SE8000410L - Sprickdetektor - Google Patents

Sprickdetektor

Info

Publication number
SE8000410L
SE8000410L SE8000410A SE8000410A SE8000410L SE 8000410 L SE8000410 L SE 8000410L SE 8000410 A SE8000410 A SE 8000410A SE 8000410 A SE8000410 A SE 8000410A SE 8000410 L SE8000410 L SE 8000410L
Authority
SE
Sweden
Prior art keywords
workpiece
flaws
attempts
receiver
hot
Prior art date
Application number
SE8000410A
Other languages
Unknown language ( )
English (en)
Inventor
A P Anderson
J C Jackson
Original Assignee
Lambda Ind Science Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lambda Ind Science Ltd filed Critical Lambda Ind Science Ltd
Publication of SE8000410L publication Critical patent/SE8000410L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
SE8000410A 1979-01-20 1980-01-18 Sprickdetektor SE8000410L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB7902132 1979-01-20

Publications (1)

Publication Number Publication Date
SE8000410L true SE8000410L (sv) 1980-07-21

Family

ID=10502641

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8000410A SE8000410L (sv) 1979-01-20 1980-01-18 Sprickdetektor

Country Status (4)

Country Link
US (1) US4344030A (sv)
JP (1) JPS55129734A (sv)
DE (1) DE3001885A1 (sv)
SE (1) SE8000410L (sv)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59224547A (ja) * 1983-06-03 1984-12-17 Kanzaki Paper Mfg Co Ltd 繊維シ−トの繊維配向測定方法
AT400988B (de) * 1983-11-07 1996-05-28 Strahlen Umweltforsch Gmbh Verfahren zur messung wetterbedingter zustandsänderungen an der oberfläche von verkehrsflächen und vorrichtung zum durchführen des verfahrens
JPS60203839A (ja) * 1984-03-29 1985-10-15 Agency Of Ind Science & Technol 電磁波による異方性材料の方向性測定法
US5384543A (en) * 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5886534A (en) * 1995-10-27 1999-03-23 The University Of Chicago Millimeter wave sensor for on-line inspection of thin sheet dielectrics
US5859535A (en) * 1997-02-12 1999-01-12 The United States Of America As Represented By The Secretary Of The Navy System for determining size and location of defects in material by use of microwave radiation
US6359446B1 (en) 1997-09-25 2002-03-19 Jack R. Little, Jr. Apparatus and method for nondestructive testing of dielectric materials
WO1999015883A1 (en) * 1997-09-25 1999-04-01 Little Jack R Jr Nondestructive testing of dielectric materials
US6100703A (en) * 1998-07-08 2000-08-08 Yissum Research Development Company Of The University Of Jerusalum Polarization-sensitive near-field microwave microscope
US6172510B1 (en) 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
WO2002014847A1 (en) * 2000-08-15 2002-02-21 Industrial Research Limited Apparatus and method for measuring characteristics of anisotropic materials
US7187183B2 (en) * 2001-05-31 2007-03-06 Intelscan Orbylgjutaekni Enf. Apparatus and method for microwave determination of at least one physical parameter of a substance
GB2398946A (en) * 2003-02-22 2004-09-01 Qinetiq Ltd Microwave radar detection of surface discontinuities
JP2007278916A (ja) * 2006-04-10 2007-10-25 Jfe Steel Kk 鋳片欠陥検査方法及び装置
DE102006026048A1 (de) * 2006-06-01 2007-12-20 Gbm Wiebe Gleisbaumaschinen Gmbh GPS gestütztes, kontinuierliches Trassenerkundungssystem mit Multisensorik
DE102007057696A1 (de) * 2007-11-30 2009-06-10 BAM Bundesanstalt für Materialforschung und -prüfung Vorrichtung und Verfahren zur Detektion von Verbundstörungen
US8525705B1 (en) 2010-05-20 2013-09-03 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for detecting defects in solid rocket motor propellant
US9989359B2 (en) 2013-09-25 2018-06-05 Evisive, Inc. Nondestructive, absolute determination of thickness of or depth in dielectric materials
US9488601B2 (en) * 2014-03-26 2016-11-08 Paneratech, Inc. Material erosion monitoring system and method
US9880110B2 (en) 2014-03-26 2018-01-30 Paneratech, Inc. Material erosion monitoring system and method
WO2020061289A1 (en) * 2018-09-20 2020-03-26 Nucor Corporation Online monitoring and control to eliminate surface defects arising during the production of cast steel strip

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE564022A (sv) * 1957-01-16
BE563869A (sv) * 1957-01-25
US3562642A (en) * 1968-12-02 1971-02-09 Richard Hochschild Apparatus and method for measuring properties of materials by sensing signals responsive to both amplitude and phase changes in transmitted or reflected microwave energy
US3710243A (en) * 1971-08-18 1973-01-09 Lockheed Aircraft Corp Microwave gage for monitoring thickness of a conductive workpiece, flaws therein or displacement relative thereto
US3936736A (en) * 1974-08-28 1976-02-03 Lockheed Aircraft Corporation Radome test instrument
US4123703A (en) * 1977-09-02 1978-10-31 Sri International Microwave method of and apparatus for flaw detection
CH626998A5 (en) * 1978-03-22 1981-12-15 Bbc Brown Boveri & Cie Method for non-destructive testing of non-metallic bodies

Also Published As

Publication number Publication date
US4344030A (en) 1982-08-10
JPS55129734A (en) 1980-10-07
DE3001885A1 (de) 1980-07-31

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