DE60123928T2 - System und Verfahren zur Messung von Gruppenverzögerung basiert auf Nulldurchgänge - Google Patents

System und Verfahren zur Messung von Gruppenverzögerung basiert auf Nulldurchgänge Download PDF

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Publication number
DE60123928T2
DE60123928T2 DE60123928T DE60123928T DE60123928T2 DE 60123928 T2 DE60123928 T2 DE 60123928T2 DE 60123928 T DE60123928 T DE 60123928T DE 60123928 T DE60123928 T DE 60123928T DE 60123928 T2 DE60123928 T2 DE 60123928T2
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Germany
Prior art keywords
dut
optical
signal
zero
frequency
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Expired - Fee Related
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DE60123928T
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German (de)
English (en)
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DE60123928D1 (de
Inventor
Bogdan Palo Alto Szfraniec
Douglas M. Palo Alto Baney
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of DE60123928D1 publication Critical patent/DE60123928D1/de
Publication of DE60123928T2 publication Critical patent/DE60123928T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Spectrometry And Color Measurement (AREA)
DE60123928T 2001-05-08 2001-12-17 System und Verfahren zur Messung von Gruppenverzögerung basiert auf Nulldurchgänge Expired - Fee Related DE60123928T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US851758 1986-04-14
US09/851,758 US6486961B1 (en) 2001-05-08 2001-05-08 System and method for measuring group delay based on zero-crossings

Publications (2)

Publication Number Publication Date
DE60123928D1 DE60123928D1 (de) 2006-11-30
DE60123928T2 true DE60123928T2 (de) 2007-06-06

Family

ID=25311606

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60123928T Expired - Fee Related DE60123928T2 (de) 2001-05-08 2001-12-17 System und Verfahren zur Messung von Gruppenverzögerung basiert auf Nulldurchgänge

Country Status (4)

Country Link
US (1) US6486961B1 (enExample)
EP (1) EP1256791B1 (enExample)
JP (1) JP2003028753A (enExample)
DE (1) DE60123928T2 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPQ641500A0 (en) * 2000-03-23 2000-04-15 Defence Science And Technology Organisation Method and apparatus for estimating chromatic dispersion in fibre bragg gratings
DE10125785A1 (de) * 2001-05-26 2002-11-28 Zeiss Carl Verfahren zur Absolutkalibrierung eines Interferometers
US6914681B2 (en) * 2001-08-22 2005-07-05 Agilent Technologies, Inc. Interferometric optical component analyzer based on orthogonal filters
US6900895B2 (en) * 2001-12-06 2005-05-31 Agilent Technologies, Inc. Phase noise compensation in an interferometric system
US6813027B2 (en) * 2002-01-14 2004-11-02 Agilent Technologies, Inc Time difference synchronization for determination of a property of an optical device
US6825934B2 (en) * 2002-03-14 2004-11-30 Agilent Technologies, Inc. Vibration noise mitigation in an interferometric system
TW555994B (en) * 2002-06-12 2003-10-01 Mediatek Inc Group delay test method and device
CN100353172C (zh) * 2002-09-17 2007-12-05 联发科技股份有限公司 群延迟测试方法及装置
US7526701B2 (en) * 2002-10-02 2009-04-28 Mediatek Inc. Method and apparatus for measuring group delay of a device under test
DE60225023T2 (de) * 2002-11-15 2008-05-15 Agilent Technologies Inc., Santa Clara Bestimmung einer optischen Eigenschaft unter Benutzung von überlagerten und verzögerten Signalen
CN1330948C (zh) * 2003-12-15 2007-08-08 中国科学院上海光学精密机械研究所 光纤光栅群时延谱的差动干涉测量装置及其测量方法
US20050251353A1 (en) * 2004-05-04 2005-11-10 Zoltan Azary System and method for analyzing an electrical network
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置
JP4804820B2 (ja) * 2005-07-15 2011-11-02 サンテック株式会社 光断層画像表示システム
JP5269809B2 (ja) * 2007-01-10 2013-08-21 ライトラブ イメージング, インコーポレイテッド 波長可変光源を利用した光干渉断層撮影法の方法及び装置
JP5679686B2 (ja) * 2010-03-18 2015-03-04 キヤノン株式会社 光干渉断層撮像装置
US8797541B2 (en) 2011-07-11 2014-08-05 Baker Hughes Incorporated Optical network configuration with intrinsic delay for swept-wavelength interferometry systems
AT512044B1 (de) * 2012-01-17 2013-05-15 Femtolasers Produktions Gmbh Vorrichtung und verfahren zur optischen überprüfung einer probe
US10151827B2 (en) 2014-07-25 2018-12-11 DSCG Solutions, Inc. Laser phase estimation and correction
CN105910709B (zh) * 2016-03-18 2017-08-25 华北理工大学 测量半导体激光器瞬时调谐光谱的方法
JP7074311B2 (ja) * 2017-08-30 2022-05-24 国立研究開発法人産業技術総合研究所 光学的距離測定装置および測定方法
WO2020261391A1 (ja) * 2019-06-25 2020-12-30 三菱電機株式会社 信号処理装置、信号処理方法及びレーダ装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4842358A (en) * 1987-02-20 1989-06-27 Litton Systems, Inc. Apparatus and method for optical signal source stabilization
JP3222562B2 (ja) 1992-08-25 2001-10-29 株式会社東芝 光ネットワークアナライザ
GB9615302D0 (en) * 1996-07-20 1996-09-04 Northern Telecom Ltd Etalon arrangement
US5818585A (en) * 1997-02-28 1998-10-06 The United States Of America As Represented By The Secretary Of The Navy Fiber Bragg grating interrogation system with adaptive calibration
US5978084A (en) * 1997-08-26 1999-11-02 The Texas A&M University System Open loop signal processing circuit and method for a fiber optic interferometric sensor

Also Published As

Publication number Publication date
US6486961B1 (en) 2002-11-26
JP2003028753A (ja) 2003-01-29
DE60123928D1 (de) 2006-11-30
EP1256791A3 (en) 2004-04-14
EP1256791A2 (en) 2002-11-13
EP1256791B1 (en) 2006-10-18
US20020176089A1 (en) 2002-11-28

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Legal Events

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8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee