JP2005509880A5 - - Google Patents

Download PDF

Info

Publication number
JP2005509880A5
JP2005509880A5 JP2003546060A JP2003546060A JP2005509880A5 JP 2005509880 A5 JP2005509880 A5 JP 2005509880A5 JP 2003546060 A JP2003546060 A JP 2003546060A JP 2003546060 A JP2003546060 A JP 2003546060A JP 2005509880 A5 JP2005509880 A5 JP 2005509880A5
Authority
JP
Japan
Prior art keywords
measurement device
optical measurement
lever
optical
test strip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2003546060A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005509880A (ja
Filing date
Publication date
Priority claimed from DE10156804A external-priority patent/DE10156804B4/de
Application filed filed Critical
Publication of JP2005509880A publication Critical patent/JP2005509880A/ja
Publication of JP2005509880A5 publication Critical patent/JP2005509880A5/ja
Withdrawn legal-status Critical Current

Links

JP2003546060A 2001-11-20 2002-11-18 テストストリップの光学測定デバイス Withdrawn JP2005509880A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10156804A DE10156804B4 (de) 2001-11-20 2001-11-20 Optische Meßvorrichtung für Teststreifen
PCT/US2002/036885 WO2003044474A1 (en) 2001-11-20 2002-11-18 Optical measuring device for test strips

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009027916A Division JP2009236901A (ja) 2001-11-20 2009-02-09 テストストリップの光学測定デバイス

Publications (2)

Publication Number Publication Date
JP2005509880A JP2005509880A (ja) 2005-04-14
JP2005509880A5 true JP2005509880A5 (enExample) 2005-12-15

Family

ID=7706268

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2003546060A Withdrawn JP2005509880A (ja) 2001-11-20 2002-11-18 テストストリップの光学測定デバイス
JP2009027916A Pending JP2009236901A (ja) 2001-11-20 2009-02-09 テストストリップの光学測定デバイス

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2009027916A Pending JP2009236901A (ja) 2001-11-20 2009-02-09 テストストリップの光学測定デバイス

Country Status (7)

Country Link
EP (1) EP1459040B1 (enExample)
JP (2) JP2005509880A (enExample)
CN (1) CN100483087C (enExample)
AU (1) AU2002363929A1 (enExample)
DE (1) DE10156804B4 (enExample)
TW (1) TWI266048B (enExample)
WO (1) WO2003044474A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10156804B4 (de) * 2001-11-20 2011-03-17 Quidel Corp., San Diego Optische Meßvorrichtung für Teststreifen
US7688438B2 (en) * 2005-12-20 2010-03-30 Raytheon Company Scanning solar diffuser relative reflectance monitor
DE102006018544A1 (de) * 2006-04-21 2007-10-25 Mayr-Melnhof Karton Ag Verpackung und Verwendung von Duftstoffen in einer Verpackung
CN101118217B (zh) * 2007-09-10 2010-05-19 西安近代化学研究所 维也里试验试纸颜色辨识装置
CN101620371B (zh) * 2008-07-02 2011-03-30 比亚迪股份有限公司 摄像头测试装置
CN101738385B (zh) * 2008-11-24 2011-09-21 周礼君 管状波导式等离子体激元共振感测装置及感测系统
KR101202648B1 (ko) * 2011-07-22 2012-11-19 (주)대경산업 배뇨 분석 리더기
SE536430C2 (sv) * 2011-11-23 2013-10-29 Calmark Sweden Ab Testsystemarrangemang och metod för testning
SE536431C2 (sv) 2011-11-23 2013-10-29 Calmark Sweden Ab Testsystemarrangemang och metod för testning
WO2017132172A1 (en) 2016-01-28 2017-08-03 Siemens Healthcare Diagnostics Inc. Methods and apparatus for imaging a specimen container and/or specimen using multiple exposures
WO2020058782A1 (en) 2018-09-21 2020-03-26 Foss Analytical A/S Lateral flow assay device and analyser
WO2024241349A1 (en) * 2023-05-24 2024-11-28 Inito Inc Slab-based optical device, system, and method to capture image of test device

