FR1345670A - Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide - Google Patents

Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide

Info

Publication number
FR1345670A
FR1345670A FR913395A FR913395A FR1345670A FR 1345670 A FR1345670 A FR 1345670A FR 913395 A FR913395 A FR 913395A FR 913395 A FR913395 A FR 913395A FR 1345670 A FR1345670 A FR 1345670A
Authority
FR
France
Prior art keywords
chious
empty
liquid sample
sample holders
ray spectrometers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR913395A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Generale de Radiologie SA
Original Assignee
Compagnie Generale de Radiologie SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Generale de Radiologie SA filed Critical Compagnie Generale de Radiologie SA
Priority to FR913395A priority Critical patent/FR1345670A/fr
Priority to US315031A priority patent/US3218459A/en
Application granted granted Critical
Publication of FR1345670A publication Critical patent/FR1345670A/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204Specimen supports therefor; Sample conveying means therefore

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR913395A 1962-10-25 1962-10-25 Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide Expired FR1345670A (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR913395A FR1345670A (fr) 1962-10-25 1962-10-25 Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide
US315031A US3218459A (en) 1962-10-25 1963-10-09 Fluid sample holders for x-ray spectrometers under vacuum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR913395A FR1345670A (fr) 1962-10-25 1962-10-25 Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide

Publications (1)

Publication Number Publication Date
FR1345670A true FR1345670A (fr) 1963-12-13

Family

ID=8789474

Family Applications (1)

Application Number Title Priority Date Filing Date
FR913395A Expired FR1345670A (fr) 1962-10-25 1962-10-25 Perfectionnements aux porte-échantillons liquides pour spectromètres à rayons chious vide

Country Status (2)

Country Link
US (1) US3218459A (fr)
FR (1) FR1345670A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3344274A (en) * 1967-09-26 Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing
US3378684A (en) * 1965-06-16 1968-04-16 Gen Electric Fluid sample cell with means to keep constant pressure on the sample fluid
US4528657A (en) * 1983-02-07 1985-07-09 E. I. Du Pont De Nemours And Company Fluid sample cell for X-ray analysis
US4587666A (en) * 1984-05-03 1986-05-06 Angelo M. Torrisi System and a method for mounting film to a sample holder for X-ray spectroscopic fluorescence analysis
US4575869A (en) * 1984-05-16 1986-03-11 Angelo M. Torrisi Sample holder with handling support for X-ray spectroscopic analysis
US4643033A (en) * 1985-09-20 1987-02-17 Chemplex Industries, Inc. Sample cup for use in X-ray spectroscopy
US5181233A (en) * 1991-11-08 1993-01-19 Florida State University Specimen holder
CN1511332A (zh) * 2000-12-01 2004-07-07 Ү���о�����չ���޹�˾ 采用扫描电子显微镜在非真空环境下检验样品的装置和方法
JP2005529341A (ja) 2002-06-05 2005-09-29 クアントミックス・リミテッド サンプルを含む流体のsem検査のための方法
IL150056A0 (en) * 2002-06-05 2002-12-01 Yeda Res & Dev Low-pressure chamber for scanning electron microscopy in a wet environment
US20070125947A1 (en) * 2003-02-20 2007-06-07 David Sprinzak Sample enclosure for a scanning electron microscope and methods of use thereof
CN103940836A (zh) * 2013-01-22 2014-07-23 中国科学院青海盐湖研究所 液体x射线散射样品池
US10533959B2 (en) 2013-10-18 2020-01-14 University Of Virginia Patent Foundation Device and related method for solution scattering and diffraction sample holders
US10423769B2 (en) 2014-06-12 2019-09-24 Maxell, Ltd. Information processing device, application software start-up system, and application software start-up method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2690695A (en) * 1952-01-03 1954-10-05 Perkin Elmer Corp Variable space absorption cell
US2819402A (en) * 1955-11-28 1958-01-07 Perkin Elmer Corp Radiation sample cell
US3090861A (en) * 1960-01-28 1963-05-21 Edward O Haenni Cell for use in radiation absorption analysis

Also Published As

Publication number Publication date
US3218459A (en) 1965-11-16

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