CA2500191A1 - Apparatus and method for microwave determination of at least one physical parameter of a substance - Google Patents

Apparatus and method for microwave determination of at least one physical parameter of a substance Download PDF

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Publication number
CA2500191A1
CA2500191A1 CA002500191A CA2500191A CA2500191A1 CA 2500191 A1 CA2500191 A1 CA 2500191A1 CA 002500191 A CA002500191 A CA 002500191A CA 2500191 A CA2500191 A CA 2500191A CA 2500191 A1 CA2500191 A1 CA 2500191A1
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CA
Canada
Prior art keywords
microwaves
signal
electrical signal
receiver
physical parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
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CA002500191A
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English (en)
French (fr)
Inventor
Olafur H. Jonsson
Jon Thor Thorgeirsson
Alan John Sangster
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intelscan Orbylgjutaekni ehf
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Individual
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Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2500191A1 publication Critical patent/CA2500191A1/en
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04—Investigating moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Blast Furnaces (AREA)
CA002500191A 2001-05-31 2002-05-31 Apparatus and method for microwave determination of at least one physical parameter of a substance Abandoned CA2500191A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US29424901P 2001-05-31 2001-05-31
IS5960 2001-05-31
IS5960 2001-05-31
US60/294,249 2001-05-31
PCT/IS2002/000011 WO2002097411A1 (en) 2001-05-31 2002-05-31 Apparatus and method for microwave determination of at least one physical parameter of a substance

Publications (1)

Publication Number Publication Date
CA2500191A1 true CA2500191A1 (en) 2002-12-05

Family

ID=36763231

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002500191A Abandoned CA2500191A1 (en) 2001-05-31 2002-05-31 Apparatus and method for microwave determination of at least one physical parameter of a substance

Country Status (15)

Country Link
US (1) US7187183B2 (enExample)
EP (1) EP1407254B1 (enExample)
JP (1) JP2005516181A (enExample)
KR (1) KR20040020909A (enExample)
CN (1) CN1287142C (enExample)
AT (1) ATE314639T1 (enExample)
AU (1) AU2002304283B2 (enExample)
CA (1) CA2500191A1 (enExample)
DE (1) DE60208374T2 (enExample)
DK (1) DK1407254T3 (enExample)
ES (1) ES2256478T3 (enExample)
IS (1) IS7054A (enExample)
NO (1) NO20035320D0 (enExample)
RU (1) RU2298197C2 (enExample)
WO (1) WO2002097411A1 (enExample)

