ATE232016T1 - Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement - Google Patents

Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement

Info

Publication number
ATE232016T1
ATE232016T1 AT00970312T AT00970312T ATE232016T1 AT E232016 T1 ATE232016 T1 AT E232016T1 AT 00970312 T AT00970312 T AT 00970312T AT 00970312 T AT00970312 T AT 00970312T AT E232016 T1 ATE232016 T1 AT E232016T1
Authority
AT
Austria
Prior art keywords
substrate
electrode
localizing
main surface
photovoltaic component
Prior art date
Application number
AT00970312T
Other languages
English (en)
Inventor
Der Heide Arvid Sven Hjalm Van
Original Assignee
Stichting Energie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stichting Energie filed Critical Stichting Energie
Application granted granted Critical
Publication of ATE232016T1 publication Critical patent/ATE232016T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Light Receiving Elements (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
AT00970312T 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement ATE232016T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.
PCT/NL2000/000691 WO2001026163A1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element

Publications (1)

Publication Number Publication Date
ATE232016T1 true ATE232016T1 (de) 2003-02-15

Family

ID=19769986

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00970312T ATE232016T1 (de) 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement

Country Status (9)

Country Link
US (1) US6750662B1 (de)
EP (1) EP1218946B1 (de)
JP (1) JP4628628B2 (de)
AT (1) ATE232016T1 (de)
AU (1) AU772404B2 (de)
DE (1) DE60001333T2 (de)
ES (1) ES2193992T3 (de)
NL (1) NL1013204C2 (de)
WO (1) WO2001026163A1 (de)

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US8222513B2 (en) 2006-04-13 2012-07-17 Daniel Luch Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture
US8138413B2 (en) 2006-04-13 2012-03-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US20090111206A1 (en) 1999-03-30 2009-04-30 Daniel Luch Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture
US8076568B2 (en) * 2006-04-13 2011-12-13 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US7507903B2 (en) 1999-03-30 2009-03-24 Daniel Luch Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8664030B2 (en) 1999-03-30 2014-03-04 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8198696B2 (en) 2000-02-04 2012-06-12 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898053B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898054B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7838868B2 (en) * 2005-01-20 2010-11-23 Nanosolar, Inc. Optoelectronic architecture having compound conducting substrate
US7276724B2 (en) * 2005-01-20 2007-10-02 Nanosolar, Inc. Series interconnected optoelectronic device module assembly
US7732229B2 (en) * 2004-09-18 2010-06-08 Nanosolar, Inc. Formation of solar cells with conductive barrier layers and foil substrates
US8927315B1 (en) 2005-01-20 2015-01-06 Aeris Capital Sustainable Ip Ltd. High-throughput assembly of series interconnected solar cells
DE102005040010A1 (de) * 2005-08-23 2007-03-15 Rwe Schott Solar Gmbh Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element
US9006563B2 (en) 2006-04-13 2015-04-14 Solannex, Inc. Collector grid and interconnect structures for photovoltaic arrays and modules
US8884155B2 (en) 2006-04-13 2014-11-11 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9865758B2 (en) 2006-04-13 2018-01-09 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8822810B2 (en) 2006-04-13 2014-09-02 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8729385B2 (en) 2006-04-13 2014-05-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9236512B2 (en) 2006-04-13 2016-01-12 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
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US20090223511A1 (en) * 2008-03-04 2009-09-10 Cox Edwin B Unglazed photovoltaic and thermal apparatus and method
EP2159583A1 (de) * 2008-08-29 2010-03-03 ODERSUN Aktiengesellschaft System und Verfahren zur Lokalisierung und Passivierung von Fehlern in einem photovoltaischen Element
US8318240B2 (en) * 2008-11-17 2012-11-27 Solopower, Inc. Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement
US7979969B2 (en) * 2008-11-17 2011-07-19 Solopower, Inc. Method of detecting and passivating a defect in a solar cell
US8247243B2 (en) * 2009-05-22 2012-08-21 Nanosolar, Inc. Solar cell interconnection
JP4866954B2 (ja) * 2009-11-05 2012-02-01 共進電機株式会社 太陽電池セル測定用試料台
US20130000705A1 (en) * 2009-12-16 2013-01-03 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Ltd. Photovoltaic device and method of its fabrication
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
US9306491B2 (en) * 2011-05-16 2016-04-05 First Solar, Inc. Electrical test apparatus for a photovoltaic component
HK1200212A1 (en) 2011-09-14 2015-07-31 View, Inc. Portable defect mitigator for electrochromic windows
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
JP6048837B2 (ja) * 2011-09-15 2016-12-21 パナソニックＩｐマネジメント株式会社 太陽電池モジュール
US9341912B2 (en) 2012-03-13 2016-05-17 View, Inc. Multi-zone EC windows
EP4134733A1 (de) 2012-03-13 2023-02-15 View, Inc. Stiftlochabschwächung für optische vorrichtungen
CN104302437B (zh) 2012-05-18 2017-09-05 唯景公司 限制光学装置中的缺陷
CN207135068U (zh) * 2017-08-30 2018-03-23 米亚索乐装备集成（福建）有限公司 可变角度光伏组件户外测试装置

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JPS58158977A (ja) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア 薄膜太陽電池を製造する方法及び装置
US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
US4464823A (en) * 1982-10-21 1984-08-14 Energy Conversion Devices, Inc. Method for eliminating short and latent short circuit current paths in photovoltaic devices
US4451970A (en) * 1982-10-21 1984-06-05 Energy Conversion Devices, Inc. System and method for eliminating short circuit current paths in photovoltaic devices
US4599558A (en) * 1983-12-14 1986-07-08 Ibm Photovoltaic imaging for large area semiconductors
JPS6154681A (ja) * 1984-08-25 1986-03-18 Fuji Electric Corp Res & Dev Ltd 薄膜光起電力素子の製造方法
JPS6358274A (ja) * 1986-08-29 1988-03-14 Nec Corp 半導体受光素子測定装置
JPH02216844A (ja) * 1989-02-17 1990-08-29 Toshiba Corp 半導体の光電特性測定方法
JP2633953B2 (ja) * 1989-03-28 1997-07-23 シャープ株式会社 積層型太陽電池の特性測定方法
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
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Also Published As

Publication number Publication date
EP1218946B1 (de) 2003-01-29
NL1013204C2 (nl) 2001-04-05
DE60001333D1 (de) 2003-03-06
EP1218946A1 (de) 2002-07-03
WO2001026163A1 (en) 2001-04-12
JP2003511861A (ja) 2003-03-25
US6750662B1 (en) 2004-06-15
ES2193992T3 (es) 2003-11-16
AU7971100A (en) 2001-05-10
AU772404B2 (en) 2004-04-29
JP4628628B2 (ja) 2011-02-09
DE60001333T2 (de) 2004-01-15

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