ES2193992T3 - Aparato para localizar defectos de fabricacion en un elemento fotovoltaico. - Google Patents
Aparato para localizar defectos de fabricacion en un elemento fotovoltaico.Info
- Publication number
- ES2193992T3 ES2193992T3 ES00970312T ES00970312T ES2193992T3 ES 2193992 T3 ES2193992 T3 ES 2193992T3 ES 00970312 T ES00970312 T ES 00970312T ES 00970312 T ES00970312 T ES 00970312T ES 2193992 T3 ES2193992 T3 ES 2193992T3
- Authority
- ES
- Spain
- Prior art keywords
- electrode
- substrate
- photovoltaic element
- main surface
- manufacturing defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 abstract 4
- 239000004020 conductor Substances 0.000 abstract 3
- 239000002800 charge carrier Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/208—Particular post-treatment of the devices, e.g. annealing, short-circuit elimination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Aparato para la localización de defectos de fabricación en un elemento (1) fotovoltaico, el cual está formado sustancialmente mediante un substrato (5, 6, 7) semiconductor en forma de oblea, sobre cuyas superficies principales opuestas se han dispuesto conductores (2, 3, 8) eléctricos para el transporte de portadores de carga eléctrica, que comprende: al menos un primer electrodo (23) en contacto eléctrico con una primera superficie principal de dicho substrato, y que es desplazable sobre el citado substrato, un segundo electrodo (31), que se dispone en contacto eléctrico con un conductor (8) sobre la segunda superficie principal, y medios (27) de ajuste para ajustar una polarización entre los conductores (2, 3, 8) eléctricos de las superficies principales opuestas de dicho substrato, que se caracteriza por: medios (24) de desplazamiento para desplazar el primer electrodo (23) sobre dicha primera superficie principal en dos dirección mutuamente perpendiculares, y medios (25) de medición detensión, para medir la tensión existente entre al menos un primer (23) y un segundo (31) electrodos, en función de la posición del primer electrodo (23) sobre la citada primera superficie principal.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1013204A NL1013204C2 (nl) | 1999-10-04 | 1999-10-04 | Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2193992T3 true ES2193992T3 (es) | 2003-11-16 |
Family
ID=19769986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES00970312T Expired - Lifetime ES2193992T3 (es) | 1999-10-04 | 2000-09-27 | Aparato para localizar defectos de fabricacion en un elemento fotovoltaico. |
Country Status (9)
Country | Link |
---|---|
US (1) | US6750662B1 (es) |
EP (1) | EP1218946B1 (es) |
JP (1) | JP4628628B2 (es) |
AT (1) | ATE232016T1 (es) |
AU (1) | AU772404B2 (es) |
DE (1) | DE60001333T2 (es) |
ES (1) | ES2193992T3 (es) |
NL (1) | NL1013204C2 (es) |
WO (1) | WO2001026163A1 (es) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8664030B2 (en) | 1999-03-30 | 2014-03-04 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US20090111206A1 (en) | 1999-03-30 | 2009-04-30 | Daniel Luch | Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture |
US8222513B2 (en) | 2006-04-13 | 2012-07-17 | Daniel Luch | Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture |
US7507903B2 (en) | 1999-03-30 | 2009-03-24 | Daniel Luch | Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US8138413B2 (en) | 2006-04-13 | 2012-03-20 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8076568B2 (en) * | 2006-04-13 | 2011-12-13 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8198696B2 (en) | 2000-02-04 | 2012-06-12 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7898053B2 (en) | 2000-02-04 | 2011-03-01 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7898054B2 (en) | 2000-02-04 | 2011-03-01 | Daniel Luch | Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays |
US7732229B2 (en) * | 2004-09-18 | 2010-06-08 | Nanosolar, Inc. | Formation of solar cells with conductive barrier layers and foil substrates |
