DE60001333T2 - Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement - Google Patents

Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement Download PDF

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Publication number
DE60001333T2
DE60001333T2 DE60001333T DE60001333T DE60001333T2 DE 60001333 T2 DE60001333 T2 DE 60001333T2 DE 60001333 T DE60001333 T DE 60001333T DE 60001333 T DE60001333 T DE 60001333T DE 60001333 T2 DE60001333 T2 DE 60001333T2
Authority
DE
Germany
Prior art keywords
substrate
electrode
localizing
main surface
manufacturing errors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60001333T
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English (en)
Other versions
DE60001333D1 (de
Inventor
Der Heide Sven Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUNLAB B.V., PETTEN, NL
Original Assignee
Energieonderzoek Centrum Nederland ECN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Energieonderzoek Centrum Nederland ECN filed Critical Energieonderzoek Centrum Nederland ECN
Publication of DE60001333D1 publication Critical patent/DE60001333D1/de
Application granted granted Critical
Publication of DE60001333T2 publication Critical patent/DE60001333T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/208—Particular post-treatment of the devices, e.g. annealing, short-circuit elimination
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Light Receiving Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE60001333T 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement Expired - Lifetime DE60001333T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.
PCT/NL2000/000691 WO2001026163A1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element

Publications (2)

Publication Number Publication Date
DE60001333D1 DE60001333D1 (de) 2003-03-06
DE60001333T2 true DE60001333T2 (de) 2004-01-15

Family

ID=19769986

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60001333T Expired - Lifetime DE60001333T2 (de) 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement

Country Status (9)

Country Link
US (1) US6750662B1 (de)
EP (1) EP1218946B1 (de)
JP (1) JP4628628B2 (de)
AT (1) ATE232016T1 (de)
AU (1) AU772404B2 (de)
DE (1) DE60001333T2 (de)
ES (1) ES2193992T3 (de)
NL (1) NL1013204C2 (de)
WO (1) WO2001026163A1 (de)

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US8664030B2 (en) 1999-03-30 2014-03-04 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US20090111206A1 (en) 1999-03-30 2009-04-30 Daniel Luch Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture
US8222513B2 (en) 2006-04-13 2012-07-17 Daniel Luch Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture
US7507903B2 (en) 1999-03-30 2009-03-24 Daniel Luch Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8138413B2 (en) 2006-04-13 2012-03-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8076568B2 (en) * 2006-04-13 2011-12-13 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8198696B2 (en) 2000-02-04 2012-06-12 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898053B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898054B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7732229B2 (en) * 2004-09-18 2010-06-08 Nanosolar, Inc. Formation of solar cells with conductive barrier layers and foil substrates
US7838868B2 (en) 2005-01-20 2010-11-23 Nanosolar, Inc. Optoelectronic architecture having compound conducting substrate
US7276724B2 (en) * 2005-01-20 2007-10-02 Nanosolar, Inc. Series interconnected optoelectronic device module assembly
US8927315B1 (en) 2005-01-20 2015-01-06 Aeris Capital Sustainable Ip Ltd. High-throughput assembly of series interconnected solar cells
DE102005040010A1 (de) 2005-08-23 2007-03-15 Rwe Schott Solar Gmbh Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element
US9006563B2 (en) 2006-04-13 2015-04-14 Solannex, Inc. Collector grid and interconnect structures for photovoltaic arrays and modules
US9865758B2 (en) 2006-04-13 2018-01-09 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8822810B2 (en) 2006-04-13 2014-09-02 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8729385B2 (en) 2006-04-13 2014-05-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9236512B2 (en) 2006-04-13 2016-01-12 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8884155B2 (en) 2006-04-13 2014-11-11 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
ATE545036T1 (de) 2007-04-19 2012-02-15 Oerlikon Solar Ag Testausrüstung für automatisierte qualitätskontrolle von dünnschicht-soalrmodulen
US20090223511A1 (en) * 2008-03-04 2009-09-10 Cox Edwin B Unglazed photovoltaic and thermal apparatus and method
EP2159583A1 (de) * 2008-08-29 2010-03-03 ODERSUN Aktiengesellschaft System und Verfahren zur Lokalisierung und Passivierung von Fehlern in einem photovoltaischen Element
US8318240B2 (en) * 2008-11-17 2012-11-27 Solopower, Inc. Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement
US7979969B2 (en) * 2008-11-17 2011-07-19 Solopower, Inc. Method of detecting and passivating a defect in a solar cell
US8247243B2 (en) * 2009-05-22 2012-08-21 Nanosolar, Inc. Solar cell interconnection
JP4866954B2 (ja) * 2009-11-05 2012-02-01 共進電機株式会社 太陽電池セル測定用試料台
US20130000705A1 (en) * 2009-12-16 2013-01-03 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Ltd. Photovoltaic device and method of its fabrication
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
US9306491B2 (en) * 2011-05-16 2016-04-05 First Solar, Inc. Electrical test apparatus for a photovoltaic component
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
US9507232B2 (en) 2011-09-14 2016-11-29 View, Inc. Portable defect mitigator for electrochromic windows
WO2013038780A1 (ja) * 2011-09-15 2013-03-21 三洋電機株式会社 太陽電池及び太陽電池モジュール
US9341912B2 (en) 2012-03-13 2016-05-17 View, Inc. Multi-zone EC windows
EP3410183B1 (de) 2012-03-13 2022-06-15 View, Inc. Abschwächung sichtbarer makel für elektrochrome fenster
CN104302437B (zh) 2012-05-18 2017-09-05 唯景公司 限制光学装置中的缺陷
CN207135068U (zh) * 2017-08-30 2018-03-23 米亚索乐装备集成（福建）有限公司 可变角度光伏组件户外测试装置

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US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
JPS58158977A (ja) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア 薄膜太陽電池を製造する方法及び装置
US4464823A (en) * 1982-10-21 1984-08-14 Energy Conversion Devices, Inc. Method for eliminating short and latent short circuit current paths in photovoltaic devices
US4451970A (en) * 1982-10-21 1984-06-05 Energy Conversion Devices, Inc. System and method for eliminating short circuit current paths in photovoltaic devices
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JPH02216844A (ja) * 1989-02-17 1990-08-29 Toshiba Corp 半導体の光電特性測定方法
JP2633953B2 (ja) * 1989-03-28 1997-07-23 シャープ株式会社 積層型太陽電池の特性測定方法
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
US5517128A (en) * 1993-01-05 1996-05-14 Sentech Instruments Gmbh Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning

Also Published As

Publication number Publication date
ES2193992T3 (es) 2003-11-16
AU772404B2 (en) 2004-04-29
NL1013204C2 (nl) 2001-04-05
DE60001333D1 (de) 2003-03-06
EP1218946B1 (de) 2003-01-29
JP4628628B2 (ja) 2011-02-09
US6750662B1 (en) 2004-06-15
WO2001026163A1 (en) 2001-04-12
AU7971100A (en) 2001-05-10
EP1218946A1 (de) 2002-07-03
ATE232016T1 (de) 2003-02-15
JP2003511861A (ja) 2003-03-25

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Owner name: SUNLAB B.V., PETTEN, NL