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3407754A1 (de) * 1984-03-02 1985-09-12 Boehringer Mannheim Gmbh, 6800 Mannheim Geraet zur bestimmung des diffusen reflexionsvermoegens einer probenflaeche kleiner abmessungen
US4935346A (en) * 1986-08-13 1990-06-19 Lifescan, Inc. Minimum procedure system for the determination of analytes
JPH01204481A (ja) * 1988-02-10 1989-08-17 Iwasaki Electric Co Ltd Ｌｅｄ線状光源
DE3914037A1 (de) * 1989-04-28 1990-10-31 Boehringer Mannheim Gmbh Testtraegeranalysegeraet
JP2771309B2 (ja) * 1990-04-17 1998-07-02 アルプス電気株式会社 光学読取装置
JPH04345417A (ja) * 1991-05-21 1992-12-01 Sanyo Electric Co Ltd パレット移送式コンベア
JP3559975B2 (ja) * 1992-09-10 2004-09-02 テラメックス株式会社 試験片を用いる分析方法
JP3250328B2 (ja) * 1993-07-22 2002-01-28 スズキ株式会社 ワーク移送装置
DE4420260C2 (de) * 1994-06-10 1998-08-06 Alfred Prof Dr Ing Leipertz Verfahren zur Bestimmung von Farbwertanteilen und Farbsättigung
IT1273968B (it) * 1995-02-24 1997-07-11 Finmeccanica Spa Apparecchiatura per il rilevamento ottico di difetti superficiali in particolare per nastri laminati
US5695949A (en) * 1995-04-07 1997-12-09 Lxn Corp. Combined assay for current glucose level and intermediate or long-term glycemic control
JP3660761B2 (ja) * 1996-10-03 2005-06-15 技術研究組合医療福祉機器研究所 散乱体の吸収情報の計測方法及び装置
US5877863A (en) * 1997-03-20 1999-03-02 Bayer Corporation Readhead for a photometric diagnostic instrument
JPH112635A (ja) * 1997-06-12 1999-01-06 Kdk Corp 短冊片の搬送装置、およびこれを備えた分析装置
WO1999023479A1 (en) * 1997-10-31 1999-05-14 Technical Chemicals & Products, Inc. Reflectometer
US6124585A (en) * 1998-10-27 2000-09-26 Umm Electronics, Inc. Apparatus for measuring the reflectance of strips having non-uniform color
US6115184A (en) * 1998-11-13 2000-09-05 Xerox Corporation Light collector for an LED array
JP3650558B2 (ja) * 1999-11-09 2005-05-18 株式会社日立製作所 反射率測定装置
JP2001183309A (ja) * 1999-12-27 2001-07-06 Asahi Glass Co Ltd 透明板の均質性評価装置および評価方法
JP4031824B2 (ja) * 2001-05-22 2008-01-09 ゼロックス コーポレイション カラープリント用色修正システム及び分光光度計
DE10156804B4 (de) * 2001-11-20 2011-03-17 Quidel Corp., San Diego Optische Meßvorrichtung für Teststreifen

Similar Documents

Publication Publication Date Title
JP2005509880A5 (enExample)
JP2009236901A (ja) テストストリップの光学測定デバイス
JP5576477B2 (ja) 透過サブストレートの欠陥を検出するための方法とシステム
US8264691B2 (en) Surface plasmon resonance spectrometer with an actuator driven angle scanning mechanism
CN1257207A (zh) 测量移动表面或材料输送带的速度、位移和应变的系统
JP2007298522A5 (enExample)
US20040233421A1 (en) Method and device for examining an object in a contactless manner, especially for examining the surface form of the same
CA2632724A1 (en) Apparatus and method for measuring the surface of a body
TWI518313B (zh) 透明基板的表面圖案不良測定裝置
JP3940650B2 (ja) 皮脂量測定装置及び肌用観察装置
US20060022124A1 (en) System and method for automated testing of optical characteristics of a light-emitting element
CN106796456A (zh) 用于显示器的检测器
US6295129B1 (en) Arrangement and method for marking defects
JP2004136582A (ja) 液滴吐出ヘッドの液滴吐出検査方法、液滴吐出検査装置、および液滴吐出装置
CN100476400C (zh) 免疫层析试验片的测定装置
TWI276149B (en) Method and device for detecting patterns on a substrate
US7456941B2 (en) Measuring device for measuring the refraction properties of optical lenses
US7623240B2 (en) Optical measuring device for test strips
JP2006129121A5 (enExample)
JPH11108844A (ja) 鏡面材料並びに透過材料の検査用光源装置
US4660984A (en) Reflectometer featuring an integrated cavity of enhanced efficiency
CN1211651C (zh) 样件镜面反射率的测量
CN114139562B (zh) 二维码检测装置
JP2003514690A (ja) リボン上の標識を識別するセンサ
JP2009258111A (ja) 進行する材料ウェブ上の目印の横方向位置の光学的検出装置および上記装置の操作方法