US7838868B2 (en) | 2005-01-20 | 2010-11-23 | Nanosolar, Inc. | Optoelectronic architecture having compound conducting substrate |
US7276724B2 (en) * | 2005-01-20 | 2007-10-02 | Nanosolar, Inc. | Series interconnected optoelectronic device module assembly |
US8927315B1 (en) | 2005-01-20 | 2015-01-06 | Aeris Capital Sustainable Ip Ltd. | High-throughput assembly of series interconnected solar cells |
DE102005040010A1 (de) | 2005-08-23 | 2007-03-15 | Rwe Schott Solar Gmbh | Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element |
US9006563B2 (en) | 2006-04-13 | 2015-04-14 | Solannex, Inc. | Collector grid and interconnect structures for photovoltaic arrays and modules |
US9865758B2 (en) | 2006-04-13 | 2018-01-09 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8822810B2 (en) | 2006-04-13 | 2014-09-02 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8729385B2 (en) | 2006-04-13 | 2014-05-20 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US9236512B2 (en) | 2006-04-13 | 2016-01-12 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
US8884155B2 (en) | 2006-04-13 | 2014-11-11 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
ATE545036T1 (de) | 2007-04-19 | 2012-02-15 | Oerlikon Solar Ag | Testausrüstung für automatisierte qualitätskontrolle von dünnschicht-soalrmodulen |
US20090223511A1 (en) * | 2008-03-04 | 2009-09-10 | Cox Edwin B | Unglazed photovoltaic and thermal apparatus and method |
EP2159583A1 (en) * | 2008-08-29 | 2010-03-03 | ODERSUN Aktiengesellschaft | System and method for localizing and passivating defects in a photovoltaic element |
US8318240B2 (en) * | 2008-11-17 | 2012-11-27 | Solopower, Inc. | Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement |
US7979969B2 (en) * | 2008-11-17 | 2011-07-19 | Solopower, Inc. | Method of detecting and passivating a defect in a solar cell |
US8247243B2 (en) * | 2009-05-22 | 2012-08-21 | Nanosolar, Inc. | Solar cell interconnection |
JP4866954B2 (ja) * | 2009-11-05 | 2012-02-01 | 共進電機株式会社 | 太陽電池セル測定用試料台 |
US20130000705A1 (en) * | 2009-12-16 | 2013-01-03 | Yissum Research Development Company Of The Hebrew University Of Jerusalem, Ltd. | Photovoltaic device and method of its fabrication |
US8164818B2 (en) | 2010-11-08 | 2012-04-24 | Soladigm, Inc. | Electrochromic window fabrication methods |
US9306491B2 (en) * | 2011-05-16 | 2016-04-05 | First Solar, Inc. | Electrical test apparatus for a photovoltaic component |
US9885934B2 (en) | 2011-09-14 | 2018-02-06 | View, Inc. | Portable defect mitigators for electrochromic windows |
US9507232B2 (en) | 2011-09-14 | 2016-11-29 | View, Inc. | Portable defect mitigator for electrochromic windows |
WO2013038780A1 (ja) * | 2011-09-15 | 2013-03-21 | 三洋電機株式会社 | 太陽電池及び太陽電池モジュール |
US9341912B2 (en) | 2012-03-13 | 2016-05-17 | View, Inc. | Multi-zone EC windows |
EP3410183B1 (en) | 2012-03-13 | 2022-06-15 | View, Inc. | Visible defect mitigation for electrochromic windows |
CN104302437B (zh) | 2012-05-18 | 2017-09-05 | 唯景公司 | 限制光学装置中的缺陷 |
CN207135068U (zh) * | 2017-08-30 | 2018-03-23 | 米亚索乐装备集成(福建)有限公司 | 可变角度光伏组件户外测试装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4301409A (en) * | 1978-06-06 | 1981-11-17 | California Institute Of Technology | Solar cell anomaly detection method and apparatus |
US4640002A (en) * | 1982-02-25 | 1987-02-03 | The University Of Delaware | Method and apparatus for increasing the durability and yield of thin film photovoltaic devices |
JPS58158977A (ja) * | 1982-02-25 | 1983-09-21 | ユニバ−シテイ・オブ・デラウエア | 薄膜太陽電池を製造する方法及び装置 |
US4464823A (en) * | 1982-10-21 | 1984-08-14 | Energy Conversion Devices, Inc. | Method for eliminating short and latent short circuit current paths in photovoltaic devices |
US4451970A (en) * | 1982-10-21 | 1984-06-05 | Energy Conversion Devices, Inc. | System and method for eliminating short circuit current paths in photovoltaic devices |
US4599558A (en) * | 1983-12-14 | 1986-07-08 | Ibm | Photovoltaic imaging for large area semiconductors |
