JP2005308510A5 - - Google Patents

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Publication number
JP2005308510A5
JP2005308510A5 JP2004124967A JP2004124967A JP2005308510A5 JP 2005308510 A5 JP2005308510 A5 JP 2005308510A5 JP 2004124967 A JP2004124967 A JP 2004124967A JP 2004124967 A JP2004124967 A JP 2004124967A JP 2005308510 A5 JP2005308510 A5 JP 2005308510A5
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JP
Japan
Prior art keywords
signal
distributor
phase
phase noise
input terminal
Prior art date
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Pending
Application number
JP2004124967A
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English (en)
Japanese (ja)
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JP2005308510A (ja
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Priority to JP2004124967A priority Critical patent/JP2005308510A/ja
Priority claimed from JP2004124967A external-priority patent/JP2005308510A/ja
Publication of JP2005308510A publication Critical patent/JP2005308510A/ja
Publication of JP2005308510A5 publication Critical patent/JP2005308510A5/ja
Pending legal-status Critical Current

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JP2004124967A 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム Pending JP2005308510A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004124967A JP2005308510A (ja) 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004124967A JP2005308510A (ja) 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム

Publications (2)

Publication Number Publication Date
JP2005308510A JP2005308510A (ja) 2005-11-04
JP2005308510A5 true JP2005308510A5 (enExample) 2007-05-24

Family

ID=35437461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004124967A Pending JP2005308510A (ja) 2004-04-21 2004-04-21 位相雑音測定装置および位相雑音測定システム

Country Status (1)

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JP (1) JP2005308510A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197160B (zh) * 2013-03-14 2015-09-16 东南大学 一种电子装置残余相位噪声的检测方法及其装置
CN115963333B (zh) * 2023-03-16 2023-05-16 国仪量子(合肥)技术有限公司 噪声谱密度扫描方法、扫描装置、存储介质及电子设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956170A (ja) * 1982-09-24 1984-03-31 Advantest Corp 伝達関数測定器
JP3099979B2 (ja) * 1991-05-27 2000-10-16 日本電信電話株式会社 付加位相雑音測定方法および装置
US5412325A (en) * 1993-12-23 1995-05-02 Hughes Aircraft Company Phase noise measurement system and method
JP3381109B2 (ja) * 1994-12-28 2003-02-24 ソニー株式会社 伝達関数測定装置
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
JP3921035B2 (ja) * 2000-06-14 2007-05-30 アンリツ株式会社 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置

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