JP2003158154A - Electronic component mounting method - Google Patents

Electronic component mounting method

Info

Publication number
JP2003158154A
JP2003158154A JP2001354518A JP2001354518A JP2003158154A JP 2003158154 A JP2003158154 A JP 2003158154A JP 2001354518 A JP2001354518 A JP 2001354518A JP 2001354518 A JP2001354518 A JP 2001354518A JP 2003158154 A JP2003158154 A JP 2003158154A
Authority
JP
Japan
Prior art keywords
resin
electronic component
substrate
electrode
supplying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001354518A
Other languages
Japanese (ja)
Other versions
JP3693007B2 (en
Inventor
Tadahiko Sakai
忠彦 境
Toshikazu Matsuo
俊和 松尾
Ken Maeda
憲 前田
Seiji Sakami
省二 酒見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2001354518A priority Critical patent/JP3693007B2/en
Publication of JP2003158154A publication Critical patent/JP2003158154A/en
Application granted granted Critical
Publication of JP3693007B2 publication Critical patent/JP3693007B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/118Post-treatment of the bump connector
    • H01L2224/1182Applying permanent coating, e.g. in-situ coating
    • H01L2224/11822Applying permanent coating, e.g. in-situ coating by dipping, e.g. in a solder bath
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H01L2224/1354Coating
    • H01L2224/1356Disposition
    • H01L2224/13563Only on parts of the surface of the core, i.e. partial coating
    • H01L2224/13564Only on the bonding interface of the bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H01L2224/1354Coating
    • H01L2224/13599Material
    • H01L2224/1369Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an electronic component mounting method which can simplify a reinforcing resin forming process by applying reinforcing resin beforehand and avoid mounting defects caused by gases produced from a board. SOLUTION: In an electronic component mounting method wherein an electronic component 1 is mounted on a board 3 by connecting solder bumps 2 with electrodes 4 with solder, thermosetting resin 6 having an oxide film removing capability is supplied to the bumps 2 beforehand with quantities not filling a space between the board 3 but keeping gaps for degassing after the mounting. In this state, the electronic component 3 is mounted on the board 3, the bumps 2 are connected with the electrodes 4 by reflow soldering, and the resin 6 is thermally cured to form reinforcing resin parts reinforcing the solder connections of the bumps 2 and the electrodes 4. With such a constitution, gases produced from the board 3 in a heating process can be exhausted out and mounting defects caused by voids in the resin 6 can be avoided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品を基板に
実装する電子部品実装方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic component mounting method for mounting electronic components on a board.

【0002】[0002]

【従来の技術】フリップチップなど半導体素子に接続用
電極であるバンプが設けられた電子部品の実装方法とし
て、バンプを基板の電極に半田接合する方法が広く用い
られている。この実装方法において、バンプと基板との
半田接合部を補強する目的で電子部品と基板との間に補
強樹脂部を設けることが行われる。この補強樹脂部の形
成は、半田接合後に電子部品と基板との間に補強用の樹
脂を注入することによって行うか、もしくは電子部品の
搭載に先立って実装位置全面に予め補強用樹脂を塗布す
る方法が用いられていた。
2. Description of the Related Art As a mounting method of an electronic component in which a bump, which is a connecting electrode, is provided on a semiconductor element such as a flip chip, a method of soldering the bump to an electrode of a substrate is widely used. In this mounting method, a reinforcing resin portion is provided between the electronic component and the substrate for the purpose of reinforcing the solder joint between the bump and the substrate. The reinforcing resin portion is formed by injecting a reinforcing resin between the electronic component and the substrate after soldering, or by applying the reinforcing resin in advance to the entire mounting position before mounting the electronic component. The method was used.

【0003】後者の場合には、補強用樹脂としてバンプ
表面の半田酸化膜を除去する能力を有する活性成分を含
む熱硬化性の樹脂が用いられ、電子部品搭載後に基板を
リフローにより加熱してバンプと電極とを半田接合する
とともに、樹脂を熱硬化させて樹脂補強部を形成するよ
うにしていた。このとき、活性成分を含む樹脂を用いる
ことにより、樹脂がバンプと電極との接合界面に進入し
ても半田接合を阻害することがなく、半田接合と補強樹
脂部形成が同一工程で行え、工程が簡略されるという利
点がある。
In the latter case, a thermosetting resin containing an active component having the ability to remove the solder oxide film on the bump surface is used as a reinforcing resin, and the substrate is heated by reflowing after mounting the electronic component to the bump. The electrodes and the electrodes are soldered together, and the resin is heat-cured to form the resin reinforcing portion. At this time, by using the resin containing the active component, the solder bonding and the reinforcing resin portion formation can be performed in the same process without hindering the solder bonding even if the resin enters the bonding interface between the bump and the electrode. Has the advantage of being simplified.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記補
強用樹脂を予め塗布する方法では、電子部品と基板との
空間が樹脂でほぼ完全に充填されるので、リフロー工程
において発生するボイドに起因して電子部品が持ち上げ
られるという不具合が生じやすい。すなわち、リフロー
において基板が加熱されると基板に含まれた水分や有機
成分がガス化して基板の上面から補強用樹脂内に進入
し、内部で空孔状のボイドを形成する。
However, in the method of applying the reinforcing resin in advance, since the space between the electronic component and the substrate is almost completely filled with the resin, the voids generated in the reflow process are caused. The problem that electronic components can be lifted easily occurs. That is, when the substrate is heated in the reflow, water and organic components contained in the substrate are gasified and enter the reinforcing resin from the upper surface of the substrate to form voids inside.

