JP2004144748A - アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置 - Google Patents

アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置 Download PDF

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Publication number
JP2004144748A
JP2004144748A JP2003357418A JP2003357418A JP2004144748A JP 2004144748 A JP2004144748 A JP 2004144748A JP 2003357418 A JP2003357418 A JP 2003357418A JP 2003357418 A JP2003357418 A JP 2003357418A JP 2004144748 A JP2004144748 A JP 2004144748A
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Japan
Prior art keywords
data signal
digital data
eye diagram
waveform
characteristic
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Pending
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JP2003357418A
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English (en)
Japanese (ja)
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JP2004144748A5 (https=
Inventor
Mcdonald Willard
ウィラード・マクドナルド
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2004144748A publication Critical patent/JP2004144748A/ja
Publication of JP2004144748A5 publication Critical patent/JP2004144748A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31901—Analysis of tester Performance; Tester characterization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Dc Digital Transmission (AREA)
JP2003357418A 2002-10-22 2003-10-17 アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置 Pending JP2004144748A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/278,339 US6934647B2 (en) 2002-10-22 2002-10-22 Efficient sampling of digital waveforms for eye diagram analysis

Publications (2)

Publication Number Publication Date
JP2004144748A true JP2004144748A (ja) 2004-05-20
JP2004144748A5 JP2004144748A5 (https=) 2006-11-24

Family

ID=32093404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003357418A Pending JP2004144748A (ja) 2002-10-22 2003-10-17 アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置

Country Status (2)

Country Link
US (1) US6934647B2 (https=)
JP (1) JP2004144748A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133218A (ja) * 2004-09-24 2006-05-25 Tektronix Inc パターン識別方法
US7656181B2 (en) 2005-07-25 2010-02-02 Samsung Electronics Co., Ltd. Apparatus and method for testing circuit characteristics by using eye mask
JP2018132443A (ja) * 2017-02-16 2018-08-23 アンリツ株式会社 データ解析装置及びデータ解析方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7493223B2 (en) * 2005-08-02 2009-02-17 Tektronix, Inc. Pattern identification and bit level measurements on repetitive patterns
JP4955303B2 (ja) * 2006-03-23 2012-06-20 テクトロニクス・インコーポレイテッド デジタル信号分析プログラム及び波形表示装置
US20070271052A1 (en) * 2006-05-16 2007-11-22 Abel Christopher J Method and apparatus for measuring duty cycle based on data eye monitor
US8625986B2 (en) * 2006-09-27 2014-01-07 Tti Inventions A Llc Methods and systems for optical performance monitoring
US8364033B2 (en) * 2009-12-08 2013-01-29 Telcordia Technologies, Inc. Differential eye diagrams
US9933984B1 (en) 2014-09-29 2018-04-03 Advanced Testing Technologies, Inc. Method and arrangement for eye diagram display of errors of digital waveforms
US9893879B2 (en) * 2015-09-21 2018-02-13 Tektronix, Inc. Method for automatically finding the optimum sampling point in an eye diagram
CN117871920B (zh) * 2024-03-13 2024-06-11 上海知白智能科技有限公司 眼图采集方法、装置、系统及存储介质

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54100652A (en) * 1978-01-25 1979-08-08 Mitsubishi Electric Corp Sampler
JPH06289079A (ja) * 1993-04-02 1994-10-18 Nec Corp 波形観測装置
JPH10282153A (ja) * 1997-04-04 1998-10-23 Tektronix Inc サンプリング方法及びチャンネル補償方法
WO2001038888A1 (fr) * 1999-11-19 2001-05-31 Advantest Corporation Appareil et procede de mesure d'instabilite et appareil de controle pour circuit integre a semi-conducteur equipe de l'appareil de mesure d'instabilite
JP2002055123A (ja) * 2000-06-28 2002-02-20 Agilent Technol Inc 規格に対する波形の遵守マージンを決定するための装置及び方法
JP2004282555A (ja) * 2003-03-18 2004-10-07 Tektronix Japan Ltd クロック再生方法及びジッタ測定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6546345B1 (en) * 2000-08-30 2003-04-08 Sun Microsystems, Inc. System and method for measuring extinction ratio and deterministic jitter
US6785622B2 (en) * 2001-10-29 2004-08-31 Agilent Technologies, Inc. Method and apparatus for performing eye diagram measurements
US6748338B2 (en) * 2001-11-21 2004-06-08 Winbond Electronics Corporation Method and apparatus for testing eye diagram characteristics
US20030165259A1 (en) * 2002-02-15 2003-09-04 Balent James S. Signal analysis using image processing techniques
US6892150B2 (en) * 2002-05-24 2005-05-10 Tektronix, Inc. Combined analog and DSP trigger system for a digital storage oscilloscope

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54100652A (en) * 1978-01-25 1979-08-08 Mitsubishi Electric Corp Sampler
JPH06289079A (ja) * 1993-04-02 1994-10-18 Nec Corp 波形観測装置
JPH10282153A (ja) * 1997-04-04 1998-10-23 Tektronix Inc サンプリング方法及びチャンネル補償方法
WO2001038888A1 (fr) * 1999-11-19 2001-05-31 Advantest Corporation Appareil et procede de mesure d'instabilite et appareil de controle pour circuit integre a semi-conducteur equipe de l'appareil de mesure d'instabilite
JP2002055123A (ja) * 2000-06-28 2002-02-20 Agilent Technol Inc 規格に対する波形の遵守マージンを決定するための装置及び方法
JP2004282555A (ja) * 2003-03-18 2004-10-07 Tektronix Japan Ltd クロック再生方法及びジッタ測定方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133218A (ja) * 2004-09-24 2006-05-25 Tektronix Inc パターン識別方法
US7656181B2 (en) 2005-07-25 2010-02-02 Samsung Electronics Co., Ltd. Apparatus and method for testing circuit characteristics by using eye mask
JP2018132443A (ja) * 2017-02-16 2018-08-23 アンリツ株式会社 データ解析装置及びデータ解析方法

Also Published As

Publication number Publication date
US6934647B2 (en) 2005-08-23
US20040078158A1 (en) 2004-04-22

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