JP2005078766A5 - - Google Patents

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Publication number
JP2005078766A5
JP2005078766A5 JP2003311393A JP2003311393A JP2005078766A5 JP 2005078766 A5 JP2005078766 A5 JP 2005078766A5 JP 2003311393 A JP2003311393 A JP 2003311393A JP 2003311393 A JP2003311393 A JP 2003311393A JP 2005078766 A5 JP2005078766 A5 JP 2005078766A5
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JP
Japan
Prior art keywords
data
sense amplifier
amplifier circuit
circuit
redundant
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JP2003311393A
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English (en)
Japanese (ja)
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JP4287222B2 (ja
JP2005078766A (ja
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Priority to JP2003311393A priority Critical patent/JP4287222B2/ja
Priority claimed from JP2003311393A external-priority patent/JP4287222B2/ja
Priority to US10/713,196 priority patent/US6922364B2/en
Priority to KR1020040069872A priority patent/KR100794827B1/ko
Publication of JP2005078766A publication Critical patent/JP2005078766A/ja
Publication of JP2005078766A5 publication Critical patent/JP2005078766A5/ja
Application granted granted Critical
Publication of JP4287222B2 publication Critical patent/JP4287222B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003311393A 2003-09-03 2003-09-03 不揮発性半導体記憶装置 Expired - Fee Related JP4287222B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003311393A JP4287222B2 (ja) 2003-09-03 2003-09-03 不揮発性半導体記憶装置
US10/713,196 US6922364B2 (en) 2003-09-03 2003-11-17 Non-volatile semiconductor memory device and electric device with the same
KR1020040069872A KR100794827B1 (ko) 2003-09-03 2004-09-02 불휘발성 반도체 기억 장치 및 이것을 이용한 전자 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003311393A JP4287222B2 (ja) 2003-09-03 2003-09-03 不揮発性半導体記憶装置

Publications (3)

Publication Number Publication Date
JP2005078766A JP2005078766A (ja) 2005-03-24
JP2005078766A5 true JP2005078766A5 (enExample) 2005-11-24
JP4287222B2 JP4287222B2 (ja) 2009-07-01

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ID=34214254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003311393A Expired - Fee Related JP4287222B2 (ja) 2003-09-03 2003-09-03 不揮発性半導体記憶装置

Country Status (3)

Country Link
US (1) US6922364B2 (enExample)
JP (1) JP4287222B2 (enExample)
KR (1) KR100794827B1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8559237B2 (en) 2006-03-29 2013-10-15 Mosaid Technologies Incorporated Non-volatile semiconductor memory with page erase

