JP2002529742A - 電子回路 - Google Patents
電子回路Info
- Publication number
- JP2002529742A JP2002529742A JP2000581464A JP2000581464A JP2002529742A JP 2002529742 A JP2002529742 A JP 2002529742A JP 2000581464 A JP2000581464 A JP 2000581464A JP 2000581464 A JP2000581464 A JP 2000581464A JP 2002529742 A JP2002529742 A JP 2002529742A
- Authority
- JP
- Japan
- Prior art keywords
- charge
- electronic circuit
- voltage
- current
- sensing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Radiation (AREA)
- Measurement Of Current Or Voltage (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/187,470 US6414318B1 (en) | 1998-11-06 | 1998-11-06 | Electronic circuit |
| PCT/US1999/025745 WO2000028337A2 (en) | 1998-11-06 | 1999-11-05 | Electronic circuit with a non-continuous discharge path |
| US09/435,100 | 1999-11-05 | ||
| US09/187,470 | 1999-11-05 | ||
| US09/435,100 US6353324B1 (en) | 1998-11-06 | 1999-11-05 | Electronic circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002529742A true JP2002529742A (ja) | 2002-09-10 |
| JP2002529742A5 JP2002529742A5 (https=) | 2007-01-11 |
Family
ID=26883066
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000581464A Pending JP2002529742A (ja) | 1998-11-06 | 1999-11-05 | 電子回路 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6353324B1 (https=) |
| JP (1) | JP2002529742A (https=) |
| WO (1) | WO2000028337A2 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7508187B2 (en) | 2004-10-25 | 2009-03-24 | Aplicaciones Tecnologicas, S.A. | Device and system for the measurement of an external electrostatic field, and system and method for the detection of storms |
| CN102519670A (zh) * | 2012-01-05 | 2012-06-27 | 北京东方计量测试研究所 | 真空计电参数检定装置 |
| JP2019515701A (ja) * | 2016-03-30 | 2019-06-13 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム、デバイスおよび方法 |
Families Citing this family (77)
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| US6549138B2 (en) * | 2000-09-20 | 2003-04-15 | Texas Instruments Incorporated | Method and apparatus for providing detection of excessive negative offset of a sensor |
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| US7605649B2 (en) * | 2001-03-13 | 2009-10-20 | Marvell World Trade Ltd. | Nested transimpedance amplifier |
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| US7276965B1 (en) | 2001-03-13 | 2007-10-02 | Marvell International Ltd. | Nested transimpedance amplifier |
| US7109698B2 (en) * | 2001-03-14 | 2006-09-19 | The Board Of Regents, University Of Oklahoma | Electric-field meter having current compensation |
| US6580071B2 (en) | 2001-07-12 | 2003-06-17 | Ciphergen Biosystems, Inc. | Method for calibrating a mass spectrometer |
| US6546527B1 (en) * | 2001-11-14 | 2003-04-08 | Henry Davis, Jr. | Method and apparatus for automated worst case designing and analyzing a circuit |
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| FR2864231B1 (fr) * | 2003-12-19 | 2006-05-19 | Valois Sas | Dispositif de distribution de produit fluide |
| US8223913B2 (en) * | 2004-03-31 | 2012-07-17 | Thermo Fisher Scientific Inc. | Method and apparatus for detecting high-energy radiation using a pulse mode ion chamber |
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| US7558014B1 (en) | 2004-06-24 | 2009-07-07 | Marvell International Ltd. | Programmable high pass amplifier for perpendicular recording systems |
| JP2008505456A (ja) * | 2004-07-01 | 2008-02-21 | ヴァーミリオン インコーポレイテッド | 質量分析装置における非線形増幅器およびその使用 |
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| JPWO2006132193A1 (ja) * | 2005-06-06 | 2009-01-08 | 松下電器産業株式会社 | コンデンサマイクロホンのエレクトレット化方法、エレクトレット化装置およびこれを用いたコンデンサマイクロホンの製造方法 |
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| US7948015B2 (en) | 2006-12-14 | 2011-05-24 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
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| US20100213079A1 (en) * | 2009-02-24 | 2010-08-26 | Ultradian Diagnostics, Llc | Microsecond response electrochemical sensors and methods thereof |
| US8288701B2 (en) * | 2009-03-03 | 2012-10-16 | Aptina Imaging Corporation | Method and system for controlling power to pixels in an imager |
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| WO2013038584A1 (ja) * | 2011-09-15 | 2013-03-21 | 地方独立行政法人東京都立産業技術研究センター | イオン化ガス検出器及びイオン化ガス検出方法 |
| TWI455003B (zh) * | 2011-11-25 | 2014-10-01 | Shih Hua Technology Ltd | 電容式觸控面板及防止其漏電流之驅動方法 |
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| JP2019515701A (ja) * | 2016-03-30 | 2019-06-13 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム、デバイスおよび方法 |
| US11278244B2 (en) | 2016-03-30 | 2022-03-22 | Dexcom, Inc. | Systems, devices and methods for analyte monitoring system |
| JP7059194B2 (ja) | 2016-03-30 | 2022-04-25 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム |
| JP2022106770A (ja) * | 2016-03-30 | 2022-07-20 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム、デバイスおよび方法 |
| JP7379579B2 (ja) | 2016-03-30 | 2023-11-14 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのための方法 |
| JP2024016123A (ja) * | 2016-03-30 | 2024-02-06 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム、デバイスおよび方法 |
| JP7590531B2 (ja) | 2016-03-30 | 2024-11-26 | デックスコム・インコーポレーテッド | 検体モニタリングシステム |
| JP2025028891A (ja) * | 2016-03-30 | 2025-03-05 | デックスコム・インコーポレーテッド | 検体モニタリングシステムのためのシステム、デバイスおよび方法 |
| US12471849B2 (en) | 2016-03-30 | 2025-11-18 | Dexcom, Inc. | Systems, devices and methods for analyte monitoring system |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2000028337A2 (en) | 2000-05-18 |
| US6353324B1 (en) | 2002-03-05 |
| WO2000028337A3 (en) | 2000-11-30 |
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