JP2004530243A5 - - Google Patents
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- Publication number
- JP2004530243A5 JP2004530243A5 JP2002578510A JP2002578510A JP2004530243A5 JP 2004530243 A5 JP2004530243 A5 JP 2004530243A5 JP 2002578510 A JP2002578510 A JP 2002578510A JP 2002578510 A JP2002578510 A JP 2002578510A JP 2004530243 A5 JP2004530243 A5 JP 2004530243A5
- Authority
- JP
- Japan
- Prior art keywords
- bit line
- memory cell
- coupled
- bit
- coupling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000008878 coupling Effects 0.000 claims 6
- 238000010168 coupling process Methods 0.000 claims 6
- 238000005859 coupling reaction Methods 0.000 claims 6
- 230000000295 complement effect Effects 0.000 claims 2
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/823,642 US6757209B2 (en) | 2001-03-30 | 2001-03-30 | Memory cell structural test |
| PCT/US2002/007340 WO2002080183A2 (en) | 2001-03-30 | 2002-03-08 | Memory cell structural test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004530243A JP2004530243A (ja) | 2004-09-30 |
| JP2004530243A5 true JP2004530243A5 (cg-RX-API-DMAC7.html) | 2005-12-22 |
Family
ID=25239313
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002578510A Ceased JP2004530243A (ja) | 2001-03-30 | 2002-03-08 | メモリセルの構造試験 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6757209B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP1374250B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2004530243A (cg-RX-API-DMAC7.html) |
| KR (1) | KR100544362B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN100538910C (cg-RX-API-DMAC7.html) |
| AT (1) | ATE329354T1 (cg-RX-API-DMAC7.html) |
| DE (1) | DE60212103T2 (cg-RX-API-DMAC7.html) |
| MY (1) | MY127555A (cg-RX-API-DMAC7.html) |
| WO (1) | WO2002080183A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7480195B2 (en) * | 2005-05-11 | 2009-01-20 | Micron Technology, Inc. | Internal data comparison for memory testing |
| US7602778B2 (en) * | 2005-06-29 | 2009-10-13 | Cisco Technology, Inc. | System and methods for compressing message headers |
| JP4773791B2 (ja) * | 2005-09-30 | 2011-09-14 | 富士通セミコンダクター株式会社 | 半導体記憶装置、およびメモリテスト回路 |
| US7548473B2 (en) * | 2006-04-14 | 2009-06-16 | Purdue Research Foundation | Apparatus and methods for determining memory device faults |
| CN101714407B (zh) * | 2009-11-12 | 2012-08-08 | 钰创科技股份有限公司 | 行地址保留存储单元触发电路及行地址保留存储单元装置 |
| JP6430194B2 (ja) * | 2014-09-29 | 2018-11-28 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| CN108051767B (zh) * | 2018-01-04 | 2019-07-19 | 南京国睿安泰信科技股份有限公司 | 一种用于集成电路测试仪的自动诊断方法 |
| KR20240111461A (ko) * | 2023-01-10 | 2024-07-17 | 삼성전자주식회사 | 정적 랜덤 액세스 메모리의 메모리 셀 어레이 및 이를 포함하는 정적 랜덤 액세스 메모리 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57105897A (en) * | 1980-12-23 | 1982-07-01 | Fujitsu Ltd | Semiconductor storage device |
| US4503536A (en) | 1982-09-13 | 1985-03-05 | General Dynamics | Digital circuit unit testing system utilizing signature analysis |