【0005】このボイドが温度上昇によって電子部品と
基板との間でさらに成長すると電子部品が下方から持ち
上げられ、バンプと電極との間に隙間を生じて正常な半
田接合が阻害される。このように、補強用樹脂を予め塗
布する従来の電子部品実装方法には、基板から発生した
気体が補強用樹脂内にボイドを形成することに起因し
て、実装不良を生じるという問題点があった。
When the void further grows between the electronic component and the substrate due to the temperature rise, the electronic component is lifted from below, and a gap is created between the bump and the electrode to prevent normal solder joining. As described above, the conventional electronic component mounting method in which the reinforcing resin is applied in advance has a problem in that the gas generated from the substrate forms voids in the reinforcing resin, resulting in mounting failure. It was

【0006】そこで本発明は、補強用樹脂を予め塗布し
て補強樹脂部形成工程を簡略化するとともに、基板から
発生した気体に起因する実装不良を防止することができ
る電子部品実装方法を提供することを目的とする。
Therefore, the present invention provides an electronic component mounting method which can apply a reinforcing resin in advance to simplify the step of forming the reinforcing resin portion and prevent the mounting failure due to the gas generated from the substrate. The purpose is to

【0007】[0007]

【課題を解決するための手段】請求項1記載の電子部品
実装方法は、電子部品に設けられた接続用電極を基板の
電極に半田接合することにより電子部品を基板に実装す
る電子部品実装方法であって、前記電子部品の接続用電
極に酸化膜除去能力を有する熱硬化性樹脂を供給する樹
脂供給工程と、樹脂供給工程後の前記電子部品を基板に
搭載して前記接続用電極を熱硬化性樹脂を介して基板の
電極に着地させる部品搭載工程と、部品搭載工程後の基
板を加熱することにより接続用電極を電極に半田接合す
るとともに前記熱硬化性樹脂を熱硬化させる加熱工程と
を含み、前記樹脂供給工程において部品搭載工程後の基
板と電子部品との間に脱気用隙間が確保されるように熱
硬化性樹脂を供給することにより、前記加熱工程におい
て基板から発生する気体を前記脱気用隙間から外部へ排
出する。
According to a first aspect of the present invention, there is provided an electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode of the substrate. A resin supplying step of supplying a thermosetting resin having an oxide film removing ability to the connecting electrode of the electronic component, and mounting the electronic component on the substrate after the resin supplying step to heat the connecting electrode. A component mounting step of landing on the electrode of the substrate through the curable resin, and a heating step of heating the substrate after the component mounting step to solder-bond the connection electrode to the electrode and heat cure the thermosetting resin. The thermosetting resin is supplied so as to secure a deaeration gap between the substrate and the electronic component after the component mounting process in the resin supplying process, and the resin is generated from the substrate in the heating process. Discharging the gas from the degassing gap to the outside.

【0008】請求項2記載の電子部品実装方法は、請求
項1記載の電子部品実装方法であって、前記加熱工程後
に、前記電子部品と基板との隙間に補強用樹脂を注入す
る。
The electronic component mounting method according to a second aspect is the electronic component mounting method according to the first aspect, wherein a reinforcing resin is injected into a gap between the electronic component and the substrate after the heating step.

【0009】請求項3記載の電子部品実装方法は、電子
部品に設けられた接続用電極を基板の電極に半田接合す
ることにより電子部品を基板に実装する電子部品実装方
法であって、前記基板の電極に酸化膜除去能力を有する
熱硬化性樹脂を供給する樹脂供給工程と、樹脂供給工程
後の前記基板に電子部品を搭載して前記接続用電極を熱
硬化性樹脂を介して基板の電極に着地させる部品搭載工
程と、部品搭載工程後の基板を加熱することにより接続
用電極を前記電極に半田接合するとともに前記熱硬化性
樹脂を熱硬化させる加熱工程とを含み、前記樹脂供給工
程において部品搭載工程後の基板と電子部品との間に脱
気用隙間が確保されるように熱硬化性樹脂を供給するこ
とにより、前記加熱工程において基板から発生する気体
を前記脱気用隙間から外部へ排出する。
An electronic component mounting method according to a third aspect of the invention is an electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode of the substrate. A resin supplying step of supplying a thermosetting resin having an oxide film removing ability to the electrodes of the electrodes, and an electronic component is mounted on the substrate after the resin supplying step, and the connecting electrodes are connected to the electrodes of the substrate through the thermosetting resin. In the resin supply step, including a component mounting step of landing on, and a heating step of soldering the connecting electrode to the electrode by heating the substrate after the component mounting step and thermosetting the thermosetting resin. By supplying a thermosetting resin so as to secure a deaeration gap between the substrate and the electronic component after the component mounting step, the gas generated from the substrate in the heating step is removed by the deaeration gap. Discharged to the Luo outside.

【0010】請求項4記載の電子部品実装方法は、請求
項3記載の電子部品実装方法であって、前記加熱工程後
に、前記電子部品と基板との隙間に補強用樹脂を注入す
る。
An electronic component mounting method according to a fourth aspect is the electronic component mounting method according to the third aspect, wherein a reinforcing resin is injected into a gap between the electronic component and the substrate after the heating step.

【0011】請求項5記載の電子部品実装方法は、電子
部品に設けられた接続用電極を基板の電極に半田接合す
ることにより電子部品を基板に実装する電子部品実装方
法であって、前記基板の上面に設定された電子部品固着
点に熱硬化性の第1の樹脂を供給する第1の樹脂供給工
程と、前記電子部品の接続用電極に酸化膜除去能力を有
する第2の樹脂を供給する第2の樹脂供給工程と、第2
の樹脂供給工程後の前記電子部品を第1の樹脂供給工程
後の基板に搭載して前記接続用電極を前記第2の樹脂を
介して基板の電極に着地させる部品搭載工程と、部品搭
載工程後の基板を加熱することにより接続用電極を前記
電極に半田接合するとともに前記第1の樹脂を熱硬化さ
せる加熱工程とを含み、前記第1の樹脂供給工程および
第2の樹脂供給工程において部品搭載工程後の基板と電
子部品との間に脱気用隙間が確保されるように第1の樹
脂および第2の樹脂を供給することにより、前記加熱工
程において基板から発生する気体を前記脱気用隙間から
外部へ排出する。
According to a fifth aspect of the present invention, there is provided an electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode on the substrate. A first resin supplying step of supplying a thermosetting first resin to the electronic component fixing point set on the upper surface of the electronic component, and a second resin having an oxide film removing ability to the connecting electrode of the electronic component. A second resin supplying step of
Component mounting step of mounting the electronic component after the resin supplying step on the substrate after the first resin supplying step and landing the connection electrode on the electrode of the substrate through the second resin, and the component mounting step A heating step of soldering the connection electrode to the electrode by heating the subsequent substrate and thermosetting the first resin, and the parts in the first resin supplying step and the second resin supplying step. By supplying the first resin and the second resin so as to secure a degassing gap between the board and the electronic component after the mounting step, the gas generated from the board in the heating step is degassed. Discharge to the outside through the clearance.