Families Citing this family (94)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
WO2003089948A2 (en) * 2002-04-15 2003-10-30 Toolz, Ltd. Constructing a waveform from multiple threshold samples
KR100864916B1 (ko) 2002-05-23 2008-10-22 캐스케이드 마이크로테크 인코포레이티드 피시험 디바이스를 테스트하기 위한 프로브
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
JP2007517231A (ja) 2003-12-24 2007-06-28 カスケード マイクロテック インコーポレイテッド アクティブ・ウェハプローブ
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE102004031626A1 (de) * 2004-06-30 2006-02-02 Robert Bosch Gmbh Verfahren und Vorrichtung zur Materialstärkenbestimmung auf Hochfrequenzbasis
KR101157449B1 (ko) 2004-07-07 2012-06-22 캐스케이드 마이크로테크 인코포레이티드 멤브레인 서스펜디드 프로브를 구비한 프로브 헤드
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US20060220658A1 (en) * 2005-03-31 2006-10-05 Seichi Okamura Sensor system for moisture and salt measurement using microstripline
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
JP5008330B2 (ja) * 2006-03-31 2012-08-22 大和製衡株式会社 脂質含有率測定方法及び装置
DE202007018733U1 (de) 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US20080012578A1 (en) * 2006-07-14 2008-01-17 Cascade Microtech, Inc. System for detecting molecular structure and events
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
DE102007057092B4 (de) * 2007-11-20 2009-08-06 Tews Elektronik Dipl.-Ing. Manfred Tews Verfahren und Vorrichtung zur Feuchte- und/oder Dichtemessung
RU2354959C1 (ru) * 2008-04-07 2009-05-10 Институт проблем управления им. В.А. Трапезникова РАН Устройство для определения сплошности газожидкостного потока
DE102008032835A1 (de) * 2008-07-14 2010-01-21 Hauni Maschinenbau Ag Verfahren und Vorrichtung zur Messung der Beladung eines Stranges der Tabak verarbeitenden Industrie mit einer Stoffmenge
JP5421566B2 (ja) * 2008-09-30 2014-02-19 カワサキ機工株式会社 低含水率茶葉の含水率測定方法及びその装置並びにこれらを用いた製茶加工工程の制御方法
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
JP5373534B2 (ja) * 2009-10-07 2013-12-18 三井造船株式会社 位相差測定方法及び位相差測定装置
US9805692B2 (en) 2010-02-26 2017-10-31 Synaptics Incorporated Varying demodulation to avoid interference
US9898121B2 (en) 2010-04-30 2018-02-20 Synaptics Incorporated Integrated capacitive sensing and displaying
DE102011102991B4 (de) * 2011-05-24 2014-02-13 Krohne Messtechnik Gmbh Vorrichtung zur Bestimmung des Volumenanteils wenigstens einer Komponente eines mehrphasigen Mediums
CN102621161B (zh) * 2012-03-31 2013-10-16 中国科学院长春应用化学研究所 一种材料性能参数获取方法
RU2508534C1 (ru) * 2012-08-13 2014-02-27 Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук Устройство для измерения геометрического размера диэлектрической частицы
ITFI20130266A1 (it) * 2013-11-05 2015-05-06 Advanced Microwave Engineering S R L Dispositivo e metodo associato per la rilevazione e la misura delle caratteristiche fisico-chimiche di materiali in forma di fogli, film, tessuti, strati depositati su di un supporto o simili.
RU2550778C1 (ru) * 2014-01-10 2015-05-10 Учреждение Российской академии наук Институт проблем управления им. В.А. Трапезникова РАН Способ определения состояния поверхности дороги
RU2552272C1 (ru) * 2014-03-14 2015-06-10 Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук Способ определения состояния поверхности дороги
EP3120473B1 (en) 2014-03-20 2021-04-07 Ariel-University Research and Development Company Ltd. Method and system for controlling phase of a signal
