JP2003028753A - ゼロ交差に基づく群遅延を測定するためのシステム及び方法 - Google Patents

ゼロ交差に基づく群遅延を測定するためのシステム及び方法

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Publication number
JP2003028753A
JP2003028753A JP2002130478A JP2002130478A JP2003028753A JP 2003028753 A JP2003028753 A JP 2003028753A JP 2002130478 A JP2002130478 A JP 2002130478A JP 2002130478 A JP2002130478 A JP 2002130478A JP 2003028753 A JP2003028753 A JP 2003028753A
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JP
Japan
Prior art keywords
dut
optical
frequency
signal
group delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002130478A
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English (en)
Japanese (ja)
Other versions
JP2003028753A5 (enExample
Inventor
Bogdan Szafraniec
ボーデン・スザファニック
Douglas M Baney
ダグラス・エム・バーニー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2003028753A publication Critical patent/JP2003028753A/ja
Publication of JP2003028753A5 publication Critical patent/JP2003028753A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2002130478A 2001-05-08 2002-05-02 ゼロ交差に基づく群遅延を測定するためのシステム及び方法 Pending JP2003028753A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US851758 1986-04-14
US09/851,758 US6486961B1 (en) 2001-05-08 2001-05-08 System and method for measuring group delay based on zero-crossings

Publications (2)

Publication Number Publication Date
JP2003028753A true JP2003028753A (ja) 2003-01-29
JP2003028753A5 JP2003028753A5 (enExample) 2005-09-22

Family

ID=25311606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002130478A Pending JP2003028753A (ja) 2001-05-08 2002-05-02 ゼロ交差に基づく群遅延を測定するためのシステム及び方法

Country Status (4)

Country Link
US (1) US6486961B1 (enExample)
EP (1) EP1256791B1 (enExample)
JP (1) JP2003028753A (enExample)
DE (1) DE60123928T2 (enExample)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置
JP2007024677A (ja) * 2005-07-15 2007-02-01 Sun Tec Kk 光断層画像表示システム
JP2010515919A (ja) * 2007-01-10 2010-05-13 ライトラボ・イメージング・インコーポレーテッド 波長可変光源を利用した光干渉断層撮影法の方法及び装置
JP2011196771A (ja) * 2010-03-18 2011-10-06 Canon Inc 光干渉断層撮像装置
JP2015504167A (ja) * 2012-01-17 2015-02-05 フェムトレーザース プロドゥクシオンズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 試料の光学検査のための装置及び方法
CN105910709A (zh) * 2016-03-18 2016-08-31 华北理工大学 测量半导体激光器瞬时调谐光谱的方法
JP2017526911A (ja) * 2014-07-25 2017-09-14 ディーエスシージー ソルーションズ，インコーポレイテッド レーザー位相推定及び補正
JP2019045200A (ja) * 2017-08-30 2019-03-22 国立研究開発法人産業技術総合研究所 光学的距離測定装置および測定方法
JPWO2020261391A1 (ja) * 2019-06-25 2021-10-28 三菱電機株式会社 信号処理装置、信号処理方法及びレーダ装置