【0012】請求項6記載の電子部品実装方法は、請求
項5記載の電子部品実装方法であって、前記第2の樹脂
は熱硬化性樹脂であり、第2の樹脂が熱硬化することに
より、電子部品の接続用電極と基板の電極との半田接合
部を補強する樹脂補強部が形成される。
An electronic component mounting method according to a sixth aspect is the electronic component mounting method according to the fifth aspect, wherein the second resin is a thermosetting resin and the second resin is thermoset. A resin reinforcement portion is formed to reinforce the solder joint portion between the connection electrode of the electronic component and the electrode of the substrate.

【0013】請求項7記載の電子部品実装方法は、請求
項5記載の電子部品実装方法であって、前記第2の樹脂
は、半田接合用のフラックスである。
An electronic component mounting method according to a seventh aspect is the electronic component mounting method according to the fifth aspect, wherein the second resin is a solder joining flux.

【0014】本発明によれば、補強用の熱硬化性樹脂を
予め基板上に供給する樹脂供給工程において部品搭載工
程後の基板と電子部品との間に脱気用隙間が確保される
ように熱硬化性樹脂を供給することにより、加熱工程に
おいて基板から発生する気体を脱気用隙間から外部へ排
出することができ、基板から発生した気体に起因する実
装不良を防止することができる。
According to the present invention, in the resin supplying step of supplying the reinforcing thermosetting resin onto the substrate in advance, the deaeration gap is secured between the substrate and the electronic component after the component mounting step. By supplying the thermosetting resin, the gas generated from the substrate in the heating step can be discharged to the outside through the degassing gap, and the mounting failure due to the gas generated from the substrate can be prevented.

【0015】[0015]

【発明の実施の形態】(実施の形態1)図1、図2は本
発明の実施の形態1の電子部品実装方法の工程説明図で
ある。図1(a)において、電子部品1の下面(バンプ
形成面)には接続用電極としてのバンプ2が、半田を形
成材料として設けられている。図1(a)は、バンプ2
に樹脂を塗布するための樹脂供給工程を示しており、電
子部品1は樹脂塗布部5上に位置している。樹脂塗布部
5は樹脂6の塗膜が形成された樹脂転写容器5aを備え
ており、樹脂転写容器5aに対して電子部品1を上下動
させることにより、バンプ2の下面側に所定量の樹脂6
が転写により供給される。樹脂6は、エポキシ樹脂など
の熱硬化性樹脂を主成分とする基剤に、酸化膜除去能力
を有する活性成分を含有させたものである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS (Embodiment 1) FIGS. 1 and 2 are process explanatory views of an electronic component mounting method according to Embodiment 1 of the present invention. In FIG. 1A, a bump 2 as a connecting electrode is provided on the lower surface (bump formation surface) of the electronic component 1 using solder as a forming material. FIG. 1A shows the bump 2
The resin supply step for applying the resin is shown in FIG. 1, and the electronic component 1 is located on the resin application part 5. The resin coating part 5 includes a resin transfer container 5a on which a coating film of resin 6 is formed. By vertically moving the electronic component 1 with respect to the resin transfer container 5a, a predetermined amount of resin is applied to the lower surface side of the bump 2. 6
Are supplied by transfer. The resin 6 is a base containing a thermosetting resin such as an epoxy resin as a main component, and an active component having an oxide film removing ability contained therein.

【0016】この樹脂供給工程における樹脂供給量は、
電子部品1が後工程で基板3に搭載された状態で、基板
3の上面と電子部品1の下面との間を過度に密封してリ
フロー時に基板3から放出されるガスの外部への排出を
阻害しないよう、かつ樹脂6が熱硬化した後の補強効果
が確保されるための下限量以上となるよう、調整され
る。供給量の調整は、樹脂転写容器5aに形成される樹
脂6の塗膜の厚みを調整、もしくは塗膜に対する電子部
品1の下降高さを調整することにより行われる。要は、
樹脂6がバンプ形成面全面に付着しないようにすればよ
く、好ましくはバンプ2にのみ樹脂6を付着させる。
The resin supply amount in this resin supply step is
In a state where the electronic component 1 is mounted on the substrate 3 in a later process, the upper surface of the substrate 3 and the lower surface of the electronic component 1 are excessively sealed so that the gas released from the substrate 3 during reflow is discharged to the outside. It is adjusted so as not to hinder it and to be equal to or more than the lower limit amount for ensuring the reinforcing effect after the resin 6 is thermoset. The supply amount is adjusted by adjusting the thickness of the coating film of the resin 6 formed in the resin transfer container 5a or adjusting the descending height of the electronic component 1 with respect to the coating film. In short,
It is sufficient that the resin 6 does not adhere to the entire surface on which the bumps are formed, and preferably the resin 6 is adhered only to the bumps 2.

【0017】図1(b)、(c)は、樹脂供給工程後の
電子部品1を基板3に搭載する部品搭載工程を示してい
る。ここでは、バンプ2を基板3の上面に形成された電
極4に位置合わせして電子部品1を基板3に対して下降
させて、バンプ2を樹脂6を介して電極4に着地させ
る。これにより、バンプ2の下面に転写された樹脂6は
電極4に付着しさらに電極4を覆った形で基板3の上面
に拡がるが、このとき樹脂6の供給量が上述のように管
理されることから、樹脂6は基板3の上面と電子部品1
の下面との間を充填するには至らない。
FIGS. 1B and 1C show a component mounting process for mounting the electronic component 1 on the substrate 3 after the resin supplying process. Here, the bumps 2 are aligned with the electrodes 4 formed on the upper surface of the substrate 3, the electronic component 1 is lowered with respect to the substrate 3, and the bumps 2 land on the electrodes 4 via the resin 6. As a result, the resin 6 transferred onto the lower surface of the bump 2 adheres to the electrode 4 and further spreads over the upper surface of the substrate 3 so as to cover the electrode 4. At this time, the supply amount of the resin 6 is controlled as described above. Therefore, the resin 6 is applied to the upper surface of the substrate 3 and the electronic component 1.
It is not possible to fill the space between the bottom surface of and.

