JP2005533254A5 - - Google Patents
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- Publication number
- JP2005533254A5 JP2005533254A5 JP2004521866A JP2004521866A JP2005533254A5 JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5 JP 2004521866 A JP2004521866 A JP 2004521866A JP 2004521866 A JP2004521866 A JP 2004521866A JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5
- Authority
- JP
- Japan
- Prior art keywords
- electrical
- contactor
- interposer
- test
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims 13
- 239000000758 substrate Substances 0.000 claims 13
- 230000000875 corresponding Effects 0.000 claims 5
- 239000000523 sample Substances 0.000 claims 4
- 230000001808 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 claims 1
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/197,133 US6853209B1 (en) | 2002-07-16 | 2002-07-16 | Contactor assembly for testing electrical circuits |
US10/197,104 US6867608B2 (en) | 2002-07-16 | 2002-07-16 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
PCT/US2003/022125 WO2004008163A2 (en) | 2002-07-16 | 2003-07-15 | Assembly for connecting a test device to an object to be tested |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005533254A JP2005533254A (ja) | 2005-11-04 |
JP2005533254A5 true JP2005533254A5 (zh) | 2006-08-17 |
Family
ID=30117843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004521866A Pending JP2005533254A (ja) | 2002-07-16 | 2003-07-15 | 被試験部品上の電気回路を試験するために被試験部品を試験機械に電気的に接続するための組立体 |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1523685A2 (zh) |
JP (1) | JP2005533254A (zh) |
KR (1) | KR20050029215A (zh) |
CN (1) | CN100523826C (zh) |
AU (1) | AU2003249276A1 (zh) |
WO (1) | WO2004008163A2 (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5085534B2 (ja) | 2005-04-27 | 2012-11-28 | エイアー テスト システムズ | 電子デバイスを試験するための装置 |
CN101051067B (zh) * | 2006-04-03 | 2010-08-11 | 航天科工防御技术研究试验中心 | 电连接器综合检测控制装置设计方法 |
MY152599A (en) | 2007-02-14 | 2014-10-31 | Eles Semiconductor Equipment S P A | Test of electronic devices at package level using test boards without sockets |
EP1959265A1 (en) * | 2007-02-16 | 2008-08-20 | Eles Semiconductor Equipment S.P.A. | Testing integrated circuits on a wafer with a cartridge leaving exposed a surface thereof |
US7557594B2 (en) * | 2007-08-14 | 2009-07-07 | Electro Scientific Industries, Inc. | Automated contact alignment tool |
US7800382B2 (en) | 2007-12-19 | 2010-09-21 | AEHR Test Ststems | System for testing an integrated circuit of a device and its method of use |
CN101545926B (zh) * | 2008-03-25 | 2011-05-11 | 旺矽科技股份有限公司 | 探针测试装置 |
DE102009012021B4 (de) * | 2009-03-10 | 2011-02-03 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Messvorrichtung zur elektrischen Vermessung einer einseitig an einer Messseite elektrisch kontaktierbaren Messstruktur |
TWI440412B (zh) * | 2011-12-28 | 2014-06-01 | Princo Corp | 超薄多層基板之封裝方法 |
CN103808979A (zh) * | 2012-11-08 | 2014-05-21 | 富泰华工业(深圳)有限公司 | 用于承载待测试电子装置的治具 |
CN103808969A (zh) * | 2012-11-08 | 2014-05-21 | 富泰华工业(深圳)有限公司 | 用于承载待测试电子装置的治具 |
CN105548859A (zh) * | 2015-12-09 | 2016-05-04 | 上海精密计量测试研究所 | 用于环境测试的测试设备及方法 |
CN106200239B (zh) * | 2016-09-14 | 2019-03-15 | 海信集团有限公司 | 光机照明系统 |
US10782316B2 (en) * | 2017-01-09 | 2020-09-22 | Delta Design, Inc. | Socket side thermal system |
EP4290243A3 (en) | 2017-03-03 | 2024-02-28 | AEHR Test Systems | Electronics tester |
JP2023545764A (ja) | 2020-10-07 | 2023-10-31 | エイアー テスト システムズ | 電子試験器 |
WO2023278632A1 (en) | 2021-06-30 | 2023-01-05 | Delta Design, Inc. | Temperature control system including contactor assembly |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5148103A (en) * | 1990-10-31 | 1992-09-15 | Hughes Aircraft Company | Apparatus for testing integrated circuits |
JPH0763788A (ja) * | 1993-08-21 | 1995-03-10 | Hewlett Packard Co <Hp> | プローブおよび電気部品/回路検査装置ならびに電気部品/回路検査方法 |
US6028437A (en) * | 1997-05-19 | 2000-02-22 | Si Diamond Technology, Inc. | Probe head assembly |
US6137297A (en) * | 1999-01-06 | 2000-10-24 | Vertest Systemsn Corp. | Electronic test probe interface assembly and method of manufacture |
JP2001013208A (ja) * | 1999-06-30 | 2001-01-19 | Mitsubishi Electric Corp | 半導体テスト治工具 |
-
2003
- 2003-07-15 EP EP03764698A patent/EP1523685A2/en not_active Withdrawn
- 2003-07-15 KR KR1020057000799A patent/KR20050029215A/ko not_active Application Discontinuation
- 2003-07-15 CN CNB038166755A patent/CN100523826C/zh not_active Expired - Fee Related
- 2003-07-15 JP JP2004521866A patent/JP2005533254A/ja active Pending
- 2003-07-15 AU AU2003249276A patent/AU2003249276A1/en not_active Abandoned
- 2003-07-15 WO PCT/US2003/022125 patent/WO2004008163A2/en active Application Filing
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