CN105510386A (zh) * 2014-09-26 2016-04-20 多瑙控制治理工程有限责任公司 用于测量纸和各种含纤维材料的含水量的射频测量系统
PL3238552T3 (pl) * 2014-12-26 2021-12-06 Japan Tobacco Inc. Urządzenie do kontroli filtra
US10520302B2 (en) * 2015-10-02 2019-12-31 Honeywell International Inc. Monitoring thickness uniformity
US10257014B2 (en) 2015-10-08 2019-04-09 Ariel-University Research And Development Company Ltd. Method and system for controlling phase of a signal
DE102015225578A1 (de) * 2015-12-17 2017-06-22 Robert Bosch Gmbh Vorrichtung zum Empfangen von Mikrowellenstrahlung
GB201602773D0 (en) * 2016-02-17 2016-03-30 Orsus Medical Ltd A method and apparatus for measuring the concentration of target substances in blood
JP6709710B2 (ja) * 2016-09-26 2020-06-17 株式会社日立製作所 検査装置
WO2018085452A1 (en) * 2016-11-07 2018-05-11 FarmX Inc. Systems and Methods for Soil Modeling and Automatic Irrigation Control
US11519896B2 (en) 2017-01-13 2022-12-06 FarmX Inc. Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus
US10591423B1 (en) 2017-03-22 2020-03-17 Northrop Grumman Systems Corporation Inline fabric conductivity measurement
CN107064917A (zh) * 2017-03-30 2017-08-18 上海斐讯数据通信技术有限公司 一种微波定位方法及系统
CN107421967B (zh) * 2017-07-28 2020-12-22 昆山国显光电有限公司 一种玻璃检测装置及检测方法
JP2019070535A (ja) * 2017-10-06 2019-05-09 マイクロメジャー株式会社 含水率等の測定装置及び測定方法
US11166404B2 (en) 2018-09-02 2021-11-09 FarmX Inc. Systems and methods for virtual agronomic sensing
RU2690952C1 (ru) * 2018-09-17 2019-06-07 ООО "Генезис-Таврида" Способ определения процентного содержания воды в смеси диэлектрик-вода при использовании различных диэлектриков
EP3674703A1 (en) * 2018-12-31 2020-07-01 INESC TEC - Instituto de Engenharia de Sistemas e Computadores, Tecnologia e Ciência Method and device for measuring water present in vegetation
DE102019101598A1 (de) * 2019-01-23 2020-07-23 Endress+Hauser SE+Co. KG Messgerät zur Bestimmung eines Dielektrizitätswertes
JP6889346B1 (ja) 2019-08-20 2021-06-18 日本たばこ産業株式会社 円筒状加熱型喫煙物品の製造方法及び製造装置
DE102019008595B4 (de) * 2019-12-11 2021-11-11 OndoSense GmbH Verfahren zur Bestimmung von Kenngrößen von dielektrischen Schichten
US12000788B1 (en) * 2020-01-10 2024-06-04 Gold Bond Building Products, Llc Inline detection of gypsum panel calcination
DE102020103978A1 (de) 2020-02-14 2021-08-19 Tews Elektronik Gmbh & Co. Kg Vorrichtung und Verfahren zur Transmissionsmessung von reflektierten Mikrowellen
US11533946B2 (en) * 2020-06-22 2022-12-27 R. J. Reynolds Tobacco Co. Systems and methods for determining a characteristic of a smoking article
US11464179B2 (en) 2020-07-31 2022-10-11 FarmX Inc. Systems providing irrigation optimization using sensor networks and soil moisture modeling
CN113607758A (zh) * 2021-09-06 2021-11-05 中国计量大学 一种污泥含水率检测装置及方法
CN114018955A (zh) * 2021-11-04 2022-02-08 南京航空航天大学 一种基于微波的仓储烟包含水率测量装置及测量方法
CN116124800A (zh) * 2021-11-13 2023-05-16 安徽青囊科技有限公司 Uwb高价值中草药检测传感器
CN116136503A (zh) * 2021-11-17 2023-05-19 安徽青囊科技有限公司 Uwb水体重金属污染无线检测仪
CN114965511A (zh) * 2022-05-20 2022-08-30 上海兰宝传感科技股份有限公司 基于微波的检测设备及电路
CN115684212A (zh) * 2022-10-28 2023-02-03 上海兰宝传感科技股份有限公司 一种木材含水率的检测装置及方法
JP2024085449A (ja) * 2022-12-15 2024-06-27 Ｊｆｅスチール株式会社 耐火物層の欠陥検査方法、溶融金属用容器の修繕方法及び、耐火物層の欠陥検査装置
WO2024170249A1 (en) * 2023-02-17 2024-08-22 Gea Food Solutions Bakel B.V. Food processing line and method for processing foodstuff
CN118464943B (zh) * 2024-07-09 2024-11-15 欣禾电子(上海)有限公司 一种微波水分测量系统、方法、装置和存储介质

