JP2005516181A - 物体の少なくとも1つの物理的パラメータのマイクロ波測定のための装置及び方法 - Google Patents

物体の少なくとも1つの物理的パラメータのマイクロ波測定のための装置及び方法 Download PDF

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JP2005516181A
JP2005516181A JP2003500541A JP2003500541A JP2005516181A JP 2005516181 A JP2005516181 A JP 2005516181A JP 2003500541 A JP2003500541 A JP 2003500541A JP 2003500541 A JP2003500541 A JP 2003500541A JP 2005516181 A JP2005516181 A JP 2005516181A
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microwave
signal
electrical signal
receiver
polarizer
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ジョンソン,オラファー,エイチ
ソーゲイアーソン,ジョン,ソー
サングスター,アラン,ジョン
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Intelscan Orbylgjutaekni ehf
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04Investigating moisture content

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  • Electromagnetism (AREA)
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JP2003500541A 2001-05-31 2002-05-31 物体の少なくとも1つの物理的パラメータのマイクロ波測定のための装置及び方法 Pending JP2005516181A (ja)

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US29424901P 2001-05-31 2001-05-31
IS5960 2001-05-31
PCT/IS2002/000011 WO2002097411A1 (en) 2001-05-31 2002-05-31 Apparatus and method for microwave determination of at least one physical parameter of a substance

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US (1) US7187183B2 (enExample)
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KR (1) KR20040020909A (enExample)
CN (1) CN1287142C (enExample)
AT (1) ATE314639T1 (enExample)
AU (1) AU2002304283B2 (enExample)
CA (1) CA2500191A1 (enExample)
DE (1) DE60208374T2 (enExample)
DK (1) DK1407254T3 (enExample)
ES (1) ES2256478T3 (enExample)
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NO (1) NO20035320D0 (enExample)
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WO (1) WO2002097411A1 (enExample)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271412A (ja) * 2006-03-31 2007-10-18 Yamato Scale Co Ltd 脂質含有率測定方法及び装置
JP2010085193A (ja) * 2008-09-30 2010-04-15 Kawasaki Kiko Co Ltd 低含水率茶葉の含水率測定方法及びその装置並びにこれらを用いた製茶加工工程の制御方法
JP2011080877A (ja) * 2009-10-07 2011-04-21 Mitsui Eng & Shipbuild Co Ltd 位相差測定方法及び位相差測定装置
WO2016103477A1 (ja) * 2014-12-26 2016-06-30 日本たばこ産業株式会社 フィルタ検査装置
JP2018054330A (ja) * 2016-09-26 2018-04-05 株式会社日立製作所 検査装置
JP2019511267A (ja) * 2016-02-17 2019-04-25 オルサス メディカル リミテッド 血液中の標的物質の濃度を測定するための方法および装置
JP2019070535A (ja) * 2017-10-06 2019-05-09 マイクロメジャー株式会社 含水率等の測定装置及び測定方法
JP2023526569A (ja) * 2020-02-14 2023-06-22 テウス エレクトロニク ゲーエムベーハー ウント コー カーゲー 反射マイクロ波の透過測定のための装置および方法
JP2024085449A (ja) * 2022-12-15 2024-06-27 Jfeスチール株式会社 耐火物層の欠陥検査方法、溶融金属用容器の修繕方法及び、耐火物層の欠陥検査装置