JPS6154681A (ja) * | 1984-08-25 | 1986-03-18 | Fuji Electric Corp Res & Dev Ltd | 薄膜光起電力素子の製造方法 |
JPS6358274A (ja) * | 1986-08-29 | 1988-03-14 | Nec Corp | 半導体受光素子測定装置 |
JPH02216844A (ja) * | 1989-02-17 | 1990-08-29 | Toshiba Corp | 半導体の光電特性測定方法 |
JP2633953B2 (ja) * | 1989-03-28 | 1997-07-23 | シャープ株式会社 | 積層型太陽電池の特性測定方法 |
US5521519A (en) * | 1992-07-30 | 1996-05-28 | International Business Machines Corporation | Spring probe with piloted and headed contact and method of tip formation |
US5517128A (en) * | 1993-01-05 | 1996-05-14 | Sentech Instruments Gmbh | Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning |
-
1999
- 1999-10-04 NL NL1013204A patent/NL1013204C2/nl not_active IP Right Cessation
-
2000
- 2000-09-27 AU AU79711/00A patent/AU772404B2/en not_active Ceased
- 2000-09-27 WO PCT/NL2000/000691 patent/WO2001026163A1/en active IP Right Grant
- 2000-09-27 US US10/089,546 patent/US6750662B1/en not_active Expired - Fee Related
- 2000-09-27 DE DE60001333T patent/DE60001333T2/de not_active Expired - Lifetime
- 2000-09-27 EP EP00970312A patent/EP1218946B1/en not_active Expired - Lifetime
- 2000-09-27 AT AT00970312T patent/ATE232016T1/de not_active IP Right Cessation
- 2000-09-27 JP JP2001529029A patent/JP4628628B2/ja not_active Expired - Fee Related
- 2000-09-27 ES ES00970312T patent/ES2193992T3/es not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AU772404B2 (en) | 2004-04-29 |
NL1013204C2 (nl) | 2001-04-05 |
DE60001333D1 (de) | 2003-03-06 |
EP1218946B1 (en) | 2003-01-29 |
JP4628628B2 (ja) | 2011-02-09 |
US6750662B1 (en) | 2004-06-15 |
WO2001026163A1 (en) | 2001-04-12 |
AU7971100A (en) | 2001-05-10 |
DE60001333T2 (de) | 2004-01-15 |
EP1218946A1 (en) | 2002-07-03 |
ATE232016T1 (de) | 2003-02-15 |
JP2003511861A (ja) | 2003-03-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ES2193992T3 (es) | Aparato para localizar defectos de fabricacion en un elemento fotovoltaico. | |
TW200608456A (en) | Nanowire device with (111) vertical sidewalls and method of fabrication | |
WO2008041249A8 (en) | Single voltage supply pseudomorphic high electron mobility transistor (phemt) power device and process for manufacturing the same | |
ATE467905T1 (de) | Integrierte anitfuse-struktur für finfet- und cmos-vorrichtungen | |
EP1670067A3 (en) | Reverse biasing method and apparatus for solar battery module | |
EP2296182A3 (en) | Solar cell and method for manufacturing the same | |
ATE439683T1 (de) | Schaltungsanordnung mit verbindungseinrichtung sowie herstellungsverfahren hierzu | |
ATE467909T1 (de) | Solarzelle und herstellungsverfahren | |
GB1453919A (en) | Semi-conductor electrical generator and method of producing same | |
TW200601485A (en) | Semiconductor device substrate with wmbedded capacitor | |
TW200617410A (en) | Semiconductor wafer and inspection method thereof | |
Zhao et al. | Photolithography-compatible conformal electrodes for high-performance bottom-contact organic single-crystal transistors | |
SA518391957B1 (ar) | خلية شمسية تشتمل على حبيبات من مادة مطلية شبه موصلة وطريقة لتصنيع الخلية الشمسية | |
CN103308584A (zh) | 场效应晶体管气体传感器及其制造方法 | |
ES2723713T3 (es) | Una estructura semiconductora y un método para formarla | |
EP0178148A3 (en) | Thin film photodetector | |
TW200516684A (en) | Method of electrical characterization of a silicon-on-insulator (SOI) wafer | |
ATE472834T1 (de) | Einrichtung zum richten von energie und herstellungsverfahren | |
TW200721346A (en) | Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials | |
TW200520035A (en) | Dielectric isolation type semiconductor device and method for manufacturing the same | |
CN206271679U (zh) | 具有保护晶圆的独立静电载具机构 | |
CN114373812A (zh) | 一种光电探测器及其制备方法 | |
EP0701288A3 (en) | Semiconductor device and method of manufacturing the same | |
Jackson et al. | Large area flexible electronics fabricated using self-aligned imprint lithography | |
WO2022096908A8 (ja) | 半導体装置及びその製造方法 |