JP2005308510A - 位相雑音測定装置および位相雑音測定システム - Google Patents

位相雑音測定装置および位相雑音測定システム Download PDF

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Publication number
JP2005308510A
JP2005308510A JP2004124967A JP2004124967A JP2005308510A JP 2005308510 A JP2005308510 A JP 2005308510A JP 2004124967 A JP2004124967 A JP 2004124967A JP 2004124967 A JP2004124967 A JP 2004124967A JP 2005308510 A JP2005308510 A JP 2005308510A
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Japan
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signal
phase noise
phase
frequency
distributor
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JP2004124967A
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Japanese (ja)
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JP2005308510A5 (enExample
Inventor
Yoshiyuki Yanagimoto
吉之 柳本
Junichi Iwai
岩井　淳一
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Agilent Technologies Inc
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Agilent Technologies Inc
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Priority to JP2004124967A priority Critical patent/JP2005308510A/ja
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JP2004124967A 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム Pending JP2005308510A (ja)

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JP2004124967A JP2005308510A (ja) 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム

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JP2004124967A JP2005308510A (ja) 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム

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JP2005308510A true JP2005308510A (ja) 2005-11-04
JP2005308510A5 JP2005308510A5 (enExample) 2007-05-24

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197160A (zh) * 2013-03-14 2013-07-10 东南大学 一种电子装置残余相位噪声的检测方法及其装置
CN115963333A (zh) * 2023-03-16 2023-04-14 国仪量子(合肥)技术有限公司 噪声谱密度扫描方法、扫描装置、存储介质及电子设备

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956170A (ja) * 1982-09-24 1984-03-31 Advantest Corp 伝達関数測定器
JPH04350576A (ja) * 1991-05-27 1992-12-04 Nippon Telegr & Teleph Corp <Ntt> 付加位相雑音測定方法および装置
JPH07270464A (ja) * 1993-12-23 1995-10-20 Hughes Aircraft Co 位相雑音測定システムおよび方法
JPH08184624A (ja) * 1994-12-28 1996-07-16 Sony Corp 伝達関数測定装置
JPH09119957A (ja) * 1995-06-06 1997-05-06 He Holdings Inc Dba Hughes Electron ノイズ測定検査システム
JP2001358616A (ja) * 2000-06-14 2001-12-26 Anritsu Corp 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956170A (ja) * 1982-09-24 1984-03-31 Advantest Corp 伝達関数測定器
JPH04350576A (ja) * 1991-05-27 1992-12-04 Nippon Telegr & Teleph Corp <Ntt> 付加位相雑音測定方法および装置
JPH07270464A (ja) * 1993-12-23 1995-10-20 Hughes Aircraft Co 位相雑音測定システムおよび方法
JPH08184624A (ja) * 1994-12-28 1996-07-16 Sony Corp 伝達関数測定装置
JPH09119957A (ja) * 1995-06-06 1997-05-06 He Holdings Inc Dba Hughes Electron ノイズ測定検査システム
JP2001358616A (ja) * 2000-06-14 2001-12-26 Anritsu Corp 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197160A (zh) * 2013-03-14 2013-07-10 东南大学 一种电子装置残余相位噪声的检测方法及其装置
CN115963333A (zh) * 2023-03-16 2023-04-14 国仪量子(合肥)技术有限公司 噪声谱密度扫描方法、扫描装置、存储介质及电子设备
CN115963333B (zh) * 2023-03-16 2023-05-16 国仪量子(合肥)技术有限公司 噪声谱密度扫描方法、扫描装置、存储介质及电子设备

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