NL1013204C2 - Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. - Google Patents

Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. Download PDF

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Publication number
NL1013204C2
NL1013204C2 NL1013204A NL1013204A NL1013204C2 NL 1013204 C2 NL1013204 C2 NL 1013204C2 NL 1013204 A NL1013204 A NL 1013204A NL 1013204 A NL1013204 A NL 1013204A NL 1013204 C2 NL1013204 C2 NL 1013204C2
Authority
NL
Netherlands
Prior art keywords
substrate
electrode
needle
main surface
electrical
Prior art date
Application number
NL1013204A
Other languages
English (en)
Dutch (nl)
Inventor
Arvid Sven Hjalmar Van D Heide
Original Assignee
Stichting Energie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stichting Energie filed Critical Stichting Energie
Priority to NL1013204A priority Critical patent/NL1013204C2/nl
Priority to ES00970312T priority patent/ES2193992T3/es
Priority to AT00970312T priority patent/ATE232016T1/de
Priority to AU79711/00A priority patent/AU772404B2/en
Priority to JP2001529029A priority patent/JP4628628B2/ja
Priority to US10/089,546 priority patent/US6750662B1/en
Priority to DE60001333T priority patent/DE60001333T2/de
Priority to PCT/NL2000/000691 priority patent/WO2001026163A1/en
Priority to EP00970312A priority patent/EP1218946B1/en
Application granted granted Critical
Publication of NL1013204C2 publication Critical patent/NL1013204C2/nl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/208—Particular post-treatment of the devices, e.g. annealing, short-circuit elimination
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Light Receiving Elements (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
NL1013204A 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. NL1013204C2 (nl)

Priority Applications (9)

Application Number Priority Date Filing Date Title
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.
ES00970312T ES2193992T3 (es) 1999-10-04 2000-09-27 Aparato para localizar defectos de fabricacion en un elemento fotovoltaico.
AT00970312T ATE232016T1 (de) 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement
AU79711/00A AU772404B2 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element
JP2001529029A JP4628628B2 (ja) 1999-10-04 2000-09-27 光起電性素子における製造エラーを局所化する装置
US10/089,546 US6750662B1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element
DE60001333T DE60001333T2 (de) 1999-10-04 2000-09-27 Apparat zur lokalisierung von herstellungsfehler in einem substrat für ein photovoltaisches bauelement
PCT/NL2000/000691 WO2001026163A1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element
EP00970312A EP1218946B1 (en) 1999-10-04 2000-09-27 Apparatus for localizing production errors in a photovoltaic element

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.
NL1013204 1999-10-04

Publications (1)

Publication Number Publication Date
NL1013204C2 true NL1013204C2 (nl) 2001-04-05

Family

ID=19769986

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1013204A NL1013204C2 (nl) 1999-10-04 1999-10-04 Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element.

Country Status (9)

Country Link
US (1) US6750662B1 (ja)
EP (1) EP1218946B1 (ja)
JP (1) JP4628628B2 (ja)
AT (1) ATE232016T1 (ja)
AU (1) AU772404B2 (ja)
DE (1) DE60001333T2 (ja)
ES (1) ES2193992T3 (ja)
NL (1) NL1013204C2 (ja)
WO (1) WO2001026163A1 (ja)

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US7507903B2 (en) 1999-03-30 2009-03-24 Daniel Luch Substrate and collector grid structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8076568B2 (en) * 2006-04-13 2011-12-13 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8664030B2 (en) 1999-03-30 2014-03-04 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8222513B2 (en) 2006-04-13 2012-07-17 Daniel Luch Collector grid, electrode structures and interconnect structures for photovoltaic arrays and methods of manufacture
US20090111206A1 (en) 1999-03-30 2009-04-30 Daniel Luch Collector grid, electrode structures and interrconnect structures for photovoltaic arrays and methods of manufacture
US8138413B2 (en) 2006-04-13 2012-03-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US7898054B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US8198696B2 (en) 2000-02-04 2012-06-12 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7898053B2 (en) 2000-02-04 2011-03-01 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
US7276724B2 (en) * 2005-01-20 2007-10-02 Nanosolar, Inc. Series interconnected optoelectronic device module assembly
US7838868B2 (en) * 2005-01-20 2010-11-23 Nanosolar, Inc. Optoelectronic architecture having compound conducting substrate
US7732229B2 (en) * 2004-09-18 2010-06-08 Nanosolar, Inc. Formation of solar cells with conductive barrier layers and foil substrates
US8927315B1 (en) 2005-01-20 2015-01-06 Aeris Capital Sustainable Ip Ltd. High-throughput assembly of series interconnected solar cells
DE102005040010A1 (de) * 2005-08-23 2007-03-15 Rwe Schott Solar Gmbh Verfahren und Vorrichtung zur Ermittlung von Produktionsfehlern in einem Halbleiterbau-element
US8884155B2 (en) 2006-04-13 2014-11-11 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9865758B2 (en) 2006-04-13 2018-01-09 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8822810B2 (en) 2006-04-13 2014-09-02 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9236512B2 (en) 2006-04-13 2016-01-12 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US8729385B2 (en) 2006-04-13 2014-05-20 Daniel Luch Collector grid and interconnect structures for photovoltaic arrays and modules
US9006563B2 (en) 2006-04-13 2015-04-14 Solannex, Inc. Collector grid and interconnect structures for photovoltaic arrays and modules
ATE545036T1 (de) 2007-04-19 2012-02-15 Oerlikon Solar Ag Testausrüstung für automatisierte qualitätskontrolle von dünnschicht-soalrmodulen
US20090223511A1 (en) * 2008-03-04 2009-09-10 Cox Edwin B Unglazed photovoltaic and thermal apparatus and method
EP2159583A1 (en) * 2008-08-29 2010-03-03 ODERSUN Aktiengesellschaft System and method for localizing and passivating defects in a photovoltaic element
US8318240B2 (en) * 2008-11-17 2012-11-27 Solopower, Inc. Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement
US7979969B2 (en) * 2008-11-17 2011-07-19 Solopower, Inc. Method of detecting and passivating a defect in a solar cell
US8247243B2 (en) * 2009-05-22 2012-08-21 Nanosolar, Inc. Solar cell interconnection
JP4866954B2 (ja) * 2009-11-05 2012-02-01 共進電機株式会社 太陽電池セル測定用試料台
US20130000705A1 (en) * 2009-12-16 2013-01-03 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Ltd. Photovoltaic device and method of its fabrication
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
US9306491B2 (en) * 2011-05-16 2016-04-05 First Solar, Inc. Electrical test apparatus for a photovoltaic component
EP2756289B1 (en) 2011-09-14 2023-03-29 View, Inc. Portable defect mitigator for electrochromic windows
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
WO2013038780A1 (ja) * 2011-09-15 2013-03-21 三洋電機株式会社 太陽電池及び太陽電池モジュール
EP4134733A1 (en) 2012-03-13 2023-02-15 View, Inc. Pinhole mitigation for optical devices
US9341912B2 (en) 2012-03-13 2016-05-17 View, Inc. Multi-zone EC windows
US10583523B2 (en) 2012-05-18 2020-03-10 View, Inc. Circumscribing defects in optical devices
CN207135068U (zh) * 2017-08-30 2018-03-23 米亚索乐装备集成（福建）有限公司 可变角度光伏组件户外测试装置

