배치 필름, 그 제조 방법, 검사 프로브 유닛, 도통 검사 방법
CN107479274A (zh) * 2017-07-11 2017-12-15 武汉华星光电半导体显示技术有限公司 显示面板与外接电路的邦定方法及显示装置
JP7405337B2 (ja) * 2018-10-11 2023-12-26 積水ポリマテック株式会社 電気接続シート、及び端子付きガラス板構造
KR102075669B1 (ko) * 2018-10-26 2020-02-10 오재숙 신호 전송 커넥터 및 그 제조방법
KR102110150B1 (ko) * 2019-01-08 2020-06-08 (주)티에스이 신호 전송 커넥터용 도전부 보호부재 및 그 제조방법과, 이를 갖는 신호 전송 커넥터 및 그 제조방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11154550A (ja) * 1997-11-19 1999-06-08 Jsr Corp コネクター
JP3788258B2 (ja) * 2001-03-27 2006-06-21 Ｊｓｒ株式会社 異方導電性コネクターおよびその応用製品
JP2003163047A (ja) * 2001-11-28 2003-06-06 Jsr Corp 異方導電性シートおよび異方導電性シートの製造方法、ならびに電気回路部品の検査治具および電気回路部品の検査方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009245745A (ja) * 2008-03-31 2009-10-22 Jsr Corp 異方導電性シート
KR100988304B1 (ko) * 2008-07-23 2010-10-18 주식회사 아이에스시테크놀러지 탄성 도전시트 및 그 탄성도전시트의 제조방법
WO2024048439A1 (ja) * 2022-08-31 2024-03-07 三井化学株式会社 フレーム付き異方導電性シート、フレーム付き異方導電性シートの製造方法及び電気検査装置

Also Published As

Publication number Publication date
WO2006009144A1 (ja) 2006-01-26
CN1989664A (zh) 2007-06-27
KR20070029205A (ko) 2007-03-13
TW200618424A (en) 2006-06-01

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