JP2003511861A5 - - Google Patents

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Publication number
JP2003511861A5
JP2003511861A5 JP2001529029A JP2001529029A JP2003511861A5 JP 2003511861 A5 JP2003511861 A5 JP 2003511861A5 JP 2001529029 A JP2001529029 A JP 2001529029A JP 2001529029 A JP2001529029 A JP 2001529029A JP 2003511861 A5 JP2003511861 A5 JP 2003511861A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2001529029A
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JP2003511861A (ja
JP4628628B2 (ja
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Publication date
Priority claimed from NL1013204A external-priority patent/NL1013204C2/nl
Application filed filed Critical
Publication of JP2003511861A publication Critical patent/JP2003511861A/ja
Publication of JP2003511861A5 publication Critical patent/JP2003511861A5/ja
Application granted granted Critical
Publication of JP4628628B2 publication Critical patent/JP4628628B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001529029A 1999-10-04 2000-09-27 光起電性素子における製造エラーを局所化する装置 Expired - Fee Related JP4628628B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.
NL1013204 1999-10-04
PCT/NL2000/000691 WO2001026163A1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element

Publications (3)

Publication Number Publication Date
JP2003511861A JP2003511861A (ja) 2003-03-25
JP2003511861A5 true JP2003511861A5 (ja) 2007-08-02
JP4628628B2 JP4628628B2 (ja) 2011-02-09

Family

ID=19769986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001529029A Expired - Fee Related JP4628628B2 (ja) 1999-10-04 2000-09-27 光起電性素子における製造エラーを局所化する装置

Country Status (9)

Country Link
US (1) US6750662B1 (ja)
EP (1) EP1218946B1 (ja)
JP (1) JP4628628B2 (ja)
AT (1) ATE232016T1 (ja)
AU (1) AU772404B2 (ja)
DE (1) DE60001333T2 (ja)
ES (1) ES2193992T3 (ja)
NL (1) NL1013204C2 (ja)
WO (1) WO2001026163A1 (ja)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8138413B2 (en) 2006-04-13 2012-03-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US7507903B2 (en) 1999-03-30 2009-03-24 Daniel Luch Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8076568B2 (en) * 2006-04-13 2011-12-13 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8664030B2 (en) 1999-03-30 2014-03-04 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US20090111206A1 (en) 1999-03-30 2009-04-30 Daniel Luch Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture
US8222513B2 (en) 2006-04-13 2012-07-17 Daniel Luch Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture
US7898054B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898053B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8198696B2 (en) 2000-02-04 2012-06-12 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7838868B2 (en) * 2005-01-20 2010-11-23 Nanosolar, Inc. Optoelectronic architecture having compound conducting substrate
US7732229B2 (en) * 2004-09-18 2010-06-08 Nanosolar, Inc. Formation of solar cells with conductive barrier layers and foil substrates
US7276724B2 (en) * 2005-01-20 2007-10-02 Nanosolar, Inc. Series interconnected optoelectronic device module assembly
US8927315B1 (en) 2005-01-20 2015-01-06 Aeris Capital Sustainable Ip Ltd. High-throughput assembly of series interconnected solar cells
DE102005040010A1 (de) * 2005-08-23 2007-03-15 Rwe Schott Solar Gmbh Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element
US8884155B2 (en) 2006-04-13 2014-11-11 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8822810B2 (en) 2006-04-13 2014-09-02 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8729385B2 (en) 2006-04-13 2014-05-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9865758B2 (en) 2006-04-13 2018-01-09 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9236512B2 (en) 2006-04-13 2016-01-12 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9006563B2 (en) 2006-04-13 2015-04-14 Solannex, Inc. Collector grid and interconnect structures for photovoltaic arrays and modules
JP2010525311A (ja) * 2007-04-19 2010-07-22 エーリコン・トレイディング・アーゲー・トリューバッハ 薄膜太陽モジュールの自動品質管理試験装置
US20090223511A1 (en) * 2008-03-04 2009-09-10 Cox Edwin B Unglazed photovoltaic and thermal apparatus and method
EP2159583A1 (en) * 2008-08-29 2010-03-03 ODERSUN Aktiengesellschaft System and method for localizing and passivating defects in a photovoltaic element
US7979969B2 (en) * 2008-11-17 2011-07-19 Solopower, Inc. Method of detecting and passivating a defect in a solar cell
US8318240B2 (en) * 2008-11-17 2012-11-27 Solopower, Inc. Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement
US8247243B2 (en) * 2009-05-22 2012-08-21 Nanosolar, Inc. Solar cell interconnection
JP4866954B2 (ja) * 2009-11-05 2012-02-01 共進電機株式会社 太陽電池セル測定用試料台
WO2011073971A2 (en) * 2009-12-16 2011-06-23 Shenkar College Of Engineering And Design Photovoltaic device and method of its fabrication
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
US9306491B2 (en) * 2011-05-16 2016-04-05 First Solar, Inc. Electrical test apparatus for a photovoltaic component
US9507232B2 (en) 2011-09-14 2016-11-29 View, Inc. Portable defect mitigator for electrochromic windows
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
JP6048837B2 (ja) * 2011-09-15 2016-12-21 パナソニックＩｐマネジメント株式会社 太陽電池モジュール
WO2013138535A1 (en) 2012-03-13 2013-09-19 View, Inc. Pinhole mitigation for optical devices
US9341912B2 (en) 2012-03-13 2016-05-17 View, Inc. Multi-zone EC windows
EP2849915B1 (en) 2012-05-18 2023-11-01 View, Inc. Circumscribing defects in optical devices
CN207135068U (zh) * 2017-08-30 2018-03-23 米亚索乐装备集成（福建）有限公司 可变角度光伏组件户外测试装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4301409A (en) * 1978-06-06 1981-11-17 California Institute Of Technology Solar cell anomaly detection method and apparatus
US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
JPS58158977A (ja) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア 薄膜太陽電池を製造する方法及び装置
US4451970A (en) * 1982-10-21 1984-06-05 Energy Conversion Devices, Inc. System and method for eliminating short circuit current paths in photovoltaic devices
US4464823A (en) * 1982-10-21 1984-08-14 Energy Conversion Devices, Inc. Method for eliminating short and latent short circuit current paths in photovoltaic devices
US4599558A (en) * 1983-12-14 1986-07-08 Ibm Photovoltaic imaging for large area semiconductors
JPS6154681A (ja) * 1984-08-25 1986-03-18 Fuji Electric Corp Res & Dev Ltd 薄膜光起電力素子の製造方法
JPS6358274A (ja) * 1986-08-29 1988-03-14 Nec Corp 半導体受光素子測定装置
JPH02216844A (ja) * 1989-02-17 1990-08-29 Toshiba Corp 半導体の光電特性測定方法
JP2633953B2 (ja) * 1989-03-28 1997-07-23 シャープ株式会社 積層型太陽電池の特性測定方法
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
US5517128A (en) * 1993-01-05 1996-05-14 Sentech Instruments Gmbh Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning

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