WO2003008952A1 - Procede et dispositif d'analyse non destructive et objet specifique soumis a ce procede - Google Patents

Procede et dispositif d'analyse non destructive et objet specifique soumis a ce procede Download PDF

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Publication number
WO2003008952A1
WO2003008952A1 PCT/JP2002/006595 JP0206595W WO03008952A1 WO 2003008952 A1 WO2003008952 A1 WO 2003008952A1 JP 0206595 W JP0206595 W JP 0206595W WO 03008952 A1 WO03008952 A1 WO 03008952A1
Authority
WO
WIPO (PCT)
Prior art keywords
ray
refraction
nondestructive analysis
intensity
nondestructive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2002/006595
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Masami Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to EP02743766A priority Critical patent/EP1429138A1/en
Priority to US10/483,399 priority patent/US20040196957A1/en
Publication of WO2003008952A1 publication Critical patent/WO2003008952A1/ja
Anticipated expiration legal-status Critical
Priority to US12/073,976 priority patent/US7817779B2/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PCT/JP2002/006595 2001-07-11 2002-06-28 Procede et dispositif d'analyse non destructive et objet specifique soumis a ce procede Ceased WO2003008952A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP02743766A EP1429138A1 (en) 2001-07-11 2002-06-28 NONDESTRUCTIVE ANALYSIS METHOD AND NONDESTRUCTIVE ANALYSIS DEVICE AND SPECIFIC OBJECT BY THE METHOD/DEVICE
US10/483,399 US20040196957A1 (en) 2001-07-11 2002-06-28 Nondestructive analysis method and nondestructive analysis device and specific object by the method/device
US12/073,976 US7817779B2 (en) 2001-07-11 2008-03-12 Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2001211221 2001-07-11
JP2001-211221 2001-07-11
JP2002058053 2002-03-04
JP2002-58053 2002-03-04
JP2002186332A JP4498663B2 (ja) 2001-07-11 2002-06-26 透過型結晶分析体の厚さ設定方法
JP2002-186332 2002-06-26

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10483399 A-371-Of-International 2002-06-28
US12/073,976 Continuation US7817779B2 (en) 2001-07-11 2008-03-12 Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device

Publications (1)

Publication Number Publication Date
WO2003008952A1 true WO2003008952A1 (fr) 2003-01-30

Family

ID=27347142

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/006595 Ceased WO2003008952A1 (fr) 2001-07-11 2002-06-28 Procede et dispositif d'analyse non destructive et objet specifique soumis a ce procede

Country Status (4)

Country Link
US (2) US20040196957A1 (https=)
EP (1) EP1429138A1 (https=)
JP (1) JP4498663B2 (https=)
WO (1) WO2003008952A1 (https=)

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* Cited by examiner, † Cited by third party
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US6947521B2 (en) * 2003-06-17 2005-09-20 Illinois Institute Of Technology Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays
JP4118786B2 (ja) * 2003-11-14 2008-07-16 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 画像撮影診断支援システム
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
FR2883074B1 (fr) * 2005-03-10 2007-06-08 Centre Nat Rech Scient Systeme de detection bidimensionnelle pour rayonnement neutrons
JP4676244B2 (ja) * 2005-05-13 2011-04-27 株式会社日立製作所 Ｘ線撮像装置
JP2008122101A (ja) * 2006-11-08 2008-05-29 Tomohei Sakabe 画像測定方法及び画像測定装置
DE102008008829B4 (de) 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
JP2008197593A (ja) * 2007-02-16 2008-08-28 Konica Minolta Medical & Graphic Inc Ｘ線用透過型回折格子、ｘ線タルボ干渉計およびｘ線撮像装置
US7469037B2 (en) 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
JP2009025296A (ja) * 2007-06-21 2009-02-05 Tokyo Univ Of Science トモシンセシス画像取得方法及びトモシンセシス装置
WO2010065532A2 (en) * 2008-12-01 2010-06-10 The University Of North Carolina At Chapel Hill Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution
US8204174B2 (en) * 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
CA2763367C (en) * 2009-06-04 2016-09-13 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
US20120313001A1 (en) * 2009-10-30 2012-12-13 Tokyo University Of Science Educational Foundation Image synthesis apparatus and image synthesis method
JP6036321B2 (ja) 2012-03-23 2016-11-30 株式会社リガク Ｘ線複合装置
US9269468B2 (en) * 2012-04-30 2016-02-23 Jordan Valley Semiconductors Ltd. X-ray beam conditioning
US9068927B2 (en) * 2012-12-21 2015-06-30 General Electric Company Laboratory diffraction-based phase contrast imaging technique
US9008278B2 (en) 2012-12-28 2015-04-14 General Electric Company Multilayer X-ray source target with high thermal conductivity
JP2019191168A (ja) 2018-04-23 2019-10-31 ブルカー ジェイヴィ イスラエル リミテッドＢｒｕｋｅｒ Ｊｖ Ｉｓｒａｅｌ Ｌｔｄ． 小角ｘ線散乱測定用のｘ線源光学系
CN118624653A (zh) 2018-07-05 2024-09-10 布鲁克科技公司 小角度x射线散射测量
CN110793982B (zh) * 2019-11-21 2022-03-04 山东建筑大学 一种纳米晶化动力学过程的高能x射线表征方法
US11781999B2 (en) 2021-09-05 2023-10-10 Bruker Technologies Ltd. Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
US12249059B2 (en) 2022-03-31 2025-03-11 Bruker Technologies Ltd. Navigation accuracy using camera coupled with detector assembly