| US4527272A (en) | 1982-12-06 | 1985-07-02 | Tektronix, Inc. | Signature analysis using random probing and signature memory |
| JPS61261895A (ja) * | 1985-05-16 | 1986-11-19 | Toshiba Corp | 半導体記憶装置 |
| JPS61292300A (ja) * | 1985-06-18 | 1986-12-23 | Toshiba Corp | オンチツプメモリテスト容易化回路 |
| JP2523586B2 (ja) * | 1987-02-27 | 1996-08-14 | 株式会社日立製作所 | 半導体記憶装置 |
| JP2831767B2 (ja) * | 1990-01-10 | 1998-12-02 | 株式会社アドバンテスト | 半導体メモリ試験装置 |
| JPH04212799A (ja) * | 1990-01-31 | 1992-08-04 | Nec Ic Microcomput Syst Ltd | テスト回路内蔵半導体メモリ |
| JPH04211160A (ja) * | 1990-03-20 | 1992-08-03 | Mitsubishi Electric Corp | 半導体記憶装置 |
| KR940007240B1 (ko) * | 1992-02-21 | 1994-08-10 | 현대전자산업 주식회사 | 병렬 테스트 회로 |
| JP3251637B2 (ja) * | 1992-05-06 | 2002-01-28 | 株式会社東芝 | 半導体記憶装置 |
| JP3307473B2 (ja) * | 1992-09-09 | 2002-07-24 | ソニー エレクトロニクス インコーポレイテッド | 半導体メモリの試験回路 |
| JPH07211099A (ja) * | 1994-01-12 | 1995-08-11 | Sony Corp | 半導体記憶装置の試験装置 |
| JPH07307100A (ja) * | 1994-05-11 | 1995-11-21 | Nec Corp | メモリ集積回路 |
| US5708598A (en) * | 1995-04-24 | 1998-01-13 | Saito; Tamio | System and method for reading multiple voltage level memories |
| JP3607407B2 (ja) * | 1995-04-26 | 2005-01-05 | 株式会社日立製作所 | 半導体記憶装置 |
| US5973967A (en) * | 1997-01-03 | 1999-10-26 | Programmable Microelectronics Corporation | Page buffer having negative voltage level shifter |
| US6002623A (en) * | 1997-02-12 | 1999-12-14 | Micron Technology, Inc. | Semiconductor memory with test circuit |
| JPH10308100A (ja) * | 1997-05-06 | 1998-11-17 | Mitsubishi Electric Corp | 半導体記憶装置 |
| KR100269319B1 (ko) * | 1997-12-29 | 2000-10-16 | 윤종용 | 동시칼럼선택라인활성화회로를구비하는반도체메모리장치및칼럼선택라인제어방법 |
| US5963497A (en) * | 1998-05-18 | 1999-10-05 | Silicon Aquarius, Inc. | Dynamic random access memory system with simultaneous access and refresh operations and methods for using the same |
| KR100308191B1 (ko) | 1998-05-28 | 2001-11-30 | 윤종용 | 빌트-인패럴테스트회로를구비한반도체메모리장치 |
| JP2001210095A (ja) * | 2000-01-24 | 2001-08-03 | Mitsubishi Electric Corp | メモリモジュール |
| US6353568B1 (en) * | 2000-12-29 | 2002-03-05 | Lsi Logic Corporation | Dual threshold voltage sense amplifier |
-
2001
- 2001-03-30 US US09/823,642 patent/US6757209B2/en not_active Expired - Fee Related
-
2002
- 2002-01-21 MY MYPI20020232A patent/MY127555A/en unknown
- 2002-03-08 WO PCT/US2002/007340 patent/WO2002080183A2/en not_active Ceased
- 2002-03-08 CN CNB028106474A patent/CN100538910C/zh not_active Expired - Fee Related
- 2002-03-08 EP EP02717602A patent/EP1374250B1/en not_active Expired - Lifetime
- 2002-03-08 JP JP2002578510A patent/JP2004530243A/ja not_active Ceased
- 2002-03-08 AT AT02717602T patent/ATE329354T1/de not_active IP Right Cessation
- 2002-03-08 KR KR1020037012883A patent/KR100544362B1/ko not_active Expired - Fee Related
- 2002-03-08 DE DE60212103T patent/DE60212103T2/de not_active Expired - Fee Related
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