JP2005157382A - 人間工学的に配置された観察試料調整制御装置 - Google Patents

人間工学的に配置された観察試料調整制御装置 Download PDF

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Publication number
JP2005157382A
JP2005157382A JP2004340272A JP2004340272A JP2005157382A JP 2005157382 A JP2005157382 A JP 2005157382A JP 2004340272 A JP2004340272 A JP 2004340272A JP 2004340272 A JP2004340272 A JP 2004340272A JP 2005157382 A JP2005157382 A JP 2005157382A
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JP
Japan
Prior art keywords
microscope
sample holder
control
stage
knob
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2004340272A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005157382A5 (enExample
Inventor
Jasna Roeth
ジャスナ・レース
Manfred Gilbert
マンフレッド・ギルバート
Russell Bonaventura
ラッセル・ボナベンチュラ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems CMS GmbH
Original Assignee
Leica Microsystems Wetzlar GmbH
Leica Microsystems CMS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/721,695 external-priority patent/US7324275B2/en
Priority claimed from US10/733,628 external-priority patent/US20050128575A1/en
Application filed by Leica Microsystems Wetzlar GmbH, Leica Microsystems CMS GmbH filed Critical Leica Microsystems Wetzlar GmbH
Publication of JP2005157382A publication Critical patent/JP2005157382A/ja
Publication of JP2005157382A5 publication Critical patent/JP2005157382A5/ja
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/242—Devices for focusing with coarse and fine adjustment mechanism
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
JP2004340272A 2003-11-25 2004-11-25 人間工学的に配置された観察試料調整制御装置 Abandoned JP2005157382A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/721,695 US7324275B2 (en) 2003-11-25 2003-11-25 Microscope stage apparatus and movement means
US10/733,628 US20050128575A1 (en) 2003-12-11 2003-12-11 Microscope stage contrasting means
US10/811,344 US7136223B2 (en) 2003-11-25 2004-03-26 Erogonomically arranged object adjustment controls

Publications (2)

Publication Number Publication Date
JP2005157382A true JP2005157382A (ja) 2005-06-16
JP2005157382A5 JP2005157382A5 (enExample) 2006-04-13

Family

ID=34637205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004340272A Abandoned JP2005157382A (ja) 2003-11-25 2004-11-25 人間工学的に配置された観察試料調整制御装置

Country Status (4)

Country Link
US (1) US7136223B2 (enExample)
JP (1) JP2005157382A (enExample)
CN (1) CN1651963A (enExample)
DE (1) DE102004056531A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011508282A (ja) * 2007-12-27 2011-03-10 サイテック コーポレイション 顕微鏡の機能を片手でコントロールするための装置
JP2015222381A (ja) * 2014-05-23 2015-12-10 オリンパス株式会社 顕微鏡装置

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7324275B2 (en) * 2003-11-25 2008-01-29 Leica Microsystems Cms Gmbh Microscope stage apparatus and movement means
DE102006061067A1 (de) * 2006-12-22 2008-06-26 Carl Zeiss Microimaging Gmbh Tischtrieb für Mikroskope
TWM441541U (en) * 2012-05-03 2012-11-21 mao-xiang Wu Precision alignment platform for X, Y and θ
USD754229S1 (en) * 2013-11-14 2016-04-19 Carl Zeiss Microscopy Gmbh Microscope
US11112592B2 (en) * 2015-04-24 2021-09-07 Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College Fine focus microscope control
CN110361858A (zh) * 2018-08-21 2019-10-22 上海北昂医药科技股份有限公司 三维扫描平台
CN109298518A (zh) * 2018-11-13 2019-02-01 普宁市思迪实业有限公司 一种便于观察型医用显微镜
CN110161672B (zh) * 2019-06-11 2022-05-10 长春长光辰英生物科学仪器有限公司 一种粗微调结合的精密位移装置
CN112033720B (zh) * 2020-08-31 2023-05-16 重庆医科大学 一种犯罪现场取样装置及证物观察装置
CN112485142B (zh) * 2020-11-20 2023-04-18 中国直升机设计研究所 一种布氏硬度压痕测量装置
CN114910342A (zh) * 2022-05-17 2022-08-16 厦门理工学院 一种精密测量仪及利用该精密测量仪测量布氏硬度压痕的方法
CN115128004B (zh) * 2022-06-29 2023-03-28 湛江中心人民医院 一种用于生物医疗的显微视觉检测装置
CN118603888B (zh) * 2024-08-07 2024-11-08 徐州聚之科光电科技有限公司 一种望远镜镜片影像测量仪及其测量方法
CN119087658B (zh) * 2024-11-08 2025-05-27 苏州科灵医疗科技有限公司 一种用于光学显微镜的对焦机构及其对焦方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4911543A (en) * 1988-05-31 1990-03-27 Hodgson R W Microscope viewing apparatus for viewing a specimen image and an optical overlay pattern image in a comparison manner
JPH07318807A (ja) * 1994-05-19 1995-12-08 Nikon Corp 自動顕微鏡
JPH10197418A (ja) * 1997-01-10 1998-07-31 Chuo Seiki Kk ミクロトーム
JP4378762B2 (ja) * 1999-05-19 2009-12-09 株式会社ニコン ステージ装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011508282A (ja) * 2007-12-27 2011-03-10 サイテック コーポレイション 顕微鏡の機能を片手でコントロールするための装置
JP2015222381A (ja) * 2014-05-23 2015-12-10 オリンパス株式会社 顕微鏡装置

Also Published As

Publication number Publication date
CN1651963A (zh) 2005-08-10
DE102004056531A1 (de) 2005-06-30
US7136223B2 (en) 2006-11-14
US20050111096A1 (en) 2005-05-26

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