Citations (2)

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Publication number Priority date Publication date Assignee Title
JP2694049B2 (ja) * 1991-05-14 1997-12-24 ブイ―レイ イメージング コーポレイション 物体の内部構造の像を得るための方法
US5850425A (en) * 1993-08-16 1998-12-15 Commonwealth Scientific And Industrial Research Organisation X-ray optics, especially for phase contrast

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JPS57203426A (en) * 1981-06-08 1982-12-13 Tokyo Shibaura Electric Co X-ray diagnostic apparatus
JPS59230540A (ja) * 1983-06-13 1984-12-25 キヤノン株式会社 エツクス線デジタルスリツト撮影装置
JPS6193936A (ja) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The 放射線による被測定物の組成分析方法
JPH0783744B2 (ja) * 1987-06-02 1995-09-13 株式会社日立製作所 Ｘ線断層撮影装置
US5245648A (en) * 1991-04-05 1993-09-14 The United States Of America As Represented By The United States Department Of Energy X-ray tomographic image magnification process, system and apparatus therefor
JPH06102600A (ja) * 1992-09-24 1994-04-15 Yokogawa Medical Syst Ltd スリット撮影および画像情報読み取り装置
BE1007349A3 (nl) * 1993-07-19 1995-05-23 Philips Electronics Nv Asymmetrische 4-kristalmonochromator.
JPH09187455A (ja) * 1996-01-10 1997-07-22 Hitachi Ltd 位相型ｘ線ｃｔ装置
DE69730550T2 (de) * 1996-03-29 2005-11-10 Hitachi, Ltd. Phasenkontrast-Röntgenabbildungssystem
WO1998016817A1 (en) * 1996-10-16 1998-04-23 Illinois Institute Of Technology Method for detecting an image of an object
JP2001033406A (ja) * 1999-07-16 2001-02-09 Nec Corp Ｘ線位相差撮像方法及びｘ線位相差撮像装置
WO2001079823A2 (en) * 2000-04-17 2001-10-25 Leroy Dean Chapman Diffraction enhanced x-ray imaging of articular cartilage
JP4313844B2 (ja) * 2000-05-31 2009-08-12 株式会社リガク チャンネルカットモノクロメータ
US6870896B2 (en) * 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
WO2003043498A2 (en) * 2001-11-17 2003-05-30 Council For The Central Laboratory Of The Research Councils Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector
JP3726080B2 (ja) * 2002-05-23 2005-12-14 株式会社リガク 多結晶材料の配向性の評価方法
AUPS299302A0 (en) * 2002-06-17 2002-07-04 Monash University Methods and apparatus of sample analysis
US6947521B2 (en) * 2003-06-17 2005-09-20 Illinois Institute Of Technology Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays
US7076025B2 (en) * 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2694049B2 (ja) * 1991-05-14 1997-12-24 ブイ―レイ イメージング コーポレイション 物体の内部構造の像を得るための方法
US5850425A (en) * 1993-08-16 1998-12-15 Commonwealth Scientific And Industrial Research Organisation X-ray optics, especially for phase contrast

Also Published As

Publication number Publication date
US20040196957A1 (en) 2004-10-07
US20080298551A1 (en) 2008-12-04
US7817779B2 (en) 2010-10-19
EP1429138A1 (en) 2004-06-16
JP2003329617A (ja) 2003-11-19
JP4498663B2 (ja) 2010-07-07

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