Families Citing this family (85)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
WO2003089950A2 (en) * 2002-04-15 2003-10-30 Toolz, Ltd. Distance measurement device
US6815963B2 (en) 2002-05-23 2004-11-09 Cascade Microtech, Inc. Probe for testing a device under test
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE102004031626A1 (de) * 2004-06-30 2006-02-02 Robert Bosch Gmbh Verfahren und Vorrichtung zur Materialstärkenbestimmung auf Hochfrequenzbasis
JP4980903B2 (ja) 2004-07-07 2012-07-18 カスケード マイクロテック インコーポレイテッド 膜懸垂プローブを具えるプローブヘッド
JP2008512680A (ja) 2004-09-13 2008-04-24 カスケード マイクロテック インコーポレイテッド 両面プロービング構造体
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US20060220658A1 (en) * 2005-03-31 2006-10-05 Seichi Okamura Sensor system for moisture and salt measurement using microstripline
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
WO2006137979A2 (en) 2005-06-13 2006-12-28 Cascade Microtech, Inc. Wideband active-passive differential signal probe
WO2007146285A2 (en) 2006-06-09 2007-12-21 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US20080012578A1 (en) * 2006-07-14 2008-01-17 Cascade Microtech, Inc. System for detecting molecular structure and events
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
DE102007057092B4 (de) * 2007-11-20 2009-08-06 Tews Elektronik Dipl.-Ing. Manfred Tews Verfahren und Vorrichtung zur Feuchte- und/oder Dichtemessung
RU2354959C1 (ru) * 2008-04-07 2009-05-10 Институт проблем управления им. В.А. Трапезникова РАН Устройство для определения сплошности газожидкостного потока
DE102008032835A1 (de) * 2008-07-14 2010-01-21 Hauni Maschinenbau Ag Verfahren und Vorrichtung zur Messung der Beladung eines Stranges der Tabak verarbeitenden Industrie mit einer Stoffmenge
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
KR101843590B1 (ko) * 2010-02-26 2018-03-29 시냅틱스 인코포레이티드 간섭을 회피하기 위해 복조를 변경하는 것
US9898121B2 (en) 2010-04-30 2018-02-20 Synaptics Incorporated Integrated capacitive sensing and displaying
DE102011102991B4 (de) * 2011-05-24 2014-02-13 Krohne Messtechnik Gmbh Vorrichtung zur Bestimmung des Volumenanteils wenigstens einer Komponente eines mehrphasigen Mediums
CN102621161B (zh) * 2012-03-31 2013-10-16 中国科学院长春应用化学研究所 一种材料性能参数获取方法
RU2508534C1 (ru) * 2012-08-13 2014-02-27 Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук Устройство для измерения геометрического размера диэлектрической частицы
US10009114B2 (en) 2013-03-20 2018-06-26 Ariel-University Research And Development Company Ltd. Method and system for controlling phase of a signal
ITFI20130266A1 (it) * 2013-11-05 2015-05-06 Advanced Microwave Engineering S R L Dispositivo e metodo associato per la rilevazione e la misura delle caratteristiche fisico-chimiche di materiali in forma di fogli, film, tessuti, strati depositati su di un supporto o simili.
RU2550778C1 (ru) * 2014-01-10 2015-05-10 Учреждение Российской академии наук Институт проблем управления им. В.А. Трапезникова РАН Способ определения состояния поверхности дороги
RU2552272C1 (ru) * 2014-03-14 2015-06-10 Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук Способ определения состояния поверхности дороги
CN105510386A (zh) * 2014-09-26 2016-04-20 多瑙控制治理工程有限责任公司 用于测量纸和各种含纤维材料的含水量的射频测量系统
US10520302B2 (en) * 2015-10-02 2019-12-31 Honeywell International Inc. Monitoring thickness uniformity
US10257014B2 (en) 2015-10-08 2019-04-09 Ariel-University Research And Development Company Ltd. Method and system for controlling phase of a signal
DE102015225578A1 (de) * 2015-12-17 2017-06-22 Robert Bosch Gmbh Vorrichtung zum Empfangen von Mikrowellenstrahlung
WO2018085452A1 (en) * 2016-11-07 2018-05-11 FarmX Inc. Systems and Methods for Soil Modeling and Automatic Irrigation Control
US11519896B2 (en) 2017-01-13 2022-12-06 FarmX Inc. Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus
US10591423B1 (en) 2017-03-22 2020-03-17 Northrop Grumman Systems Corporation Inline fabric conductivity measurement
CN107064917A (zh) * 2017-03-30 2017-08-18 上海斐讯数据通信技术有限公司 一种微波定位方法及系统
CN107421967B (zh) * 2017-07-28 2020-12-22 昆山国显光电有限公司 一种玻璃检测装置及检测方法
US11166404B2 (en) 2018-09-02 2021-11-09 FarmX Inc. Systems and methods for virtual agronomic sensing
RU2690952C1 (ru) * 2018-09-17 2019-06-07 ООО "Генезис-Таврида" Способ определения процентного содержания воды в смеси диэлектрик-вода при использовании различных диэлектриков
EP3674703A1 (en) * 2018-12-31 2020-07-01 INESC TEC - Instituto de Engenharia de Sistemas e Computadores, Tecnologia e Ciência Method and device for measuring water present in vegetation
DE102019101598A1 (de) * 2019-01-23 2020-07-23 Endress+Hauser SE+Co. KG Messgerät zur Bestimmung eines Dielektrizitätswertes
DE112020001112B4 (de) 2019-08-20 2022-09-29 Japan Tobacco Inc. Herstellverfahren und Herstellvorrichtung für zylindrische Heiztyp-Tabakartikel
DE102019008595B4 (de) * 2019-12-11 2021-11-11 OndoSense GmbH Verfahren zur Bestimmung von Kenngrößen von dielektrischen Schichten
US12000788B1 (en) * 2020-01-10 2024-06-04 Gold Bond Building Products, Llc Inline detection of gypsum panel calcination
US11533946B2 (en) * 2020-06-22 2022-12-27 R. J. Reynolds Tobacco Co. Systems and methods for determining a characteristic of a smoking article
US11464179B2 (en) 2020-07-31 2022-10-11 FarmX Inc. Systems providing irrigation optimization using sensor networks and soil moisture modeling
CN113607758A (zh) * 2021-09-06 2021-11-05 中国计量大学 一种污泥含水率检测装置及方法
CN114018955A (zh) * 2021-11-04 2022-02-08 南京航空航天大学 一种基于微波的仓储烟包含水率测量装置及测量方法
CN116124800A (zh) * 2021-11-13 2023-05-16 安徽青囊科技有限公司 Uwb高价值中草药检测传感器
CN116136503A (zh) * 2021-11-17 2023-05-19 安徽青囊科技有限公司 Uwb水体重金属污染无线检测仪
CN114965511A (zh) * 2022-05-20 2022-08-30 上海兰宝传感科技股份有限公司 基于微波的检测设备及电路
CN115684212A (zh) * 2022-10-28 2023-02-03 上海兰宝传感科技股份有限公司 一种木材含水率的检测装置及方法
CN120693070A (zh) * 2023-02-17 2025-09-23 Gea 食品策划巴克尔公司 食品加工生产线和加工食品的方法
CN118464943B (zh) * 2024-07-09 2024-11-15 欣禾电子(上海)有限公司 一种微波水分测量系统、方法、装置和存储介质

