JP2003028753A5 - - Google Patents
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- Publication number
- JP2003028753A5 JP2003028753A5 JP2002130478A JP2002130478A JP2003028753A5 JP 2003028753 A5 JP2003028753 A5 JP 2003028753A5 JP 2002130478 A JP2002130478 A JP 2002130478A JP 2002130478 A JP2002130478 A JP 2002130478A JP 2003028753 A5 JP2003028753 A5 JP 2003028753A5
- Authority
- JP
- Japan
- Prior art keywords
- dut
- optical
- crossing
- zero
- derivative
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US851758 | 2001-05-08 | ||
| US09/851,758 US6486961B1 (en) | 2001-05-08 | 2001-05-08 | System and method for measuring group delay based on zero-crossings |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003028753A JP2003028753A (ja) | 2003-01-29 |
| JP2003028753A5 true JP2003028753A5 (enExample) | 2005-09-22 |
Family
ID=25311606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002130478A Pending JP2003028753A (ja) | 2001-05-08 | 2002-05-02 | ゼロ交差に基づく群遅延を測定するためのシステム及び方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6486961B1 (enExample) |
| EP (1) | EP1256791B1 (enExample) |
| JP (1) | JP2003028753A (enExample) |
| DE (1) | DE60123928T2 (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AUPQ641500A0 (en) * | 2000-03-23 | 2000-04-15 | Defence Science And Technology Organisation | Method and apparatus for estimating chromatic dispersion in fibre bragg gratings |
| DE10125785A1 (de) * | 2001-05-26 | 2002-11-28 | Zeiss Carl | Verfahren zur Absolutkalibrierung eines Interferometers |
| US6914681B2 (en) * | 2001-08-22 | 2005-07-05 | Agilent Technologies, Inc. | Interferometric optical component analyzer based on orthogonal filters |
| US6900895B2 (en) * | 2001-12-06 | 2005-05-31 | Agilent Technologies, Inc. | Phase noise compensation in an interferometric system |
| US6813027B2 (en) * | 2002-01-14 | 2004-11-02 | Agilent Technologies, Inc | Time difference synchronization for determination of a property of an optical device |
| US6825934B2 (en) * | 2002-03-14 | 2004-11-30 | Agilent Technologies, Inc. | Vibration noise mitigation in an interferometric system |
| TW555994B (en) * | 2002-06-12 | 2003-10-01 | Mediatek Inc | Group delay test method and device |
| CN100353172C (zh) * | 2002-09-17 | 2007-12-05 | 联发科技股份有限公司 | 群延迟测试方法及装置 |
| US7526701B2 (en) * | 2002-10-02 | 2009-04-28 | Mediatek Inc. | Method and apparatus for measuring group delay of a device under test |
| DE60225023T2 (de) * | 2002-11-15 | 2008-05-15 | Agilent Technologies Inc., Santa Clara | Bestimmung einer optischen Eigenschaft unter Benutzung von überlagerten und verzögerten Signalen |
| CN1330948C (zh) * | 2003-12-15 | 2007-08-08 | 中国科学院上海光学精密机械研究所 | 光纤光栅群时延谱的差动干涉测量装置及其测量方法 |
| US20050251353A1 (en) * | 2004-05-04 | 2005-11-10 | Zoltan Azary | System and method for analyzing an electrical network |
| JP2006266797A (ja) * | 2005-03-23 | 2006-10-05 | Anritsu Corp | 光ヘテロダイン干渉装置 |
| JP4804820B2 (ja) * | 2005-07-15 | 2011-11-02 | サンテック株式会社 | 光断層画像表示システム |
| CN102973243B (zh) * | 2007-01-10 | 2015-11-25 | 光学实验室成像公司 | 用于扫频源光学相干断层的方法和装置 |
| JP5679686B2 (ja) * | 2010-03-18 | 2015-03-04 | キヤノン株式会社 | 光干渉断層撮像装置 |
| US8797541B2 (en) | 2011-07-11 | 2014-08-05 | Baker Hughes Incorporated | Optical network configuration with intrinsic delay for swept-wavelength interferometry systems |
| AT512044B1 (de) * | 2012-01-17 | 2013-05-15 | Femtolasers Produktions Gmbh | Vorrichtung und verfahren zur optischen überprüfung einer probe |
| US10151827B2 (en) | 2014-07-25 | 2018-12-11 | DSCG Solutions, Inc. | Laser phase estimation and correction |
| CN105910709B (zh) * | 2016-03-18 | 2017-08-25 | 华北理工大学 | 测量半导体激光器瞬时调谐光谱的方法 |
| JP7074311B2 (ja) * | 2017-08-30 | 2022-05-24 | 国立研究開発法人産業技術総合研究所 | 光学的距離測定装置および測定方法 |
| WO2020261391A1 (ja) * | 2019-06-25 | 2020-12-30 | 三菱電機株式会社 | 信号処理装置、信号処理方法及びレーダ装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4842358A (en) * | 1987-02-20 | 1989-06-27 | Litton Systems, Inc. | Apparatus and method for optical signal source stabilization |
| JP3222562B2 (ja) | 1992-08-25 | 2001-10-29 | 株式会社東芝 | 光ネットワークアナライザ |
| GB9615302D0 (en) * | 1996-07-20 | 1996-09-04 | Northern Telecom Ltd | Etalon arrangement |
| US5818585A (en) * | 1997-02-28 | 1998-10-06 | The United States Of America As Represented By The Secretary Of The Navy | Fiber Bragg grating interrogation system with adaptive calibration |
| US5978084A (en) * | 1997-08-26 | 1999-11-02 | The Texas A&M University System | Open loop signal processing circuit and method for a fiber optic interferometric sensor |
-
2001
- 2001-05-08 US US09/851,758 patent/US6486961B1/en not_active Expired - Fee Related
- 2001-12-17 EP EP01129971A patent/EP1256791B1/en not_active Expired - Lifetime
- 2001-12-17 DE DE60123928T patent/DE60123928T2/de not_active Expired - Fee Related
-
2002
- 2002-05-02 JP JP2002130478A patent/JP2003028753A/ja active Pending
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