JP2006029826A5 - - Google Patents

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Publication number
JP2006029826A5
JP2006029826A5 JP2004205178A JP2004205178A JP2006029826A5 JP 2006029826 A5 JP2006029826 A5 JP 2006029826A5 JP 2004205178 A JP2004205178 A JP 2004205178A JP 2004205178 A JP2004205178 A JP 2004205178A JP 2006029826 A5 JP2006029826 A5 JP 2006029826A5
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JP
Japan
Prior art keywords
digital data
output signal
input signal
signal
shift amount
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Application number
JP2004205178A
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English (en)
Japanese (ja)
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JP4526891B2 (ja
JP2006029826A (ja
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Application filed filed Critical
Priority to JP2004205178A priority Critical patent/JP4526891B2/ja
Priority claimed from JP2004205178A external-priority patent/JP4526891B2/ja
Priority to DE112005001590T priority patent/DE112005001590T5/de
Priority to PCT/JP2005/011439 priority patent/WO2006006354A1/ja
Priority to US11/251,600 priority patent/US7197413B2/en
Publication of JP2006029826A publication Critical patent/JP2006029826A/ja
Publication of JP2006029826A5 publication Critical patent/JP2006029826A5/ja
Application granted granted Critical
Publication of JP4526891B2 publication Critical patent/JP4526891B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004205178A 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置 Expired - Fee Related JP4526891B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置
DE112005001590T DE112005001590T5 (de) 2004-07-12 2005-06-22 Verzögerungsmessverfahren
PCT/JP2005/011439 WO2006006354A1 (ja) 2004-07-12 2005-06-22 遅延量測定方法
US11/251,600 US7197413B2 (en) 2004-07-12 2005-10-25 Delay amount measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Publications (3)

Publication Number Publication Date
JP2006029826A JP2006029826A (ja) 2006-02-02
JP2006029826A5 true JP2006029826A5 (https=) 2007-04-19
JP4526891B2 JP4526891B2 (ja) 2010-08-18

Family

ID=35783703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004205178A Expired - Fee Related JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Country Status (4)

Country Link
US (1) US7197413B2 (https=)
JP (1) JP4526891B2 (https=)
DE (1) DE112005001590T5 (https=)
WO (1) WO2006006354A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5119016B2 (ja) * 2008-03-14 2013-01-16 株式会社リコー ベルト駆動制御装置及び画像形成装置
CN114578207B (zh) * 2022-02-16 2025-04-18 重庆中科渝芯电子有限公司 一种高精密集成运放非线性度测试系统和测试方法
CN115840473B (zh) * 2022-11-22 2026-04-21 上海新纪元机器人有限公司 一种提升液压缸与电动缸同步性的方法和装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2561816B2 (ja) * 1985-07-11 1996-12-11 日本ヒューレット・パッカード株式会社 タイミング較正方法
JP2589864B2 (ja) * 1990-09-11 1997-03-12 松下電器産業株式会社 信号比較装置
JP2002040099A (ja) * 2000-07-24 2002-02-06 Advantest Corp 近似波形生成方法及び半導体試験装置
JP2003014786A (ja) * 2001-06-27 2003-01-15 Iwatsu Electric Co Ltd トリガ信号生成装置

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