IL150056A0 - Low-pressure chamber for scanning electron microscopy in a wet environment - Google Patents

Low-pressure chamber for scanning electron microscopy in a wet environment

Info

Publication number
IL150056A0
IL150056A0 IL15005602A IL15005602A IL150056A0 IL 150056 A0 IL150056 A0 IL 150056A0 IL 15005602 A IL15005602 A IL 15005602A IL 15005602 A IL15005602 A IL 15005602A IL 150056 A0 IL150056 A0 IL 150056A0
Authority
IL
Israel
Prior art keywords
low
pressure chamber
scanning electron
electron microscopy
wet environment
Prior art date
Application number
IL15005602A
Other languages
English (en)
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Priority to IL15005602A priority Critical patent/IL150056A0/xx
Publication of IL150056A0 publication Critical patent/IL150056A0/xx
Priority to JP2004511866A priority patent/JP2005529340A/ja
Priority to PCT/IL2003/000455 priority patent/WO2003104847A2/en
Priority to EP03725573A priority patent/EP1509941A4/en
Priority to US10/516,407 priority patent/US7304313B2/en
Priority to AU2003228091A priority patent/AU2003228091A1/en
Priority to IL165495A priority patent/IL165495A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2602—Details
    • H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
    • H01J2237/2608—Details operating at elevated pressures, e.g. atmosphere with environmental specimen chamber

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IL15005602A 2002-06-05 2002-06-05 Low-pressure chamber for scanning electron microscopy in a wet environment IL150056A0 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL15005602A IL150056A0 (en) 2002-06-05 2002-06-05 Low-pressure chamber for scanning electron microscopy in a wet environment
JP2004511866A JP2005529340A (ja) 2002-06-05 2003-06-01 湿った環境中の走査型電子顕微鏡のための低圧チャンバー
PCT/IL2003/000455 WO2003104847A2 (en) 2002-06-05 2003-06-01 Low-pressure chamber for scanning electron microscopy in a wet environment
EP03725573A EP1509941A4 (en) 2002-06-05 2003-06-01 LOW-PRESSURE CHAMBER FOR RASTER ELECTRONIC MICROSCOPY IN A WET ENVIRONMENT
US10/516,407 US7304313B2 (en) 2002-06-05 2003-06-01 Low-pressure chamber for scanning electron microscopy in a wet environment
AU2003228091A AU2003228091A1 (en) 2002-06-05 2003-06-01 Low-pressure chamber for scanning electron microscopy in a wet environment
IL165495A IL165495A (en) 2002-06-05 2004-12-01 Specimen enclosure assembly for scanning fluid containing specimens via scanning electron microscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL15005602A IL150056A0 (en) 2002-06-05 2002-06-05 Low-pressure chamber for scanning electron microscopy in a wet environment

Publications (1)

Publication Number Publication Date
IL150056A0 true IL150056A0 (en) 2002-12-01

Family

ID=28053348

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15005602A IL150056A0 (en) 2002-06-05 2002-06-05 Low-pressure chamber for scanning electron microscopy in a wet environment

Country Status (6)

Country Link
US (1) US7304313B2 (https=)
EP (1) EP1509941A4 (https=)
JP (1) JP2005529340A (https=)
AU (1) AU2003228091A1 (https=)
IL (1) IL150056A0 (https=)
WO (1) WO2003104847A2 (https=)

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JP4808100B2 (ja) * 2006-07-28 2011-11-02 花王株式会社 細菌の共凝集能の評価方法
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US8698098B2 (en) 2010-07-30 2014-04-15 E.A. Fischione Instruments, Inc. In situ holder assembly
US8178851B2 (en) 2010-07-30 2012-05-15 E.A. Fischione Instruments, Inc. In situ holder assembly
WO2012018827A2 (en) * 2010-08-02 2012-02-09 Protochips, Inc. Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
US9437393B2 (en) 2012-11-16 2016-09-06 Protochips, Inc. Method for forming an electrical connection to an sample support in an electron microscope holder
JP6364167B2 (ja) * 2013-09-30 2018-07-25 株式会社日立ハイテクノロジーズ 環境制御型荷電粒子観察システム
GB2537579A (en) * 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
WO2017006408A1 (ja) * 2015-07-06 2017-01-12 株式会社 日立ハイテクノロジーズ 荷電粒子線装置
CN209591971U (zh) * 2018-03-22 2019-11-05 邑流微测股份有限公司 显微镜

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Also Published As

Publication number Publication date
US20050279938A1 (en) 2005-12-22
EP1509941A2 (en) 2005-03-02
WO2003104847A2 (en) 2003-12-18
JP2005529340A (ja) 2005-09-29
US7304313B2 (en) 2007-12-04
WO2003104847A3 (en) 2004-04-15
AU2003228091A1 (en) 2003-12-22
AU2003228091A8 (en) 2003-12-22
EP1509941A4 (en) 2007-12-12

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