JP2004144748A5 - - Google Patents

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Publication number
JP2004144748A5
JP2004144748A5 JP2003357418A JP2003357418A JP2004144748A5 JP 2004144748 A5 JP2004144748 A5 JP 2004144748A5 JP 2003357418 A JP2003357418 A JP 2003357418A JP 2003357418 A JP2003357418 A JP 2003357418A JP 2004144748 A5 JP2004144748 A5 JP 2004144748A5
Authority
JP
Japan
Prior art keywords
region
data signal
digital data
characteristic
eye diagram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003357418A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004144748A (ja
Filing date
Publication date
Priority claimed from US10/278,339 external-priority patent/US6934647B2/en
Application filed filed Critical
Publication of JP2004144748A publication Critical patent/JP2004144748A/ja
Publication of JP2004144748A5 publication Critical patent/JP2004144748A5/ja
Pending legal-status Critical Current

Links

JP2003357418A 2002-10-22 2003-10-17 アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置 Pending JP2004144748A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/278,339 US6934647B2 (en) 2002-10-22 2002-10-22 Efficient sampling of digital waveforms for eye diagram analysis

Publications (2)

Publication Number Publication Date
JP2004144748A JP2004144748A (ja) 2004-05-20
JP2004144748A5 true JP2004144748A5 (https=) 2006-11-24

Family

ID=32093404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003357418A Pending JP2004144748A (ja) 2002-10-22 2003-10-17 アイ・ダイヤグラム解析用ディジタル波形の効率的サンプリング方法及び装置

Country Status (2)

Country Link
US (1) US6934647B2 (https=)
JP (1) JP2004144748A (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1643258B1 (en) * 2004-09-24 2009-12-16 Tektronic, Inc. Pattern identification and bit level measurements on repetitive patterns
US7493223B2 (en) * 2005-08-02 2009-02-17 Tektronix, Inc. Pattern identification and bit level measurements on repetitive patterns
KR100712519B1 (ko) 2005-07-25 2007-04-27 삼성전자주식회사 아이 마스크를 이용하여 회로의 특성을 검출하는 테스트장비 및 테스트 방법
JP4955303B2 (ja) * 2006-03-23 2012-06-20 テクトロニクス・インコーポレイテッド デジタル信号分析プログラム及び波形表示装置
US20070271052A1 (en) * 2006-05-16 2007-11-22 Abel Christopher J Method and apparatus for measuring duty cycle based on data eye monitor
US8625986B2 (en) * 2006-09-27 2014-01-07 Tti Inventions A Llc Methods and systems for optical performance monitoring
US8364033B2 (en) * 2009-12-08 2013-01-29 Telcordia Technologies, Inc. Differential eye diagrams
US9933984B1 (en) 2014-09-29 2018-04-03 Advanced Testing Technologies, Inc. Method and arrangement for eye diagram display of errors of digital waveforms
US9893879B2 (en) * 2015-09-21 2018-02-13 Tektronix, Inc. Method for automatically finding the optimum sampling point in an eye diagram
JP2018132443A (ja) * 2017-02-16 2018-08-23 アンリツ株式会社 データ解析装置及びデータ解析方法
CN117871920B (zh) * 2024-03-13 2024-06-11 上海知白智能科技有限公司 眼图采集方法、装置、系统及存储介质

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54100652A (en) * 1978-01-25 1979-08-08 Mitsubishi Electric Corp Sampler
JPH07111447B2 (ja) * 1993-04-02 1995-11-29 日本電気株式会社 波形観測装置
US5978742A (en) * 1997-04-04 1999-11-02 Tektronix, Inc. Method and apparatus for digital sampling of electrical waveforms
JP3609780B2 (ja) * 1999-11-19 2005-01-12 株式会社アドバンテスト ジッタ測定装置及び方法、並びにこのジッタ測定装置を備えた半導体集積回路試験装置
US6577964B1 (en) * 2000-06-28 2003-06-10 Agilent Technologies, Inc. Apparatus and method for determining compliance margin of a waveform relative to a standard
US6546345B1 (en) * 2000-08-30 2003-04-08 Sun Microsystems, Inc. System and method for measuring extinction ratio and deterministic jitter
US6785622B2 (en) * 2001-10-29 2004-08-31 Agilent Technologies, Inc. Method and apparatus for performing eye diagram measurements
US6748338B2 (en) * 2001-11-21 2004-06-08 Winbond Electronics Corporation Method and apparatus for testing eye diagram characteristics
US20030165259A1 (en) * 2002-02-15 2003-09-04 Balent James S. Signal analysis using image processing techniques
US6892150B2 (en) * 2002-05-24 2005-05-10 Tektronix, Inc. Combined analog and DSP trigger system for a digital storage oscilloscope
JP4150759B2 (ja) * 2003-03-18 2008-09-17 テクトロニクス・インコーポレイテッド クロック再生方法及びジッタ測定方法

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