JP2003329617A5 - - Google Patents

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Publication number
JP2003329617A5
JP2003329617A5 JP2002186332A JP2002186332A JP2003329617A5 JP 2003329617 A5 JP2003329617 A5 JP 2003329617A5 JP 2002186332 A JP2002186332 A JP 2002186332A JP 2002186332 A JP2002186332 A JP 2002186332A JP 2003329617 A5 JP2003329617 A5 JP 2003329617A5
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JP
Japan
Prior art keywords
particle beam
electromagnetic wave
crystal
analyte
monochromatic parallel
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Application number
JP2002186332A
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English (en)
Japanese (ja)
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JP2003329617A (ja
JP4498663B2 (ja
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Priority claimed from JP2002186332A external-priority patent/JP4498663B2/ja
Priority to JP2002186332A priority Critical patent/JP4498663B2/ja
Application filed filed Critical
Priority to PCT/JP2002/006595 priority patent/WO2003008952A1/ja
Priority to EP02743766A priority patent/EP1429138A1/en
Priority to US10/483,399 priority patent/US20040196957A1/en
Publication of JP2003329617A publication Critical patent/JP2003329617A/ja
Publication of JP2003329617A5 publication Critical patent/JP2003329617A5/ja
Priority to US12/073,976 priority patent/US7817779B2/en
Publication of JP4498663B2 publication Critical patent/JP4498663B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002186332A 2001-07-11 2002-06-26 透過型結晶分析体の厚さ設定方法 Expired - Fee Related JP4498663B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2002186332A JP4498663B2 (ja) 2001-07-11 2002-06-26 透過型結晶分析体の厚さ設定方法
PCT/JP2002/006595 WO2003008952A1 (fr) 2001-07-11 2002-06-28 Procede et dispositif d'analyse non destructive et objet specifique soumis a ce procede
EP02743766A EP1429138A1 (en) 2001-07-11 2002-06-28 NONDESTRUCTIVE ANALYSIS METHOD AND NONDESTRUCTIVE ANALYSIS DEVICE AND SPECIFIC OBJECT BY THE METHOD/DEVICE
US10/483,399 US20040196957A1 (en) 2001-07-11 2002-06-28 Nondestructive analysis method and nondestructive analysis device and specific object by the method/device
US12/073,976 US7817779B2 (en) 2001-07-11 2008-03-12 Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2001211221 2001-07-11
JP2001-211221 2001-07-11
JP2002058053 2002-03-04
JP2002-58053 2002-03-04
JP2002186332A JP4498663B2 (ja) 2001-07-11 2002-06-26 透過型結晶分析体の厚さ設定方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009215442A Division JP5187694B2 (ja) 2001-07-11 2009-09-17 非破壊分析方法および非破壊分析装置

Publications (3)

Publication Number Publication Date
JP2003329617A JP2003329617A (ja) 2003-11-19
JP2003329617A5 true JP2003329617A5 (https=) 2005-10-20
JP4498663B2 JP4498663B2 (ja) 2010-07-07

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ID=27347142

Family Applications (1)

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JP2002186332A Expired - Fee Related JP4498663B2 (ja) 2001-07-11 2002-06-26 透過型結晶分析体の厚さ設定方法

Country Status (4)

Country Link
US (2) US20040196957A1 (https=)
EP (1) EP1429138A1 (https=)
JP (1) JP4498663B2 (https=)
WO (1) WO2003008952A1 (https=)

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US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
FR2883074B1 (fr) * 2005-03-10 2007-06-08 Centre Nat Rech Scient Systeme de detection bidimensionnelle pour rayonnement neutrons
JP4676244B2 (ja) * 2005-05-13 2011-04-27 株式会社日立製作所 Ｘ線撮像装置
JP2008122101A (ja) * 2006-11-08 2008-05-29 Tomohei Sakabe 画像測定方法及び画像測定装置
DE102008008829B4 (de) 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
JP2008197593A (ja) * 2007-02-16 2008-08-28 Konica Minolta Medical & Graphic Inc Ｘ線用透過型回折格子、ｘ線タルボ干渉計およびｘ線撮像装置
US7469037B2 (en) 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
JP2009025296A (ja) * 2007-06-21 2009-02-05 Tokyo Univ Of Science トモシンセシス画像取得方法及びトモシンセシス装置
WO2010065532A2 (en) * 2008-12-01 2010-06-10 The University Of North Carolina At Chapel Hill Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution
US8204174B2 (en) * 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
CA2763367C (en) * 2009-06-04 2016-09-13 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
US20120313001A1 (en) * 2009-10-30 2012-12-13 Tokyo University Of Science Educational Foundation Image synthesis apparatus and image synthesis method
JP6036321B2 (ja) 2012-03-23 2016-11-30 株式会社リガク Ｘ線複合装置
US9269468B2 (en) * 2012-04-30 2016-02-23 Jordan Valley Semiconductors Ltd. X-ray beam conditioning
US9068927B2 (en) * 2012-12-21 2015-06-30 General Electric Company Laboratory diffraction-based phase contrast imaging technique
US9008278B2 (en) 2012-12-28 2015-04-14 General Electric Company Multilayer X-ray source target with high thermal conductivity
JP2019191168A (ja) 2018-04-23 2019-10-31 ブルカー ジェイヴィ イスラエル リミテッドＢｒｕｋｅｒ Ｊｖ Ｉｓｒａｅｌ Ｌｔｄ． 小角ｘ線散乱測定用のｘ線源光学系
CN118624653A (zh) 2018-07-05 2024-09-10 布鲁克科技公司 小角度x射线散射测量
CN110793982B (zh) * 2019-11-21 2022-03-04 山东建筑大学 一种纳米晶化动力学过程的高能x射线表征方法
US11781999B2 (en) 2021-09-05 2023-10-10 Bruker Technologies Ltd. Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
US12249059B2 (en) 2022-03-31 2025-03-11 Bruker Technologies Ltd. Navigation accuracy using camera coupled with detector assembly

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US7076025B2 (en) * 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object

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