JP2005529340A5 - - Google Patents

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Publication number
JP2005529340A5
JP2005529340A5 JP2004511866A JP2004511866A JP2005529340A5 JP 2005529340 A5 JP2005529340 A5 JP 2005529340A5 JP 2004511866 A JP2004511866 A JP 2004511866A JP 2004511866 A JP2004511866 A JP 2004511866A JP 2005529340 A5 JP2005529340 A5 JP 2005529340A5
Authority
JP
Japan
Prior art keywords
specimen
enclosure assembly
pressure
fluid
conduit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004511866A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005529340A (ja
Filing date
Publication date
Priority claimed from IL15005602A external-priority patent/IL150056A0/xx
Application filed filed Critical
Publication of JP2005529340A publication Critical patent/JP2005529340A/ja
Publication of JP2005529340A5 publication Critical patent/JP2005529340A5/ja
Pending legal-status Critical Current

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JP2004511866A 2002-06-05 2003-06-01 湿った環境中の走査型電子顕微鏡のための低圧チャンバー Pending JP2005529340A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL15005602A IL150056A0 (en) 2002-06-05 2002-06-05 Low-pressure chamber for scanning electron microscopy in a wet environment
PCT/IL2003/000455 WO2003104847A2 (en) 2002-06-05 2003-06-01 Low-pressure chamber for scanning electron microscopy in a wet environment

Publications (2)

Publication Number Publication Date
JP2005529340A JP2005529340A (ja) 2005-09-29
JP2005529340A5 true JP2005529340A5 (https=) 2006-07-20

Family

ID=28053348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004511866A Pending JP2005529340A (ja) 2002-06-05 2003-06-01 湿った環境中の走査型電子顕微鏡のための低圧チャンバー

Country Status (6)

Country Link
US (1) US7304313B2 (https=)
EP (1) EP1509941A4 (https=)
JP (1) JP2005529340A (https=)
AU (1) AU2003228091A1 (https=)
IL (1) IL150056A0 (https=)
WO (1) WO2003104847A2 (https=)

Families Citing this family (18)

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WO2003104846A2 (en) * 2002-06-05 2003-12-18 Quantomix Ltd. A sample enclosure for a scanning electron microscope and methods of use thereof
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JP4808100B2 (ja) * 2006-07-28 2011-11-02 花王株式会社 細菌の共凝集能の評価方法
EP1953793B1 (en) * 2007-01-31 2012-05-16 JEOL Ltd. Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder
JP5226378B2 (ja) 2008-04-28 2013-07-03 株式会社日立ハイテクノロジーズ 透過型電子顕微鏡、及び試料観察方法
US8059271B2 (en) 2009-02-04 2011-11-15 The United States Of America As Represented By The Secretary Of The Army Reusable sample holding device permitting ready loading of very small wet samples
US8698098B2 (en) 2010-07-30 2014-04-15 E.A. Fischione Instruments, Inc. In situ holder assembly
US8178851B2 (en) 2010-07-30 2012-05-15 E.A. Fischione Instruments, Inc. In situ holder assembly
WO2012018827A2 (en) * 2010-08-02 2012-02-09 Protochips, Inc. Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
US9437393B2 (en) 2012-11-16 2016-09-06 Protochips, Inc. Method for forming an electrical connection to an sample support in an electron microscope holder
JP6364167B2 (ja) * 2013-09-30 2018-07-25 株式会社日立ハイテクノロジーズ 環境制御型荷電粒子観察システム
GB2537579A (en) * 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
WO2017006408A1 (ja) * 2015-07-06 2017-01-12 株式会社 日立ハイテクノロジーズ 荷電粒子線装置
CN209591971U (zh) * 2018-03-22 2019-11-05 邑流微测股份有限公司 显微镜

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