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US4301409A (en) * 1978-06-06 1981-11-17 California Institute Of Technology Solar cell anomaly detection method and apparatus
EP0087776A2 (en) * 1982-02-25 1983-09-07 University of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
US4451970A (en) * 1982-10-21 1984-06-05 Energy Conversion Devices, Inc. System and method for eliminating short circuit current paths in photovoltaic devices
US4464823A (en) * 1982-10-21 1984-08-14 Energy Conversion Devices, Inc. Method for eliminating short and latent short circuit current paths in photovoltaic devices
JPS6154681A (ja) * 1984-08-25 1986-03-18 Fuji Electric Corp Res & Dev Ltd 薄膜光起電力素子の製造方法

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US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
US4599558A (en) * 1983-12-14 1986-07-08 Ibm Photovoltaic imaging for large area semiconductors
JPS6358274A (ja) * 1986-08-29 1988-03-14 Nec Corp 半導体受光素子測定装置
JPH02216844A (ja) * 1989-02-17 1990-08-29 Toshiba Corp 半導体の光電特性測定方法
JP2633953B2 (ja) * 1989-03-28 1997-07-23 シャープ株式会社 積層型太陽電池の特性測定方法
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
US5517128A (en) * 1993-01-05 1996-05-14 Sentech Instruments Gmbh Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning

Patent Citations (5)

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Publication number Priority date Publication date Assignee Title
US4301409A (en) * 1978-06-06 1981-11-17 California Institute Of Technology Solar cell anomaly detection method and apparatus
EP0087776A2 (en) * 1982-02-25 1983-09-07 University of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
US4451970A (en) * 1982-10-21 1984-06-05 Energy Conversion Devices, Inc. System and method for eliminating short circuit current paths in photovoltaic devices
US4464823A (en) * 1982-10-21 1984-08-14 Energy Conversion Devices, Inc. Method for eliminating short and latent short circuit current paths in photovoltaic devices
JPS6154681A (ja) * 1984-08-25 1986-03-18 Fuji Electric Corp Res & Dev Ltd 薄膜光起電力素子の製造方法

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Title
BOYEAUX J P ET AL: "LIGHT BEAM INDUCED CURRENT MAPPING APPLIED TO THE CONTROL OF HIGH EFFICIENCY GAAS SOLAR CELLS", PHOTOVOLTAIC SPECIALISTS CONFERENCE,US,NEW YORK, IEEE, vol. CONF. 19, 1987, pages 804 - 807, XP000044719 *
PATENT ABSTRACTS OF JAPAN vol. 010, no. 217 (E - 423) 29 July 1986 (1986-07-29) *

Also Published As

Publication number Publication date
EP1218946B1 (en) 2003-01-29
EP1218946A1 (en) 2002-07-03
AU772404B2 (en) 2004-04-29
ATE232016T1 (de) 2003-02-15
JP2003511861A (ja) 2003-03-25
ES2193992T3 (es) 2003-11-16
DE60001333D1 (de) 2003-03-06
WO2001026163A1 (en) 2001-04-12
AU7971100A (en) 2001-05-10
DE60001333T2 (de) 2004-01-15
JP4628628B2 (ja) 2011-02-09
US6750662B1 (en) 2004-06-15

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Effective date: 20040501