【0018】次いで基板3はリフロー装置に送られ、こ
こで図1(d)に示すように部品搭載工程後の基板3を
加熱する加熱工程が行われる。この加熱により、バンプ
2が溶融して電極4に半田接合される。この半田接合に
おいて、バンプ2の表面に生成した酸化膜は酸化膜除去
能力を有する樹脂6によって除去されることから、接合
性のよい良好な半田接合が行われる。またこのとき樹脂
6の熱硬化反応が並行して進行し、バンプ2と電極4と
の半田接合部を周囲から包み込んで補強する。なお、こ
のリフロー時においては、樹脂6の硬化は完全硬化まで
至る必要はなく、半硬化の状態でよい。
Next, the substrate 3 is sent to a reflow device, where a heating process for heating the substrate 3 after the component mounting process is performed as shown in FIG. 1 (d). By this heating, the bump 2 is melted and soldered to the electrode 4. In this solder joining, the oxide film formed on the surface of the bump 2 is removed by the resin 6 having an oxide film removing ability, so that good solder joining with good joining property is performed. At this time, the thermosetting reaction of the resin 6 proceeds in parallel, and the solder joint between the bump 2 and the electrode 4 is wrapped from the surroundings to reinforce. In this reflow, the resin 6 does not have to be completely cured, but may be in a semi-cured state.

【0019】上記加熱工程において、基板3の内部に含
有されていた有機成分や水分が加熱によりガス化して表
面から放出されるが、上述のように基板3の上面と電子
部品1の下面との間の隙間は樹脂6によって充填された
状態とはなっておらず、これらのガス(気体)を外部に
排出するための脱気用隙間がバンプとバンプの間に確保
されている。このためこれらのガスが樹脂6の内部に気
泡状態で閉じこめられることによるボイドが発生しても
ある程度の大きさまで成長すると脱気用隙間と連通して
消滅する。
In the heating step, the organic components and water contained in the substrate 3 are gasified and released from the surface by heating, but as described above, the upper surface of the substrate 3 and the lower surface of the electronic component 1 are separated. The gap between them is not filled with the resin 6, and a degassing gap for discharging these gases to the outside is secured between the bumps. Therefore, even if a void occurs due to these gases being trapped inside the resin 6 in the form of bubbles, it grows to a certain size and communicates with the degassing gap to disappear.

【0020】従って、樹脂を電子部品と基板との間に充
填した状態で半田接合する従来の電子部品実装において
このようなボイドに起因して発生していた不具合、すな
わち電子部品がボイドによって持ち上げられて、バンプ
が電極から浮き上がってしまうことによる半田接合不良
が発生しない。
Therefore, in the conventional electronic component mounting in which the resin is filled between the electronic component and the substrate and soldered, the defect caused by such a void, that is, the electronic component is lifted by the void. As a result, the solder joint failure due to the bump rising from the electrode does not occur.

【0021】次にこの加熱工程後の基板3は樹脂封止工
程に送られる。なお、この樹脂封止はより高い補強効果
を確保するために行われるものであり、求められる補強
レベルによっては必ずしも行う必要はない。図2(a)
に示すように、電子部品1の下面と基板3の上面の間の
隙間には、ディスペンサ7によって補強用樹脂8が注入
される。そして図2(b)に示すように、基板3と電子
部品1との間を完全に補強用樹脂8によって充填した
後、図2(c)に示すように基板3は再度加熱される。
この加熱によって補強用樹脂8が熱硬化することによ
り、電子部品1と基板3との間が樹脂封止される。そし
てこの加熱で樹脂6も完全硬化し、バンプ2と電極4と
の半田接合部の周囲を強固に補強する。
Next, the substrate 3 after this heating step is sent to the resin sealing step. It should be noted that this resin encapsulation is performed in order to secure a higher reinforcing effect, and is not necessarily required depending on the required reinforcing level. Figure 2 (a)
As shown in, the dispenser 7 injects the reinforcing resin 8 into the gap between the lower surface of the electronic component 1 and the upper surface of the substrate 3. Then, as shown in FIG. 2B, after the space between the substrate 3 and the electronic component 1 is completely filled with the reinforcing resin 8, the substrate 3 is heated again as shown in FIG. 2C.
The heating causes the reinforcing resin 8 to be thermally cured, so that the electronic component 1 and the substrate 3 are resin-sealed. This heating also completely cures the resin 6 and firmly reinforces the periphery of the solder joint between the bump 2 and the electrode 4.

【0022】上記方法により実現される電子部品実装構
造においては、樹脂6中の活性成分の酸化膜除去能力に
よりバンプ2と電極4との半田接合性が確保される。ま
た半田接合後に樹脂6が熱硬化することにより半田接合
部を補強するとともに、基板3と電子部品1との間を封
止した補強用樹脂8によって、実装後において基板3と
電子部品1との間に発生する熱応力を緩和することがで
き、信頼性に優れた実装構造が実現される。
In the electronic component mounting structure realized by the above method, the solder bondability between the bump 2 and the electrode 4 is secured by the ability of the active component in the resin 6 to remove the oxide film. In addition, the resin 6 is thermally cured after solder bonding to reinforce the solder bonding portion, and the reinforcing resin 8 that seals between the substrate 3 and the electronic component 1 makes it possible to connect the substrate 3 and the electronic component 1 after mounting. The thermal stress generated between them can be relaxed, and a highly reliable mounting structure can be realized.

【0023】さらに樹脂6は活性成分を含有しているこ
とから、従来の電子部品実装において半田接合に際して
必要とされたフラックスの塗布を行う必要がない。そし
て樹脂6中の活性成分は、熱効果過程において硬化剤と
して大部分が消費され、また活性成分の残留分も硬化し
た樹脂中に閉じこめられるため、実装後に回路パターン
が活性成分によって腐食するマイグレーションの発生が
ない。従って、フラックスを用いる従来の方法において
必要とされた洗浄処理が不要となる。また前述の樹脂封
止工程を省略する場合には、半田接合と補強樹脂部の形
成が同一工程で完了することになり、工程の簡略化・低
コスト化が実現される。
Further, since the resin 6 contains an active component, it is not necessary to apply the flux which is required for soldering in the conventional electronic component mounting. Most of the active component in the resin 6 is consumed as a curing agent in the heat effect process, and the residual component of the active component is also trapped in the cured resin. There is no occurrence. Therefore, the cleaning process required in the conventional method using the flux is unnecessary. Further, when the above-mentioned resin sealing step is omitted, the solder joining and the formation of the reinforcing resin portion are completed in the same step, and the simplification and cost reduction of the step are realized.