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3247508A (en) * 1963-10-04 1966-04-19 American Brake Shoe Co Microwave identification of railroad cars
GB1376747A (en) 1971-02-11 1974-12-11 Molins Ltd Monitoring devices
US4052666A (en) 1976-04-15 1977-10-04 Nasa Remote sensing of vegetation and soil using microwave ellipsometry
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
DE3027094C2 (de) 1980-07-17 1987-03-19 Siemens AG, 1000 Berlin und 8000 München Umpolarisiereinrichtung zur Erzeugung zirkular polarisierter elektromagnetischer Wellen
IL66327A0 (enExample) * 1982-07-15 1982-11-30
AT400988B (de) * 1983-11-07 1996-05-28 Strahlen Umweltforsch Gmbh Verfahren zur messung wetterbedingter zustandsänderungen an der oberfläche von verkehrsflächen und vorrichtung zum durchführen des verfahrens
US4707652A (en) * 1983-11-30 1987-11-17 Philip Morris Incorporated Impurity detector measuring parallel polarized scattered electromagnetic radiation
SU1223028A2 (ru) * 1984-07-16 1986-04-07 Казанский Ордена Трудового Красного Знамени И Ордена Дружбы Народов Авиационный Институт Им.А.Н.Туполева Интерферометр дл диагностики плазмы
US4757514A (en) * 1985-08-13 1988-07-12 Laser Corporation Of America Wire array light polarizer for gas laser
DE3768767D1 (en) * 1986-11-12 1991-04-25 Atomic Energy Authority Uk Duennschichtmonitor.
US4745361A (en) * 1987-03-03 1988-05-17 University Of Rochester Electro-optic measurement (network analysis) system
SU1506387A1 (ru) * 1987-06-23 1989-09-07 Институт Прикладной Физики Ан Бсср Устройство дл измерени толщины диэлектрических покрытий металлов
US4947128A (en) * 1989-02-23 1990-08-07 Texaco Ijn Inc Co-variance microwave water cut monitoring means and method
US5315258A (en) * 1989-01-13 1994-05-24 Kajaani Elektroniikka Oy Method and apparatus for determining the moisture content of a material
US5497100A (en) * 1994-10-17 1996-03-05 Hughes Aircraft Company Surface condition sensing system
WO1997010514A1 (en) * 1995-09-11 1997-03-20 Yissum Research Development Company Of The Hebrew University Of Jerusalem Near-field resistivity microscope
GB2307611B (en) * 1995-11-01 2000-03-22 British Gas Plc Measurement arrangement
US6163158A (en) * 1996-02-20 2000-12-19 Hauni Maschinenbau Ag Method of and apparatus for ascertaining at least one characteristic of a substance
US5959594A (en) * 1997-03-04 1999-09-28 Trw Inc. Dual polarization frequency selective medium for diplexing two close bands at an incident angle
US6100703A (en) * 1998-07-08 2000-08-08 Yissum Research Development Company Of The University Of Jerusalum Polarization-sensitive near-field microwave microscope
US6172510B1 (en) * 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
FI991548A7 (fi) * 1999-07-06 2001-04-05 Metso Paper Automation Oy Menetelmä rainan sakeuden mittaamiseksi ja mittalaite
US6529154B1 (en) * 2000-03-16 2003-03-04 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for reading two dimensional identification symbols using radar techniques
AU2001282722A1 (en) * 2000-08-15 2002-02-25 Industrial Research Limited Apparatus and method for measuring characteristics of anisotropic materials