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPQ641500A0 (en) * 2000-03-23 2000-04-15 Defence Science And Technology Organisation Method and apparatus for estimating chromatic dispersion in fibre bragg gratings
DE10125785A1 (de) * 2001-05-26 2002-11-28 Zeiss Carl Verfahren zur Absolutkalibrierung eines Interferometers
US6914681B2 (en) * 2001-08-22 2005-07-05 Agilent Technologies, Inc. Interferometric optical component analyzer based on orthogonal filters
US6900895B2 (en) * 2001-12-06 2005-05-31 Agilent Technologies, Inc. Phase noise compensation in an interferometric system
US6813027B2 (en) * 2002-01-14 2004-11-02 Agilent Technologies, Inc Time difference synchronization for determination of a property of an optical device
US6825934B2 (en) * 2002-03-14 2004-11-30 Agilent Technologies, Inc. Vibration noise mitigation in an interferometric system
TW555994B (en) * 2002-06-12 2003-10-01 Mediatek Inc Group delay test method and device
CN100353172C (zh) * 2002-09-17 2007-12-05 联发科技股份有限公司 群延迟测试方法及装置
US7526701B2 (en) * 2002-10-02 2009-04-28 Mediatek Inc. Method and apparatus for measuring group delay of a device under test
DE60225023T2 (de) * 2002-11-15 2008-05-15 Agilent Technologies Inc., Santa Clara Bestimmung einer optischen Eigenschaft unter Benutzung von überlagerten und verzögerten Signalen
CN1330948C (zh) * 2003-12-15 2007-08-08 中国科学院上海光学精密机械研究所 光纤光栅群时延谱的差动干涉测量装置及其测量方法
US20050251353A1 (en) * 2004-05-04 2005-11-10 Zoltan Azary System and method for analyzing an electrical network
US8797541B2 (en) 2011-07-11 2014-08-05 Baker Hughes Incorporated Optical network configuration with intrinsic delay for swept-wavelength interferometry systems

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4842358A (en) * 1987-02-20 1989-06-27 Litton Systems, Inc. Apparatus and method for optical signal source stabilization
JP3222562B2 (ja) 1992-08-25 2001-10-29 株式会社東芝 光ネットワークアナライザ
GB9615302D0 (en) * 1996-07-20 1996-09-04 Northern Telecom Ltd Etalon arrangement
US5818585A (en) * 1997-02-28 1998-10-06 The United States Of America As Represented By The Secretary Of The Navy Fiber Bragg grating interrogation system with adaptive calibration
US5978084A (en) * 1997-08-26 1999-11-02 The Texas A&M University System Open loop signal processing circuit and method for a fiber optic interferometric sensor

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置
JP2007024677A (ja) * 2005-07-15 2007-02-01 Sun Tec Kk 光断層画像表示システム
JP2010515919A (ja) * 2007-01-10 2010-05-13 ライトラボ・イメージング・インコーポレーテッド 波長可変光源を利用した光干渉断層撮影法の方法及び装置
JP2011196771A (ja) * 2010-03-18 2011-10-06 Canon Inc 光干渉断層撮像装置
JP2015504167A (ja) * 2012-01-17 2015-02-05 フェムトレーザース プロドゥクシオンズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 試料の光学検査のための装置及び方法
JP2017526911A (ja) * 2014-07-25 2017-09-14 ディーエスシージー ソルーションズ，インコーポレイテッド レーザー位相推定及び補正
US10739448B2 (en) 2014-07-25 2020-08-11 DSCB Solutions, Inc. Laser phase estimation and correction
CN105910709A (zh) * 2016-03-18 2016-08-31 华北理工大学 测量半导体激光器瞬时调谐光谱的方法
JP2019045200A (ja) * 2017-08-30 2019-03-22 国立研究開発法人産業技術総合研究所 光学的距離測定装置および測定方法
JP7074311B2 (ja) 2017-08-30 2022-05-24 国立研究開発法人産業技術総合研究所 光学的距離測定装置および測定方法
JPWO2020261391A1 (ja) * 2019-06-25 2021-10-28 三菱電機株式会社 信号処理装置、信号処理方法及びレーダ装置
JP7042975B2 (ja) 2019-06-25 2022-03-28 三菱電機株式会社 信号処理装置、信号処理方法及びレーダ装置

Also Published As

Publication number Publication date
US6486961B1 (en) 2002-11-26
DE60123928T2 (de) 2007-06-06
DE60123928D1 (de) 2006-11-30
EP1256791A3 (en) 2004-04-14
EP1256791A2 (en) 2002-11-13
EP1256791B1 (en) 2006-10-18
US20020176089A1 (en) 2002-11-28

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