【0024】なお、補強用樹脂8を硬化させるための加
熱温度は、基板3から新たなガスが発生するのを抑制す
るために、半田接合時の加熱温度よりも低くすることが
望ましいが、半田接合時の加熱で基板3からの脱ガスが
十分行われる場合は、半田接合時の加熱温度以上で加熱
して硬化させてよい。
The heating temperature for hardening the reinforcing resin 8 is preferably lower than the heating temperature at the time of solder joining in order to suppress generation of new gas from the substrate 3. When degassing from the substrate 3 is sufficiently performed by the heating at the time of joining, it may be cured by heating at a heating temperature at the time of solder joining or higher.

【0025】(実施の形態2)図3は本発明の実施の形
態2の電子部品実装方法の工程説明図である。本実施の
形態2は、実施の形態1と同様の電子部品1を基板3に
実装するに際し、樹脂6を予め基板3の電極4上に供給
するようにしたものである。
(Embodiment 2) FIG. 3 is a process explanatory view of an electronic component mounting method according to Embodiment 2 of the present invention. In the second embodiment, when mounting the electronic component 1 similar to that of the first embodiment on the substrate 3, the resin 6 is previously supplied onto the electrodes 4 of the substrate 3.

【0026】図3(a)において、基板3の電極4上に
は実施の形態1に示すものと同様の樹脂6が供給され
る。この樹脂供給工程における樹脂供給量も、実施の形
態1と同様に調整され、電子部品1が後工程で基板に搭
載された状態で、基板上面と電子部品1の下面との間を
過度に密封してリフロー時に基板3から放出されるガス
の外部への排出を阻害しないよう、かつ樹脂6が熱硬化
した後の補強効果が確保されるための下限量以上となる
よう設定されている。
In FIG. 3A, the resin 6 similar to that shown in the first embodiment is supplied onto the electrode 4 of the substrate 3. The resin supply amount in this resin supply step is also adjusted in the same manner as in the first embodiment, and in a state where the electronic component 1 is mounted on the substrate in the subsequent step, the upper surface of the substrate and the lower surface of the electronic component 1 are excessively sealed. Then, it is set so as not to hinder the discharge of the gas released from the substrate 3 to the outside during the reflow and to be equal to or more than the lower limit amount for ensuring the reinforcing effect after the resin 6 is thermally cured.

【0027】図3(b)、(c)は、樹脂供給工程後の
基板3に対して電子部品1を搭載する部品搭載工程を示
しており、電子部品1を下降させることによりバンプ2
は樹脂6を介して電極4に着地する。これにより、バン
プ2の下面に転写された樹脂6は電極4に付着しさらに
電極4を覆った形で基板3の上面に拡がるが、このとき
樹脂6の供給量が上述のように管理されることから、樹
脂6は基板3の上面と電子部品1の下面との間を充填す
るには至らない。すなわち、バンプとバンプの間には脱
気用隙間が確保される。
3 (b) and 3 (c) show a component mounting process for mounting the electronic component 1 on the substrate 3 after the resin supplying process.
Lands on the electrode 4 via the resin 6. As a result, the resin 6 transferred onto the lower surface of the bump 2 adheres to the electrode 4 and further spreads over the upper surface of the substrate 3 so as to cover the electrode 4. At this time, the supply amount of the resin 6 is controlled as described above. Therefore, the resin 6 does not fill the space between the upper surface of the substrate 3 and the lower surface of the electronic component 1. That is, a deaeration gap is secured between the bumps.

【0028】次いで基板3はリフロー装置に送られ、こ
こで図3(d)に示すように部品搭載工程後の基板3を
加熱する加熱工程が行われる。この加熱により、実施の
形態1と同様にバンプ2が溶融して電極4に半田接合さ
れる。この加熱工程においても実施の形態1と同様に基
板3から放出されるガスを外部に排出するための脱気用
隙間が確保されてため、このようなボイドに起因する不
具合が発生しない。この後、加熱工程後の基板3は実施
の形態1と同様に、図2に示す樹脂封止工程に送られ、
同様に補強用樹脂8による樹脂封止が行われる。
Next, the substrate 3 is sent to a reflow device, where a heating process for heating the substrate 3 after the component mounting process is performed as shown in FIG. 3 (d). By this heating, the bumps 2 are melted and solder-bonded to the electrodes 4 as in the first embodiment. In this heating step as well, the degassing gap for discharging the gas released from the substrate 3 to the outside is ensured as in the first embodiment, so that the defect caused by such a void does not occur. After this, the substrate 3 after the heating step is sent to the resin sealing step shown in FIG. 2 as in the first embodiment.
Similarly, resin sealing with the reinforcing resin 8 is performed.

【0029】なお、補強用樹脂8を硬化させるための加
熱温度は、基板3から新たなガスが発生するのを抑制す
るために、半田接合時の加熱温度よりも低くすることが
望ましいが、半田接合時の加熱で基板3からの脱ガスが
十分行われる場合は、半田接合時の加熱温度以上で加熱
して硬化させてよい。そしてこのようにして実現される
実装構造も、実施の形態1と同様の特性を備えている。
The heating temperature for hardening the reinforcing resin 8 is preferably lower than the heating temperature at the time of solder joining in order to suppress the generation of new gas from the substrate 3. When degassing from the substrate 3 is sufficiently performed by the heating at the time of joining, it may be cured by heating at a heating temperature at the time of solder joining or higher. The mounting structure thus realized has the same characteristics as those of the first embodiment.

【0030】(実施の形態3)図4は本発明の実施の形
態3の電子部品実装方法の工程説明図である。本実施の
形態3は、実施の形態1、2と同様の電子部品1の基板
3への実装において、電子部品1と基板3との間を樹脂
封止する代わりに、補強樹脂によって電子部品1と基板
3とを局部的に固着させることによって補強効果を得る
ものである。
(Embodiment 3) FIG. 4 is a process explanatory diagram of an electronic component mounting method according to Embodiment 3 of the present invention. In the third embodiment, when mounting the electronic component 1 on the substrate 3 similarly to the first and second embodiments, instead of resin-sealing the electronic component 1 and the substrate 3, the electronic component 1 is made of a reinforcing resin. The reinforcing effect is obtained by locally fixing the substrate 3 and the substrate 3.