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271412A (ja) * 2006-03-31 2007-10-18 Yamato Scale Co Ltd 脂質含有率測定方法及び装置
JP2010085193A (ja) * 2008-09-30 2010-04-15 Kawasaki Kiko Co Ltd 低含水率茶葉の含水率測定方法及びその装置並びにこれらを用いた製茶加工工程の制御方法
JP2011080877A (ja) * 2009-10-07 2011-04-21 Mitsui Eng & Shipbuild Co Ltd 位相差測定方法及び位相差測定装置
WO2016103477A1 (ja) * 2014-12-26 2016-06-30 日本たばこ産業株式会社 フィルタ検査装置
JPWO2016103477A1 (ja) * 2014-12-26 2017-05-25 日本たばこ産業株式会社 フィルタ検査装置
JP2019511267A (ja) * 2016-02-17 2019-04-25 オルサス メディカル リミテッド 血液中の標的物質の濃度を測定するための方法および装置
JP6990187B2 (ja) 2016-02-17 2022-01-12 エイフォン テクノロジー リミテッド 血液中の標的物質の濃度を測定するための方法および装置
JP2018054330A (ja) * 2016-09-26 2018-04-05 株式会社日立製作所 検査装置
JP2019070535A (ja) * 2017-10-06 2019-05-09 マイクロメジャー株式会社 含水率等の測定装置及び測定方法
JP2023526569A (ja) * 2020-02-14 2023-06-22 テウス エレクトロニク ゲーエムベーハー ウント コー カーゲー 反射マイクロ波の透過測定のための装置および方法
JP7472295B2 (ja) 2020-02-14 2024-04-22 テウス エレクトロニク ゲーエムベーハー ウント コー カーゲー 反射マイクロ波の透過測定のための装置および方法
JP2024085449A (ja) * 2022-12-15 2024-06-27 Jfeスチール株式会社 耐火物層の欠陥検査方法、溶融金属用容器の修繕方法及び、耐火物層の欠陥検査装置

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AU2002304283B2 (en) 2007-10-11
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EP1407254A1 (en) 2004-04-14
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