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3631463B2 (ja) 2001-12-27 2005-03-23 株式会社東芝 不揮発性半導体記憶装置
JP3977799B2 (ja) * 2003-12-09 2007-09-19 株式会社東芝 不揮発性半導体記憶装置
JP4256175B2 (ja) * 2003-02-04 2009-04-22 株式会社東芝 不揮発性半導体メモリ
JP4175991B2 (ja) 2003-10-15 2008-11-05 株式会社東芝 不揮発性半導体記憶装置
KR100528483B1 (ko) * 2004-01-02 2005-11-15 삼성전자주식회사 패스/페일 점검이 가능한 불휘발성 반도체 메모리장치
JP4357331B2 (ja) * 2004-03-24 2009-11-04 東芝メモリシステムズ株式会社 マイクロプロセッサブートアップ制御装置、及び情報処理システム
JP4157065B2 (ja) * 2004-03-29 2008-09-24 株式会社東芝 半導体記憶装置
US7400537B2 (en) * 2005-03-31 2008-07-15 Sandisk Corporation Systems for erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
JP4634229B2 (ja) * 2005-06-03 2011-02-16 シャープ株式会社 半導体不揮発性メモリ装置およびそれを備えた携帯情報端末機器
US7451264B2 (en) * 2006-04-13 2008-11-11 Sandisk Corporation Cycle count storage methods
WO2007121025A1 (en) * 2006-04-13 2007-10-25 Sandisk Corporation Cycle count storage methods and systems
US7467253B2 (en) * 2006-04-13 2008-12-16 Sandisk Corporation Cycle count storage systems
US7894269B2 (en) * 2006-07-20 2011-02-22 Sandisk Corporation Nonvolatile memory and method for compensating during programming for perturbing charges of neighboring cells
US7885119B2 (en) * 2006-07-20 2011-02-08 Sandisk Corporation Compensating for coupling during programming
US7499338B2 (en) * 2006-10-13 2009-03-03 Sandisk Corporation Partitioned soft programming in non-volatile memory
US7499317B2 (en) * 2006-10-13 2009-03-03 Sandisk Corporation System for partitioned erase and erase verification in a non-volatile memory to compensate for capacitive coupling
KR101062032B1 (ko) * 2006-10-13 2011-09-05 샌디스크 코포레이션 비휘발성 메모리에서의 분할된 소거 및 소거 검증
US7495954B2 (en) 2006-10-13 2009-02-24 Sandisk Corporation Method for partitioned erase and erase verification to compensate for capacitive coupling effects in non-volatile memory
US7535766B2 (en) * 2006-10-13 2009-05-19 Sandisk Corporation Systems for partitioned soft programming in non-volatile memory
US7660166B2 (en) * 2007-01-31 2010-02-09 Sandisk Il Ltd. Method of improving programming precision in flash memory
US7804718B2 (en) * 2007-03-07 2010-09-28 Mosaid Technologies Incorporated Partial block erase architecture for flash memory
US7558116B2 (en) * 2007-08-13 2009-07-07 Spansion Llc Regulation of boost-strap node ramp rate using capacitance to counter parasitic elements in channel
US7652929B2 (en) * 2007-09-17 2010-01-26 Sandisk Corporation Non-volatile memory and method for biasing adjacent word line for verify during programming
KR101068496B1 (ko) * 2008-11-14 2011-09-29 주식회사 하이닉스반도체 불휘발성 메모리 장치의 소거방법 및 프로그램 방법
KR101001449B1 (ko) * 2009-04-14 2010-12-14 주식회사 하이닉스반도체 불휘발성 소자의 독출 동작 방법
JP2011060388A (ja) * 2009-09-11 2011-03-24 Toshiba Corp 不揮発性メモリ装置
JP5524134B2 (ja) * 2011-06-14 2014-06-18 株式会社東芝 不揮発性半導体記憶装置
US8854895B2 (en) * 2013-02-28 2014-10-07 Kabushiki Kaisha Toshiba Semiconductor memory device
KR102701788B1 (ko) * 2018-09-28 2024-08-30 삼성전자주식회사 메모리 장치 및 이를 이용한 스토리지 시스템

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0713879B2 (ja) * 1985-06-21 1995-02-15 三菱電機株式会社 半導体記憶装置
JP3190031B2 (ja) 1990-03-31 2001-07-16 株式会社東芝 不揮発性半導体記憶装置
JP3199989B2 (ja) * 1994-09-30 2001-08-20 株式会社東芝 不揮発性半導体記憶装置とその過書込み救済方法
JPH08273390A (ja) * 1995-03-28 1996-10-18 Kokusai Electric Co Ltd フラッシュメモリの消去回数の管理方法
JP3967409B2 (ja) * 1996-12-26 2007-08-29 株式会社東芝 半導体集積回路装置
JP3946849B2 (ja) 1997-01-17 2007-07-18 株式会社東芝 不揮発性半導体記憶装置及びその消去方法
US6028794A (en) 1997-01-17 2000-02-22 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device and erasing method of the same
JP3549723B2 (ja) 1998-03-27 2004-08-04 富士通株式会社 半導体記憶装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8559237B2 (en) 2006-03-29 2013-10-15 Mosaid Technologies Incorporated Non-volatile semiconductor memory with page erase

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