【0031】図4(a)において、基板3の電極4のう
ち、最外縁に位置する電極4上には予め熱硬化性の補強
用樹脂9(第1の樹脂)が供給される(第1の樹脂供給
工程)。最外縁の電極4は、電子部品1を基板3に固着
させるために基板3の上面に設定された電子部品固着点
となっている。また電子部品1のバンプ2には、実施の
形態1の図1(a)に示す樹脂供給と同様に、酸化膜除
去能力を有する熱硬化性の樹脂6(第2の樹脂)が供給
される(第2の樹脂供給工程)。
In FIG. 4A, a thermosetting reinforcing resin 9 (first resin) is previously supplied to the electrode 4 located at the outermost edge among the electrodes 4 of the substrate 3 (first resin). Resin supply process). The electrode 4 at the outermost edge serves as an electronic component fixing point set on the upper surface of the substrate 3 for fixing the electronic component 1 to the substrate 3. Further, the thermosetting resin 6 (second resin) having an oxide film removing ability is supplied to the bumps 2 of the electronic component 1 similarly to the resin supply shown in FIG. 1A of the first embodiment. (Second resin supply step).

【0032】この第1の樹脂供給工程における補強用樹
脂9の供給量および第2の樹脂供給工程における樹脂6
の供給量も、実施の形態1、2と同様に、電子部品1が
後工程で基板3に搭載された状態で、基板3の上面と電
子部品1の下面との間を過度に密封してリフロー時に基
板3から放出されるガスの外部への排出を阻害しないよ
う、かつ樹脂6が熱硬化した後の補強効果が確保される
ための下限量以上となるよう調整される。
Supply amount of the reinforcing resin 9 in the first resin supplying step and resin 6 in the second resin supplying step
Similarly to the first and second embodiments, the supply amount of the component is excessively sealed between the upper surface of the substrate 3 and the lower surface of the electronic component 1 with the electronic component 1 mounted on the substrate 3 in a later step. It is adjusted so as not to hinder the discharge of the gas released from the substrate 3 during reflow to the outside and to be the lower limit amount or more for ensuring the reinforcing effect after the resin 6 is thermally cured.

【0033】図4(b)、(c)は、第1の樹脂供給工
程後の基板3に対して第2の樹脂供給工程後の電子部品
1を搭載する部品搭載工程を示しており、電子部品1を
下降させることによりバンプ2は樹脂6を介して電極4
に着地する。このとき下面に樹脂6が塗布されたバンプ
2は、最外縁の電極4においては補強用樹脂9中に埋入
した状態で電極4に着地する。この搭載状態において、
樹脂6、補強用樹脂9の供給量が上述のように管理され
ることから、樹脂6や補強用樹脂9は基板3の上面と電
子部品1の下面との間を充填するには至らない。
FIGS. 4B and 4C show a component mounting process for mounting the electronic component 1 after the second resin supplying process on the substrate 3 after the first resin supplying process. When the component 1 is lowered, the bumps 2 pass through the resin 6 and the electrodes 4
Land on. At this time, the bump 2 having the lower surface coated with the resin 6 lands on the electrode 4 while being embedded in the reinforcing resin 9 in the electrode 4 at the outermost edge. In this mounted state,
Since the supply amounts of the resin 6 and the reinforcing resin 9 are controlled as described above, the resin 6 and the reinforcing resin 9 do not fill the space between the upper surface of the substrate 3 and the lower surface of the electronic component 1.

【0034】次いで基板3はリフロー装置に送られ、こ
こで図4(d)に示すように部品搭載工程後の基板3を
加熱する加熱工程が行われる。この加熱により、実施の
形態1、2と同様にバンプ2が溶融して電極4に半田接
合される。この半田接合とともに樹脂6と補強用樹脂9
がともに熱硬化し、熱硬化した樹脂6がバンプ2と電極
4との半田接合部を周囲から補強する樹脂補強部が形成
されるとともに、熱硬化した補強用樹脂9が電子部品1
の本体部を基板3に直接固着する。この加熱工程におい
ても実施の形態1、2と同様に基板3から放出されるガ
スを外部に排出するための脱気用隙間が確保されてた
め、このようなボイドに起因する不具合が発生しない。
Next, the substrate 3 is sent to a reflow device, where a heating process for heating the substrate 3 after the component mounting process is performed as shown in FIG. 4 (d). By this heating, the bumps 2 are melted and solder-bonded to the electrodes 4 as in the first and second embodiments. Resin 6 and reinforcing resin 9 together with this solder joint
Together with each other, a thermosetting resin 6 forms a resin reinforcing portion that reinforces the solder joint portion between the bump 2 and the electrode 4 from the surroundings, and the thermosetting reinforcing resin 9 forms the electronic component 1
The main body of is directly fixed to the substrate 3. In this heating step as well, similar to the first and second embodiments, the degassing gap for discharging the gas released from the substrate 3 to the outside is secured, so that the defect caused by such a void does not occur.

【0035】なお、上記実施の形態3において、バンプ
2の下面に樹脂6を供給する代わりに、活性作用を有す
るフラックスを塗布するようにしてもよい。これによ
り、バンプ2と電極4との半田接合においてバンプ2の
酸化膜がフラックスにより除去され、良好な半田接合性
が確保される。この例では、バンプ2と電極4との半田
接合部を周囲から補強する効果はないが、電子部品1は
補強用樹脂9によって基板3に直接固着されていること
から、十分な補強強度を有する実装構造となっている。
In the third embodiment, instead of supplying the resin 6 to the lower surface of the bump 2, a flux having an activating effect may be applied. As a result, the oxide film of the bump 2 is removed by the flux in the solder joint between the bump 2 and the electrode 4, and good solder joint property is secured. In this example, there is no effect of reinforcing the solder joint between the bump 2 and the electrode 4 from the surroundings, but since the electronic component 1 is directly fixed to the substrate 3 by the reinforcing resin 9, it has sufficient reinforcing strength. It has a mounting structure.