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3247508A (en) * 1963-10-04 1966-04-19 American Brake Shoe Co Microwave identification of railroad cars
GB1376747A (en) * 1971-02-11 1974-12-11 Molins Ltd Monitoring devices
US4052666A (en) * 1976-04-15 1977-10-04 Nasa Remote sensing of vegetation and soil using microwave ellipsometry
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
DE3027094C2 (de) * 1980-07-17 1987-03-19 Siemens AG, 1000 Berlin und 8000 München Umpolarisiereinrichtung zur Erzeugung zirkular polarisierter elektromagnetischer Wellen
IL66327A0 (enExample) * 1982-07-15 1982-11-30
AT400988B (de) * 1983-11-07 1996-05-28 Strahlen Umweltforsch Gmbh Verfahren zur messung wetterbedingter zustandsänderungen an der oberfläche von verkehrsflächen und vorrichtung zum durchführen des verfahrens
US4707652A (en) * 1983-11-30 1987-11-17 Philip Morris Incorporated Impurity detector measuring parallel polarized scattered electromagnetic radiation
SU1223028A2 (ru) * 1984-07-16 1986-04-07 Казанский Ордена Трудового Красного Знамени И Ордена Дружбы Народов Авиационный Институт Им.А.Н.Туполева Интерферометр дл диагностики плазмы
US4757514A (en) * 1985-08-13 1988-07-12 Laser Corporation Of America Wire array light polarizer for gas laser
EP0267683B1 (en) * 1986-11-12 1991-03-20 United Kingdom Atomic Energy Authority Thin layer monitor
US4745361A (en) * 1987-03-03 1988-05-17 University Of Rochester Electro-optic measurement (network analysis) system
SU1506387A1 (ru) * 1987-06-23 1989-09-07 Институт Прикладной Физики Ан Бсср Устройство дл измерени толщины диэлектрических покрытий металлов
US4947128A (en) * 1989-02-23 1990-08-07 Texaco Ijn Inc Co-variance microwave water cut monitoring means and method
US5315258A (en) * 1989-01-13 1994-05-24 Kajaani Elektroniikka Oy Method and apparatus for determining the moisture content of a material
US5497100A (en) * 1994-10-17 1996-03-05 Hughes Aircraft Company Surface condition sensing system
WO1997010514A1 (en) * 1995-09-11 1997-03-20 Yissum Research Development Company Of The Hebrew University Of Jerusalem Near-field resistivity microscope
GB2307611B (en) * 1995-11-01 2000-03-22 British Gas Plc Measurement arrangement
US6163158A (en) * 1996-02-20 2000-12-19 Hauni Maschinenbau Ag Method of and apparatus for ascertaining at least one characteristic of a substance
US5959594A (en) * 1997-03-04 1999-09-28 Trw Inc. Dual polarization frequency selective medium for diplexing two close bands at an incident angle
US6100703A (en) * 1998-07-08 2000-08-08 Yissum Research Development Company Of The University Of Jerusalum Polarization-sensitive near-field microwave microscope
US6172510B1 (en) * 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
FI991548A7 (fi) * 1999-07-06 2001-04-05 Metso Paper Automation Oy Menetelmä rainan sakeuden mittaamiseksi ja mittalaite
US6529154B1 (en) * 2000-03-16 2003-03-04 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for reading two dimensional identification symbols using radar techniques
WO2002014847A1 (en) * 2000-08-15 2002-02-21 Industrial Research Limited Apparatus and method for measuring characteristics of anisotropic materials

Also Published As

Publication number Publication date
CN1287142C (zh) 2006-11-29
RU2298197C2 (ru) 2007-04-27
US7187183B2 (en) 2007-03-06
DE60208374D1 (de) 2006-02-02
CN1559004A (zh) 2004-12-29
US20040239338A1 (en) 2004-12-02
ATE314639T1 (de) 2006-01-15
EP1407254B1 (en) 2005-12-28
AU2002304283B2 (en) 2007-10-11
RU2003137895A (ru) 2005-06-10
JP2005516181A (ja) 2005-06-02
ES2256478T3 (es) 2006-07-16
DK1407254T3 (da) 2006-05-22
DE60208374T2 (de) 2006-09-07
IS7054A (is) 2003-11-27
EP1407254A1 (en) 2004-04-14
NO20035320D0 (no) 2003-11-28
WO2002097411A1 (en) 2002-12-05
KR20040020909A (ko) 2004-03-09

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