【0036】また、上記実施の形態1、2、3におい
て、接続用電極として半田を形成材料とするバンプ2が
設けられた電子部品1を対象とした例を示したが、本発
明は半田バンプ形式の電極に限定されず、電子部品1と
基板3との間に隙間を保った形で半田接合によって実装
する形態であれば、その他の形状の接続用電極を用いた
場合にあっても本発明を適用することができる。
In the first, second and third embodiments described above, an example has been shown in which the electronic component 1 provided with the bump 2 made of solder as a connecting electrode is used as the connecting electrode. The present invention is not limited to the type of electrode, and the electronic component 1 and the substrate 3 may be mounted by solder bonding with a gap maintained, even if a connecting electrode having another shape is used. The invention can be applied.

【0037】[0037]

【発明の効果】本発明によれば、補強用の熱硬化性樹脂
を予め基板上に供給する樹脂供給工程において部品搭載
工程後の基板と電子部品との間に脱気用隙間が確保され
るように熱硬化性樹脂を供給するようにしたので、加熱
工程において基板から発生する気体を脱気用隙間から外
部へ排出することができ、基板から発生した気体に起因
する実装不良を防止することができる。
According to the present invention, a degassing gap is secured between the board and the electronic parts after the parts mounting step in the resin supplying step of supplying the reinforcing thermosetting resin onto the board in advance. Since the thermosetting resin is supplied as described above, the gas generated from the substrate in the heating process can be discharged to the outside through the degassing gap, and the mounting failure caused by the gas generated from the substrate can be prevented. You can

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態1の電子部品実装方法の工
程説明図
FIG. 1 is a process explanatory diagram of an electronic component mounting method according to a first embodiment of the present invention.

【図2】本発明の実施の形態1の電子部品実装方法の工
程説明図
FIG. 2 is a process explanatory view of the electronic component mounting method according to the first embodiment of the present invention.

【図3】本発明の実施の形態2の電子部品実装方法の工
程説明図
FIG. 3 is a process explanatory diagram of an electronic component mounting method according to a second embodiment of the present invention.

【図4】本発明の実施の形態3の電子部品実装方法の工
程説明図
FIG. 4 is a process explanatory diagram of an electronic component mounting method according to a third embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 電子部品 2 バンプ 3 基板 4 電極 6 樹脂 8、9 補強用樹脂 1 electronic components 2 bumps 3 substrates 4 electrodes 6 resin 8, 9 Reinforcing resin

───────────────────────────────────────────────────── フロントページの続き (72)発明者 前田 憲 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 酒見 省二 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 Fターム(参考) 5E319 AA07 AB05 AC01 BB02 BB20 CC33 CC70 CD21 CD25 GG20 5F044 LL01 LL11 RR18 RR19    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Ken Maeda             1006 Kadoma, Kadoma-shi, Osaka Matsushita Electric             Sangyo Co., Ltd. (72) Inventor Shoji Sakami             1006 Kadoma, Kadoma-shi, Osaka Matsushita Electric             Sangyo Co., Ltd. F-term (reference) 5E319 AA07 AB05 AC01 BB02 BB20                       CC33 CC70 CD21 CD25 GG20                 5F044 LL01 LL11 RR18 RR19

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】電子部品に設けられた接続用電極を基板の
電極に半田接合することにより電子部品を基板に実装す
る電子部品実装方法であって、前記電子部品の接続用電
極に酸化膜除去能力を有する熱硬化性樹脂を供給する樹
脂供給工程と、樹脂供給工程後の前記電子部品を基板に
搭載して前記接続用電極を熱硬化性樹脂を介して基板の
電極に着地させる部品搭載工程と、部品搭載工程後の基
板を加熱することにより接続用電極を電極に半田接合す
るとともに前記熱硬化性樹脂を熱硬化させる加熱工程と
を含み、前記樹脂供給工程において部品搭載工程後の基
板と電子部品との間に脱気用隙間が確保されるように熱
硬化性樹脂を供給することにより、前記加熱工程におい
て基板から発生する気体を前記脱気用隙間から外部へ排
出することを特徴とする電子部品実装方法。
1. An electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode on the substrate, wherein an oxide film is removed on the connecting electrode of the electronic component. A resin supplying step of supplying a thermosetting resin having a capability, and a component mounting step of mounting the electronic component after the resin supplying step on a substrate and landing the connection electrode on the electrode of the substrate through the thermosetting resin. And a heating step of soldering the connection electrode to the electrode by heating the board after the component mounting step and thermosetting the thermosetting resin, and the board after the component mounting step in the resin supply step. By supplying a thermosetting resin so as to secure a deaeration gap with the electronic component, the gas generated from the substrate in the heating step is discharged to the outside through the deaeration gap. Electronic component mounting method to.
【請求項2】前記加熱工程後に、前記電子部品と基板と
の隙間に補強用樹脂を注入することを特徴とする請求項
1記載の電子部品実装方法。
2. The electronic component mounting method according to claim 1, wherein a reinforcing resin is injected into a gap between the electronic component and the substrate after the heating step.
【請求項3】電子部品に設けられた接続用電極を基板の
電極に半田接合することにより電子部品を基板に実装す
る電子部品実装方法であって、前記基板の電極に酸化膜
除去能力を有する熱硬化性樹脂を供給する樹脂供給工程
と、樹脂供給工程後の前記基板に電子部品を搭載して前
記接続用電極を熱硬化性樹脂を介して基板の電極に着地
させる部品搭載工程と、部品搭載工程後の基板を加熱す
ることにより接続用電極を前記電極に半田接合するとと
もに前記熱硬化性樹脂を熱硬化させる加熱工程とを含
み、前記樹脂供給工程において部品搭載工程後の基板と
電子部品との間に脱気用隙間が確保されるように熱硬化
性樹脂を供給することにより、前記加熱工程において基
板から発生する気体を前記脱気用隙間から外部へ排出す
ることを特徴とする電子部品実装方法。
3. An electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode on the substrate, wherein the electrode on the substrate has an oxide film removing ability. A resin supplying step of supplying a thermosetting resin, a component mounting step of mounting an electronic component on the substrate after the resin supplying step and landing the connecting electrode on the electrode of the substrate via the thermosetting resin, A heating step of heating the substrate after the mounting step to solder-bond the connection electrode to the electrode and heat-curing the thermosetting resin, and the substrate and the electronic component after the component mounting step in the resin supply step. By supplying a thermosetting resin so that a deaeration gap is secured between the gas and the gas, the gas generated from the substrate in the heating step is discharged to the outside from the deaeration gap. Child component mounting method.
【請求項4】前記加熱工程後に、前記電子部品と基板と
の隙間に補強用樹脂を注入することを特徴とする請求項
3記載の電子部品実装方法。
4. The electronic component mounting method according to claim 3, wherein a reinforcing resin is injected into a gap between the electronic component and the substrate after the heating step.
【請求項5】電子部品に設けられた接続用電極を基板の
電極に半田接合することにより電子部品を基板に実装す
る電子部品実装方法であって、前記基板の上面に設定さ
れた電子部品固着点に熱硬化性の第1の樹脂を供給する
第1の樹脂供給工程と、前記電子部品の接続用電極に酸
化膜除去能力を有する第2の樹脂を供給する第2の樹脂
供給工程と、第2の樹脂供給工程後の前記電子部品を第
1の樹脂供給工程後の基板に搭載して前記接続用電極を
前記第2の樹脂を介して基板の電極に着地させる部品搭
載工程と、部品搭載工程後の基板を加熱することにより
接続用電極を前記電極に半田接合するとともに前記第1
の樹脂を熱硬化させる加熱工程とを含み、前記第1の樹
脂供給工程および第2の樹脂供給工程において部品搭載
工程後の基板と電子部品との間に脱気用隙間が確保され
るように第1の樹脂および第2の樹脂を供給することに
より、前記加熱工程において基板から発生する気体を前
記脱気用隙間から外部へ排出することを特徴とする電子
部品実装方法。
5. An electronic component mounting method for mounting an electronic component on a substrate by soldering a connecting electrode provided on the electronic component to an electrode on the substrate, wherein the electronic component is fixed on the upper surface of the substrate. A first resin supplying step of supplying a thermosetting first resin to the spot, and a second resin supplying step of supplying a second resin having an oxide film removing ability to the connecting electrode of the electronic component, A component mounting step of mounting the electronic component after the second resin supply step on the substrate after the first resin supply step and landing the connection electrode on the electrode of the substrate through the second resin; The connection electrode is soldered to the electrode by heating the substrate after the mounting step, and
And a heating step of thermally curing the resin, so that a deaeration gap is secured between the board and the electronic component after the component mounting step in the first resin supplying step and the second resin supplying step. An electronic component mounting method, wherein the gas generated from the substrate in the heating step is discharged to the outside from the degassing gap by supplying the first resin and the second resin.
【請求項6】前記第2の樹脂は熱硬化性樹脂であり、第
2の樹脂が熱硬化することにより、電子部品の接続用電
極と基板の電極との半田接合部を補強する樹脂補強部が
形成されることを特徴とする請求項5記載の電子部品実
装方法。
6. The second resin is a thermosetting resin, and when the second resin is thermoset, the resin reinforcing portion reinforces a solder joint portion between a connecting electrode of an electronic component and an electrode of a substrate. 6. The electronic component mounting method according to claim 5, wherein:
【請求項7】前記第2の樹脂は、半田接合用のフラック
スであることを特徴とする請求項5記載の電子部品実装
方法。
7. The electronic component mounting method according to claim 5, wherein the second resin is a flux for solder joining.
JP2001354518A 2001-11-20 2001-11-20 Electronic component mounting method Expired - Fee Related JP3693007B2 (en)

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JP3693007B2 JP3693007B2 (en) 2005-09-07

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US7951700B2 (en) * 2005-04-06 2011-05-31 Panasonic Corporation Flip chip mounting method and bump forming method
JP2012069839A (en) * 2010-09-27 2012-04-05 Panasonic Corp Electronic component mounting method
WO2012160817A1 (en) * 2011-05-26 2012-11-29 パナソニック株式会社 Method for mounting electronic component, device for mounting electronic component, and system for mounting electronic component
JP2013153047A (en) * 2012-01-25 2013-08-08 Panasonic Corp Electronic component packaging method and electronic component packaging line
JP2013153048A (en) * 2012-01-25 2013-08-08 Panasonic Corp Electronic component packaging method and electronic component packaging line
JP2016162778A (en) * 2015-02-26 2016-09-05 株式会社タムラ製作所 Method for bonding electronic component, and conductive composition and pretreatment agent used for the method
JP2016181600A (en) * 2015-03-24 2016-10-13 株式会社タムラ製作所 Method for bonding electronic component, solder composition used therein, and pretreatment agent
JP2018101726A (en) * 2016-12-21 2018-06-28 パナソニックIpマネジメント株式会社 Electronic component mounting device and electronic component mounting method

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Publication number Priority date Publication date Assignee Title
US7951700B2 (en) * 2005-04-06 2011-05-31 Panasonic Corporation Flip chip mounting method and bump forming method
US8283246B2 (en) 2005-04-06 2012-10-09 Panasonic Corporation Flip chip mounting method and bump forming method
JP2012069839A (en) * 2010-09-27 2012-04-05 Panasonic Corp Electronic component mounting method
WO2012042809A1 (en) * 2010-09-27 2012-04-05 パナソニック株式会社 Electronic component mounting method
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WO2012160817A1 (en) * 2011-05-26 2012-11-29 パナソニック株式会社 Method for mounting electronic component, device for mounting electronic component, and system for mounting electronic component
CN103518424A (en) * 2011-05-26 2014-01-15 松下电器产业株式会社 Method for mounting electronic component, device for mounting electronic component, and system for mounting electronic component
JP2013153047A (en) * 2012-01-25 2013-08-08 Panasonic Corp Electronic component packaging method and electronic component packaging line
JP2013153048A (en) * 2012-01-25 2013-08-08 Panasonic Corp Electronic component packaging method and electronic component packaging line
JP2016162778A (en) * 2015-02-26 2016-09-05 株式会社タムラ製作所 Method for bonding electronic component, and conductive composition and pretreatment agent used for the method
JP2016181600A (en) * 2015-03-24 2016-10-13 株式会社タムラ製作所 Method for bonding electronic component, solder composition used therein, and pretreatment agent
JP2018101726A (en) * 2016-12-21 2018-06-28 パナソニックIpマネジメント株式会社 Electronic component mounting device and electronic component mounting method

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